X-RAY DIFFRACTION
1
LIST OF CONTENT:
• INTRODUCTION
• INSTRUMENTATION:
-Production of X-rays
-Collimator
-Monochromator
-Detector
• APPLICATION
• REFERENCE
• It is a novel & non destructive method of
chemical analysis and a variety of x –ray
techniques are available in practice.
• These are :X – ray Absorption
X-ray diffraction
X-ray Fluorescence
• Definition :
The atomic planes of a crystal cause an incident beam
of X-rays to interfere with one another as they leave the
crystal. The phenomenon is called X-ray diffraction.
Bragg’s Law and Diffraction:
• How waves reveal the atomic structure of
crystals
N ƛ = 2d sinθ
N = integer
Bragg’s equation is a negative law
If Bragg’s eq. is NOT satisfied no reflection can occur
If Bragg’s eq. is satisfied reflection may occur
Diffraction = Reinforced Coherent Scattering
Instrumentation:
• Production of X-rays:
X-rays are produced whenever high-speed electrons
collide with a metal target.
Collimator:
• Collimator system is used for achieving a
narrow beam of X-rays.
• X-rays are allowed to pass through collimator.
Monochromator:
• Two methods are available:
1)Filter
2)crystal monochromator
Filter: A filter is a window of material that
absorbs undesirable radiation but allows the
radiation of required wavelength to pass.
eg. zirconium filter which is used for
molybdenium radiation.
• Crystal monochromator :
It is made up of a
suitable crystalline material positioned in the X-
ray beam so that angle of reflecting planes
satisfied the bragg’s equation for required
[Link] flat crystal monochromator.
Detectors:
• 1) Photographic methods
• 2) counter methods:
-Geiger muller counter
-Scintillation detector
- propertional counter
• Geiger muller tube counter:
• Scintillation counter:
A Modern Automated X-ray Diffractometer
X-ray Tube Detector
Sample stage
Cost: $560K to 1.6M
Applications of XRD
• XRD is a non destructive technique to identify crystalline phases and
orientation
- Obtain XRD pattern ; Measure d-spacings ; Obtain integrated
intensities ;
• To determine structural properties:
- Lattice parameters (10-4Å),, grain size, composition, prefer
strained orientation (Laue) order-disorder transformation, thermal
expansion
• To measure thickness of thin films and multi-layers*
• To determine atomic arrangement
• Detection limits: ~3% in a two phase mixture; can be ~0.1% with synchrotron
radiation
Spatial resolution: normally none
Applications of XRD
• The electron density and accordingly, the position of the atoms in
complex structures, such as penicillin may be determined from a
comprehensive mathematical study of the x-ray diffraction pattern.
• The elucidation of structure of penicillin by xrd paved the way for the
later synthesis of penicillin.
• The powder xrd pattern may be thought of as finger print of the single
crystal structure, and it may be used conduct qualitative and
quantitative analysis.
• Xrd can also be used to determine whether the compound is solvated
or not
Applications of XRD
• Particle size determination by applying the relation.
v= V. δθ. cos θ / 2n
Where v = the volume or size of an individual crystalline
V= the total volume of the specimen irradiated
n = the number of spots in a deffraction ring at a Bragg
angle θ δθ = the divergence of the X –ray beam
• Determination of Cis-Trans isomerism
• It is used to assess the weathering and degradation of natural
and synthetic , minerals.
• Tooth enamel and dentine have been examined by xrd.
• State of anneal in metals
References:
• Text book of Instrumental analysis by skoog,Holler,and
crouch,2007 Edition from [Link] 2.303 to 2.339.
• Pictures and diagram are taken from Google images.
Thank you.