ay Designation: D 149 - 870 ‘Standard Test Method for (ohare Nara Sard Dielectric Breakdown Voltage and Dielectric Strength of Solid Electrical Insulating Materials at Commercial Power Frequencies’ ‘Tis sndard ive under the fed deinaion D 19; the member iomeisy Slowing the dination indicus the yar of ral adoption or ia the ae of ein, the ya of lt revisom. A rin pets indicate Year ofa rapprval A saperciteplon lanes an ena change nce the lt revo or eapproval. ‘This spect has been approved for we by agencies ofthe Department of Defoe 1. Scope 1.1 This test method covers procedures for the determina- tion of dielectric strength of solid insulating materials at ‘commercial power frequencies, under specified conditions *? 1.2 Unless otherwise specified, the tests shall be made at 60 Hz. However, this test method may be uscd at any frequency from 25 (0 800 Hz At frequencies above 800 Hz Gielectric heating may be a problem. 1.3 This test method is intended to be used in conjunction with any ASTM standard or other document that refers to this test method, References to this document should specify ‘the particular options to be used (see 5.5). 1.4 It may be used at various temperatures, and in any suitable gaseous or liquid surrounding wedium. 1.5 This test method is not intended for measuring the diclectric strength of materials that are fluid under the conditions of test. 1.6 This test method is not intended for use in deter- ‘mining intcinsic dielectric strength, direct-voltage dielectric strength, of thermal failure under electrical stress (see Test Method D 3151). 1.7 This test method is most commonly used to deter- ‘mine the dielectric breakdown voltage through the thickness Of a test specimen (puncture). It may also be used to determine diclectric breakdown vohtage along the interface between a solid specimen and a gascous or liquid sur- rounding medium (Qasbover). With the addition of instruc- ions modifying Section 12, this test method may be used for 1.8 This test method is similar to IEC Publication 243-1. All procedures in this method are included in TEC 243-1. Differences between this method and IEC 243-1 are largely editorial. 1.9 This standard does not purport to address all of the "Ths tom metho is wader the jartction of ASTM Commitee 0-9 on lect ae Pwoni Ieltng Mtns tod he ret pony Sobcommlte DOR IY on Ectied Teos arent eon approved Se 10, 1997. Posh Jamar 1948, Originally published as D 14922 T Las previous edition D149 97 2 BarikasR Capi 3, High Volinge Mewasement.” Electrical Proeter Sona inndanig Matra Mean ecipes Wa UR. peer icles, R. batt, Eds, ASTHF STP? 925, ASTM, Paden, 947, Shehon, 4. K, Chuger 5, “Dickie Braden of Sole” Elec Properties of Sad Insdaing Maura: Molendar Sracire and Etec! Bakawir, Vl 1h, Expiring Dickares, Re: bein Had Mt. OS, Eshton, ASTM STP 783, ASTM, Pailadtphin,1983, safety concerns, if any, associated with its use. It is the responsibilty of the user of this standard 10 establish appro- priate safety and health practices ard determine the applica- bility of regulatory limitations prior 10 use. Specific hazard statements are given in Section 7. Also see Note 1. 2. Referenced Documents 2.1 ASTM Standards: D374 Test Methods for Thickness of Solid Electrical Insulation* D618 Practice for Conditioning Plastics and Electrical Insulating Materials for Testing’ D877 Test Method for Dielectric Breakdown Voltage of Insulating Liquids Using Disk Electrodes* DI7L Terminology Relating to Electrical Insulation* 1D 2413 Methods for Preparation and Electrical Testing of {asulting Paper and Board impregnated with « Liguid 13151 Test Method for Thermal Failure of Solid Elec trical Insulating Materials Under Electric Stress? 1D 3487 Specatication for Mineral Insulating Oil Used in Electrical Apparatus’ 5423 Specification for Forced-Convection Laboratory ‘Ovens for Electrical Insulation? 2.2 IEC Standard: Pub. 243-1 Methods of Test for Electrical Strength of Sotid Tasalating Materials—Part |: Tests at Power Frequen- 2.3 ANSI Standard: 68.1 Techniques for Dielectric Tests, IEEE Standard No. 3. Terminology BA Definitions: 3.1.1 dielectric breakdown voltage (electric breakdown voltage), n—the potential difference a1 which dielectric failure occurs under prescribed conditions, in an electrical ‘Arman Book of ASTM Sundar, VoL 1001 3 dno Bak of ASTal Sinden, Vol 088 4 Anu Book of ASTM Standards, Vol 10.03. Anal Book ef ASTM Sander, Vol 1002. readable fom tbe Tnceaoodl Excimechnial Commision, Gesera, Swirerand "Attlee Amecag Nationa Sandan Intute, 1) West 420d St, 1h Foor, New York MY 10036,@ 0149 insulating material located between two electrodes. (See also Appendix X1.) Drcusion—The term dielectric breakdown voltge is sometimes shortened to “breakdown voltae.” 3.1.2 dielectric failure (under test), n—an event that is evidenced by an increase in conductance in the dielectric ‘under test limiting the electric field that can be sustained. 3.1.3 dielectric strength, n—the voltage gradient at which diclectrio faiture of the insulating maserial occurs under specific conditions of test. 3.14 elecric strength, n—see dielectric strength, 3.14.1 Discussion—Internationally, “electric ctreagih” ie used almost universally. 3.1.5 flashover, n—a disruptive electrical discharge at the surface of electrical insulation or in the surrounding me- dium, which may or may not cause permanent damage to the insulation. 3.1.6 For definitions of other terms relating to solid insulating materials, refer to Terminology D 1711. 4, Summary of Test Method 4.1 Altemating voltage, at a commercial power frequency (60 Hz, unless otherwise specified) is appliod to a test ‘Specimen. The voltage is increased from zero of from a level ‘well below the breakdown voltage, in one of three prescribed ‘methods of voltagc application, until dielectric falfure of the test specimen occurs. 4.2 Most commonly, the test voltage is applied using simple test electrodes on apposite faces of specimens. The specimens may be molded or cast, of cat from flat sheet or plate. Other electrode and specimen configurations may be used to accommodate the geometry of the sample material, ‘oF to simulate a specific application for which the material is being evaluated. 5 Significance and Use 5.1 The dielectric strength of an electrical insulating. ‘material is a property of interest for any application where an clectrical field will be preseat. In many cases the dielectric strength of a material will be the determining factor in the design of the apparatus in which itis to be used. 5.2 Tests made 2s specified berein may be used to provide part of the information needed for determining suitability of ‘8 matesial for a given application; and also, for detecting. changes or deviations from normal characteristics resulting from processing variables, aging conditions, or other manu- facturing or environmental situations. This tect method is ‘useful for process control, acceptance or research testing. 5.3 Results obtained by this test method can seldom be used directly to determine the dielectric behavior of a ‘material in an actual application. In most cases itis necessary ‘that these results be evaluated by comparison with results ‘obtained from otber functional tests or from tests on other or both, iu order to esulmate their significance for matt $.5 Documents specifying the use ofthis tet method shall also specify: 5.5.1 Method of voltage application, TABLE 1 Typical Clacton for Oleectrk: Strength Tesung of Venous Types of ineultting Materials” nna esarpton of Bacrodent 1 Oppgaa ofecers 61 ron (2 wm dame 25 men i) Ba “ngesreuncded fo 64 rn (0.25 vce 2 Oppaning eytnern 25 ren (1) cert, 25 (1) hk wth ‘cog runded to 3.2 men (125 nan 3 Ceposig cyl rods 8.4 eum (0.25 bn} Wt lanoter with epee ‘ard OB re fORTTO NN) a 4 Ret pte 04 men 025 i) ne ard 108 (4.25 forge ‘gay and ere unde 1 3.2 oem (0125 rae © Hevlophrta! screen 12.7 nm 8.5) amare 8 Oppoeing erin ti ower ane 75 6) bn carter, 15 ce of pee Re Rin nae, a a ‘boards ge, rc, ae arr ‘sane a fF Tipe 1. parca or ae, mica. platl and crac ‘mere Type 1, parce for var, asc, and oar an ac ‘epee: where sud spectrara necesito the use of Saker encodes, tee tg otra wet be ‘sare as Wr Type partly for Ae pen ne other arom wi oft mater (ig ad weeny comcuros, gm ans pores CoTpcunce and esi, ‘orbeadrg.poting and ecapeaatng metatle sare mtr Types tend? (0.90 in) Hide Be upper one 26 en (1) arene, 25 oer wth edges of oe rors 3a tga 1 pent ead Mt Sat 180 eo pe anced 193126 rach 1D men Wick wy fat cc, pa, toand matr, for tats ws the vetage rade petal 0 Fe arte 4 The secon wv the mot conmarh apedid of eferancnd ASTM varcarGe. WH te exon of Type & elacrades, io aiept tao bean mat ‘sungest encode nvtema or her than at min metal Csr ecw ry based oa epmcaed W AETBA Wervanen ene syed epee wserees tear wee ‘erchamer whore ne of fae eacroden i the alee paabls x rope eveim cf be el Da tse, {2 Secrodes ar rorraty mace For ts bras statis st Fferance Al be ade oe eared govern lh rar o be tat! oct wh, per mast a protrai. The elcrodes urtaces shoud be pod ard tee fom {fat tw apropran snout ed te apled Oy fe oper cece ‘Fatah appropiate Saree rte pope pa (te Types Td areas 1 Oar ata ry vac, proved ato part fn Set aot aw ot et 19 ere cg hom proves str eer. eon ernie spect te upp acto sted be 50:8 29. 6 dears ee ov Qe MEG PROOF tag see rer. Tey er eo concn he eos fan a "The Type secon, os ecrond ne tbe and Note ©, ww ioe Que EC Pusoton 2451 fr making tnt paral 6 fe aoc,GQ ow Voltage rate-of-rise, if slow rate-oCrise method is specified, . 5.5.3 Specimen selection, preparation, and conditioning, 5.54 Surrounding medium and temperature during test, 5.55 Electrodes, 3.5.6 Wherever possible, me failure criterion of the cur- rent-sensing element, and 55.7 Any desired deviations from the recommended procedures a¢ given. 5.6 Uf any of the requirements listed in 5.5 are missing from the specifying document, then the recommendations for the several variables shall be followed. ‘3.1 Uniess the items listed in 5.5 are specified, tests made with such inadequate reference to this test method are not in conformance with this test metbod. If the items listed in 5.5 are not closely controlted during the text, the provisions Stated in 15.2 and 15.3 may not be realized, ‘58 Variations in the failure criteria (current setting and ‘sponse time) of the current sensing element significanly the test results, 5.9 Appendix X1. contains a more complete discussion of the significance of dielectric strength tests. 6. Apparates 6.1 Voltage Source—Obtain the test voltage from a step- up transformer supplied from a variable sinusoidal low. ‘voltage source. The transformer, its voltage source, and the associated controls shall have the following capabilitis: 6.1.1 The ratin af crest to root-mesp-equare (eme) test voltage shall be cqual to V2 + 5% (1.34 to 1.48), with the {est specimen in the circuit, at all voltages greater than 50 % of the breakdown voltage. 6.1.2 The capacity of the source shall be sufficient 10 ‘maintain the test voltage until dielectric breakdown occurs. For most materials, using clectrodes similar to those shown in Table 1, ap output current capocity of 40 mA is usually satisfactory. For more complex electrode structures, or for ‘esting high-loss materials, higher current capacity may be needed. The power rating for most tests will vary from 0.5, KVA for testing low-capacitance specimens at voltages up to 10 kV, to 5 kVA for voltages up to 100 kV. 6.1.3 The controls on the variable low-voltage source shall bbe capable of varying the supply vohage and the resuftant {est voltage smoothly, uniformly, and without overshoots or transients, in accordance with 12.1, Do not allow the peak voltage to exceed 1.48 times the indicated rms test voltage under any circumstance. Motor-driven controls are prefer- able for making short-time (see 12.1.1) or slow-rate-ofrise (see 12.1.3) tests, 6.1.4 Equip the voltage source with a circuit-breaking device that wil operate within three cycles. The device shall disconnect the voltage-source equipment from the power service and protect it from overload as a reoult of specimen breakdown causi essary burning of the test specimens, pitting ofthe electrodes, and contamination of any liquid surrounding medium. 6.1.5 The circuit-breaking device should have an adjust- able current-sensing clement in the step-up transformer secondary, to allow for adjustment consisien with whe Specimen characteristics and arranged to sense specimen current. Set the sensing clement to respond to 8 current that is indicative of specimen breakdown as defined in 122. 6.1.6 The current setting can have a significant effect on the test results. Make the setting high enough that transients, such as partial discharges, will not trip the breaker but not 30 Ligh that excessive burning of the specimen, with resultant electrode damage, will occur on breakdown, The optimum current setting is not the same for all specimens and depending upon the inteudo) use of the material and the purpose of the test, it may be desirable to make tests on a ‘given sample at more than one current setting. The electrode area may bave a significant effect upon what the current setting should be. 6.1.7 The specimen current-sensing clement may be in ‘the primary of the step-up transformer. Calibrate the cus- ‘ent-sensing dial in terms of specimen current. 6.1.8 Exercise care in setting the response of the current control. If the control is set too high, the circuit wi that they be described in the report. 6.3.1 One of the electrodes listed in Table 1 should be ‘specified by the document referring to this test method. If no slecrodes have boc seri let as sopicablc one from Table 1, oF use other electrodes mutually acceptable to Parties concemed whea the standard electrodes cannot be ‘used due to the nature or configuration of the material being tested. See references in Appendix X2 for examples of some special clectrodes. Io any event the clevinnkes must be described in the report. 6.3.2 The electrodes of Types 1 through 4 and Type 6 of Table 1 should he in contact with the test specimen over the entire flat area of the electrodes. 6.3.3 The specimens tested using Type 7 electrodes should bbe of such size that all portions of the specimen will be ‘within and no Jess than 15 mm from the edges electrodes during test. In most eases, tests using = Q a@ p49 lectrodes are made with the plane of the electrode surfaces in a vertical position, Tests made with horizontal electrodes Should not be directly compared with tests wade With Wertical electrodes, particularly when the tests are made in a liquid surrounding medium, face and any specified edge radius, 6.3.6 Whenever the electrodes are dissimilas in size of shape, the one at which the lowest concentration of strise exists, usually the larger in size and with the largest radius, should be at ground potential, 6.3.7 In some special cases liquid metal electrodes, foil clectrodes, metal shot, water, or conductive coating ‘clec- ‘todes are used. It must be recognized that these may give results diflering widely from those obeained with other types of electrodes. 6.3.8 Because of the effect of the electrodes on the test is frequently possible to obtain additional informa. tom as to the dielectric properties of a material (ora group of ‘materials) by running tests with more than one type of clectrode. This technique is of particular value for research testing. 6.4 Surrounding Medium —The docusoeat calling for this test method should specify the surroundiag medium and the tex temperature, Since flashover must be avoided and the effects of partial discharges prior to breakdown mimimized, lating liquid (see 6.4.1), insulating Liquid may not be comparable with those obtained in air. The nature of the 6.4.1 When trts are made iu insulating oll, an oil bath of adequate size shall be provided. Nore 1: Canton —The use of gas container isnot recommend {or rsa tanger shove shout AY. Danes eee treakown may be sufficient o shatter te contsner: Me tena at be proonded Its recommended that mineral oil mectiog the reayuirements of Spectication D 3487, Type I or I be used. It should have 2 dielectric breakdown voltage a6 determined by ‘Tet ‘Method D 877 of at east 26 RV. Other dielectric fuzie may be used as surrounding mediums if specified. These include, ‘but aze not limited 10, silicone Mids and other liquids intended for use in transformers, circuit breakers, capacitors, of cables. 64.1.1 The quality of the insulating oil may have an appreciable effect upon the test results. In addition to the icteric breakdown voltage, mentioned above, particulate fomtaminants are especially important when very thin spec- mens (25 wen (1 mil) or kess) are being tested. Depending Upon the nature of the oil and the properties of the materal tent, water content, and dissipation factor of the oil may also ‘have an effect upom the result. Frequest replacement of the ‘il, or the use of fiers and other reconditioning equipment ‘may be necessary to minimize the effect of variations of the quality of the oi om the test results. 64.1.2 Breakdown values obtained using liquids having different electrical properties may not be comparable, Soe 14.7. If tests are to be made at other than room tempera. ‘ure, the bath must be provided with a meuns fOr beating oF cooling the liquid, and with a means to ensure uniform emiperature. Small baths can in some cases be placed in an (grea (see 6.4.2) in order to provide temperature control. if 64.2 I tests in air are to be made at other than ambient temperature or humidity, an oven or controlled humidity chamber must be provided for the tests. Ovens meting the requirements of Specification D $423 and provided with ‘means for introducing the test voltage will be suitable for use ‘when only temperature is to be controlled. 64.3 Tests in gaoses other than air will generally require coe ciate hat canbe vaca lod wh se ‘est gas, usually under some controlled pressure. The design of such chambers willbe determined by the nature ofthe text Program to be undertaken. . 6.35 Test Chamber—The test chamber or area in which ‘the tests are 1o be made shall be of sufficient size to hold the ‘ex equipment, and shall be provided with interlocks to ‘Prevent ancidental contact with any electrically energized Parts. A number of differeat pivtical rangement of Voltage cource, measuring equipuai, baths OF OVENS, Clectrodes are possible, but itis essential that (7) all gates or doors providing access to spaces in which these are clecti- cally cocreized parts he interlocked to abut off the voltageHous 7, Harards ‘7.1 Waraing—Lethal voltages may be present during this test. It is essential that the test apparatus, and all associated equipment that may be electrically connected to it, be Froud a death condhative ors Ha or one, come into contact with during the test. Provide means for use at the completion of any test to ground any pants which: were at high voltage during the test; may have acquired an induced charge during the test: may retain a charge even afier disconnection of the voltage source. Thoroughly instruct all operators in the proper wav to conduct tests safely. When making high-voltage tests, particularly in compressed gas or in oil, the energy released at breakdown may be sufficient to result in fire, explosion, or rupture of the test chamber. Design tt coupe est chamber, and et specimens 90 a5 10 minimize the possibility of suck occurrences and to eliminate the possibility of personal injury. 7.2. Warning—Ozone is a physiologically hazardous gas at elevated concentrations. The exposure limits are set by governmental agencies and are usually based upon recom- mendations made by the American Conference of Govern- ‘mental Industrial Hygienists.’ Ozone is likely to be present whenever voltages exist which are sufficient to cause partial, or complete, discharges in air or other atmospheres that contain oxygen, Ovo bas a ditncuve odor which itially discernible at low concentrations but sustained Inhalation of ozone can cause tmporary lu of sensi 10 the scent of ozone. Because of this it is important to measure the concentration of ozone in the atmosphere, using com- mercially available monitoring devices, whenever the odor of ozone is persistently present or when ozone generating conditions continue, Ue sppropias icaum slo cubase vents, to reduce ozone concentrations to acceptable levels in sorting areas 8. Sampling 8.1 The detailed sampling procedure for the material being tested should be defined in the apecifcation Yor thet material 8.2 Sampling procedures for quality control purposes should provide for gathering of sufficient saunpes to estimate both the average quality and the variability of the lot being. examined; and for proper protection of the samples from the time they are taken until the preparation of the test speci- ‘mens in the laboratory or other test area is begua. 8.3 For the purposes of most tess it is desirable 10 take ‘samples from areas that are got immediately adjacent to obvious deferts ne discontinuities in the material The puter few layers of roll material, the top sheets of a package of sheets, or material immediately next to an edge of a sheet or roll should be avoided, unless the presence or proximity of defects or discontinuities is of interest im the investigation of the material. ‘8.4 The sample should be large enough to permit making ss many individual teats as may be required forthe putivalar material (see (2.3), ‘ Amiuble Grom the American Conreoce of Governmental todos! ‘ype Bldg No, D7, 6300 Gleneay Ave, Gatnaa, OH 45217, FIO. 1 Voltage Profile ofthe Short Time Test, 9. Test Specimens 9.1 Preparation and Handling: 1.1 Prepare specimens from samples collected im accor dance with Section 8. 9.1.2 When flat-faced electrodes are to be used, the ‘surfaces of the specimens which will be in contact with the cloctrodes shall be smooth parallel planes, insofar as possible 9.1.3 The specimens shall be of sufficient size to prevent ‘Oashover under the conditions of test. For thin materials it ‘may be convenient to use specimens large enough to permit making more than one test on a single picce. 9.14 For thicker materials (usually more than 2 mm thick) the breakdown strength may be high enough that ashover or intense surface partial discharges (corona) may ‘occur prior to breakdown. Techniques that may be used to prevent flashover, or to reduce partial discharge (corona) include: 9.1.4.1 Immerse the specimen in insulating oil during the ‘est. See X1.4.7 for the surrounding medium factors influ- acing breakdown. This may be necessary for specimens that, hhave not born dried and impregnated with oil, as well as for those which have been prepared in accordance with Methods 1D 2413, for example. (See 6.4.) 9.1.4.2 Machine a recess or drill a flat-bottom bole in one ‘or both surfaces of the specimen to reduce the test thickness, If dissimilar electrodes are used (such as Type 6 of Table |) and only one surface isto be machined, the larger of the two ‘electrodes should be in contact with the machined surface, (Care must be taken in machining specimens not to contam- inate or mechanically damage them, 9.1.43 Apply seals or shrouds around the electrodes, in contact with the specimen to reduce the teudeawy to Oash- over. 9.1.5 Materials that are not in flat sheet form shall be tested using specimens (and electrodes) appropriate to the ‘material and the geometry of the sample. It is essential that for these materials both the specimen and the electrodes be efined in the specification for the material. 9.1.6 Whatever the form of the material, if tests of other ‘than surfacoto-surface puncture strength axe to be made,0 149 s Time gQ ty ty ty Freres suring votes, Vr 025,050. 1, 25, 10,20 $0, se 100 KV. ‘Sip Vetage ten creat Fe o oe Txow, owe 50 10 ‘050 ow 101025, : ‘ove 25 1050 2 om 50.0 ton : ‘ovr 100 0 Ag * 05 (ter Sher Tie Tet ions cones cant ba rat “conan tate t=. Wee ‘Arata tp nes, 20 2 ha wd G00 198 Y20e 5 hg 3 7200, 608 eas FQ. 2 Voltage Profle of Step-by-Step Test define the spovimens und ihe electrodes tn the specification for the material. 92 In nearly all cases the actual thickness of the test specimen is important TInleet otherwise specified, meamure ‘the thickness afer the test in the immediate vicinity of the area of breakdown. Measurements shall be made at room temperature (25 + $°C), using the appropriate procedure of ‘Test Methods D 376. 10. Calibration 10.1 In making calibration measurements, take care that the values of vollage at the electrodes can be determined within the accuracy given in 6.2, with the test specimens in the circuit 10.2 Use an independently calibrated voltmeter attached to the output ofthe test voltage source to verify the securacy Of the measuring device. Electrostatic voltmeters, valtage dividers, or poteatial transformers having conaparable accl- racy may be used for calibration measurement. 10.3 At voltages above about 17 kV rms (16.9 KV peak) a sphere gap may be used to calibrate the readings of the Voltage-measuring device. Follow procedures a3 specified in ANSI C68.1 in such calibration. 11. Condittoaing 11.1 ‘The dielectric strength of most solid insalating mate- tials is influenced by tempersture and moisture content. “Materials so affected should be brought to equilibrium with FIG. 3. Vokage Protie of Sow Rate-ct-Rise Test ‘an atmosphere of controlled temperature and relative hu- midity before testing. For such auaterials, the conditioning should be included in the standard referencing this test ‘method. 11.2 Unless otherwise specified, follow the procedures in Practice D618. 11.3 For many materials the moisture content has more effect on dielectric strength than does temperature. Condi- ‘Soning times for these materials should be sufficiently long ‘to permit the specimens to reach moisture equilibrium as ‘well as temperature equitbrium. 11.4 Ifthe conditioning atmosphere is such that condea- sation occurs on the surface of the specimens, it may be desirable to wipe the surfaces of the opecimens immodiately before testing This will usually reduce the probability of surface fashover. 12, Procedere [Nore 2—Caation: se Section 7 before commencement of any test. 12.1 Methods of Voltage Application: 12.1.1 Method 4, Short-Time Test—Apply voltage uni- formly to the test electrodes from zero at one of the rates shown in Fig | until breakdown occurs. Use the short-time test unless otherwise specified. 12.4.1. When establishing a rate initially in order for it to be included in a new specification, select @ rate that, for a ‘given set of specimens, will give an average time to break- ‘down of between 10 and 20's. It may be necessary to ran one ‘or two preliminary tests in order to detcrmine the most ‘suitable rate-of-rise. For many materials a ratc of 500 V/sia used. 12112 U the dovamem refeeacing this wet method Specified a rate-of-rse, it shall be used consistently in spite. Occasional average time to breakdown falling outside the range of 10 to 20s. In this case, the times to failures shall be comparing different material, the same rate-of-rise shall be used with preference@ ous siven 104 rate that allows the average time to be between 10 ‘and 208 Ifthe time to breakdown cannot be adbered to, the time shall be made a part of the report. (2.1.2 Method B, Step-by-Step Test—Apply voltage to the test electrodes at the preferred starting voltage and in steps ‘aud duration as showa ia Fig. 2 wulil breakilowa ocurs. 1212.1 From the fist in Fig, 2 select the initial voltage, ¥,, to be the one closest to 50 % of the experimentally determined or expected breakdown voltage under the short time test 12.1.2.2 If an initial voltage other than one of the pro- {erred valoes listed in Fig. 2 is selected, itis recommended ‘that the voltage steps be 10 % ofthe preferred initial voltage immediately below the selected value. 12.1.2.3 Apply the initial voltage by increasing the voltage from ero as eapidly as can be accomplished without introducing a peak voltage exceeding that permitted in 6.1.3. Similar requirements shall apply 1 the procedure increase the voltage between successive steps. After the inital step, the time required to raise the voltage to the succeeding ‘step shall be counted a5 part of the time at the succeeding, step. 121.24 If breakdown oocurs while the voltage is being increased to the next step, the specimen is described as having sustained a dielectric withstand voltage, V,, equal to the voltage of the step just ended. If breakdown occurs prior to the end of the holding period at any step, the dielectric Withstand voltage, Ve, for the specimen is taken as the voltage atthe last completed step. The voltage at breakdown, Yeu 18 10 be used to caleuiate dielectne breakdown strength, ‘The dielectric withstand streagth is to be calculated from the thickness and the dielectric withstand voltagc, Va. (See Fig. 2) 12.1.2.5 Itis desirable that breakdown occur in four to ten steps, Dut in not tess than 120 s. If failure occurs at tbe third step or less, or in less than 120 5, whichever is greater, om more than ‘one specimen in a group, the tests should be repeated with a lower initial voltage. If failure does not occur ‘before the twelfth step or greater than 720 s, increase the inital voltage. 12.1.2.6 Record the initial voltage, the voltage steps, the breakdown voltage, and the length of time that the break- down voltage was held. If failure occurred while the voltage ‘was being increased to the starting voltage the failure time shall be zero. 12.1.2.7 Other time lengths for the voltage steps may be specified, depending upon the purpose of the test. Com- ‘monly used lengths are 20 $ and 300 s (5 min). For research, ‘purposes, it may be of value to conduct tests using more than, fone time interval on a given material 12.1.3 Method C, Slow Rate-of Rise Test—Apply voltage to the test electrodes, from the starting voltage and at the rate shown in Fig. 3 until breakdown oocurs 12.131 Select the initial voliage from short-time tests made a8 specified in 12.1.1. The initial voltage shall be reached 2s specified in 12.1.2.3. 12.1.3.2 Use the rate-oF-voltage rise from the initial value specified in the document calling for this test method. Oraianly the rte cleted to approximate the average rate for a T2133 If more than one specimen of a group of speci ‘mens breaks down in fess than 120, reduce either the initial voltage or the mteof-ise, or both. 12.1.3.4 If more than one specimen of 2 group of speci- ‘mens breaks down at less than 1.5 times the initial voltage, reduce the inital value, If breakdown ‘occurs at a value greater thau 2.5 tues the initial value (amd at a time of over 120 2), increase the initial voltage. 12.2 Criteria of Breakdown—Dielectric failure or dielec- tic breakdown (a8 defined in Terminology 1 1711) consists of an increase in conductance, limiting the electric field that can be sustained. This phenoorenon is most commonly evidenced during the test by an abrupt visible and audible ‘rupture through the thickness of the specimen, resulting 1 a visible puncture and decomposition of the specimen in the breakdown area. This form of breakdown is generally reversible. Repeated applications of voltage will sometime sesult in failure at lower voltages (sometimes unmeasurably toe, muly with tional damage athe Wears ae repeated applications of ved t0 gi prative Cadence of breakdown tod to make as eakdowrs path more visible. 122.1 A rapid rise in leakage current may result in ‘tipping of the voltage source without visible decomposition of the specimen. This type of failure, usually associated with Sowsie ems a lvaed tempers, uy fn soe canes be reversible, that is, the dielectric strenglh may or the prntaca b lowed to ood to ordeal tk temperature before reapplying voltage. The voltage source ‘must tip rapidly at relatively low current for this type of failure wy Govan 12.2.2 Tripping of the voltage source may oocur due to flashover, to partial discharge current, to reactive current in a ‘high capacitance specimen. or io malfunctioning of the breaker. Such iaterupions of the tex do not coositute breakdown (except for flashover tests) and should not be ‘considered 2s a satisfactory test. 12.2.3 If the breaker is 3e1 (Or t00 high a cument, oF ifthe breaker malfunctions, excessive burning of the specimen will occur. 12.3 Number of Tests—Make five breakdowns unlees otherwise specified for the particular material. 13. Calcalation 13.1 Caleulate for cach test the dielectric strength in KV/mm or V/mil at breakdown, and for step-by-step tests, the gradieat at the highest voltage step at which breakdown did not occur, 13.2 Caleufate the average diclectric strength and the standard deviation, or other measure of variability. 14, Report 14.1 Report the following information: 14.1.1 Identification of the test sample. 14.1.2 For Each Specimen: 14.1.2. Measured thickness, 14,122 Maximum voltage’ withstood (for step-by-step tests), 14.1.23 Dielectric breakdown voltage, 141.24 Dielectric strength (For step-by-step tests} 2 ‘breakdown strength, and@ os TABLE 2 Dlolectc Strength“ Deta Summary From Four Laborstories Cd Therese ac Seog ma a strat vous front _ = - oe 9 Rinne v7 “hoe 0 Tio = 77 Torenem 0 10 ss 18 = we 1 reno Reve oes xn we ae ms ma cove Es newt cote 20 20 20 m a come Prope ora eae “= on mm « ss weed Son nipae 0% we “ ~ “ ” ret tence mes ‘7 os - a ~ ‘mente cama ow oo oe m= “ + oe — = Set deviation and coefficient of variation, ieee 1 Bee ae 14,1.3.6 Ambient atmosphere temperature and relative humidity, 14,1.3.7 Surrounding medium, Hit Remene 14.1.3.9 Description of electrodes, 14.13.10 Method of voltage application, SE et coc cene ‘sensing element, and 14.1.3.12 Date of test. 15, Precision and Bias 15.1 The results of an toterlaboratory study with four laboratories and eight materials are summarized in Table 2. This study made use of one electrode system and one test medium." 15.2 Single-Operator Precision—Depending upon the (erty ofthe sari! belag se the specimen hick ‘ness, method of voltage application, and the extent to which transient voltage surges are controlled or suppressed, the coefficient of variation (standard deviation divided by the ‘mean) may vary from a low 1 % to as high as 20 % or more. The comic report ix eailble home ASTM Hondgeaners Request RRDOR AES, ‘When making duplicate tests on five specimens from the same sample, the cocfficicat of variation usually is less than 98, 15.3 Multilaboratory Precision—The precision of tests made in different laboratories (or of tests made using dlfereat equipment in the same laboratory) is variahie Using identical types of equipment and controlling specimen ‘preparation, electrodes and testing procedures closely, the ‘precision is approachable. When making a direct comparison of results frum: wo or more laboratories, isa te - bcs : thickness, 15.4 If the material under test, the specimen the clectrode configuration. or the surrounding medivm differs from those listed in Table 1, or if the failure criterion of the current-sensing element of the test equipment is not closely ‘controlled, the precisions cited in 15.2 and 15.3 may not be realized. Sundards ‘whlch refer 10 nis metood” should determine for the material with which that standard is concerned the. lic ‘of this precision statement to that Particular material. Refer to $.4-5.8 and 6.1.6. 15.5 Use special techniques and equipment for materials having a thickness of 0.001 in, or less. The electrodes must ‘not damage the specimen upon contact. Accurately deter- mine the voltage at breakdown, 15.6 Bias—This test method does not determine the intrinsic dielectric strength. The test values are dependent pon specimen geometry, clecuodcy, aml oer ariae factors, in addition to the properties of the sample, so that it is not possible to make a statement of bias.ous APPENDIXES: (Nonmandatory Information) X1. SIGNIFICANCE OF THE DIELECTRIC STRENGTH TEST XL Introduction XI.1.1 A brief review of three postulated mechanisms of ‘breakdown, namely: (/) the discharge or corona mechanism, Sol asa daca he pip cay eee ss as well as a of tests (on practical dielectrics, are given here to aid in interpreting the data. The breakdown mechanisms usually operate in combination rather than singly. The following discussion applies only to solid and semisolid materials. ‘X12 Postulated Mechanisms of Dielectric Breakdowa X1.21 Breakdown Caused by Electrical Discharges—in many tests on commercial materials, breakdown is caused by electrical discharges, which produce high local fields, With ‘solid materials the discharges usually occur in the sur- rounding medium, thus increasing the test area and pro- ducing failure at or beyond the electrode edge. Discharges may occur in any internal voida or bubbies that are present or may develop. These may cause local erosion or chemical decomposition. These processes may continue until a com- plete failure path is formed between the electrodes. X122 7 ‘Breakdown—Cumulative beating do- velops in local paths within many materials when they are subjected to high clectric field intensities, causing dielectric ‘and jonie conduction losses which yrucraie heat OTe Tapidly than can be dissipated. Breakdown may then occur ‘Decause of thermal instability of the material. X1.23 Intrinsic Breakdown—If electric discharges or ‘thermal instability do not cause failure, breakdown will still ‘occur when the field intensity becomes sufficieat to accel erate electrons the material. This critical field intensity is called the tntrinsic dielectric strength. Tt cannot ‘be determined by this test method, although the mechanism itself may be involved. X13 Nature of Electrical Insulating Materials 1.3.1 Solid commercial electrical insulating materials ‘are geacrally nonhomogeneous and may contain dielectric defects of various kinds. Dielectric breakdown oflen occurs in an area of the test specimen other than that where the field intensity is greatest and sometimes in an area remote from the maictial dircely between the electrodes. Weak spots within the volume under stress sometimes determine the test results, XA Influence of Test and Specimen Conditions X1.4.1 Electrodes—tn general, the breakdown voltage will tend to decrease with increasing electrode area, this area effect being more pronounced with thin tet specimens. Test results are also affectod by the electrode geometry. Results, ‘may be affected also by the material from which the electrodes. ‘ee constructed, since the thermal and discharge mechanism ‘may be influenced by the thermal conductivity and the work Function, reepectively, of the clectrode material. Generally speaking, the effect of the electrode misterial is difficult to ‘establish because of the scatter of experimental data. X142 Specimen Thickness—The dielectric strensth of sid coumercal ctl insulating mais i eety ependent upon the specimen thickness. Experience ‘varies inversely as a fractional power of the spec- shown srongth imen tures, but the extent to which this is true depends upon the material under text. When it i enown that a material wil he required to function at other than normal room temperature, itis essential that the dielectric strength-temperature rela- tionship for the material be determined over the range of expected operating temperatures. X14 Time Tea reals wil be infused by the rate ‘of voltage application. In general, the breakdown voltage tend to increase with increasing rate of voliage application. ‘This is to be expected because the thermal breakdown iechanian i tim dependent andthe ctge mechanism is usually time-dependent, although in some cases the i mechanism may cause rapid failure by producing critically X1.45 Wave Form—In geoeral, the dielectric strength is {influenced by the wave torm ot the applied voltage. Within the limits specified in this method the influence of wave form is not significant, XIA6 Froquency—The diclotric streagth is mot signifi. cantly infiuenced by frequency variations within the range of commercial power frequencies provided for in this method. a otber than commercial power frequencies (50 to 60 Fiz) ‘must not be made from results obtained by this method. X47 Surrounding Medium—Solid insulating materials having a ‘bigh Dreakdown vonage are usually tested by ‘immersing the test specimens in a liquid dielectric such as@ p10 transformer oil, silicone oil, or chlorofluorocarbons, in order {o minimize the effects of surface discharges prior to break down. It has been shown by S. Whitehead"? that in order to avoid discharges in the surrounding medium prior to reaching the breakdown voltage of the solid test specimen, in ‘alternating voltage tests itis necessary that Eatin VDa? +1 > Be, VDF 41 the fiquid immersion medium is a low loss material, the criterion simplifies to Eetn> Be VDF ET and if the liquid immersion medium is a semiconducting ‘material the criterion becomes EnFu > 2Rft, toh, ‘m refers to immersion medium, + refers to relative, O refers to free (eg = 8854 16-9 Fe) and refers to solid dielectric, X1.4.7.1 Whitehead points out that it is therefore desir- able to increase Eq ad Ey, OF specimen and low permittivity the term containing 1, becomes relatively insig- the product of permittivity and electric streagth, Whitehead also mentions (p. In cases of lange thickness of | of specimen, nificant and is approximately a constant. 5 EMME S, Plt Breakdown of Sods, Oxort Usivnity Pram, ts '3 Star, R. W.,“Dilesaric Materials foainabion Study” Interim Engineering, Report No.5, index No ME-II1273. Avani from Mical Set Spee, (Garman Tacheical Liar, Code SEA 098 312, baal Cone, Wibgon, be zes625S101 261) that the use of moist semiconducting oil can affect an ppreciable reduction in edge discharges. Unies the break: down path between the electrodes is solely withia the solid, results in one medium cannot be compared with those i Aiflereat medium. It should also be noted that if the soli fe XI48 Relative Hurnidiiy—The relative humidity inlli- fences the dielectric strength to the extent thal moisture absorbed by, or on the surface of, the material under test affects the diclectric logs and surface conductivity. Hence, te importance will depend to large extent upon the mature of the material being testod. However, even materials that absorb litle or mo moisture may be affected because of srcatly increased chemical effects of discharge in the presence ‘where the effect of exposure on dielectric strength is being investigated, it is customary to control or limit the relative huenidity ‘effects by standard ‘conditioning procedures. 1.5.2 The dielectric breakdown test may be used as a ‘material inspection or quality control test, as a means of inferring other conditions such as variability, of to indicate iorating processes such as thermal aging. In these uses of the teat it is the relative value of the breakdown voltage that is important rather than the absolute value. 2. STANDARDS REFEKRING TO TEST METHOD D149 2.1 Introdvetion X2.1.1 The lsting of documents in this appendix provides reference to @ broad range of ASTM standards concerned with determination of dielectric strength at power frequen- cies or with elements of test cyuipment or elements of procedural details used to determine this property. While every effort has been made to include as many as possible of the standards referring ta Test Method D 149, the list may not be complete, and standards written or revised after 0 Publication of this appendix are aot included. 22.1.2 In some standards which specify that the dielectric streagth or the breakdown voltage is to be determined in ‘secordance with Test Method D 149, the manner in which the refereace is made to this tet method is aut completly in conformance with the requirements of 5.5. Do not we another document, including those listed in this appendix, as 8 model for reference to this test method unless there is conformity with 5.5.