Evaluation Module Users Guide
Evaluation Module Users Guide
User’s Guide
BQ76922EVM Evaluation Module
ABSTRACT
The BQ76922EVM evaluation module (EVM) is a complete evaluation system for the BQ76922, a 3-cell to 5-cell
Li-Ion battery monitor integrated circuit. The EVM consists of a BQ76922 circuit module which is used for simple
evaluation of the BQ76922 monitor function. The circuit module includes one BQ76922 integrated circuit (IC),
sense resistor, power FETs, and all other onboard components necessary to protect the cells from overcharge,
over discharge, short circuit, and overcurrent discharge in a 5-series cell Li-Ion or Li-Polymer battery pack. The
circuit module connects directly across the cells in a battery, or can be connected with a power supply and
the included cell simulator resistors. With the on-board interface or compatible external interface board and
Microsoft® Windows® based PC graphical user interface (GUI) software, the user can view the device registers,
adjust protection limits and enable FET control outputs.
Table of Contents
1 Features...................................................................................................................................................................................3
1.1 Kit Contents........................................................................................................................................................................3
1.2 Ordering Information.......................................................................................................................................................... 3
1.3 BQ76922EVM Circuit Module Performance Specification Summary.................................................................................3
1.4 Required Equipment.......................................................................................................................................................... 3
2 BQ76922EVM Quick Start Guide........................................................................................................................................... 4
2.1 Before You Begin............................................................................................................................................................... 4
2.2 Quick Start..........................................................................................................................................................................4
3 Interface Adapter.................................................................................................................................................................... 6
4 Battery Management Studio Software.................................................................................................................................. 7
4.1 System Requirements........................................................................................................................................................7
4.2 Installing BQStudio.............................................................................................................................................................7
4.3 BQ76922 bqz File Installation............................................................................................................................................ 7
4.4 BQStudio Operation and Registers View........................................................................................................................... 7
4.5 Commands.........................................................................................................................................................................9
4.6 Data Memory......................................................................................................................................................................9
4.7 Calibration........................................................................................................................................................................ 11
4.8 Command Sequences......................................................................................................................................................12
5 BQ76922EVM Circuit Module Use....................................................................................................................................... 14
5.1 Cell Simulator...................................................................................................................................................................14
5.2 Evaluating with Load Current........................................................................................................................................... 14
5.3 Evaluating Charge and Discharge Currents.....................................................................................................................14
5.4 Evaluating with Simulated Current................................................................................................................................... 15
5.5 Reducing the Cell Count.................................................................................................................................................. 15
5.6 Connecting Cells.............................................................................................................................................................. 16
5.7 Connecting to a Host........................................................................................................................................................17
5.8 Hardware Configuration................................................................................................................................................... 18
5.9 Configuration Register Programming...............................................................................................................................18
6 BQ76922EVM Circuit Module Physical Construction........................................................................................................20
6.1 Board Layout....................................................................................................................................................................20
6.2 Bill of Materials.................................................................................................................................................................25
6.3 REACH Compliance.........................................................................................................................................................28
6.4 Schematic........................................................................................................................................................................ 29
7 Related Documents from Texas Instruments.....................................................................................................................32
8 Revision History................................................................................................................................................................... 32
List of Figures
Figure 2-1. EVM Connection for Basic Operation........................................................................................................................5
Figure 3-1. EVM Connection with External EV2400.................................................................................................................... 6
Figure 4-1. Target Selection Wizard............................................................................................................................................ 8
Figure 4-2. BQStudio Window without Device.............................................................................................................................8
Figure 4-3. Register View with Device......................................................................................................................................... 9
Figure 4-4. Tool Selections.......................................................................................................................................................... 9
Figure 4-5. Data Memory View.................................................................................................................................................. 10
Figure 4-6. Data Memory Bit Field Change............................................................................................................................... 10
Figure 4-7. Program OTP Pane with Success Display.............................................................................................................. 11
Figure 4-8. Calibration View.......................................................................................................................................................12
Figure 4-9. Example Voltage Calibration Success.....................................................................................................................12
Figure 4-10. Example Current Calibration Failure..................................................................................................................... 12
Figure 4-11. Command Sequence View.................................................................................................................................... 13
Figure 5-1. Evaluating with Load Current.................................................................................................................................. 14
Figure 5-2. Evaluating with Charge or Discharge Current......................................................................................................... 15
Figure 5-3. Simulating Current Setup........................................................................................................................................ 15
Figure 5-4. Example 3-Cell Simple Evaluation Configuration....................................................................................................16
Figure 5-5. Example Connection with 4 Cells............................................................................................................................17
Figure 5-6. Host Connection Concept....................................................................................................................................... 18
Figure 6-1. Top Silk Screen....................................................................................................................................................... 20
Figure 6-2. Top Assembly.......................................................................................................................................................... 21
Figure 6-3. Top Layer.................................................................................................................................................................21
Figure 6-4. Layer 2.................................................................................................................................................................... 22
Figure 6-5. Layer 3.................................................................................................................................................................... 22
Figure 6-6. Bottom Layer........................................................................................................................................................... 23
Figure 6-7. Bottom Silk Screen..................................................................................................................................................23
Figure 6-8. Bottom Assembly.................................................................................................................................................... 24
Figure 6-9. Schematic Diagram Monitor.................................................................................................................................... 29
Figure 6-10. Schematic Diagram FETs......................................................................................................................................30
Figure 6-11. Schematic Diagram Interface Adapter...................................................................................................................31
List of Tables
Table 1-1. Ordering Information................................................................................................................................................... 3
Table 1-2. Performance Specification Summary..........................................................................................................................3
Table 5-1. Reducing Cell Count................................................................................................................................................. 16
Table 6-1. BQ76922 Circuit Module Bill of Materials................................................................................................................. 25
Table 6-2. REACH Components................................................................................................................................................ 28
Trademarks
Microsoft® and Windows® are registered trademarks of Microsoft Corporation.
All trademarks are the property of their respective owners.
1 Features
• Complete evaluation system for the BQ76922 3-cell to 5-cell Li-Ion and Phosphate battery monitor
• Populated circuit module for 5-cell configuration for quick setup
• Power connections available on test points
• Communication available with included USB interface adapter or available on 4-pin connector
• Resistor cell simulator for quick setup with only a power supply
• PC software available for configuration
1.1 Kit Contents
• BQ76922 circuit module
• USB cable
1.2 Ordering Information
For complete ordering information, refer to the product folder at www.ti.com.
Table 1-1. Ordering Information
EVM Part Number Chemistry Configuration Capacity
BQ76922EVM Li-Ion 5 cells Any
Note
Although capacity is shown as Any, practical limits of the physical construction of the module typically
limits the operation of the EVM to a 1P or 2P battery construction. Refer to the physical construction
section for board details.
CAUTION
The default settings of the BQ76922 do not limit performance to the ratings of the EVM. Set all
protections appropriately and limit current for safe operation.
CAUTION
The circuit module has signal traces, components, and component leads on the top and bottom of
the board. This may result in exposed voltages, hot surfaces or sharp edges. Do not reach under the
board during operation. Do not leave the EVM powered when unattended.
CAUTION
The circuit module may be damaged by over temperature. To avoid damage, monitor the
temperature during evaluation and provide cooling, as needed, for your system environment.
CAUTION
Some power supplies can be damaged by application of external voltages. If using more than
1 power supply, check your equipment requirements and use blocking diodes or other isolation
techniques, as needed, to prevent damage to your equipment.
CAUTION
The communication interface is not isolated on the EVM. Be sure no ground potential exists between
the computer and the EVM. Also be aware that the computer is referenced to the PACK- potential of
the EVM.
CAUTION
Connections for rated current must be made at the terminal block. Test points are not rated for the
board current.
DC Power Supply
+ -
Install cell
simulator shunts
Position shunts
to “INT”
3 Interface Adapter
The BQStudio software uses either the on-board USB interface adapter or separate EV2400 interface board to
provide communication with the EVM board from the computer. The on-board interface identifies as an EV2400.
The EV2400 uses operating system drivers and no separate installation is required.
When connecting an external EV2400 change the J7 jumpers on the board from the INT to the EXT position.
Since the external EV2400 provides pull ups, do not install shunts at the PU positions. Figure 3-1 shows an
example of the EVM connected with an external EV2400.
EV2400
I2C
DC Power Supply
Install cell
+ - simulator shunts
EV2400 versions 0.28 and newer are compatible with the on-board interface. The latest version is
recommended. If updates are available for the on-board interface adapter, they are available from the EV2400
tool folder on the web, www.ti.com/tool/EV2400. Do not install the EV2400 firmware version 0.18 in the on-board
adapter.
The BQ76922 devices are not supported with the older EV2300 interface.
CAUTION
Do not program the on-board adapter with version 0.18 or earlier firmware.
If the software was started without a communication interface adapter, a Battery Management Studio popup
window indicates a free adapter is not available. Acknowledge the message to proceed. Errors appear in the left
bottom border of the Battery Management Studio screen. Correct the problem with the adapter and restart the
software.
BQStudio contains a user guide for general operation of the software. Refer to the menu selection Help | Help
Contents for information.
The BQStudio window appears as shown in Figure 4-2. The register area is blank since the device is not
attached.
The center pane of BQStudio displays tool tips when the cursor is held over an item name. The tool tip provides
some description of the item. The tool tip closes after approximately 30 seconds. To avoid the tool tip display
move the cursor to the value or units column, or to the Dashboard pane.
Without a device, BQStudio operates with reduced functions. Tools can be browsed and data fields inspected,
but data can not be entered.
On the left side of the window is the dashboard which shows the adapter, device and simple voltage and current
displays. The dashboard updates periodically unless Auto Refresh is stopped by clicking on the banner. The
right side of the window has the commands pane.
The center panel of the window initially shows the register tab. The register display shows device status registers
and is read once when the device is detected. To update the register values select the Refresh button at the
top of the Registers tab. To repeatedly read the registers select the Scan button. To repeatedly read and log
the register values to a file select the Start Log button and follow the prompts to save a log file. When a log is
running, select Stop Log to end the log and close the file. The Parameter View selection allows the choice of
basic parameters which shows commonly used registers, or all parameters which shows more registers.
If a device is connected and powered after BQStudio is powered, dashboard may auto detect the device and
update the device and register display. Figure 4-3 shows a register display with a connected device.
The available tools for the device are shown at the top of the window and may be selected by clicking on the tool
icon. Tools may also be selected from the View menu as shown in Figure 4-4. Opening a new tool may change
the center tab of the window. These tools are described in following sections. Not all devices have all the tools
described. Multiple tools can be active at one time, tools which use the center pane for display are shown as a
tabs at the top of the center section. These tabs can be closed with the X as desired, but closing the tab may
terminate the operation running in the tab.
4.5 Commands
The Commands tab is displayed on the right side of the BQStudio window. Buttons allow reading various
information about the device and certain operations. Commands and returned data are shown in the Log Panel
of the tab. The seal function is unusual in general evaluation and is not recommended during initial evaluation.
CAUTION
Sealing the device without remembering the key reduces the function of the EVM.
Configuration can be entered in the volatile registers using the Data Memory tool. The Data Memory tool
displays as a tab in the center pane of the BQStudio window. Figure 4-5 shows the initial data memory view
with a device connected. Configuration settings are grouped into different functions accessed with buttons on the
left side of the pane. The Calibration section is displayed on initial selection. Other functional sections can be
displayed by clicking on the named button.
Changes to configuration by memory changes take place immediately, however the FETs are enabled using the
Enable_FETs command. Enabling a protection and enabling the protection action on a FET are not sufficient,
the FETs must be enabled with the command. BQStudio will enter and exit configuration update mode of the
part automatically when data memory is edited. If FETs were on when config update mode was entered they will
be turned off during the write and turned on after exit. Exiting config will clear some command settings such as
SLEEP_DISABLE, check settings after configuration changes.
Calibration data is also located in data memory. Calibration values may be loaded manually or calculated by a
tool.
The data is read from the part when the Data Memory view is opened, but the window does not know when
the power may have been cycled so that the data is not current. Data may be read using the Read All tool
at the top of the pane. The Export tool in the Data Memory view allows saving the configuration data to a
comma-separated-value file format which can be accessed by a spreadsheet program. Reading data before
export with the Read All button loads the data from the part rather than values which may be only in the view.
Export also has an option to export a Flash Stream format file which can be written to another part by the
Command Sequence tool. The FS file can be saved with OTP programming command included. The Import tool
allows loading a saved file into the view so that it can be written to the device. The Write All tool writes all values
in the view into registers in the device. The gg.csv files should not be edited with a spreadsheet program since
those may add characters causing the import to fail.
4.6.2 OTP Programming
CAUTION
OTP programming is a permanent change to the device. Be sure all configuration and calibration
are set before programming settings into the device. Casual programming may leave the board
inoperable. Writes to OTP are not incremental, all OTP is written at the same time.
Once the configuration and calibration has been determined and loaded in the registers, it may be programmed
to the BQ76922 OTP memory using the Program OTP button at the top of the pane. Note that this is a
permanent programming and is not reversible. There are 2 writes possible, if the device has been programmed
once, a second memory is available. Additional memories are not available. OTP memory is programmed using
the OTP memory view. Programming typically takes about 40 s. To program the OTP memory:
1. OTP write requires 12V at the board stack and room temperature. Calibrate the device if needed.
2. Be sure the desired settings are written to the data memory.
3. Select the Program OTP tool at the top of the Data Memory window. This opens a Program OTP pane.
4. Adjust the board voltage to 12.0 +/- 0.1 V for programming.
5. Select the Check OTP Programming Possible button. If not successful make the recommended adjustments
if possible. If successful, the display is similar to Figure 4-7.
6. Select the Program Data Memory to OTP Memory button. If successful, the display is similar to the check.
7. Adjust the board voltage back to normal operating conditions, cycle power, and test as desired.
4.7 Calibration
The calibration tool may not be available for all versions of devices. When the calibration tool is not available
calibration of the device can be performed by entering values in the calibration section of the data memory.
The calibration writes to the volatile registers in the device which are available in the Data Memory view. When
calibration values are complete they can be written to the OTP with other configuration settings. Calibration
cannot be written to OTP separately from configuration settings.
The EVM and all new boards should be calibrated before operation. The calibration view is shown in Figure 4-8.
Temperature is typically calibrated first. Board Offset should be calibrated with no current flow and should be
calibrated before Current Gain. The EVM uses a 1-mΩ sense resistor and calibration at low current results in
some granularity from the current resolution. This may result in an apparent error at higher currents. Calibration
at higher currents reduces this effect and should be done where it is important.
Voltages and temperatures may be calibrated individually or as a group. All values entered are calibrated. If
individual values are to be calibrated, leave all the other entries blank. As an example, measure the battery
voltage, calculate the average cell value and enter the value in the box. Clicking the Calibrate Voltage button
runs the calibration. Values left blank or entered as '0' are not calibrated. When successful, a green check
appears next to the button as shown in Figure 4-9. If there is an error, a red X appears instead as shown in
Figure 4-10 with a message in the bottom border.
When calibrating the EVM voltage, remember the EVM uses 1% values for the cell simulator resistors.
Measuring each cell voltage value is recommended rather than using a common value if individual cell voltage
calibration is desired.
DC Power Supply
+ -
Install cell
simulator shunts
Position shunts
to “INT”
+ -
+ -
Install cell
simulator shunts
Position shunts
to “INT”
DC Power Supply
(Simulated load) + -
DC Power Supply
+ -
Install cell
simulator shunts
Position shunts
to “INT”
shorting unused cells at the input terminal block. Follow the recommendations in the datasheet for which cells
to short. This works for both operation with the cell simulator and cells, but can have some side effects in
transient tests because it parallels the shorted resistors to the cell IC where the capacitor provides a signal path
to the used input. See Figure 5-4 for an example of simple reduced cell configuration for 3 cells. For the best
evaluation with reduced cells in a transient environment, short the VCx pins at the capacitor and remove the
unused input resistor. When using the cell simulator, shorting the unused cell at the terminal block is still required
to eliminate the simulated cell voltage. Shorting the cell inputs at the terminal block screw terminals is suggested
since it should be apparent if the board is re-used for a different cell count. Table 5-1 shows configuration
recommendations for reduced cell count.
Table 5-1. Reducing Cell Count
Unused Cell
Short Cell Input Input Resistor To Replace Capacitor
(Numbered from Bottom IC Inputs Shorted
Terminals Remove With 0 Ω
Cell 1)
Cell 4 CELL4 to CELL3 R4 C5 VC4 to VC3
Cell 3 CELL3 to CELL2 R5 C7 VC3 to VC2
DC Power Supply
Short
+ - CELL4 to CELL3
and
CELL3 to CELL2
Install cell
simulator shunts
When reducing the cell count with the top cell used, the resulting configuration of the BQ7718 secondary
protector does not match its data sheet configuration. While the circuit typicaly function on the EVM, when
implementing a design the configuration of the data sheet is recommended.
After changing the physical connection the Vcell Mode must be changed in Data Memory Settings for proper
operation. The default setting of 0x0000 selects all cells and will be the same as 0x001F. For 3 cells as shown
above set the Vcell Mode to 0x0013.
5.6 Connecting Cells
The EVM is constructed with a single connection to the top and bottom of the cell stack. Cell voltage for these
cells is sensed on the board.
While the EVM has a place to mount an activated fuse, the pattern is shorted to allow easy evaluation without
the concern of activating the fuse. When connecting cells use a fuse in the current path and any other signal
path appropriate for your application.
The cell simulator provides resistors between the cell inputs. When the cell simulator shunts are installed, these
resistors load the cells, and divide the voltage to any unconnected inputs as cells are connected. If desired,
the cell simulator shunts can be installed during cell connection and removed after cell connection. The shunts
must be removed after connection of cells, or the cells are discharged by the constant drain of the cell simulator
resistors.
BAT- is the reference voltage for the IC and should be connected first. After BAT- cells may be connected in any
order. Cell connection from the bottom up minimizes the voltage step size applied to the board. Recommended
connection sequence for the EVM when connecting cells is bottom up:
1. Connect BAT–
2. Connect cells bottom up; CELL1, CELL2, CELL3 ...
Remove cell
simulator shunts
to avoid draining
cells
CAUTION
Do not connect the MCU board to both the J2 GND and J5 PACK- terminals, this shorts the sense
resistor and could result in damage to equipment or unexpected results.
MCU
Evaluaon Board
SDA
SCL
DC Power Supply
+ -
Install cell
simulator shunts
CAUTION
Multi-function pins must be connected to compatible signal levels before programming registers to
avoid device damage.
The J16 cell simulator header and J7 I2C configuration are discussed with board connection diagrams.
J4 selects the connection of the DFETOFF and CFETOFF pins. Pins may be pulled low, high to REG1 or
brought to a terminal block for external connection.
J3 selects the connection of TS2. It may be taken to a terminal block for connection of an external wake or
thermistor. It may also be pulled to VSS. The 10k R22 simulates a nominal temperature.
J6 selects the connection of ALERT. It may be connected to a terminal block for external connection, to the
on-board interface for HDQ, or pulled up to REG1 or down to VSS.
5.8.2 Unused Components
The EVM contains a number of component patterns which may be useful for evaluation. Unpopulated headers
at the MCU may provide future signal access. Parallel FET configuration is possible by changing the component
population in the FET area. See the FET schematic page Figure 6-10.
5.9 Configuration Register Programming
Configuration register programming should be done once hardware configuration is set with jumpers.
Configuration registers are set in the Data Memory screen and are different from the status registers displayed
in the Registers screen. See the BQ76922 data sheet and supporting documentation for register information.
When a configuration file is available it may be imported to set all operational selections at once. However,
a configuration file loaded with Data Memory Import can load as little as 1 parameter, so the user should be
familiar with the contents of imported files. With a new device or after loading a configuration file, individual
register changes may be made. Configuration register programming typically involves the following general
principles selected in various register names:
1. Selection of the function for multi-function pins
2. Selection of the protection features to be enabled
3. Selection of the protection thresholds for the enabled features
4. Setting the FET control options
5. Exporting (saving) the configuration register file for future use
When no additional changes are anticipated to the configuration and extended validation is planned, the user
may write the configuration to OTP. OTP is written using the Program OTP button on the Data memory window
of BQStudio. Once programmed the device loads the register values from OTP after reset. Additional register
changes may be made, but the user should realize the part features have been permanently changed. OTP
settings may be incompatible with additional hardware configuration changes and could result in damage. The
user should check settings or replace the IC or EVM as required.
CAUTION
Hardware changes after OTP programming may result in damage to the IC or board after reset if
incompatible configuration is selected.
C19, C24, C25, C26, C27, C28, C29, 12 0.1uF CAP, CERM, 0.1 uF, 50 V, +/- 10%, X7R, 0603 0603 885012206095 Wurth Elektronik
C30, C31, C32, C33, C34
C11 1 0.022uF CAP, CERM, 0.022 uF, 16 V, +/- 10%, X7R, 0603 0603 C0603C223K4RACTU Kemet
C12 1 0.01uF CAP, CERM, 0.01 uF, 16 V, +/- 10%, X7R, 0603 0603 885012206040 Wurth Elektronik
C16 1 1uF CAP, CERM, 1 uF, 16 V, +/- 10%, X7R, 0805 0805 EMK212B7105KG-T Taiyo Yuden
C18 1 2.2uF CAP, CERM, 2.2 uF, 16 V, +/- 10%, X7R, 0805 0805 EMK212B7225KG-T Taiyo Yuden
C35, C37, C40, C41, C43 5 0.1uF CAP, CERM, 0.1 uF, 16 V, +/- 10%, X7R, 0402 0402 885012205037 Wurth Elektronik
C36, C42, C44 3 0.47uF CAP, CERM, 0.47 uF, 6.3 V, +/- 10%, X5R, 0402 0402 04026D474KAT2A AVX
C38, C39 2 10uF CAP, CERM, 10 µF, 16 V,+/- 10%, X5R, 0805 0805 CL21A106KOQNNNG Samsung Electro-Mechanics
C45 1 2200pF CAP, CERM, 2200 pF, 10 V, +/- 10%, X7R, 0402 0402 885012205008 Wurth Elektronik
D1, D2, D7 3 40V Diode, Schottky, 40 V, 0.2 A, SOT-323 SOT-323 BAS40W-7-F Diodes Inc.
D3 1 Red LED, Red, SMD LED_0603 150060RS75000 Wurth Elektronik
D4, D5, D6 3 16V Diode, Zener, 16 V, 500 mW, SOD-123 SOD-123 MMSZ5246B-7-F Diodes Inc.
D8 1 100V Diode, Ultrafast, 100 V, 0.15 A, SOD-123 SOD-123 1N4148W-7-F Diodes Inc.
D9 1 100V Diode, Schottky, 100 V, 0.15 A, SOD-123 SOD-123 BAT46W-7-F Diodes Inc.
D13, D14, D15 3 Green LED, Green, SMD LED_0603 150060VS75000 Wurth Elektronik
H1, H2, H3, H4 4 Bumpon, Hemisphere, 0.44 X 0.20, Clear Transparent Bumpon SJ-5303 (CLEAR) 3M
J1 1 TERM BLOCK 3.5MM VERT 6POS PCB HDR6 OSTTE060161 On Shore Technology
J2 1 Terminal Block, 3.5mm, 8-Pos, TH Terminal Block, 3.5mm, 8-Pos, ED555/8DS On-Shore Technology
TH
J4 1 Header, 100mil, 6x2, Tin, TH Header, 6x2, 100mil, Tin PEC06DAAN Sullins Connector Solutions
J3 1 Header, 2.54mm, 3x1, Gold, SMT Header, 2.54mm, 3x1, SMT 87898-0304 Molex
J5 1 Header (friction lock), 100mil, 4x1, R/A, TH 4x1 R/A Header 22/05/3041 Molex
J7, J16 2 Header, 100mil, 5x2, Tin, TH Header, 5x2, 100mil, Tin PEC05DAAN Sullins Connector Solutions
J6 1 Header, 100mil, 4x2, Tin, TH Header, 4x2, 100mil, Tin PEC04DAAN Sullins Connector Solutions
J9 1 TERM BLOCK 3.5MM VERT 4POS PCB HDR4 OSTTE040161 On Shore Technology
J12 1 Receptacle, Micro-USB Type B, 0.65 mm, 5x1, R/A, Bottom Receptacle, 0.65mm, 5x1, 47346-1001 Molex
Mount SMT R/A, SMT
J13 1 Header, 2.54 mm, 2x1, Gold, TH Header, 2.54mm, 2x1, TH 61300211121 Wurth Elektronik
J15 1 Header, 2.54mm, 4x1, Tin, TH Header, 2.54mm, 4x1, TH 22284043 Molex
6.4 Schematic
Figure 6-9 through Figure 6-11 illustrate the schematics.
Input
22V 10A
TP1
BAT+
1 5P
5P 5P
2 4P
4P
3 3P
3P
4 2P
2P
5 1P
1P
TP2 TP3
6 D1 C1
R1 BAT CP1
CD
100
J1 C2 C3 0.47uF
40V 100pF 1uF U1
TP4
BAT- D2
1 32
BAT CP1
VSS VSS 40V
CHG 31 CHG
R2 CHG
VC5 2 VC5
20.0 VC4 3 VC4A DSG 30 DSG
C4 DSG R3
4 VC4B
R4 0.22uF 5 29 PACK 200
VC3A PACK PACK
20.0 VC3 6 VC3B
C5 VC2 7 28 LD
R5 VC2 LD LD
0.22uF VC1 8 C6
VC1
20.0 VC0 9 27 PCHG 1uF
VC0 PCHG PCHG
C7
2,4
TP5 Q1
R6 0.22uF SRP 11 26 PDSG J2
SRP PDSG PDSG BCX5616TA
20.0 1 VSS EXTTS2 1
C8 TS2
FUSE 25 FUSE EALERT 2
R7 0.22uF FUSE ALERT
SRN 12 SRN
EDFETOFF 3
DFETOFF
3
20.0 BREG 24 BREG TP6 ECFETOFF 4
CFETOFF
TS1 13 TS1
RST_SHUT 5
R8 R9 RST-SHUT
TS2 14 TS2 REGIN 23 REGIN EREGIN 6
REGIN
20.0 0 7
REG1
REG1 8
C9 C10 VSS
ALERT 16 ALERT RST_SHUT 21
0.22uF 0.22uF SRP SRN TS1 TS2
SCL 17 SCL
TP7 SDA 18 SDA DFETOFF 20 DFETOFF VSS
TP8 TP9 TP10 REG1 RESET
VSS 22 19 CFETOFF R10 TP11
REG1 CFETOFF
10M S1 REG1
TP12 15 REG18 1 4
33 2 3
PAD
VSS 10
C11 VSS R11 R12 R13
BQ76922RSNT 10k 10k 10k C12
EXTTS2 0.022uF
C13 REG18 0.01uF
J3
1 VSS J4 VSS VSS
C14 100pF C15 2 C16 C17 C18 1 2
0.1uF C19 0.1uF 3 3 4
NT1 1uF 0.01uF 2.2uF 5 6
BAT-
TP13 TP14 7 8
VSS 0.1uF VSS 9 10
4
3
WAKE REG1
10k 1 2 EALERT 3
R23 100 SDA2 SDA
3 4 HDQ 2
HDQ SCL
TP19 5 6 1
100 PACK-
9
7
5
3
1
GND 7 8
J7
TP20 R24
BAT- 100k
1
R25 VSS
E1 E2
10
8
6
4
2
0.001 PGND U2 U3
SCL2
VSS
2
PGND
4
SFK-3030 C24 C25 0.1uF
TP24
R28 0.1uF 0.1uF
Q4 Q5 PGND
100 U4 R29 R30
D3 1.0k
1 8 Red R32 R31
VDD OUT
10M 10M
R33 2
FUSE Q6
V5 R34 PDgate
1.0k C26 C27 7,8 1,2,3
3 V4 0
R35 0.1uF 0.1uF 1 5,6,
4P
4 V3 J9
1.0k Q7 Q8
4
C28 R36 TP25
R37 0.1uF 5 7 3.9k PACK+
3P V2 VSS 1,2,3 7,8 7,8 1,2,3 4 PACK+
1.0k C29 6 9 R38 5,6, 5,6, R39 R40 C30
R41 V1 PAD PACK+
0.1uF D4 10M PCgate 10M D5 10M D6 0.1uF 3
2P
4
16V
1.0k C31 16V 16V PACK-
BQ771807DPJR Cgate 2
R42 0.1uF C32
1P R43 Q9 0.1uF 1 PACK-
1.0k R44
C33 R45 51 0 R46
0.1uF 5.1k Output
10k 22V 10A max
TP26 TP27 TP28 TP29
E4
VSS
TP30 Dgate
D7
Q10 R47 R48 R49 R50 R51
5.1k 5.1k 5.1k 10k 1.0k
D8
40V PCHG PDSG 100V
R52 C34 TP31 TP32 TP33 TP34 PGND
20k 0.1uF
PGND
D9 PACK LD
100V TP35 TP36
CHG PCHG CD PDSG
R54 R53
5.1k 10k TP37
1 D3 and R35 are not required in design, but used to simulate fuse blown condition. VSS
R55
PACK
DSG 10k
FUSE
R56 PGND
LD
10k
VSS
SCL2
U5
J10
SDA2
1 21
P1.0/TA0CLK/ACLK P2.0/TA1.1
29 HDQ
HDQ
2 22 30
P1.1/TA0.0 P2.1/TA1.2
3 23 31
P1.2/TA0.1 P2.2/TA2CLK/SMCLK
4 24 32
P1.3/TA0.2 P2.3/TA2.0
5 25 P1.4/TA0.3 P2.4/TA2.1 33
6 26 P1.5/TA0.4 P2.5/TA2.2 34
7 27 P1.6/TA1CLK/CBOUT P2.6/RTCCLK/DMAE0 35
28 P1.7/TA1.0 P2.7/UCB0STE/UCA0CLK 36
2
5 U6 U7 J13 J14 8
GND P7.3/CB11/A15
1 1 57 72
P7.4/TB0.2 P7.4/TB0.2 PJ.0/TDO
2 2 58 73
P7.5/TB0.3 P7.5/TB0.3 PJ.1/TDI/TCLK
VUSB QGND 3 59 P7.6/TB0.4 PJ.2/TMS 74
P7.6/TB0.4
11
9
7
4 60 75
P7.7/TB0CLK/MCLK P7.7/TB0CLK/MCLK PJ.3/TCK
2
R70
3.3V 200
J15 R71
1
2
10k RST J16
3 TEST 1 2 R72
NT5 5P 200
4 3 4
4P
5 6
Net-Tie 3P
1 2 PGND 7 8
2P
QGND 9 10
1P R73
MP1S3 MP2
1
200
MP3 MP4
U9 U10
BAT-
QGND
8 Revision History
NOTE: Page numbers for previous revisions may differ from page numbers in the current version.
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