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com

!41L-R-39008C

?&&w%nP”
MIL-R-39008B
14 June 1973

MILITARY SPECIFICATION

RESISTORS, FIXED, COMPOSITION (IWSULATEO),

ESTA8LISHE0 RELIABILITY
GENERAL SPECIFICATION FOR

This speclflcatfon is approved for use by all Depitrt-

●ents ●nd Agencies of the Department of Oefense.

1. SCOPE

1.1 Scope. This specification comers the general requirements for established
reljabfllty, insulated, ffxed resfstors having a coapositton resistance element
consisting of a mixture of carbon, insulating material, and suitable binders,
●ither molded together or applied as a thin layer of conducting material on an
insulating form. Resistors covered by this specification have failure rates
ran ing from 1.0 to 0.001 percent per 1,000 hours (see 1.2.1.5) at 50 percent
ful?-load operatlnm ●t .. t.bi.fit temperature of 70 C (see table 1). These
faflure ‘iates ●re established at ● 60 percent confidence level “on the bbsis of
Iffe tests. The faflure rate, identified by the appropriate symbol, is referred
to operation at rated temperatareand ●t ● voltage ●quivalent -to-SO percent of
rated watta e (with m permissible resistance change of ●15’perCent). A-p4rt per
● illion {PP i ) qualfty system is used for documenting ●nd reportfng the Bverage
outgoing quallty of resistors supplfed to thfs specfffcatlon. Statfstlcal
process control (SPC) techniques are required in the ●anufacturing process to
minimize variation in production of resistors supplied to this specification.

1.2 Classlficatfon.

1.2.1 part or Identifying Number ’[PIN). The Part or Identifying Number is fn

the following form. and as specified [see 3.1. 6.1. and 6.12):

i i i i i
St l%aracteristfc resistance Resistance 7 il t
(see 112~1.1) (see 1.2.1.2) “(see 1.2.1.3) tolerance = (~ee”1~2~i.~)
(see 1.2.1.4)

I r
lBeneficial comments (recommendations, addftfons, deletions) and any I
lpertfnent data which may be of use in improving thfs document should be
Iaddressed to: IJS Army Laboratory Command ATTN: SLCET-R-S, Fort Monmouth, NJ i
.107703-S000 by using the self-addressed Standardization Document Improvement I
I(OO Form 1426) appearing at the end of thfs document or by letter. ~
I

AMSC N/A FSC 5905

DISTRIBUTION STATEMENT A. Approved for public release; distribution fs unlimited.
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MIL-R-39008C

TABLE I. Characteristic.

I I I r
I lMaximum ambient I Resistance temperature characteristic I
I Ioperating tempera- I I
lSymbollture (100 percent In aximum all owabl h 1
1 Irated wattage and I Ireslstance from ~e~t~!~;c~natl
150 percent rated [ Nomfnal resistance Iambfent temperature of 25 C I
i Iwattage for I
I Ifaflure rate At -55*C i At +105”C
I Ideternlnatfon. ) / I I i

I “c I Ohms I Percent (+) I Percent (+) /

I / 11,000 ?i7W_under 1~1
I1,1OO to 10,000 Incl.1 10:0 i
! 1 111,000 to 0.1 megohm I 13.0 I 7:5 :
Ilncl i I
/ / I I I I
fG 70 I 1
I i 10.11%% tncl I 15.0 I 10.0
11.1 to 10 Incl i 20.0 15.0
/ ; 111.0 and over I 25.o ! 15.0 /
I I I 1 I I

1.2.1.1 Style. The style Is Identfffed by the three-letter symbol “RCR”

followed by a two-dlglt numbar; the letters Identffy established rellabflfty,
insulated, composftlon, fixed resfstors, and the number ldentfffes the sfze ●nd
power r~tlng of the resistors.

1.2.1.2 Characterfstfc. The characteristic fs identified by ● sfngle, lttter

In ●ccordance wfth tabl ● I.
1.2.1.3 Reslstenct. The nominal resistance value expressed fn ohms fs
identified by hree-iflgft number; the ffrst two dlgfts represent sfgnfffcant
ffgures ●nd the last Qfgft specfffes the number of zeros to follow. When
resistance values less than 10 ohms are requfred, the letter “R” fs substituted
for one of the sfgnfffcant dfgfts to represent the decfmal pofnt. When the
letter “R” fs used, succeeding digfts of the group represent figures as shown {n
the following example:

2R7 = 2.7 ohms

Mfnlmum and maxtmum resistance values shall be as specfffed (see 3.1). The
standerd values for ●very decade shall follow the sequence demonstrated fQr the
‘1O to 100” decade fn ●ccordance ufth MS90178.

1.2.1.4 Resistance tolerance. The resistance tolerance Is Identlfled by a

sfngle letter in accordance wfth table II.

TABLE 11. Resistance tolercnce.

i Symbol ; Resistance tolerance I

I i Percent (*) i
IJ I
]K I 1: I
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MIL-R-39008C

1.2.1.5 Failure rate designation. The failure rate designation as shown in

table 111 is signified by a single letter (M, P, R, S), which identifies the
failure rate level for which the resfstor is qualified (see 4.4).

TABLE III. Faflure rate level (at 50 percent rated wattage).

1 I f-
1 Failure-rate level I Failure rate I
I designation 1 percent/1,000 hours I

I . . . . . . . . . . . I 1.0 I
I ! .. ........~
● 0.1 I
. .........
● 0.01 I
i ! . . . . . . . . ...! 0.001 i

2. APPLICABLE DOCUMENTS

2.1 Government documents.

2.1.1 Speciffc&tfons, standards, and handbooks. The followlng specfffcations,

standards, ●nd h db k f t of thi document to the extent specified
herein. Unless ~~he%l~e ~~sc?f!~~, the is~ues of these documents are those
lfsted In the fssue of the Department of Defense Index of Specfficatlons and
Standards (DODISS) and supplement thereto, cited fn the solicitation (see 6.1).

SPECIFICATION

NILITARY
\
HIL.R.39008/l Resfstors. Fixed, Composition Insulated),
Established Reliability, Style RCR07 .
UIL-R-39008/2 . Resfstors. Ffxed. Composition Insulated).
Establfsh8d Rell~bflity, Style-RCR20. ‘-
MIL-R-39008/3 ‘Resistors, Ffxed, Composition (Insulated),
Established Relfabflity, Style RCR32.
MIL-R-39008/4 Resistors, Ffxed Composition (Insulated),
Established Relfabflfty, Style RCR05.
M!L-R-39008/5 Resistors, Fixed, Composition (Insulated),
Established Reliability. Style RCR42.
MIL-R-39032 Resistors, Packaging of.

STANOARDS

MILITARY

MIL-STD-202 . Test Methods for Electronic ●nd Electrical

Component Parts.
MIL-STD-690 . Faflure rate Sampling Plans and Procedures.
MIL-STD-790 . Relfabilfty Assurance Program for Electronic Parts
$pecfffcations.
MIL-STD-81O - Environmental Test Methods and Engfneerfng
Gufdelfnes.
MIL-STD-1276 . Leads for Electronic Component Parts.
MIL-STO-1285 Marking of Electrical and Electronic Parts.
MS90178 . Standard 24 Value Series Oecade for Electronic
Components of S-, 10-, and 20-Percent Tolerances.

(Unless otherwfse indfcated, copies of federal ●nd ●flftary specfffcations,

standards, and handbooks are avaflable from the Standardization Documents Order
Desk. Bufldfng 4D, 700 Robbins Avenue, Philadelphia, PA 19111-5094).

3
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NIL-R-39008C

2.2 Non.Government publications. The followfng documents form a part of thfs

documen% to ttl ● extent speclffed herein. Unless otherwise speclflerl, the Issues
of the documents which are DOD adopted are those listed In the issue of the
DODISS cited In the solicitation. Unless otherwise specffled, the Issues of
documents not lfsted In the DODISS are the issues of the documents cited in the
solicitation (see 6.1).

ELECTRONIC INDUSTRIES ASSOCIATION (EIA]

EIA-554 Assessment of Outgotng Nonconforming Levels In Part

Per Mllllon (PPM) (DOD Adopted).
EIA-557 Statistical Process Control Systems (DOD Adopted).
(ApplfCatfOn fOr COpleS should be ●ddressed to the Electronic Industries
Association, 2001 Eye Street, Washington DC 20006.)

(Non-Government standards and other publications are normally ●vaflable from

Organfzatlons that prepare or d~strfbute the documents. These documents also may
be available fn or through librarfes or other informational services.

2.3 Order of prece~ence. In the ●vent of a conflict between the text of this
document and the references cited herein (except for related associated detafl
specfficatlons, specification sheets, or MS standards), the text of this document
takes precedence. Nothfng fn this document, however, supersedes applicable laws
and regulations unless a specfffc exemptfon has been obtained.

3. REQUIREMENTS

3.1 Associated detafl speclflcatlons. The Indfvfdual ftem requirements shall

be as specfffed herein and In accordance wfth the ●pplicable ●ssociated detafl
speclffcatfon. In the event of ●ny confllct between the requirements of thfs
specfffcatlon and the associated detafl specfffcatfon, the latter shall govern.

3.2 Qualification. Resfstors furnfshed under thfs speclffcatfon shall be

products wnlca ●re ●uthorized by the qualifying ●ctfvity for lfstfng on the
applicable qualffled products list ●t the time of award of contract (see 4.4 ●nd
6.2). In additfon, the manufacturer shall obtafn certification from the
qualifying activ?ty that the reliability assurance requirements of 4.1.2 have
been met and are befng maintained. Authorized distributors that ●re approved to
MIL-STO-790 distributor requirements by the qualfffed products lfst (QPL)
■anufacturer are listed in the QPL.

3.3 Relfabflfty and quallty.

The relfabflfty of resistors furnfshed under thfs

s~~;;;ca%%+i%e established ●nd ●afntal.ed fn accordance with the
rkqulrement~ ●nd proc~duras $pectffed In MIL-$TD.6~ and MIL-STD-790 with details
and ●xceptions specfffed fn 4.1.2, 4.4.4, 4.6.2.1.

3.3.2 CJualfty.

3.3.2.1 Statlstlcal process control. The contractor I hall Implement and use
statistical process control techniques fn the ●anufacture< ng process for parts
covered by thfs specfflcatlon. The SPC program shall be developed and ●aintained
fn accordance wfth all the requirements of EIA-557. The SPC program shall be
documented and nafntafned as part of the overall relfabf< fty assurance program as
speciffed In HIL-STD-790. The implementation of statfst’ cal process control
shall be 12 ●onths from the date of thfs specfffcatfon. Processes for
application of SPC techniques should Include but are not lfmfted to ●oldlng
operatfon and marking.

4
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MI L- R-39008C

3.3.2.2 Quality levels. The quality of lots that have been subjected to and
passed the subgroup 1 UO percent screening inspection of the group A inspection
shall be established ~nd maintained in accordance with 4.6.1.2.2 and EIA-554.
Individual PPN defect level (I.e., PPM-2 and PPM-3) and an overall PPM defect
level (I.e., PPN-5) shall be established based on the tects prescribed in the
subgroup 2 tests af the group A Inspections. The defect level for PPM-2 shall be
less than 100 PPM. The implementation of part per ●illlon verification shall be
12 months from the date of this specification.

3.3.2.2.1 Noncompliance. The contr~ctor shall notify the qualifying activity

when the 100 1 evel is reached or exceeded for PPM-2. The contractor shall
provide sufficient information to the qualifying activfty documenting the causes
of the problea and what corrective action fs being taken. Failure to correct
this problem shall be the basts for removal of the affected product from the QPL.

3.4 Material. The ●aterial shall -be ●s specffied herefn. However, when a
defintte ●ater~el fs not specffied, a ●aterfal shall be used which wi17 enable
the resistors to ●eet the performance requirements of this speciflcetfon.
Acceptance or 8pproval of any constituent ●aterial shall not be construed as a
guarantee of the acceptance of the finfshed product.

3.5 Design and construction. The resistors shal? be of the desfgn,

construct on, and physfcal imensions specffied (see 3.1). Each resfstor shall
consist of a composition resistance element protected against exposure to
humidity and temperature conditions by an enclosure or a coatfng of
●oisture-resfstant, Insulating ●aterial.

3.5.1 Termfnals. All teralnals shall be suitably treated to facillate

soldering. ~~ .
— 3.5.1.1 Solder dfp (netlnnlag) lecds. The aanufacturer’(or hfs authorized
category C butor) ●y solder 1P (retin) the leads of prodmct suppllhd to
this speciflc~t!on provided the solder dfp process has been approved by the
qualifying ●ctlvfty.
3.5.1.2 Qualifying activity ●p proval . Approval of the solder dip process will
be based on one of the following options:

a. Uhen the origfnal lead finish qualfffed was hot solder dfp lead finish
52 of RIL-STO-1276. (NOTE: The 200 ●fcroinch ■axfmum thfckness is not
applicable. ) The manufacturer shall use the same solder dip process for
retinnlng as is used in the original Manufacture of the product.

b. When the lead originally qualffied was not hot solder dfp lead finish 52
of NIL-STO-1276 ●s prescrlbod In Itea ● , ●pproval for the process to be
used for solder dip shall be based on the following test procedure:

(1) Thirty saaples of ●ny roslstance value for etch style ●nd lead
flnfsh shall be subjected to the manufacturing’s solder dip
process. Folleufng the solder dip process, the reststors are
$ubJected to the dc ?eslstance test ●nd other group A
electrfcals). No defects ●re allowed.

(2) Ten of the 30 samples ●re then subjected to the solderabilfty

test. No defects are ●llowed.
(3) The reaIafning 20 samples are subjected to the resistance to solder
heat test followed by the moisture resistance test (NOTE: Solder
dip of gold plated leads is not allowed.)
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UIL-R-39008C

3.5.1.3 Solder dip (retInning) optfons. The manufacturer (or authorized

category C fstrib utorl may solder dip (retfn) as follows:

a. After the 100 percent group A screening tests. Following the solder dfp
(retfnning process), the ●lectrical ●easurements required In group A,
subgroup 1, 100 percent screening tests shall be repeated on 100 percent
of the lot. (NOTE: The ■anufacturer ●sy solder dlp (retfn) prior to the
100 percent electrical measurements of the group A, sub roup 1 tests.)
The percentage defective allowable (PDA) for the electr 7 cal measurements
shall be the same as for the subgroup 1 tests.

b. As a corrective action, if the lot falls the group A solderabflfty test.

c. After the grou A InspectIon has been completed. Followlng the solder
dip (retfnning ! process, the ●lectrical ●easurements required in group A,
sub9rouD 1, 100 percent screening test shall be reDeated on 100 Percent
Of ~he 10tj The- ercent defectf~e ●llowable (PDA)- for the ●lect_rfcal
measurements shal?be thesame as forthesubgroup ltests. Following
these tests, the ●anufacturer shall submft the lot to the group A
solderabflfty test as specfffed in 4.6.1.2.

Resistors shall have a power rating ●s specified (See 3.1),

b&~ 0~. nuous full-load operatfon (100-percent rated wattage) at an ambient
temperature of 70 C. This power ratfng is dependent on the ability of the
resistors to meet the applicable life requirements specfffed in 4.7.15. For
resistors operated at an ambfent temperature fn excess of 70”C, the laad shall be
derated in ●ccordance with the specffied curve (see 3.1).

3.7 Voltage ratfng. Resistors %hall have a rated direct current (de)
continuous work tng voltage or ●n ●pproximately sine-wave root-mean-square (rms)
continuous working volta~e at commerfcel-lfne frequmc
to the power rating, ●s determined fmom the followiag #J~~lfivefor~ corresponding

E=fi
Where: E - Rated dc or rms ac continuous workdng voltage ●t Commerlcal-lfne
frequency and waveform.

P . Power ratfng (see 3.1)

R - Nominal resistance (see 3.1)

In no case shall the rated ,dc or NS Continuous workfng. voltage be greater than
the applicable ■axfmum value (see 3.1 and table IV).
TABLE IV. Naxfmum continuous working voltcge.

-1 I r
I Power ratfng I Maximum continuous uorklmg :
I I voltage Idc or ms)
(
j Uetts 1: V03 ts J
I
I 0.12s0 150
I 0.2s00 I 250 ;
I 0.5000 I 350 I
1.0000 500 I
/ 2.0000 i 500 I
I I I

6
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UIL. R-39008C

3.8 DC res~ stance. Uhen resfstors are tested as specified in 4.7.2, the dc
resistance shall be within the specified tolerance of the nominal resistance (see
1.2.1.3). The nominal resistance shall be in accordance with MS90178.

3.9 Resistance-temperature characteristic. When resistors are tested as

specified 4 3, the change tn resistance at ●ny temperature, referred to an
ambient tem~er~t~re of 25*C, shall not exceed the limlts specfffed for the
applicable temperature and resistance values speciffed in table I. The change fn
resistance at the intermediate temperatures shall not exceed a value proportional
to the maximum values specified in table 1.

3.10 Voltage coefficient (app lfcable only to resfstors of 1,000 ohms and
above) . hen resistors are tested ●s specified In 4.1.5, volt ●ge coeff ic~ent
●easurements which will result in a total resistance cha~ge of 2 percent er less
shall be considered acceptable. However, If the change Is greater than 2
percent, the voltage coefficient shall not ●xceed 0.05 percent per volt for
resistors rated at 0.125 watt, “0,035 percent per volt for resistors rated at .250
and .500 watt, and 0.02 percent per volt for resistors rated above .500 Watt.

3.11 Dielectric withstanding voltage. When resistors are tested as specified

in 4.7.5, there shall be no evid ence of mechamfcal damage, arcing, or breakdown.

3.12 Insulation resistance. when resistors are tested as specified in 4.7.6,

the insu~at ion resistance shall be not less than 10,000 ●egohms.
3.13 Low temperature operation. Uhea resistors are tested as specified In
4.7.7, there shall be no ●vt dence of mechanical damage ●nd $he change In
resf$tance between the fnltlal cad f$nd ●easurements at 2S C AS*C shall not
exceed ●[3 percent +0.05
..-
ohm). .

-. 3.14 thermal shock. Uhen resistors ●re’ tested ● specffted In 4.7.8, there
shall be no evtdence of ●echanical damage ●nd the change In resistance shall not
exceed ●(4 percent +0.05 ohm).

3.1S Holsture resistance. When resistors ●re tested as specffled in 4.7.9,

there shall be no ev$donce of ●echanical denage or products of corrosion except
for normal discoloration, and the change in resistance $hall not exceed an
average OF 10 percent for each group of 10 resistors tested, nor a maximum of 15
percent for any individual resistor (plus or minus), unless otherwfse speclf~ed
see 3.1. Uhen computing the average change in resistance, the sign (plus or
minus) of the individual change shall be disregarded. The insulation resistance
shall be 100 megohms, ●inimum.

3.16 Short-time overload. When resfstors ●re tested ●s speclffed fn 4.7.10.

there shall be no evid ence of arcfng, burning, or charrfng, and the change In
resistance shall not ●xceed ●(2.5 percent +0.05 ohm).

3.17 Termfnal Strength.

3.17.1 Dfrect load. When resistors ●re tested as speclfled fn 4.7.11,

resfstors shall with stand the specified loed without ●ochanlcal damage.

3.17.2 Twfst. Uhen resfstors ●re tested ●s specified fn 4.7.11.1, there shall
be no evid~of breakage or other ●echanical damage and the change in
resistance from the inftfal measurement of 3.17.1 shall not ●xceed *(1.O percent
+0.05 ohm).

3.18 Resistance to soldering heat. When resfstors ●re tested as speciffed fn

4.7.12, here shall be no evi dence of mechanical damage and the change In
resistance shall not exceed ●(3 percent +0.05 ohm).
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MIL-R-39008C

3.19 Shock, (specified pulse). Uhen resistors are tested as speclfled in

4.7.13, here shall be no evl dence of mechanical damage. There shall be no
electrical dlscontlnufty during the test.

3.20 Vibration, h~gh frequency. Uhen resistors are tested as speclf$ed in

4.7,14, here shall be no evidence of mechanical damage and the change in
resistance from the Inltlal measurement of 3.19 shall not exceed ●(2 percent
+0.05 ohm). There shall be no electrical discontinuity durfng the test.

3.21 Life.

3.21.1 ouallflcation.

3.21.1.1 One hundred percent rated wattage. When resistors are tested as
specified In dence of ■echanical damage; the change
in resistance ~e~we~n t~~ei~i~fal ;eziu;~ments ●nd each of the succeeding
●easurements shall not exceed an average of 6 percent for each group of 10
resistors tested, nor a maximum value of 10 percent for any Individual resistor.
kihen computing the average change in resistance, the sign (plus or minus)of the
individual changes shall be disregarded.

3.21.1.2 Fifty percent rated wattage (quallflcation only). When resistors are
tested as speclfi 4 7 5, there shall mechanical damage.
The change in res?sta~ce”between the lnitlalem~~s~~em~~~ea~d any succeeding
measurement shall not exceed ●8 percent.

3.21.2 Failure-rate level determination. When resistors are tested as

specified In 15 th h 11 be no evfdence of ●echanical damage. The change
in reslstaace ~e~we~n t~~ef~4;fal ●easurement and any of the succeeding
measurements up to and Including 2,000 hours shall not ●xceed ●15 percent. This
single faflure criteria shall be applicable to ●ll ●easurements during the llfe
test for urposes of determining failure-rate quallflcation, ●nd Is ●pplicable as
a paralle 1’ requirement with 3.21.1 to the measurements ■ade during the life test
specified for qualification inspection.

3.22 Solderabllfty. When resistors ●re tested ●s specffled in 4.7.16. the

dipped surface of he leads shall be at least 95-percent covered with a new
solder coating. The remaining 5-percent of the Iesd surface may show only small
pinholes or voids and shall not be concentrated in one area. Bare base ●etal and
areas where the solder dfp failed to cover the original coating are indications
of poor solderability, and shall be cause for failure.
3.23 Low temperature storage. kihen resistors are tested as specified in
4.7.17, here shall be no evi dence of mechanical damage. The change in
resistance shall not ●xceed ●(3 percent +0.0S ohm).

Resistors shall be free of ■issing, illegible, incorrect. ●ixed

o?;~tar%’%%~ markings, and shall be permanently colored coded ,. accordance
wfth MIL-STO-1285. A fifth band shall denote the failure-rate designation (see
1.2.1.5), ●s follows:

Failure designation Band color

M. . . . . . . . . . . . . . . . . . . . Brown
P. . . . . . . . . . . . . . . . . . . . Red
Orange
!:::::::::::::::::::: Yellow

3.24.1 Unit package. The unit package shall be ●arked with the PIN, ‘JAN”
marking, date code, and the ●anufacturer’s name. trademark or code symbol. Date
and source code shall be in ●ccordance with 141L-STO-1285. Marking shall remain
legible at the end of all tests.

8
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MIL-R.39008C
.

3.24.2 JAN and “J’ narkinq. The Untted States Government has adopted, and is
exercising legitimate control over the certification marks ‘JAN” and J,
respectively, to indicate that Items so marked or fdentffled are manufactured to,
and meet all the requlreaents of mflftary SpeCfffCatfOnS. Accordingly, fteas
acqufred to, ●nd neetfng all of the crfterla specffied herefn and fn applicable
specifications shall bear the certification mark “JANa except that ftems too
small to bear the certification mark “JAN” shall bear the letter “J”. The ‘JAN”
or ‘J” shall be placed immediately before the PIN except that If such ● locatlon
would place a hardship on the ●anufacturer fn connection with such ●arkfngs the
“JAN” or “J” may be located on the first lfne above or below the PIN. Items
furnished under contracts or orders which ●ither permft or require devlatlon frOa
the conditions or requirements specified herein and in applicable specfffcatfons
shall not bear “JAN” or “J”. In the ●vent en ltea fafls to me~t the requfreaents
of this speclffcatlon and the applicable specifications sheets or ●ssociated
detafl speclffcatfons, the ●anufacturer shall retaove the ‘JAM” or the ‘Jm from
the sample tested and also from all Items represented by the sample. The “JAN”
or ‘J” certification ■ark shall not be used on products acquired to contractor
drawfngs or specfffcatfons. The Unfted States Government has obtafned
Certfffcatfon of Reglstratfon No. 504,860 for the certlffciitlon mark “JAN*.

3.25 Failure rate substitution. A manufacturer may supply to all hfgher

faflure rate levels than that to which he Is qual$fied. Parts quallfled and
marked to lower faflure rate levels are substitutable, with procuring agency
approval, for hfgher faflure rate level parts, and shall not be remarked unless
speclffed In the contract or purchase order.

TABLE V. Faflure rate substitute.

1 1 f
i Faflure rate i Substitute i

3.26 Fungus. All external materials includfng the color codfng material, shall
be nonnutrienf to fungus growth, or shall be suitably treated to retard fungus
growth. The manufacturer shall verify by certification that all external
materials, fncludfng the color codfng aaterfal, are fungus resistant or shall test
the res~stors as specffled in 4.7.18. If tested fn accordance with 4.7.18, there
shall be no ●violence of fungus growth om ●xternal surfaces.

Uhen soldering fs ●mployed, only noncorrosive flux shall be

.2if7.nWFP” can be shown that corrosfve elements have been satisfactorily
removed ●fter soldering. Electrical connections shall be ●lectrically continuous
after solderl~ . In no case shall the solder used, start to flow ●t a temperature
less than 200 ! .

Resfstors shall be processed fn such ● ●anner ●s to be

u~;~~a -“ y, shall ●eet the requirements of 3.1, 3.4, 3.5.1 to 3.5.1.3
inclusive, 3.24, 3.25 to 3.28 inclusive, as applicable, and shall be free from
cracks, holes, chf s, ●alforaatfon, and other defects that will ●ffect l{fe or
serviceability. Tte wfre leads shall be unbroken, and not crushed or nicked.
Nfcks or scratches resultlng from handlfng durfng final processing or testfng
shall not be considered as defects, provided they are located at least 0.5 inch
(1.27 ●m) away froa the ●nd of the resistor.

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MIL-R-39008C

4. QUALITY ASSURANCE PROVISIONS

4.1 Responsibility for Inspection. Unless otherwfse specfffed in the contract

or purchase order, the contractor Is responsible for the performance of all
inspection requirements (examfnatlons and tests) as specfffed herein. Except as
otherwise specified fn the contract or purchase order, the contractor nay use his
own or any other facilities suitable for the performance of the inspection
requirements specified herefn, unless disapproved by the Government. The
Government reserves the right to perform any of the Inspections set forth in the
specification where such inspections are deemed necessary to assure supplies and
servfces conform to prescribed requirements.

4.1.1 Responsfbflfty for compliance. All ftens shall ●eet all requirements of
sectfons d 5 Th Inspection set forth fn thfs specfffcatfon shall become a
part of thea;ont~acto~’s overall inspection system or quality program. The
absence of any inspection requfre,ents in the specfffcatfon shall not relfeve the
contractor of the responsibility of assurfng that all products or supplfes
submitted to the 6overnment for acceptance comply wfth all requirements of the
contract. Sampling inspection. as part of manufacturing operations, is an
acceptable practfce to ascertain conformance to requirements, however, this does
not ●uthorize submission of known defectfve material, efther fndlcated or actual ,
nor does it commit the Government to accept defective ●aterial.

4.1.2 Reliability assurance program. A relfabfllty assurance program shall be

established and maintained in accordance wfth NIL-STD-790. Evfdence of such
compliance shall be verffied by the qualifying actfvfty of thfs specification as
a prerequisite for qualification and continued qualification.

4.1.3 Statfstfcal process control. A SPC program shall be established and

●aintafnea in accordance wfth EIA-557. Evfdence of such compliance shall be —
verffled by the qualifying actfvlty ●s ● prerequisite for qualfflcatfon and
retention of qualfflcatfon.

4.2 Classification of inspection. The inspection requirements speciffed

herein are classified as foil Ows :

a. oualfffcation inspection (see 4.4).

b. Verification of qualification (see 4.5).

c. Qualfty conformance inspection (see 4.6).

4.3 Inspections conditions ●nd precautions.

4.3.1 Inspection conditions. Unless otherwfse speciffed herefn, all

inspections shall be performed fn ●ccordance wfth tho test conditions specfffed
fn the “GENERAL REQUIREMENTS” OF MIL-STD-202.

4.3.2 Precautions. Adequate precautions shall be taken during inspection to

prevent condensation of mofsture on resistors. Precautions shall also be taken
to prevent damage by heat when solderfng resfstor leads to termfnals.

4.3.3 Mounting of resfstors. Unless otherwfse specfffed harefn, suftable

clips shall be used wherever resfstors are mounted for test purposes.

4.4 Qualification inspection. Qualfflcation inspection shall be performed at

a laboratory aCCeptiiblt2 to he Government.

4.4.1 Sample. The number of sample units comprising a sample of resfstors to

be submitled for qualification inspection shall be as speclffed fn the appendfx
to this specification. The sample shall be taken from a production run and shall
be produced wfth ●qufpment and procedures normally used fn production.

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HIL.R.39008C

4.4.2 Test routine. All sample units shall be conditioned for 96 ●4 hours in
a dry oven at a temperature of 100”C ●5-C. For style RCR05, the duratfon for
conditioning shall be 25 ●4 hours, and for RCR42, the duration shall be 130 ●4
hours. After condftfonin sample unfts shall be subjected to the inspection for
their particular group. !;mple units shall be stored fn fle.sfccatot=s usfng a
suftable desfccentp such as activated alumina or SfllCa gtl, from tine of removal
from the oven untfl the beginning tests. Sample units, wfth the ●xceptfon of
those for group VII, shall be subjected to the dc resistance test of group 1;
only 20 sample unfts, with the exceptfon of those for group VII, shall be
subjected to the vfsual and mechanical examination of group I. The 84 sample
unfts shall then be divided 10 each for groups 11 to VI, Inclusfve, and 34 for
group VIII. Ten or 20 sample unfts, at the optfon of the ●anufacturer, shall be
subjected to the inspection of group VII.

4.4.3 Failures. Faflure in excess of those allowed In table VI shall be cause

for refusal to grant qualification.

4.4.4 FR qualification. FR qualfffcatfon shall be in accordance wfth the

general and detail requirements of MIL.sTD-690 and the followfng detafls:

a. Procedure I - oualffication at the fnftial FR level. Level M (1.0

percent) of FRS P-60 shall apply. Sample units shall be subjected to the
qualification inspection speclffed in group VIII, table VI (see 4.4.2).
Entfre llfe test sample shall contfnue on test to 10,000 hours us
speclffed in 4.7.15, upon completion of the 2,000 hour qualification.

b. Procedure 11 - Extensfon of qualfffcatfon to lower FR levels. To extend

qualffi R (o 01 percent] and (o 001 parcent) FR
levels,c~at~nfr% t~o ore~~re s~yles of sfmflar cons~ructfon may be
combfned.

c. Proceduro III - Nafntenance of FR level qualfffcatfon. Maintenance

perlotl of t B1 VII h 1 Regard less of t he number of production
lots produc;d ~urlngst~fs ~~?f~;, the specffled number of unft hours
shall be accumulated to ●afntafn quallffcatfon (see 4.6.2).

4.4.5 Quallty level verfflcatfon. The contractor Is responsible for

establishing a qualfty system to verify the PPM level of lots that are subjected
to subgroup 2 tests of group A inspections. The PPM defect level shall be based
on a 6 month movfng average. The contractor shall verffy and report monthly on
Individual PPM categories (f.e.. PPM-2 and PPM-3) ●nd an overall PPM defect level
(f.e., PPM-5).

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MI L- R-39008C -

TABLE VI. Quallficatfon inspection.

I Inspection I Requirement I Test i Number of sample i

I paragraph I method I failures allowed I
/ I I paragraph I ~/ I
I I I I I

I Grou I 13.1. 3.4, I i i

1
Ivi+d mechanical 13.5.1 to I
I Inspection ;/ ~1 13. 5.1.3 incl,! 4.7.1 I I
I 13.24. 3.27 tol 11 I
I 13.28 fncl. ‘1 I 1
I I I I I
~DC resistance ~/ i 3.8 I 4.7.2 I 1
I I I
I
!Res=temperature !
I characteristic 3/ I 3.9 4.7.3
lVoltage coefficlen~’ : I
[ (applicable to / 11
I resistors ●f 1,000 I I
I ohms and above) I 3.10 4.7.4 i I
[Dielectric withstanding
I voltage ~1 I 3.11 4.7.5 I
l Insulation I 3.12 4.7,.6 1 2 I
~ resistance ~/ I I I
I I
i i
I I —
I operation I 3.13 4.7.7. I
lThermal shock I 3.14 1 4.7.8 11 i
ILOW temperature storagel 3.23 4.7.17 I I
[Moisture resistance I 3.15 ~ 4.7.9 I I
lShort-time overload I 3.16 4.7.10 I) I
I I
; I I
lTermi%%T#ngth ! 3.17 ! 4.7.11
lResistance
I heat
to soldering
[ 3.18 4.7.12
1
I
/ } i
I I I I I
I I I I
{Shock w spec fied pulse)! 3.19 I 4.7.13 \l I
lVibration, high I I
~ frequency I 3.20 4.7.14 I
I i }
I i
Ilife wcentrate~ 3.21 ~ 4.7.15 11 I
I wattage) ~/ I I I I
I I I I I
i
lSolde%#%+#~/
I
~
I
3.22 4.7.16 ~1 — !
I
i / I
lLife -t rated /
I wattage I 3.21, and 4.7.15 ~1
I 3.21. 1.2 I
I Group IX I I
~Fungus ~ 3.26 ~ 4.7.18 10
I

See footnotes on next page.

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MIL.R-39008C

Failure of an individual resistor In one or more tests in groups 1 to V’

inclusive, shall be charged as d single failure. Failures for each
resistance value shall be permftted as specffied ~n each group, but not more
than two faflures shall be permftted in groups I through VI combined.
Markfng shall be considered defective only ff the marking Is fllegfble.
Nondestuctlve examinations and tests.
Uhen a group of resistors f&fls-to-meet the specified average percent change
In resistance requirement, three failures shall be charged; however, a
failure shall be charged for each resfstor of the group which exceeds the
specfffed maximum percent change in resistance requirement, and these
resistors shall not bc considered In computing the average.
Ten or 20 sample units, ●t the option of the supplier, shall be submitted to
this test; lf 10 sample Unfts are submftted, both terminals ltPLIdS Of eaCII
resfstor shall be subjected to the test; ff 20 sample unfts are submftted,
only one terminal of each resistor shall be subjected to the test. Failure
of two terminal leads on the same resistor subjected to the solderabilfty
test shall be considered as two separate failures.

4.5 Verification of qualification. Every six months the manufacturer shall

compile a summary of he results of CIUalfty conformance inspections and extended
faflure rate (FR) data, In the forsn of ● verfficat(on of qualification report,
and forward ft to the qualifying actfvity wfthfn 30 days after the end of the
reporting period as the basis of continued qualification approval. In addition,
the manufacturer shall immediately notify the qualifying activity whenever the FR
data indicates that the manufacturer has fafled to maintain the quallfied FR
level , or the gromp fk Inspection data Intlfcates faflure of the qualfffed product
to ●eet the requirements of th~s speclflcatlon. Continuation shall be based on
evidence that ov~r the 6.month perfod.the followfng has been ●et:

a. Verfffcation by the qualifying activity that the manufacturer meets the

requirements of MIL.STD-790.
b. The ●anufacturer has not modffied the design of the ftem.
c. The specification requirements for the ftem have not been amended so far
as to affect the character of the item.
d. Lot rejection for group A inspection does not exceed 15 percent or one
lot, whfchever is greater.
e. The requirements for group B inspection are met.
f. The records of FR tests combined substantiate that the “M” (1.0 percent),
or “P= (0.1 percent) FR level has been mafntafned, or that the
manufacturer continues to meet the ‘R” (0.01 percent), and “S” (0.001
percent) FR level for which qualified, although the total component hours
of testing does not, as yet meet the requirements of 4.4.4c.
9* The contractor shall provfde documentation to the qualifying activity
pertafnln to PPM calculations including number of part types tested,
indfvldua ? PPN defect categories (f.e., PPM-2, PPM-3) and overall PPM
defect rate (PPM.5). This information shall be submlttod on ● detafl
speclflcatlon b~sls and based on a 6-month ●ovfng ●verage.

When group B requirements were not ●et ●nd the ●anufacturer has taken corrective
action satisfactory to the Government, group B testln shall be Instituted. A
summary of the retesting shall be fowarded to the qua ? ifying actfvfty wfthin 30
days after completion of the retest. All reports shall be certified by a
responsible company offlcfa? and the Government fnspector.

4.6 Quallty conformance inspection.

4.6.1 InspectIon of product for delfvery. Inspection of product for delivery

shall consfst of group A inspection. Deli very of shfpment shall not be delayed
pendfng completion of group B fnspqction.

.-
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MIL-R-39008C

.
4.6.1.1 Inspection lot. An Inspection lot shall consist of all the resistors
of the same style, cnaracterlstlc, and protective enclosure or coating
manufactured under essentially the same process and conditions during a
manufacturing period of one month, maxlaua.

TABLE VII. Sampllng plan for maintenance of FR level quallflcatlon.

~ F~el~Qualifled Ilfaximum i Cumulative unfts hours in ■flllons I

lqualificatlool (c. number of failures permitted) I
Isymboll le~!!l Imalntenance 1/1 I I
I I ..
lDerfOd I c =-01 C911C =21 C=31CS41C *51
I I I I I I I I I I

M I 3 months .0532 I .11OI .175 1 .243 I .3151

I 0.1 I 6 months 1 I .532 I 1.10 I 1.75 I 2.43 ~ $~5
II I 0.01 I 9 months I 11.0 1 17.5 [ 24.3
Is I 0.001 112 months 110.5 15!::2 1110 1175 1243 1315” I
1/ Applicable to FR level “S’ only.

4.6.1.2 Group & inspection. Group A Inspection shall consist of the

examinations and tests specffled in table VIII, and shall be made set of sample
units fn the order shown.

TABLE VIII. Group A inspection.

i InsBectfon i Reaulrement i Test method Iwumber of I

1“ I pa~agraph I paragraph [samples I

1 Sub rou 1 \ Se:Xtable I

lDC~e PPH-2 ~ 3.8 I 4.7.2 I
(Mechanical ~ [ 3.5 I 4.7.1 1“ I
I I
1 I I
I Sub rou 2 I I
lvf~natfon \ i I
lMaterfal 3.4 I see
10esi9n and / i I 4.6.1.2.3 ~
Iconstructlon 3.5
[Terminals / 3.5.1 ; / I
ISolderlng 3.27 I
Iilorkmanshfn i 3.28 I / I
lMarking “ I 3.24 I 4.7.1 I I

i sub rou 3 i i i see i

I SO+5W%W 3.22 I 4.7.16 I 4.6.1.2.4 I

TABLE IX. Samplfng plan for PPM categories.

1 1 1-
1 Lot sfze I Sample size I

i 1- 125 i 100 percent i

126 - 3,200 I 125 I
/ 3,201 - 10,000 I 200 I
I 10,001 . 35.000 I 315 I
I 35,001 - 150,000 I 500 I
I 150,001 - 500,000 800
I 500,001 - up 1250
-

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— MIL-R-39008C

4.6.1.2.2 Subgroup 1 (PPM categories). Subgroup 1 tests shall be performed on

an inspection lot basis. Samples subj ected to subgroup 1 shall be selected in
accordance with table VIII based on the size of the inspection lot. (NOTE:
Larger samples ❑ay be fnspected by the contractor fn order to calculate PPN,
however rejection of the lot shall be based on one or more defects.) In the
event of one or more faflures, the lot shall be rejected. Major and ●lnor
defects shall be as defined In table X.

TABLE X. Classfficatlon of defects.

I Requirement I Defect classfffcatfon

Construction: I
I Resfstor b d cracks, holes, or chfps I Major
Malformati~nyo; body due to fmproper molding I Major
/
I End chfpplng: /
Tess tnan .33 3 dfstance to wfre lead Mf nor
Greater than .333 dfstance to wfre lead and /
same distance fn longitudinal dlrectfon Major
i
Leads: I
~, crushed, or nicked ( wfthfn 0.5 inch I
from body) Major
I
-r ❑fs~lng markfng MaJor
--- Illeglble or smeared ●arkfng Ml nor

Resistance:
Greater ttlan 100 nercent but not exceedlna .
12S percent of tolerance Mfnor
Greater than 125 percent of tolerance Major

4.6.1.2.2.1 Rejected lots. The rejected lot shall be segregated from new lots
and those lots fiat have passed inspection. The rejected lot shall be 100
percent fnspected for those qualfty characteristics found defectfve In the sample
and any defects found removed from the lot. A new sample of parts shall then be
randomly selected fn accordance wfth table VIII. If one or more defects are
found in this second sample, the lot shall be rejected and shall mot be su~~lfed
. .
to thfs specfffcatfon.

4.6.1.2.2.2 PPM calculations. PPM calculations shall be based on the results

of the ffrst sample check as prescribed fn 4.6.1.2.2. Calcul&tlons ●nd data
excluslon shsll be in accord*ncc wfth EXA.5540 8ethod B. (NOTE: PPM calculations
shall not use data on the second sample submlsslon).

4.6.1.2.3 Sub rou Subgroup 2 shall be performed on an inspection lot

basis. A samjA+E7+~ arts shall then be randomly selected, ff one or ●ore
defects are found, the ot shall be rescreened ●nd defects removed. A new sample
of 50 parts shall then randomly be selected. If one or ●ore defects are found fn
thfs second sample, the lot shall be rejected and shall not be supplfed to this
specification.

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MIL-R-39008C

4.6.1.2.4 Subgroup 3 (solderabilfty).

4.6. 1.2.4,1 Sam ltn Thfrteen samples shall be selected randomly from
each inspection -I+=!+H” ected to the subgroup 3 solderability test. The
manufacturer ●ay use electrical rejects from the subgroup 1 screenfng tests for
all or part of the samples to be used for solderabllity testing. If there ●re
one or ●ore defects, the lot shall be considered to have failed.

4.6.1.2.4.2 Rejected lots. In the event of one or more defects, the

inspection lot IS rejected. The manufacturer ●ay use one of the followlng
Optfons to rework the lot:

a. Each production lot that was used to form the failed inspection lot
shall be Indfvfduall submftted to the solderabflfty test as required In
4.7.16. ProductIon !ots that pass the solderabflfty test are available
for shipment. Production lots fafling the solderabflfty test can be
reworked only ff submitted to the solder dfp procedure In b.

b. The manufacturer submits the failed lot to a 100 percent solder dlp
ustng an a proved solder dfp process per 3.5.1.1. Followfng the solder
dip, the ●! ectrlcal measurements requfred in group A, subgroup 1 tests
shall be repeated on 100 percent of the lot. The percent defectfve
allowable (POA) for the electrical measurements shall be as for the
subgroup 1 tests. Thirteen additional samples shall be then selected
and subjected to the solderablllty test with zero defects allowed. If
the lot fails thfs solderabllfty test, the lot shall be considered
rejected and shall not be furnfshed against the requirements of thfs
specification.

4.6.1.2.4.3 Disposltfon of samples. The soldorabflf.ty test fs considered a

destructive tes% and samples SUbEft ted to the solderabflfty test shall not be
supplled on the contract.

4.6.2 Perfodlc inspection. Perlodfc inspection shall consist of group B.

Except where the results of these Inspections show noncompliance with the
applicable requirements (see 4.6.2.1.4), delfvery of products whfch have passed
group A inspection shall not be delayed pendfng the results of these perlodfc
Inspections.

4.6.2.1 Group B inspection. Group B inspection shall consist of the tests

speclffed In table In he order shown. The tests shall be erformed on
sample units of each ~tyle selected from lots that have been su E jectcd to ●nd
passed group,A inspection. Before being subjected to ●ny of the tests llsted,
all sample units shall be conditioned ●s specified In 4.4.2.

4.6.2.1.1 Sampling plan.

4.6.2.1.1.1 Nonthly (subgroup 1). Test sa~ples shall be selected for ●ach
iaspectlon lot produced durlag ● one ●onth period. These sam les shall bq
●ccumulated ●nd laced on the lffe test ●s speclfled In 4.7.1 ! once ● ●onth, for
the full 10,000- E our llfe test period. The test sample size s~all be determined
by the •snufac~urer so that the Unft hours generat.d meet the maintenance of
~;;l~~fcatf”n rewlrements ~eclfled f or the qualftled faflure level (see
. . In ●ny ●vent, a mln ●um of 5 samples shall be selected from each lot.
As far as practicable. the resistance values tested during ● ●aintenance period
shall be representative of all resistance decades produced durfng this ~erfod
The accumulated data Shall be used for ❑aintenance and extensfon of fai ure rite
quallffcatlon.

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MIL-R-39008C

4.6.2.1.1.2 Nonthly {subgroup 2). Ten sample un~ts of each style and of any
resistance value shall be inspected monthly in accordance with table XI.

4.6.2.1.1.3 Quarterl Sample units selected for quarterly Inspection shall

be of the same +“sty e. en sample units of the lowest resistance value, 10 of the
critical or the value closest to the critfcal value (see table XI), and 10 of the
highest resistance value, which were produced during the previous 3-month period,
shall be subjected to the tests, in accordance with table XI.

TABLE XI. Group B inspection.

? I
I Inspection I Requirement I Test Number of samples 1
I I paragraph I ●ethod I
I paragraph
1 I
i i
Suwl
\Life ; 3.21.2 4.7.15 see 4.6.2.1.1.1
I
1

)
;Voltm cient 1/ I 3.10 4.7.4
lDielectric withstanditig I 10
I volts ● (atmospheric] I 3.11 4.7.5.1
lInsulat ? on resistance ~ 3.12 4.7.6
I

4.7.7
.- lThermal shock I 3.14 4.7.8
ILOW tcmporaturc stora e I 3.23 4.7.17
lHolsture resistance -1
! i 3.1s 4.7.9
lShort-tfme overload 1 3.16 4.7.10

l-!
I
lDielec r c w standina I 10 high
I voltage (barometric)- ~ 3.11 4.7.5.2 30 10 critical
lResistance temperature 10 low
I characteristic I 3.9 4.7.3
}
/
lTermi_th ! 3.17 4.7.11
[Resistance to soldering I 10
~ heat I 3.18 4.7.12
I }

!Shock%%%dpul$e) i 3.19 4.7.13 10

lVfbratlon, high frequency 3.20 4.7.14
I I
1
ILife%%i%%ntr.ted I i 10 critical
\ wattage)” Al i 3.21.1.1 I 4.7.1s 20 10 low ~
I I
1/ Applicable only to resistors of 1,000 ohms and greater.
~/ When a group of resistors fails to ●eet the specified average percent
than e In resistance requirement, three failures shall be charged; however,
a fa ! lure shall be charged in resistance requirement, and these resistors
shall not be considered fn computing the average.

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MIL-R-39008C

4.6.2.1.1.4 Seatlannuall Sample units selected for semiannual inspection

shall be of the ~“same sty e. Ten sample units of the lowest resistance value, 10
of the critical or the value closest to the critical value (see table XI), and 10
of the highest value, which were produced during the previous 6-nonth period,
shall be subjected to the tests of sub roup 1 in accordance with table XI. Ten
sample units of any resistance value s ! all be inspected for each of subgroups 2
and 3. Ten sample units of the lowest resistance value and 10 of the critical or
nearest crltfcal value, shall be subjected to the test of subgroup 4. A separate
sample shall be selected for each subgroup listed.

4.6.2.1.2 Failures. One failure shall be ●llowed in any ~roup of 10 resistors

of the same resistance value within a subgroup (not applicab e to ●onthly,
subgroup 1). (In subgroup 2 of quarterly inspection, the group shall consist of
10 or 20 resistors, ●s applicable.) If this number is exceeded, ●n ●dditional
group of 10 resistors of the same resistance value ●ay be tested ●nti a total of
three failures shall be allowed for the 20 resistors. In semiannual inspection,
only one resubmission shall be allowed In any subgroups 1, 2. 3, and 4; i.e.,
only one resistance value shall be retested per subgroup. If more than one
resistance value fails in any of these groups, it shall be considered that the
resistors have failed to pass group 8 inspection.

4.6.2.1.3 Disposition of sample units. Sample unfts whfch have been subjected
to group B inspecti on shall not be deli vered on the contract or purchase order.

4.6.2.1.4 Noncompliance. If a sample fails to pass group B inspection, the

manufacturer shall notify the qualifying actfvity and the cognfzant inspection
activity of such a failure and take corrective action on the ●aterials or
processes, or both, ●s warranted, ●nd on ●ll units of production Ubfcb can be
corrected and which were ●anufactured under ●ssentially the same ■aterials ●nd
processes, and which are considered subject to the same failure. Acceptance and
shipment of the product shall be discontinued until corrective ●ctfon has been
taken. Group B inspection shall be repeated on ●dditional sample units (all
fnspectfons, or the ins ection wh$ch the original sample failed, at the option of
the qualifying activity ! . 6roups A inspection ●ay be reinstituted; however,
final acceptance and shipment shall be withheld until the group B inspection has
shown that the corrective action was successful. In the event of failure after
“reinspection, information concerning the faflure shall be furnfshed to the
cognizant inspection activity and the qualifying activity.

4.6.3 Inspection of packagfn~. The sampling and inspection of the

preservation, packin container marking shall be in accordance with the
requirements of MIL- !:3$::2.

4.7 Methods of inspection.

4.7.1 Visual ●nd ●echanical inspection. Resfstors shall be examined to verify

that the materials, desfgn, construct Ion, physical dimensions, ●arking ●nd
workmanship are In accordance wfth the applicable requirements. General
workmanship defects shall be classified In ●ccordance with tcble X (see 3.1. 3.4,
3.S.1 to 3.5.1.3 inclusfve, and 3.24, 3.25, 3.27 ●nd 3.28).

18
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MIL-R-39008C
-.

4.7.2 DC resistance (see 3.8). Resistors shall be tested in ●ccordance with

❑ethod 303 of ~L1-ZOZ. Th e following details and exception shall apply:

a. Measuring apparatus: The same measuring Instrument shall be used for

any one test, but not necessarily for all tests.

b. Combined lim~t of error of measurfng apparatus: Shall not exceed 0.5

pevcent.

c. Test voltage: Table XII gives the recommended test voltage to be

impressed across the resistor in making resistance ●easurements. Other
test voltages way be used; however, in no ●vent shall the test voltage
exceed the voltage shown in table XIX. In the event of a conflict in
results, attributable to the test voltage used, the nominal voltage
specified in table XII shell be used to solve the confllct.

d. Temperature: The dc resistance test specified in group I of table VI

shall be performed at 25°C ●2”C. For all other tests, unless otherwise
specified herein, the temperature at which subsequent and final
resistance measurements are made shall be wfthin *2°C of the temperature
at which the first resistance measurement was made.

TA8LE XII. OC resistance test voltages.

? I
I Nomfnal resistance I Test potential

I ohms i Volts
I i
i 2.7 to 9.1 inclusive i :.;: : :.::
-. 1 incluslve I
1& 9;: incluslvo I 2:75 ● 0;25
I 1.000 9,100 incluslve I 9.00 ● 1.00
[ 10,000 91,000 incluslwe I 27.00 ~ 3.00
I 0.1 mtgohm of higher I 90.0 ●1O.OO

4.7.3 Resistance temperature characteristic (see 3.9]. The resistors shall be

malntainea at each of he ambient temperatures in table XIII. Resistance
measurements shall be made at each temt)erature. 3; ;O 45 ●inutes after resistors
have attained that temperature. The temperature adjustment shall be accurate
within l-C. The eercent change in resistance, referred to a reference
temperature at 25 C, shall be computed by the following formula:

(R-r) 100
Percent change in resistance -
Where: r
R ● Resistance ●t test temperature. -
r ● Resistance ● t referance t~pertture.

TABLE XIII. Resistance-temperature characteristic test.

i Sequence I Temperature ‘c I

I F i 105 i

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MI L-R-39W8C

Resistance values at temperatures ‘B” and ‘C= of table XIII shall referred to the
resistance value at temperature “A”, and resistance values at temperature ‘Em,
and ‘F” shall be referred to the resistance value at temperature D“.

NOTE: At the option of the manufacturer the reverse sequence of table XIII may be
as fellows:
Room temperature.
;: Serfes of high temperatures.
3. Room temperature.
4. Series of low temperatures.

4.7.4 Voltage coeff.fcfent (applicable only to resistors of 1,000 ohms and

●bove) In ●ccordance
L --
one-tenth
(see

the
3.10).
z, at the
rated
Resfstors
rated
continuous
shall
continuous
working
measured
working
voltage.
voltage specified
The voltage
with method
In 3.7
coefficient
and ~f
shall
●
then be computed as follows:

100 (R-r) 1
Yoltage coefficient = x
r ~
Hhere:
R = Resi$t&nce at rated continuous workfng voltage.
r = Resistance at 0.1 rated continuous working voltage.
E = rated continuous working voltage.

4.7.5 Dielectric withstanding voltage (see 3.11).

4.7.5.1 Atmos herfc pressure. Resfstors shall be tested fn accordance wfth

he followlng details ●nd ●xceptfon shall ●pply:
a. Specfal preparations: Resistors shall be placed In a conductive
●aterial whfch wfll conform to.the resistor surface so that between 90
and 100 percent of the outer perfphery fs contacted. The conductive
●aterfal shall be centered on the resistor body. Care should be taken
that any part of the resistor lead Is as far away from the conductive
materfal as possfble.

b. Magnitude of test voltage: Twfce the maxfmum rms continuous working

voltage specffied in table VI.
c. Nature of potential: An sc supply at commerlcal-lfne frequency (not
sore than 100 hertz} and waveform.

d. Duratfon of ●pplication of test voltage: 5 seconds.

●✎ Rate of application of test voltage: 100 volts per second.

f. Pofnts of ●pplication of test voltage: Between resfstor termfnals
connected together ●nd the conductive ■aterfal.

9* Examlnatfo’ns after test: Resistors shall be exanfned for ●vfdence of

●echanical damage.

.
20
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— MIL-R-39008C

4.7.5.2 Barometric Resistors shall be tested In accordance w~th

method 105 ~-s he following detafls and exceptions shall apply:

a. Method of mountfng: as specffied in 4.7.5.la.

b. Test condition: B.

c. Test voltage during sub~ectfon to reduced pressure: As specified in

table XIV.

d. Nature of potentfal: As specfffed fn 4.7.5.Ic.

e. Duratfon of application of test voltage: 5 seconds.

f. Rate of application: 100 volts per second.

9. Points of application of test voltage: As specified in 4.7.5.lf.

h. Examinations after test: As specified in 4.7.5.lg.

TABLE XIV. Voltages to be app lied at barometric pressure.

1 I r
I Resistor watta9e I Voltage aDDlled I

I volts
0.125 i !
1 0.250 325
-. 0.500 / 450 I
I 1.000 I 625 I
I 2.000 I 625 I

4.7.6 Insulation resistance (see 3.12). Resfstors shall be tested in

accordance wfth method of HIL-STD-20Z. The followlng details and exceptions
shall apply:

a. Special preparations: As specified in 4.7.9a.

b. Test condftion A for styles RCR05 and RCR07, test condition B for styles
RCR20, RcR32, and RCR42.

c. Points of ●easurement: Between the resistor terufnals connected

together and the ●ounting strap.

4.7.7 Low temperature operatfon (see 3.13~.

4.7.7.1 Mountln Resistors shall be ●ounted by thefr termlntls so that there

Is ●t least +* of free &fr space ●round each resistor ●nd the ●ountfng 1s fn
such a posftfon wfth respect to the ●fr that it offers substantially no
obstruction to the flow of afr ●cross and around the resfstors.

21
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MI L-R-39008C

4.7.7.2 Procedure. OC resistance shall be ●easured as specified in 4.7.2.

Uithin 1 hour af ter this measurement, the resistors shall be placed In a cold
cha?ber at root temperature. The temperature shall be gradually decreased to
-65 C ●O-C, -5 C, within a period of not less than 1.5 hours. For qualfty
conformance Inspection only, and at the optfon of the manufacturer, resistors may
be placed In the cold chamber when the chamber is already at the extreme low
temperature. After 1 hour of stabilization at this temperature, full rated
continuous workin voltage (see 3.7) shall be applled for 4S ●inutes.
resfstors ■ay be fully loacied fndlvfdually or fn parallel. Fffteen+5,T!~
minutes after removal of voltage, the temperature fn the chamber shall be
gradually fncredsed to room temperature wfti!in a period of not ●ore than 8
hours. The resfstors shall be removed from the chamber and maintained at a
temperature of 25*C ●5-C for ● perfod of ●pproximately 24 hours; the dc
resistance shall then be ●easured as speclfled In 4.7.2. Resistors shall then be
●xamined for evfdence of ●echanical damage.

4.7.8 Thermal shock (see 3.14). Reststors shall be tested fn accordance with
method 10/ or nlL-~. Ine ollowlng detafls and ●xceptions shall apply:

a. Special mountfng: As specffied in 4.7.7.1.

b. Measurement of afr temperature: The air temperature shall be measured

by a suftable means and as near to the center of the
If a thermometer fs used, ft shall be mounted paralle Yr::p;: %:i%e”
the resfstors.

c. Test condftfon: A.

d. Measurements before and after cycllng: DC resistance shall be measured

as speclffed fn 4.7.2, prfor to the ffrst cycle and wfthln 24 hours
after completion of the fifth cycle.

e. Examlnatfon after test: Resistors shsll be examfned for ●vfdence of

■echanical damage.

4.7.9 Moisture resfsttnce (see 3.15). Resistors shall be tested fn ●ccordance

with ●ethod of~. he followfng details and exceptions shall apply:

a. Mountfng: Resfstors shall be soldered by their leads to stand-off

insulators ~/ on a suftable panel so that there wfll be at least 1 inch
of free ●ir space around each resistor. The spacin of the ●ounts shall
be such that the length of each resfstor lead f% .3 ! 5 ●.0625 inch when
●easured from the edge of the supporting termfnal to the resistor body.
In ●ddftfon, c1l sample units shall be covered wfth a flat, non-
corrosive, metal strap whose width fs ●qual to the length of the
resfstors ●nd of sufficient thfckness to be rfgld. A 0.075.fnch thick
layer of resflent mofsture-resfstant ●aterfal, bavfn g ● resfst$vft{;f
less than 1,000 okm-centimeters, shall be bonded to t e surface of
strap next to the resfstors. $ufflcfent contact pressure shall be
●aintained between thfs ●aterial ●nd the resistor fn order that ●ll
color code bands shall be completely fmbedded in the ●aterial. This fs
done by ●pplying ● compressive force between the strap ●nd ● c;~~,nder.
nonconducting rod held beneath the resistors (see fl ure 1).
●ountlng straps ●ay be used to cover one or ■ore res ! stors at a time and
may be ●pplled after the last CYCle.

1/ s tandoff insulators of polytetrafl uoroethylene are preferred for use wfth

resfstors of hfgh resistance values.

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MIL-R-39008C

b. Initial measurements: Not less than 1.5 hours after resistors have been
removed from the drying oven, the dc resistance shall be measured as
specified in 4.7.2.

c. Loading voltage: During the first two hours of steps 1 and 4, a test
potential ●quivalent to 100-percent rated wattage, but not exceeding the
●aximum rated voltage shall be applied to 50-percent of the resistors.
The remaining 50 percent of the resistors shall be tested without any
application of voltage.

d. Final measurements: Upon completion of steD 6 of the final cycle. the

resistors shall be conditioned at at temperature of 25*C ●2”C- and-at a
relative humidity of 90 to 95 percent of ● period of 1.5 to 3.5 hours.
Upon removal from the chamber, resistors shall be permitted to dry for a
maximum of 4 hours at room ambient conditions. The sample unfts shall
not be subjected to forced circulating air durfng this test. DC
resistance and insulation resistance shall be measured, as specified in
4.7.2 and 4.7.6, respectively.

4.7.10 Short-time overload (see 3.16). Resistors shall be conditioned at 50”C

+3*C, -O-C for hour ●5 ●inutes. low resistors to stabilize to room
temperature, not to exceed 30 minutes. DC resistance shall then be measured as
specified in 4.7.2. Following this measurement, a potentfal of 2.5 times the
rated continuous working voltage (see 3.7) shall be applied for 5 ●.5 seconds to
the resistor terminals.

NOTE: Test potential should be established by use of dumm load in order to

avOfd excess stress on the test specimens.

In no case shall the voltage exceed the applicable value Ilsted in table XV.
thirty minutes ●fter removal of the test potentfal, the dc resistance shall agafn
be ●easured as specified in 4.7.2.

METAL STRAP~

A- n“- RESILtENT MATERIAL

FIGURE1. Fiesistor-contacting assembly for insulation-resistance measwements.

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MIL-R-39008C

TABLE XV. Maximum overload voltage.

1 1 1-
1 Power rating [ Naximum overload voltage j
I (dc or peak ac)
1 r
i watts i Volts i
l— I ~
I 0.125 I 200
1 0.250 400
0.500 i 700 i
/ 1.000 1,000
I 2.000 / 1,000 i

4.7.11 Terminal strength (see 3.17.1). Resistors shall be tested in

accordance with method of D-2ti2. The following details and exceptions
shall apply:

a. Test condjtfon: A.

b. Measurement before test: DC resistance shall be measured as specified

in 4.7.2.

c. The resistors shall be clamped by one terminal lead.

d. The ●pplled load shall be 5 pounds for all styles except RCR05; for
style RCR05 the load shall be 2 pounds.

●✎ Examlnatlon ●fter test: Resistors shall be exaalned for evidence of —

●echanical damage.

4.7. 11.1 Twist tast (see 3.17.2). Resistors shall be tested In ●ccordance
with ●ethod of he following details shall apply:

a. Test condition: D.

b. Test to be performed followlng tests specified In 4.7.11.

c. Following the test, dc resistance shall be ●easured as specified in

4.7.2, and resistors shall be examined for ev(dence of ●echanical damage.

4.7.12 Resistance to solder t (see 3.18). Resistors shall be tested fn

accordance with ●ethod he following details shall apply:

●✎ Measurement before test: DC resistance shall be measured ●s specified

in 4.7.2.

b. Test condltfon: A for ●ll styles ●xceet RCR~6. For RCR05, the
temperature of the soldor shall be 2S0 C ●1O C for a period of 3 *0.5
seconds.

c. Special preparation of specimen: Sample units shall not have been

soldered during &ny of the previous tests.

d. Depth of immersfon In ●olten solder: Mlthfn 24 ●4 hours after

completion of test. the dc resistance shall be measured as specified $n
4.7.2. Resistors shall be examined for evidence of mechanical damage.

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MI L- R-39008C

4.7.13 Shock (specifted pulse )(see 3.19). Resistors shall be tested in

accordance with method of -- . The following details and exceptions
shall apply:

a. Special mount~ng means: Resistors shall be mounted on appropriate jig

fixtures and supported by their leads at a distance .250 inch from the
resistor body. These fixtures shall be constructed in a manner to
insure that the points of the resistor-mounting supports shall have the
same mtotlon of the shock table. Resistors shall be mounted in relation
to the test equipment in such a manner that the stress applied is In the
direction which would be considered most detrimental. Test leads used
during this test shall no longer than AWG size 22 stranded wire, so that
the influence of the test lead on the resistor shall be held to a
minimum. The test-lead length shall be no longer than necessary.

b. Measurement before shock: DC resistance shall be measured as speclfled

4.7.2.

c. Test condition: I.

d. Number and direction of applied shocks: The resistors shall be

subjected to a total of 10 shocks in each of two mutually perpendicular
planes, one perpendicular and the other parallel to the longitudinal
axis of the resistor.

e. Measurement during shock: Each resistor shall be ❑onitored to determine

electrical discontinuity by ● ●ethod wblch shall at least be sensitive
●nough to ■onitor or register, automatically any ●lectrical
discontinuity of 0.1 ●illisecond or greater duration.

f. Examination after test: Resistors shall be ●xamined for evidence of

■echanical and electrical damage.

4.7.14 Vibration, hfgh freq Resistors shall be tested In

The followlng details ●nd ●xceptions
shall apply:

a. Mounting of specimens: Resistors shall be mounted on an appropriate jig

fixtures and supported by their leads at a distance .250 inch from the
resistor body. These fixtures shall be constructed in a manner to
insure that the ofnts of the resistor-mounting supports shall have the
same motion as t R e vibration table. The arrangement of the mounting
shall be such that the body of the resistor Is not restrained in any
manner, but is allowed to respond to the vlbratlon forces ●pplied. Test
leads used durfng this test shall be no larger than AW6 22 stranded
Wire, so that the test lead on the resistor shall be held to ● ●lnfmum.
The test lead Iengtb shall b~ no grester than Is ●bsolutely necessary.
A shtelded cable, which ■ay be necessary because of the field
surrounding the vibration table, shall be cla-ped to the
resistor-mounting jig. In ●ll casts, the resistors shall be mounted In
relatfon to the test ●quipment in such ● ●anner that the stress ●pplied
1s fn the dlrectlon which would be conslder~d ■ost detrimental.

b. Test condltlon: D.

c. Dlrectlon of ●otion: In each of two mutually perpendicular directions,

one perpendicular and tho other parallel to the longitudinal axis of the
resistor. Six hours In each dlrectlon for a total of 12 hours.
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MIL.R-39008C

d. Measurement during test: Each resistor shall be monitored to determine

electrical discontinuity by a method which shall at least be sensitive
enough to ❑onitor or register, automatically, any electrical
discontinuity of 0.1 millisecond or greater duration.

e. Measurement after vibration: DC resistance shall be measured as

specified fn 4.7.2.

f. Examination after test: Resistors shall be examined for evidence of

mechanical and electrical damage.

4.7.15 Lffe (see 3.21). Resistors shall be tested fn accordance with method
108 of MIL-STD-202. The following detafls and exceptions shall apply:

a. Method of mounting: Resistors shall be mounted and soldered (see 6.6),

to lightweight terminals (see figure i!). The effective length of ●ach
lead shall be 1.000 ●.1875 inch. Resistors shall be so arranged that
the temperature of any one resistor shall not appreciably influence the
temperature of any other resistor. There shall be no circulation of air
dfrectly over the resistors other than that caused by heat of the
resistors. The mounting terminal shall be of such thermal capacity that
It may be maintained at the oven operating temperature.

b. Test temperature and tolerance: 70°c +15”C, -5-C; reference temperature

+70”C ●5”C.
c. Initial measurements: Measurements ■ay be ●ade ins{de or outsfde the
chamber.

1. Insfde the chamber: When measurements ●re to made inside the

chaatbcr, the Ioitlal dc resistance shall be ●easured after ●ounting
●t the applicable test temperature, ●fter temperature stabflizatlon,
and wfthfn 8 hours of ●xposure of the resistors to the test
temperature. The inftial ●easurement shall be used ●s the reference
temperature for all subsequent measurements under the same
conditions.

2. Outside the chamber: When measurements are to made outside the

chamber, the fnitial dc resistance shall be measured after mountin9
at the room temperature. This initfal measurement shall be used as
the reference temperature for ●ll subsequent measurements under the
same conditions.

d. Operating condltfons:

1. Group VI of table VI (qualiffcatfon ●nd subgroup 4, semiannually,

table XI): One hundred percent rated dc continuous working voltage
(see 3.7) or filtered or nonffltered full wave rectfffed ●c voltage
shall be ●pplled latermlttently, 1.5 hours “one ●nd 0.5 hour “Off”
for the applicable number of hOUrS. “On time’ shell be 75 percent
of the total ●lapsed tfme. f)urlng the ‘on- cycle, voltage shall be
regulated and controlled to ●afntafn rated continuous workfng
voltage wfth ●5 percent. In case of a conflfct, ● referee potentfal
regulated and controlled wfthin 1 percent shall be used.

NOTE: If rectffied ac is employed, ● voltmeter capable of measurin9

true rms shall be used to prevent overloading of the specimen.

2. Group VIII of table VI (qualification) and all faflure-rate

determination testfng: As specified fn 4.7.15d.l except that the
voltage applied shall be equivalent to 50-percent rated wattage.

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MXL.R-39009C
--

r6
~ F TWCIWESS
7
–(9—
I
3\
I
2

0 “@— —@–
DETAIL_l
I
4

H
++-+

~
r
Solder lug, tinned brass catalog No. 2U1,1
Cinch Mfg COW. Chicago, Ill or equal, I

~
RD HO MS No. 6-32 x .S62 long,
T
Shakeproof washer steel, Parkerlzed i
Flatwashr, brass for No. 6-32 RS I

Lockuasher, brass for No. 6-32 MS i

Hexagons 1 nut, brass No. 6-32, standerd I

Rack; I)henolic I

i
~
. .
NOTE : Metric equivalents are given for general Infomatfon only.

FIGURE 2. Suggested mounting-lug arrangement for life test.

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UIL.R-39008C

e. Test condlt{ons:

1. Qualification inspection table VI:

Group VI (100 percent rated wattage): 1,000 +48, -O hours.

Group VIII (50 percent rated wattage): 2,000 +72, -O hours

continued to 10,000 +96, -O hours.

t?. Quallty conformance InspectIon, group B, table Xl:

Monthly, subgroup I (50 percent rated wattage): 10,000 +96, -O

hours.

Semiannually, subgroup 4 (100 percent rated wattage): 1,000 +48, -O.

f. Measurements during test :

1. Qualification inspection table VI:

Group VI (100 percent rated wattage): DC resistance shall be

measured at the end of the 0.5 hour ‘off” periods after 50 +12, -0,
100 +12, -O, 250 +48,-O, 500 +48, -O, and 1,000 +48, -O hours have
elapsed.

Group VIII (50 percent rated wattage): DC resistance shall be

●easured at the end of the 0.5 hour “off’ perfods after 250 +48, .0,
500 ●48. -o, 1,000 +48, -O, and 2,000 +72, -O hours have ●lapsed.
-O. hours thereafter for the continuation phase
W :6:::0’%6, -O hours have elapsed. —
2. Qualfty conformance InspectIon, group B, table XI:

Monthly subgroup 1 (50 percent rated wattage: DC resistance shall

be ●easured ●t the end of the 0.5 hour eriod “off’ perfods 250 +48,
-O, 500 +48, -O, 1,000 +48 -O, 2,000 +!2, -O, ●nd every 2,000 +96,
-O hours thereafter until !0,000 +96, -0 have ●lapsed.
Semiannually subgroup 4 (100 pe~cent rated wattage): OC resistance
shall be measured after 50 +12
+48, -O, and 1,000 +48. -0 hc&%;Oi<~~k~O’ 250’48’ ““ ‘OO

3. Examination ●fter test: Resistors shall be examfned for ●violence of

●echanlcal damage.

4.7.16 $olderab Resistors shall be tested fn ●ccordance wfth

method 208 of HIL- he following detafl shall ●pply:
Efther one or two leads shall be tested ●s ●pplicable (see table VIII].

4.7.17 Low temperature storage (see 3.23~.

4.7.17.1 Mountfn Resfstors shall be ●ounted fn such a ●anner that there 1s

at least 1 fnc
+“ ree ●fr space around each resistor, ●nd fn such a posftlon
wfth respect to alr stream that the mountfng offers substantially no obstruction
to the flow of afr across and around the resistors.

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MIL-R-39008C

4.7.17.2 Procedure. DC resistance shall be measured as specfffet.i in 4.7.2.

Ufthin 1 hour after thfs ●easur$aent , the resistors shall be placed $n a cold
chanber at a temperature of -65 C ●2 C for a perfod Of 24 *4 hours. The
resls$ors shall then be removed from the chamber and ma~ntained at a temperature
of 25 C for a perfod of approximately from 2 to 8 hours; the dc resistance shall
agafn be ●easured as specfffed fn 4.7.2. Resistors shall then be ●xamined for
evidence of mechanical damage.

4.7.18 Fungus (see 3.26). Unless certification is provided, resistors shall

be tested in accordance with ●ethod 508 of MIL-STD-81O. Resistors shall then be
examfned for evtdence of fungus.

5. PACKAGING

The requfrenents for packagfng shall be fn

accordance WI

6. MOTES

(Thfs section contafns information of a general or explanatory nature that nay

be helpful, but fs not mandatory.)

6.1 Acquisftfon requirements. Acqufsftion documents must specify the

following:

a. Title, number, and date of thfs spoclffcation.

b. Issue of DODISS to be cfted in the solicitation, and ff required, the

specific fssue of individual documents referenced (sea 2.1 ●nd 2.2).

c. Title, number, and date of the applicable ●ssociated detail

speclffcatlon, ●nd the complete PIN (see 1.2.1 and 3.1).

d. Markfng requirement for faflure rate level (see 3.25).

e. Lead length: Specffy 1.00 +.625, .0.000 inch for tape and reel
packaging. If not specified, 1.5 *.125 inch lead length wfll be
supplied.

6.2 oualffication. With respect to products requ$rfng qualfficatfon, awards

will be ❑ade only for products which are at the time of award of contract,
qualiffed for fnclusfon fn the applicable Qualiffed Products Lfst (QPL No~#~O08 )
whether or not such products have ●ctually been so listed by that date.
attentfon of the contractors 1s called to these requirements, and manufacturers
are urged to arrange to have the products that they propose to offer to the
Federal Government tested for qualification in order that they ●ay be eligfble to
be &warded contracts or purchase orders for the products covered by thfs
speclffcetlon. The ●ctiwfty responsible for the Quallfted Products List fs US
Arm Laboratory Command, Fort Mommouth, NJ; however, $nformatlon pert&ining to
qua f fflcmtfon of products ●ay be obtained from the Defense Electronics Supply
Center (DESC-E). Engfneerfng Stamdardlzation Directorate, Myton, OH 45444-5000.

6.3 Crltfcal voltage and resistance values. The critical resistance value for
any resfstor Aype is the ●aximum resistance ●t wh4ch rated power Input can be
obtained wtthout exceedfng the maximum continuous workfng voltage. The maxfmum
permissible Input to resfstors having resistance in excess of the critical value
fs lfmlted by thefr ❑axfmum continuous workfng voltage and not by thefr rated
power-handling capacfty.

6.4 Excessfve voltaae. Appllcatfon of nominal rated working voltage to a

resfstor havfng less than the nominal resistance tolerance wfll result fn
application of more than rated power with probable shortening of resistor life.

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MIL-R-39008C

6.5 Peak voltage. When nonslnusofdal peak voltages in excess of 1.4 tines the
rated sine-wave continuous rms voltage are applied to the resistors, care should
be taken to determine the stability of resistors for use in such aPpllCatlOnS.

6.6 Solderin Care should be taken in soldering, since all properties of a

composft +“ on res stor may be seriously affected when soldering irons are applied
too close to a resistor body or for too long a period. The length of lead
~:~:infng between resistor body and soldering point should be not less than .250
nor should the requfred soldering time exceed 3 seconds. Uhen resistors
are ;O be subjected to shock and high frequency vibration forces of the
magnitudes enumerated in this specification, it Is suggested that the resistors
be mounted by their leads at a distance of .250 inch or less from the body. In
this case, fn order to avofd thermal damage to the resistors, a heat sink should
be employed durfng solderfng.

6.7 High altitude. All tests in thfs specification, wfth the exception of the
dielectric withstanding voltage at reduced barometric pressure, are performed, at
ambfent atmospheric pressure. This fact should be considered when the use of
these resistors for high altitude conditions is contanplated.

6.8 Selection and use information. Equipment designers should refer to

MIL-STD-199 Resistors, Selection and Use of’, for a selectfon of standard
resistor ty~es and values for new equipment design. All applications and use
information concerning these resistors are also provided in NIL-STD-199.

6.9 Out-of-tolerance resistors. Resistance shifts due to absorption of

●oisture are inherent in carbon composition resistors. Before being considered
failures, out-of-tflera~ce resistors should be conditioned in a dry oven at a
temperature of 100 C ●5 C for the duration shown below prior to conducting
resistance measurements.

Style RCR05 25 ●4 hours

Style RCR42 130 ●4 hours
All other styles 96 ●4 hours

Resistors which continue to be out of tolerance after the above conditioning

process shall be considered failures.

6.10 NIL-R-11 substitution data. Resistors of this speclffcation, regardless

of their fall ure rate desfgnatfon, are substitutes for resistors of the same
resistance value and tolerance speciffed in inactivated associated detail
specifications of MIL-R-11 as follows:

Substitute specification Inactivated specification

MIL-R-39008/l MIL-R-11/8
MIL-R-39008/2 MIL-R-11/3
MIL-R-3900813 MIL-R-11/6
NIL-R-39008/4 MIL-R-11/11
MIL-R-39008/5 MIL-R-11/7

6.11 RetInning leads. If retlnnfng (hot solder dfp) of the leads fs requfred
see 3.5.1.1.

6.12 Part or Identifying Number (PIN). PIN is a new term enCOmlJaSSfn9

previous terms used in thi ication such as part number, type designator,
identification number, etc~ ?!:: 1.2.1).
6.13 Changes from previous fssue. Marginal notations are not used fn this
revfsfon to dentffy changes with respect to the previous fssue due to the
extensiveness of the changes.

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MIL-R.39008C

APPENDIX

PROCEDURE FOR QUALIFICATION INSPECTION

10. SCOPE

10.1 Sco e. This appendix details the procedure for submission of Sanples,
with relate+ data, for qualfffcatfon Inspection of resistors covered by this
speclffcatfon. The procedure for extendfng quallffcatfon of the required sample
to other resfstors covered by thfs specfffcatfon fs also outlfned herein. Thi S
appendix fs a mandatory part of the specfffcatfon. The information contained
herefn Is fntended for compliance.

20. APPLICABLE 00CUlfEtiTS. This section fs not applicable to thfs appendfx.

30. SUBMISSION

30.1 Sample. A sample consisting of 84 sample unfts, ●ach of the lowest and
highest resistance values In each style for whfch qualification is sought, shall
be submftted. All sam le unfts shall be resistance tolerance J (*5 ercent). At
the option of the manu ! acturer, 94 sample unfts ●ay be supplied to a ! low 20
sample units to be submitted for group VII of table VI. when the lowest and
highest resistance values submitted are respectively, below and above the
critical value specified in table XVI, 84 sample units as practicable, of the
critical value shall also be submitted in each style. One additional sample unit
of ●ach resistance value shall be submitted to permit substitution for the
allowable defect fn group I inspection.

30.2 Test data. When examinations ●nd tests are to be performed at a

Government laboratory, prior to submission all sample unfts shall be subjected to
all of the examinations and tests fndfcated ●s destructive in table VI. Each
submission shall be accompanied by the test data obtained from these ●xaminations
and tests. The performance of the destyuctfve tests by the ■anufacturer on a
duplicate set of sample unfts is ●ncouraged, although not requfred. All test
data shall be submftted in duplicate.

30.3 Description of ftems. The manufacturer shall submit a detailed

descrfpt~on of he resfstors befng submitted for inspection, including materials
used for the resistance element and the protective enclosure or coatfng.

TABLE XVI. Critical resistance values for qualification inspection. Al

7 I r
I Style I Critical resistance value g/ I
I I I

I RCR05 I 0.18 i
I RCR07 1 O:Z7 i
J RCR20 0.27
I RCR32 I O*Z7 1
i RCR42 I 0.12 I

~/ Maxfmum continuous workfng voltage shall

be applfed (see table VI).
~/ The crftfcal resistance value is the
maximum standard resistance value which
wfll dissfpate full wattage when the
●aximum continuous working voltage fs
●pplied.

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MIL-R-39008C

APPENDIX

40. EXTENT OF QUALIFICATION

40.1 Resistance range. The res’ stance range fncluded in the qualification of
any one style shall be between any two adjacent resistance values which pass the
required quallflcatfon inspection. oualfflcation of J (*5 percent) resistance
tolerance resfstors shall also qua ffy K (*1O percent) tolerance resistors.

40.2 Extensfon of Qualiffcatfon. The extension of qualification between

failure rate levels shall be as specffled fn table XVII.

TABLE XVII. Extensfon of qualification between failure rate levels.

1 I 1-
I Failure rate level Hill qualffy failure rate level ~
I i
r
i i S, R, P, M I
i t R, P, M I
i P P, M I
I M i n I
I I I

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MIL-R-39008C

CONCLUDING MATERIAL

Custodians Preparing actlvlty

Army - ER Army - ER
Navy . EC
Air Force - 85 Agent
NASA - MA DLA - ES

Review activities (Project 5905-1199)

Army - AR, MI
Navy - As, 0s
Air Force - 11, 80
DLA - ES

User activities
Army - AT, AV, ME
Navy - MC
Air Force - 19

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STANDARDIZAmON DOCUMENT IMPROVEMENT PROPOSAL

I lNS7RUCTlC)hl$

1. The preparing activity must complete blocks 1, 2, 3, and 8 In block 1, both the document number and revision
letter should be given.
2. The submitter of this form must complete blocks 4, 5,6, and 7.

r 3. The preparing activity must provide a reply wlthln 30 days f~orn receipt of the form.

I
NOTE:This form may not be used to request copies of documents, nor to request waivers, or clarification of
requirements on current contracts. Comments submitted on this form do not constitute or impiy authorization to
waive any portion of the referenced document(s) or to amend contractual requirements.
.,.:.,.. .. .... . ,..:.%.. ....... . 1. DOCUMENT NUM8ER 2. DOCUMENT DA7E (WM~DD~

3. DOCUMENT TITLE .~i ~io~or

Resistors, Fixed, Composition (Insulated. Established Reliability. G enera 1 sDecl
$. NATURE OF CHANGE (Identify @ragraph num~r ●nd include proposrd rewrite, ifPW. Aitachcxtrt*O 8S ~-.)

L SEASON FOR RECOMMENDATION

FM30RESS (lruhde ziP Cd) IF YOU DO NOT RECEIVE A REFLV WITHIN SS OAYS, CONTACT:
Oefan- Quality snd Standatdizati Oh
s~3 Leeaburg We. S@e 1403, F~* ~U~hl VA 22041 -3A66
Tele@ome (703) 7%-3360 AUTOVON 239-Z340
.~:. .. ..
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