Wa Unit 02% Types Levels of “esting. \s of Testing t- ~ Software lesKag levels are differen’ gtages of the si development \ifeeycle where lesking is conduele : - There are Four levels of anftwoare testing + Unid Testing | Enlegralion Teking } [Eisen “Teshos | 'y Bout Testing => A Yeve] of slw testing process where ‘individual anits of o slw are Wested- The parpese a to validate that each unite OF So performs of Hesigned, e” anlegeation Testing —> - ae A level of lw testing Process where individual ants are combined 4 fested as o group- The purpose of this level of testing is fo expose Faulls 10 the interocton be integrated unie, ke. here we test dcheck Phe dota Flow behween) hwo modules 4 expose Faulk. 3) System “Testing => Tevel of lw teshing process where 9 comptele, integrated syskem is fested. i.e. we test Pre end fo end scenario of gw, The purpose of Yhis is Fo evaluate the syster's compliance with Yoe specific sequivemen . a Acceptance Tesinwe 7 y BR vevel top 7, testing process where a system is tested) aw aceeplabliily . “Tesking of application ba We caskomer befure moving whe appt? '© production Cavirominend . “The purpose Of this fest Js euchuas® He system's. comptionces ith business requirements.Bok meknS Gait testing 38 & level of slw testing where endividue) units] components of slw are tested. — The purpesé is fo yolidoke that each unit of the sia pesforms as designed. A unit is re smallest testable part of ony slw. Ay usually has one °F afew iP 4 usually o single ofp. - ana procedural programming, o unt may bean individued pregram, — dt Js pesformed by using othe tevet of atesing 4 i funckon » procedure. ete. Lihite box tesHag method - — unit testing is te First performed prior fo Anteqrahen “Testing . = ay is nermatly perbormed by shw developers themsdlves oy their pees. tO rare cases, it mey clso he performed by independent slo testing + ODrivess 4 stubs in Voit “Teshop => 2 Driver Module, | Test Cases. [ee] [eve@ swes > (caved Plodule fenite ) ) STUBS — stubs are used in top-down Ancremente) antegraHu ~Vesting- that ave not integrated « = Ai is dummy me module Fak can receive or generale date . _ grub are ich as 0 femporary replacement of module & provide Same olP as ackual product . — Skub is called by the module under test. Eyample '=>- Assume we have S Modules , Module A» Ped e By, 4 module c. — Module A is ready + we need to fest ids but Modwe A calls Functions from mode B 4 modwe C which ave not wready, ~ So developer will write damny, module whic simulates B 4 co 4 Tehums values to module i — st} is dummy module code is known as shub sican simulde Pre behaviowy of lower-level module Jule which behave like original @_Davers_ =7 Ccalting module | Parent Modudel) . = Drivers ave used in bottom: up incremental integra kes, at can simulate Me behaviows of upper Level module. e tho) is not integrated ya = aye a gio which cals up test envivanment “bel? original modwe * srub.. = Drivers module: ack oS the ‘temporary veplacement of module 4 ack as the acrucl product. = priverss calls the Function fo be tesked Grample => low suppese we have module B+ Module c is veady but Module A which calls the functions Prom module & 4 ¢ is not ready so developer wil Write d dummy piece of code for modwe A wihich ewill veturn Velues fo module 846. This dummy piece of code IS Known d driver.o Imethod of S19 Tes bing ae Anlegrson 12 ing => = antegration Testing is where individued units are combined + otter unit testing is process tesbed as o exsingte gteup _ avis always done applied. ~ FH moinly focuses 09 testing daka communtcalin al) units of system _ ae maker use of myftologis os oo = — an 3y we check © dada Row behweer amen 4 appssach 4 increment appreach isb ® hwo modules = The main objective of \nleqration resting dekermine Faults in communicaion belween inleqrahed amit. anregyetnn Yesiy, ca — Fallowing ore reasons for performing antegration “Testi ~ module is developed boy sles developer whose level of O understanding + cgrammming, legic Moy not be same as of other siw developers from, project beam . tahile performing Integrakion testing , We wequirel We worles efficienty with — So. fo checle whether sl med) prrer modules of not. developing sing\e module, Phere is vis of changes yg tre clients . fy of error occurence due fe external — While \e sequirements — There is possibiti hardware interfaces for all of these reasons We need be perform integrakion testi ngoF anlegralion Testing CIT) % . : on i : ‘ ; : k pro des systemoakic wey Yor fesHng interacten or ere ee componen’s, sary fo checks whether slw modules K« Advantages 2) ab is neces ere, a Coie “Gls Jegralton Tesh nq o- Disadvantages Of 3 initiale only aftey al} unils ave 3) Since Wo can be designed less Hime is available fy festing . 2) wv is Ret, , Yo Find ook Yocakion of defect io . big-bang approach 3g integrakoo “Tesking , + Types of Antegralion “Testing 3- : roach | en Cancrerne Mt Approsch. ) Big Bang APP » ancremento) Approach &- \)-Tap -down Approach VD _ Bottom- OP Approach wy Sandwich Approach - @ ‘ Big Bang Approach => tris shadegy oll modules, of software & then together + wh ic tested a} once. = Adding all the modules al single sho data Flow Belween ‘them is cabled oS non-imerem ‘pa (Big Bang Testing . ry we are not sure obousd big bang esting | san creaked Fist they ave combine product ave cle goftware + + tesk any he J antegeokioo “Testing iheneve childs modules Pen WS SP for paxent +fig: Big Bang Appreach, - Example of big bang approach as. pey above ayl the modules from module 1 ft Module 7 © are combined one by one + then the \ntegrattion kesHing is performed. Fig. x Ravantages of Big Bang Approach > SS Suitable for small slw projects. | wz Disadvantages of Big Bang Approach => sy) Hading defects ic difHaalF tosle because we rest whole slw a once.’ ay There are lols of Intarfaces which needed fo e be tesh 2) an big-bang approach , there is possibility thoy Some jaterfaces links may Temains untested, © Aneremental Approach => , -an this approach , to perfor fesHing hoo oy more Modules axe Merged with eacy other which ave logicaltey related - The i 4 Procedure js dome with the h Programs which are Known as shubs 4 dein? oe= A_slub is dummy Program which is called ba Me Module on which tesking is performed We replace called Module by _shuib — Oriver is dummy pregran which calls another mode \We wephace moduke bo be fested by drivers ie. Naced by driver Calling modwe is ep’ hs unk atl of the modules are grouped together < tesked Incremental Fntegrovon teshing is performed using methods such as! successhallp Wwo different S Top - 4000 \nceementad integraktoo feasting - oe integration tesking. D> Bottom-up Inere mental Y Yor - down anveqs ation => -~ an Ye *° down OPP’ from the modules present oF ok Fhe bottom. - an top down approach 1 8 . [rmodute 2) Module x fon oad , testing is porformed op to modules are present shibs axe used for skin Fig: , TTop- down approach replace , Lower (evel modules with shul opp level modules are beskd evels modules are Hated, - ere We 7 an his “approach ' with Ress —+ Frew lower \Advantages oF Top down Approach => y adenKFicolion of bug is easy. a trical Modules ave tested on prior basis go txiHcol designing defects could be found 4 Fixed early ’ pisadvantages Of Toe down approach => Top down FesHing requires mony shubs because replacing, \ower level qrodules there is need of shbs. a> Modules present od lower level are tested Angatticiently becasse of lace oF Hme. ‘a _Bokkom= Op antegrotion => e@ . NS an bette “Up approach » 2very module present od lower level is rested with mmodwes present of Righer levds aki olf modebes ore tesbed. Ovivers are’ used While performing bottom q \necemental fesking - P & ‘Prodole 4 , Bottom- Hgt- Bottom - up approach . — Were we replace upper fevel modubes with driver — In bottom-up approach + testing (s pexformed om modwes wool Present, ot bottem to module present of