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SEM vs Optical Microscope Analysis

The document summarizes the key differences between optical microscopes and scanning electron microscopes (SEM). It provides details on how an SEM works, including how it uses an electron beam to generate signals from sample surfaces, allowing for higher magnification and resolution compared to optical microscopes. The document also includes sample images comparing low and high carbon steel samples at different magnifications using both optical and SEM techniques.

Uploaded by

Jhonn Antony Gago Obispo
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73 views15 pages

SEM vs Optical Microscope Analysis

The document summarizes the key differences between optical microscopes and scanning electron microscopes (SEM). It provides details on how an SEM works, including how it uses an electron beam to generate signals from sample surfaces, allowing for higher magnification and resolution compared to optical microscopes. The document also includes sample images comparing low and high carbon steel samples at different magnifications using both optical and SEM techniques.

Uploaded by

Jhonn Antony Gago Obispo
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PPT, PDF, TXT or read online on Scribd

SEM microscope

By:
Doug, Holly & Oleg
Scanning Electron Microscope
vs.
Optical Microscope
Advantages Disadvantages
Continuously variable Cost
magnification
More knobs
High resolution
Vacuum

Depth of focus Sample limitations

Elemental analysis
attachments
Scanning Electron Microscope
(simplified drawing)

tungsten filament (electron source)

e- electrostatic lens (F = qE)


accelerating voltage anode

electromagnetic lenses (F = q v x B)
(condenser lenses)

electromagnetic lens (objective lens)


& deflector coils (raster scan)

SE detector (scintillator & PMT)

sample
Signal Generation

In (Probe)
Focused mono-energetic electron beam

Out (Signal)
 Imaging
• Backscattered electrons
• Secondary electrons
 Analysis
• X-rays
Characteristic x-rays
Bremsstrahlung x-rays (background “noise”)
• Auger electrons
Topographic contrast

surface

same penetration depth

shorter exit distance, longer exit distance,


higher signal lower signal
SEM general info
SEM General info
•Mount the sample on the holder
•“Paint” the conductive path
SEM General info
Load the sample into the SEM
SEM general info

•Vacuum pump 4
minutes
•Turn on filament
current & accelerating
voltage
•Fiddle with the knobs
Sample Prep
Low C steel Quenched from 1700
High C steel degF
Unknown C steel Anneal to 900 degF
Furnace cooled from
1700 degF
High C (optical 600x)

High C (SEM 400x)

High C (SEM 3000x)


Low C (600x optical)

Low C (SEM 400x)

Low C (SEM 3000x)


Unknown (optical 600x)

Unknown C (SEM 400x)

Unknown (SEM 3000x)


Low C vs High C (SEM 200x)

Low Carbon

Plastic

High Carbon
Low C
(3000x vs 10000x)

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