ISO 3745:1977 Acoustics Measurement Standards
ISO 3745:1977 Acoustics Measurement Standards
STANDARD 3745
INTERNATIONAL ORGANIZATION FOR STANDARDIZATION l MEXJJYHAPOAHA(I OPI-AHki3AUMX n0 CTAH~APTM3A~I4W.ORGANISATION INTERNATIONALE DE NORMALISATION
Descriptors : acoustics, acoustic measurement, noise (sound), sound sources, sound power, laboratory tests, enclosures.
Printed in Switzerland
ii
CONTENTS
2 References. ........................................ 3
3 Definitions ......................................... 3
iTeh STANDARD
5 Instrumentation PREVIEW
..................................... 5
8 ISO 3745:1977
Calculation of sound power level . . . . . . . . . . . . . . . . . . . . . . . . . . 9
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Information to be recorded ..............................
9 43b4ff37f48d/iso-3745-1977 16
Annexes
A Test room qualification procedures. . . . . . . . . . . . . . . . . . . . . . . . . 11
..I
III
iTeh This
STANDARD
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ISO 3745:1977
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43b4ff37f48d/iso-3745-1977
INTERNATIONAL STANDARD . IS0 37454977 (E)
0.1 RELATED INTERNATIONAL STANDARDS purposes of the test. The operating and mounting conditions
of the machine or equipment to be tested must be in
This International Standard is one of a series specifying accordance with the general principles stated in the basic
various methods for determining the sound power levels of documents.
machines and equipment. These basic documents specify
only the acoustical requirements for measurements
appropriate for different test environments as shown in
Guidelines for making these decisions are provided in IS0
table 1.
3740. If no sound test code is specified for a particular
When applying these basic documents, it is necessary to machine, the mounting and operating conditions shall be
decide which one is most appropriate for the conditions and fully described in the test report.
ISO 3745:1977
International https://standards.iteh.ai/catalog/standards/sist/ef56a1fb-a339-45da-b4b8-
Classif ication Volume Character Sound power levels Optional information
Standard
of method
Test environment 43b4ff37f48d/iso-3745-1977
of source of noise obtainable available
No.*
Steady,
3741
broad-band
Reverberation
In one-third A-weighted sound
room meeting
Precision Steady, octave or octave power
specified
discrete- bands level
3742 requirements
Preferably less frequency or
than 1 % of test narrow-band
l room volume
.
Steady,
Special broad-band
A-weighted and Other weighted sound
3743 Engineering reverberant narrow-band,
in octave bands power levels
test room discrete-
frequency
Largest
Outdoors or in Directivity infor-
3744 Engineering dimension Any
large room A-weighted and mation and sound
less than 15,0 m
in one-third pressure levels as a
d octave or octave function of time;
Anechoic or Preferably less bands other weighted sound
3745 Precision semi-anechoic than 0,5 % of Any power levels
room test room volume
Steady,
No restrictions : Sound pressure levels
broad-band,
No special test limited only by as a function of time;
3746 Survey narrow-band, A-weigh ted
environment available test other weighted sound
discrete-
environment power levels
frequency
1
* See clause 2.
IS0 3745-1977 (E)
0.2 SYNOPSIS OF IS0 3745 The determination of the sound power radiated by a
sound source in a completely free field or in a free field
Applicability above a reflecting plane is based on the premise that the
Test environment reverberant field produced by the source is negligible and
that the total radiated power is obtained from the mean-
Free field (anechoic room) or free field over a reflecting square sound pressure averaged in time and in space over a
plane (semi-anechoic room). hypothetical sphere or hemisphere surrounding the source.
The radius of the sphere or hemisphere is chosen so that
Type of source
its surface is in the far radiation field of the source.
Device, machine, component, subassembly.
This International Standard, together with the others in
Size of noise source this series (see table I), supersedes lSO/R 495.
2
IS0 3745-1977 (E)
Hz
One-third octave band
centre frequencies
Hz
Standard deviation
of mean value
dB
I
3 DEFINITIONS
3.2 free field over a reflecting plane : A field in a homo- 3.10 far field : That portion of the radiation field of a
geneous, isotropic medium in the half-space above an noise source in which the sound pressure level decreases by
infinite, rigid plane surface. 3 dB for each doubling of the area of the measurement
surface. This is equivalent to a decrease of 6 dB for each
3.3 anechoic room : A test room whose surfaces absorb doubling of the distance from a point source.
essentially all of the incident sound energy over the In the far field, the mean -square pressure is prop0
frequency range of interest, thereby affording free-field to the total acoustic power radiated by the sou rce.
conditions over the measurement surface.
NOTE - For most practical sources, the far field begins at a
distance from the source which may be significantly less than 2a,
3.4 semi-anechoic room : A test room with a hard, where a is the largest dimension of the source.
reflecting floor whose other surfaces absorb essentially all
the incident sound energy over the frequency range of 3.11 near field : That portion of the radiation field of a
interest, thereby affording free-field conditions above a noise source which lies between the source and the far
reflecting plane. field.
3.5 surface sound pressure : The sound pressure averaged 3.12 volume of source under test : The volume of the
in time on a mean-square basis and also averaged over the whole object und er test.
measurement surface using the averaging procedures speci-
fied in clause 7.
A-weighted
iTeh STANDARD
the frequency band used shall be indicated; for example,
The test
sound pressure level, octave band sound
PREVIEW
room shall be large enough and shall have a
sufficiently high value of the total sound absorption to
NOTE - The mean sound pressure level at some reference radius 4.1.2 Criterion for background noise
is numerically different from the sound power level and its use in
lieu of the sound power level is not recommended.. At the microphone positions, the background sound
pressure level including any noise due to the motion of
3.8 frequency range of interest : For general purposes, the the microphone shall be at least 6 dB and preferably more
frequency range of interest includes the octave bands with than 12 dB below the sound pressure level to be measured
centre frequencies between 125 and 8 000 Hz and the in each frequency band within the frequency range of
one-third octave bands with centre frequencies between interest.
100 and 10 000 Hz. Any band may be excluded in which
the level is more than 40 dB below the highest band 4.2 Room volume
pressure level. For special purposes, the frequency range
In order to make measurements in the far radiation field
of interest may be extended at either end, provided the
of the source, it is recommended that the volume of the
test environment and instrument accuracy are satisfactory
test room be at least 200 times greater than the volume of
for use over the extended frequency range. For sources
the source whose sound power level is to be determined.
which radiate predominantly high (or low) frequency
sound, the frequency range of interest may be limited in
order to optimize the test facility and procedures. 4.3 Criteria for temperature and humidity
The air absorption in the test room varies with tempera-
3.9 measurement surface : A hypothetical surface of area ture and humidity, particularly at frequencies above
S enveloping the source on which the measuring points 1 000 Hz. For measurements according to this International
are located. For the purposes of this International Standard the temperature and the relative humidity shall be
Standard, the measurement surface is usually a sphere or controlled during the sound pressure level measurements
hemisphere of radius r. and held to as nearly constant values as practicable.
4
IS0 37454977 (E)
4.4 Criteria for the reflecting plane 5.3 Frequency response of the instrumentation system
The reflecting plane on which the source is located shall The frequency response of the instrumentation system,
extend at least to the measurement surface. The sound for the angle of incidence specified by the manufacturer,
absorption coefficient of the reflecting plane shall not shall be flat over the frequency range of interest within
exceed 0,06. the tolerances given in table 4.
5.1 General
The instrumentation shall be designed to measure the
level of- the mean-square sound pressure with A-weighting
or in octave or one-third octave bands, averaged over time
and over the measurement surface. Surface averaging is
usually carried out by measuring the time-averaged sound
pressure levels with a prescribed time constant for a fixed
number of microphone positions (see 7.3) and computing
the average value according to 7.7. 5.4 Weighting network, frequency analyser
NOTE - For establishing the presence of impulsive noise, the An A-weighting network meeting the tolerances of IEC
“impulse” meter characteristics according to I EC Publication 179A
Publication 179 and an octave band or one-third octave
shall be used in addition.
band filter set meeting the requirements of IEC Publication
The instr umentation used can perform the required time 225 shall be used. The centre frequencies of the frequency
averaging in two different ways iTeh STANDARD PREVIEW bands shall correspond to those of IS0 266.
a) By continuous
(standards.iteh.ai)
averaging of the squared signal using
NOTE
weighting,
- f other weighting
the characteristics
networks
of such networks
are used in addition
shall be reported.
to A-
6.1 General
The microphone and its associated cable shall be chosen 6.2 Installation of source
so that their sensitivity does not change over the tempera-
ture range encountered in the measurement. If the micro- Whenever a typical condition of mounting exists for the
phone is moved, care shall be exercised to avoid introducing source, that condition shall be used or simulated, if
acoustical noise (for example, wind noise) or electrical practicable. Sources which are normally supported by or
noise (for example, from gears, flexing cables, or sliding associated with a hard surface shall be installed in a semi-
contacts) that could interfere with the measurements. anechoic room (free field above a reflecting plane).
5
IS0 3745-1977 (E)
6.2.1 Method of mounting 2) device under full load (if different from 1));
Many small sound sources (for example, ballasts for
fluorescent lamps, electric clocks, etc.), although them- 3) device under no load (idling);
selves poor radiators of low-frequency sound, may, as a
result of the method of mounting, produce marked 4) device u nder operating cond ition corresponding
increases in low-frequency sound when their vibrational to maximum sound generation.
energy is transmitted to surfaces large enough to be
efficient radiators. Resilient mounting should be interposed The sound power levels of sources may be determined for
if possible between the device to be measured and the any desired set of operating conditions (i.e. temperature,
supporting surfaces so that the transmission of vibration humidity, device speed, etc.). These test conditions shall
to the support and the reaction on the source are both be selected beforehand and shall be held constant during
minimized. However, such resilient mounts shall not be the test. The source shall be in a stable operating condition
used if the device under test is not resiliently mounted in before any noise measurements are made.
typical field installations. In this case, the mounting base
shall have a sufficiently high impedance to prevent it from
vibrating and radiating sound excessively.
Care shall be taken to ensure that any electrical conduits, 7.2.2 Radius of test hemisphere
piping or air ducts connected to the equipment do not For measurements in a semi-anechoic room, the hypothe-
radiate significant amounts of sound energy into the test tical hemisphere shall be centered on the projection on the
room. If practicable, all auxiliary equipment necessary floor of the centre selected according to 7.2.1. The radius
for the operation of the device under test shall be located of the test hemisphere shall be equal to or greater than
outside the test room and the test room shall be cleared twice the major source dimension, or four times the average
of all objects which may interfere with the measurements. distance of the source from the reflecting plane, whichever
is the larger, and not less than 1 m. No microphone position
6.5 Operation of source during test shall be used which Ties outside the region qualified for
measurements according to annex A.
During the acoustical measurements, the source shall be
operated in a specified manner typical of normal use. One
or more of the following operational conditions may be NOTE - If a test hemisphere cannot be used, a measurement
appropriate : surface defined by a constant distance, d (i.e. the measurement
distance) from the radiating surface of the source may be used.
I) device under normal load operating at normal speed; The measurement distance, d, should not be less than 1 m.
IS037451977 (E)