aracterisatio Nanomaterial Atomic force Microscopy (AFM)

Application of AFM for material characterization

Surface topography measurement AFM measurementsfor hardness and modulus
(b) Nanoindentation is used for characterization of
Surface scanning of (a) Al- hardness and elastic modulus of materials
clad and (b) Al 2024-T351.
14 14
M, K, Khan, et al. Atonuc
force microscopy (AFM) for A. Caron, Journal of
materialscharacterization,in
MaterialsCharacterization Visualized Experiments,
using Nondestructive 117, 1-9, 2016.
Evaluation(NOE) Methods,

Hardness value HAFM = 1.53 GPa for gold thin-flim surface.

AFM measurementsfor damage characterizations AFM characterizationsof surface treatmenteffects

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—50 z: —200

-300

Distance
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AFM image of an area 90 90 mm near to the fracture region in AISI 310 stainless steel SEM Image and AFM mode of ultrasonic nanocrystal surface
alloy after fatigue loading of 3*108 cycles. modification (UNSM) treatment on Ti-6Al-4V.
M, K, et foræ in M, K, et microscopyIAP") for material'cMractulzdon, In MaterialsCharacterization
using (NOE) orqilff D S

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 Characterisation of Nanomaterials Working modes of AFM
Contact mode
In contact mode, the AFM probe and sample surface come into contact with
separation distance less than 0.5 nm.
The cantilever deflects, owing to a constant repulsive van der Waals force
exerted on the sample, and an image of the surface is obtained. Schematic
representation
ofcontactmodeAFMscanning

Noncontact mode
The AFM cantilever and sample surface do not come into contact and keep a
distance of 0.1-10 nm.
The cantilever vibrates near to the sample surface at the frequency hiqher
than its resonant frequency.
When the cantilever moves away from the sample surface, the attractive Schematic
representation
Ofnon-contact
modeAFMscanning
van der Waals forces decrease the resonant frequency and the amplitude of
vibration.

Tapping mode
The tapping mode is used in which the cantilever oscillates, with amplitudes
of the order of nanometers during imaging.
The cantilever vibrates with intermittent contact slightly below its resonant
frequency at amplitude ranges from 20 to 100 nm. Schematic
representation
Oftapping
modeAFMscanning
This mode provides best results for soft materials or films. https:\\d0i.orqno.1016/B97g-o-08-1000ao-3.0000143

Dr.MohamedBaselBazbouz
 Characterisation of Nanomaterials Atomic force Microscopy (AFM)
Principle of AFM technique https://wvwv
John Lennard-Jones potentiallaw: Who describes the forces between
atoms and molecules (the repulsive forces at short distances and
attractive forces at long ranged interactions). 12
VLJ = 48
Lennard Jones potential

Topography Topography Topography Topography Topography

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Working modes of AFM
The AFM is usually equipped to work in three different modes termed as contact, noncontact, and tapping mode.
5/7 Dr. MohamedBaselBazbouz
_Characterisation of Nanomaterials Atomic force Microscopy (AFM)
Basic components of AFM
The cantilever ranges from 100to 200
pm in length, 10 to 40 pm in width,
and 0.3 to 2 pm in thickness. Laser
Photodetector
Cantilever with a sharp tip (stiffness constant:
(0.03- 48) Nim and frequency:(12-1200) KHZ.
It is made of silicon with gold or diamond
coating. https://www.nanoworld.com/
https://commons.wlklmedla.org/
The stiffness and resonant frequency are
higher for shorter and thicker cantilevers.
Cantilever
A laser diode, a photodetector which works as a scanner, and a
sample stage capable of moving in x, y, and z directions.

The amount of force between the probe and sample depends on the Translationstage
spring constant (stiffness of the cantilever) and the distance between the
probe and the sample surface.
Schematic representation of atomic force microscope (AFM)
This force can be described using Hooke's Law as F = kX, where M, K, Khan, et al. Atomic force microscopy (AFM) for materials
characterization, in Materials Characterization Using Nondestructive
F is the force exerted on the cantilever during scanning, k is the Evaluation (NDE) Methods, https://doi.orR/10.1016/B978-o-08-100040-3.00001-8
spring constant or stiffness of the cantilever, and x is the
cantilever deflection.
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 Characterisation f Nan materi I Atomic force Microscopy (AFM)
Introduction 178.4 nm
AFM (Nondestructive Analytical Technique) has capability to
measure the Z height and thus generate very high-resolution
topographic images of a surface down to atomic resolution.
AFM can be used for 3D informationof surface defects
such as scratches, gouges and corrosions.
Comparison of AFM with other microscopy
techniques -305.9 nm
Parameter SEM TEM AFM https://www.ndsu.edu/cpmnnstrumentatlon/afm/
Measuremenl Vacuum Vacuum Air. water.gas.
environment vacuum,etc.
Surtaceheight I Not possible Not possible Possible
Measure•nent 2D
di•nension
Expensive Expensive Cheap
Usage] Skilled openuor Skilled operator Easy to use
required requited
[Measutementspeed 1 Fast Fast Slow
M, K, Khan, et al. Atomic force microscopy (AFM) for materials characterization,
in Materials Characterization Using Nondestructive Evaluation (NDE) Methods, A typical atomic force average surface size (nm and catalyst
https://doi.org/10.1016/B978-O-08-100040-3.00001-8 microscope (AFM). number density (200,200 nm2)

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