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Compression

The document outlines four methods for compressing test data: Ones-Count Compression, Signature Analysis using LFSR, XOR-Based Compaction, and Parity Compression. Each method provides a unique approach to reduce data storage while maintaining fault detection capabilities, with examples illustrating their functionality. The advantages of these methods include simplicity, efficiency, and effective error detection.

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0% found this document useful (0 votes)
22 views2 pages

Compression

The document outlines four methods for compressing test data: Ones-Count Compression, Signature Analysis using LFSR, XOR-Based Compaction, and Parity Compression. Each method provides a unique approach to reduce data storage while maintaining fault detection capabilities, with examples illustrating their functionality. The advantages of these methods include simplicity, efficiency, and effective error detection.

Uploaded by

228w1a0492
Copyright
© © All Rights Reserved
We take content rights seriously. If you suspect this is your content, claim it here.
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Download as PDF, TXT or read online on Scribd

1.

Ones-Count Compression
How It Works:
1. Collect the test output data.
2. Count the number of 1s in the output.
3. Store this count instead of the full data.
Example:
Test Output: 101110
• Count the 1s → 4.
• Store the value 4 instead of storing 101110.
Why Use It?
Simple and easy to implement.
Reduces the amount of stored test data.
Can be used in built-in self-test (BIST) systems.

2. Signature Analysis (LFSR - Linear Feedback Shift Register)


How It Works:
1. Instead of storing full test data, use a shift register to process and compress the output.
2. The LFSR (Linear Feedback Shift Register) applies a mathematical function to generate a
compressed signature.
3. The signature is compared with a known expected value to check if the circuit is faulty.
Example:
Test Output: 1101011101
• Instead of storing 10 bits, we pass it through an LFSR circuit.
• The LFSR generates a 4-bit signature (e.g., 1010).
• If the circuit is fault-free, the signature matches the expected signature.
• If there's a fault, the signature does not match, indicating an error.
Why Use It?
Highly compresses test data.
Detects faults efficiently.
Commonly used in Built-In Self-Test (BIST) circuits.

3. XOR-Based Compaction
How It Works:
1. Take multiple test outputs.
2. Apply bitwise XOR (exclusive OR) to compress the data.
3. The result is a smaller set of bits that still represents the original test information.
Example:
Test Outputs:
yaml
CopyEdit
1101
1011
• XOR operation:
markdown
CopyEdit
1101
⊕ 1011
--------
0110
• Instead of storing two 4-bit values, we store just one 4-bit value (0110).
Why Use It?
Compresses test data efficiently.
Reduces storage and testing time.
Good fault detection capability.

4. Parity Compression
How It Works:
1. Count how many 1s are in the test output.
2. If the number of 1s is even, store a parity bit = 0.
3. If the number of 1s is odd, store a parity bit = 1.
4. Compare the stored parity bit with the expected parity to detect faults.
Example:
Test Output: 1011
• Number of 1s = 3 (odd)
• Store parity bit: 1
Test Output: 1100
• Number of 1s = 2 (even)
• Store parity bit: 0
Why Use It?
Reduces storage to just one bit.
Quick error detection.
Used in simple fault detection applications.

Final Summary:
Compression
How It Works Example Advantage
Method
Ones-Count Counts the number of 1s
101110 → 4 Simple and effective.
Compression in test data.
Uses a shift register to
Signature 1101011101 → High compression and
create a compressed test
Analysis (LFSR) 1010 (signature) good fault detection.
signature.
Uses XOR to combine Reduces storage while
XOR-Based 1101 ⊕ 1011 =
multiple test outputs into keeping fault
Compaction 0110
fewer bits. information.
Stores only one parity bit
Parity 1011 → 1 (odd),
based on even/odd count Very simple and fast.
Compression 1100 → 0 (even)
of 1s.

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