M.tech VLSI Syllabus
M.tech VLSI Syllabus
(Formerly Uttarakhand Technical University, Dehradun Established by Uttarakhand State Govt. wide Act no. 415 of 2005)
Suddhowala, PO-Chandanwadi, Premnagar, Dehradun, Uttarakhand (Website- [Link])
SYLLABUS
For
Syllabus of [Link] in VMSB Uttarakhand Technical University, Dehradun for admissions in (2022-23) and onwards
VEER MADHO SINGH BHANDARI UTTARAKHAND TECHNICAL UNIVERSITY, DEHRADUN
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Courses Structure and Scheme of Examination for
M. Tech.- 2 Year Programme
VLSI Design
Semester I
Teaching
Sr. Course Internal Marks External Total
Course Name Scheme Credits
No. Type/Code Marks Marks
L T P CT TA Total
VDT301 CMOS Analog Circuit
1 Design
3 1 0 4 30 20 50 100 150
VDT302 Digital System Design
2 Using Verilog
3 1 0 4 30 20 50 100 150
VDT303 Semiconductor Devices
3 Theory and Modelling
3 1 0 4 30 20 50 100 150
4 VDT30X Professional Elective-I 3 0 0 3 30 20 50 100 150
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Professional Elective-
3 VDT31X 3 1 0 4 30 20 50 100 150
III
Professional Elective-
4 VDT31X 3 0 0 3 30 20 50 100 150
IV
5 OET30X Open Elective-2 3 0 0 3 30 20 50 100 150
Lab-III:VLSI Design
6 VDP303 0 0 3 1 25
Lab 25 25 50
7 VDP304 Lab- IV: TCAD Lab 0 0 3 1 25 25 25 50
Total 15 3 6 20 300 550 850
Open Elective-2
8 OET30X 3 0 0 3 30 20 50 100 150
(Optional)
Open Elective-2
(1) IoT and its Applications (4) Industrial Safety
(2) Artificial Intelligence and Machine Learning (5) Non-Conventional Energy Sources
(3) Composite Materials
Open Elective-2
(6) Nanomaterials and Nanotechnology
(7) Green Energy
(8) Industry4.0
(9) Operations Research
(10) Entrepreneurship Development Program
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Abbreviations: L-No. of Lecture hours per week, T-No. of Tutorial hours per week, P-No. of Practical
hours per week, CT-Class Test Marks, TA-Marks of teacher’s assessment including student’s class
performance and attendance,
1 Hr 1 Hr
2 or 3 Hr Practical
Lecture Tutorial
1
Credit 1 Credit 1 Credit
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Course Structure and Scheme of Examination for
[Link].-M. Tech. Dual 1 Year [Link]. Programme
VLSI Design
Semester III
Teaching
Sr. Course Internal Marks External Total
Course Name Scheme Credits
No. Type/Code Marks Marks
L T P CT TA Total
Advanced
1 AHT-301 3 1 0 4 30 20 50 100 150
Mathematics
FPGA Based
2 VDT310
System Design
3 1 0 4 30 20 50 100 150
3 OET30X Open Elective 3 0 0 3 30 20 50 100 150
Research
4 AHT-302 Methodology and 2 0 0 2 30 20 50 50 100
IPR
5 VDP305 Seminar 0 0 4 2 100 100 100
6 VDP306 Project 0 0 10 5 100 100 150 250
7 VDP307 Dissertation 0 0 12 6 300 300 300
Total 11 2 26 26 120 580 700 500 1200
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Abbreviations:L-No. of Lecture hours per week, T-No. of Tutorial hours per week, P-No. of Practical
hours per week, CT-Class Test Marks, TA-Marks of teacher’s assessment including student’s class
performance and attendance,
1 Hr 1 Hr
2 or 3 Hr Practical
Lecture Tutorial
1
Credit 1 Credit 1 Credit
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Course objectives:
Learning outcomes:
Course content:
Unit II: Partial differential equation and its applications: (10 hours)
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Introduction and classification of partial differential equation, Four standard forms of non-linear
partial differential equations and their solutions, linear equations with constant coefficients.
Applications of partial differential equationsone and two-dimensional wave equation, one and
two-dimensional heat equation, Two-dimensional Laplace’s equation.
Z-transform, Properties of Z-transform, Shifting theorems, Initial and final value theorem,
Convolution theorems, Inverse Z-transform, Application of Z-transform
Concept and laws of probability, Discrete and continuous random variable and their
distributions; Some special distributions such as Binomial, Poisson, Negative Binomial,
Geometric, Continuous uniform, Normal, Exponential, Weibull, Moments,Moment generating
functions, Expectation and variance
Practical demo with statistical software like R, SPSS, SAS, etc. (non-evaluative)
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CMOS Analog Circuit Design (VDT-301)
COURSE OBJECTIVES:
1. Design and implement the product level opamps and buffers for VLSI applications
2. Study the basic principle of operation, the circuit choices and the tradeoffs involved in the MOS
transistor level design common to all analog CMOS ICs.
3. Understand specific design issues related to single and multistage voltage, current and differential
amplifiers, their output and impedance issues, bandwidth, feedback and stability
5: Ability to design some CMOS analog circuits employing modern circuit concepts
COURSE CONTENT:
UNIT-1 : Importance, advantages and limitations of CMOS analog circuits; common source amplifier and
source follower; differential amplifier; offset voltage determination; Frequency response; noise analysis;
voltage follower, Flipped voltage follower (8 hours)
UNIT-2 : IC biasing-current sources, current mirrors and current-steering circuits, Wilson current mirror,
Cascode and modified Wilson Current Mirrors; Comparative analysis of various Current mirrors and their
features (8 hours)
UNIT-3 :CMOS op-amps: typical architectures, compensation techniques; stability considerations;
analysis and design; CMOS OTAs and CMOS single-ended transconductors (8 hours)
UNIT-4: Translinear principle, TL circuits, MOS TL circuits, Square root domain circuits, Typical
examples of MOS translinear circuits; Current Conveyors, CFOAs and other modern building blocks
(8 hours)
UNIT-5: General Techniques of non-linearity cancellation in MOS analog circuits and their applications;
Linearized transconductors, CMOS VCR realisation; CMOS multipliers/dividers; squarers and square-
rooters. (8 hours)
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Text Books:
1. Philip E. Allen and Douglas R. Holberg, CMOS Analog Circuit Design, Oxford University Press.
References:
1. Gray R., Paul, Hurst, J. Paul, Lewis H. Stephen and Meyer G. Robert, Analysis and Design of
Analog Integrated Circuits, John Wiley and Sons.
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Digital System Design Using Verilog (VDT-302)
L:T:P[Link] Credits-4
COURSE OBJECTIVES:
1. Design and operation of semiconductor memories frequently used in application specific digital
system
2. Design and diagnosis of processors and I/O controllers used in embedded systems
COURSE OUTCOMES:
At the end of the course the student will be able to:
1. To understand the concepts of VLSI design flow using HDL.
2. To understand the Design concept of the combinational Circuits.
3. To understand the Design concept of the Sequential Circuits
4. To understand, how to employ EDA tools to model a digital system.
5. To understand, how to Write test benches to verify the design.
(8 hours)
UNIT 4: TASKS AND FUNCTIONS DESIGN: Introduction, function, structure and scope of
function, task enabling, user defined primitive: combinational and sequential user defined
primitive, path delay, system task and functions, file based task and function. (8 hours)
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UNIT 5: QUEUES AND FINITE STATE MACHINE: Introduction, task for queue
initialization, task for adding and removing from the queue, design of finite state machine:
Moore machine and Mealy machine. (8 hours)
BOOKS:
1. Samir Palnitkar, “Verilog HDL, A Guide to Digital Design and Synthesis”, Second Edition,
Pearson Education, 2004
2. T.R. Padmanabhan, B. Bala Tripura Sundari “Design through Verilog HDL” Wiley India
Pvt. Ltd, 2008
3. J. Bhaskar, “Verilog HDL Synthesis”, BS publications, 2001.
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Semiconductor Devices Theory and Modelling (VDT-303)
L:T:P[Link] Credits-4
COURSE OBJECTIVES:
1. Theory of operation, modeling, parameter extraction, scaling issues, and higher order effects of active
and passive semiconductor devices
2. Understand the latest models for the devices that are valid out to very high frequencies and the use of
physical device modeling.
COURSE OUTCOMES
1. Understand the basic properties of semiconductors including the band gap, charge carrier
concentration, doping and charge carrier injection/excitation.
2. Explain the working, design considerations and applications of various semiconducting
devices including p-n junctions, BJT and Metal semiconductor Junction.
3. Understand the basics of MOS modelling.
4. Analyse and Model the MOSFET devices
5. Understand the comprehensive idea about small geometry effects.
Couse Contents:
UNIT-1 Band structure: Band structure evolution, E‐ k relation, Density of states, Carrier
Statistics, Semiconductors in Equilibrium and Carrier Transport in Semiconductors:
Semiconductor Materials, Carrier Concentration, Carrier Drift, Carrier Diffusion, Generation and
Recombination Process, Continuity Equation, Thermionic Emission, Tunnelling, Ballistic
Transport, High Field Effects. (8 hours)
UNIT-3 MOS Electrostatics in two terminal MOS structure: Energy band diagram in equilibrium
and under bias, Flat band voltage, Potential Balance and charge balance, Effect of gate body
voltage on surface condition, Accumulation and depletion, Inversion, CV Characteristics,
Frequency [Link] terminal MOS Structure: Introduction, Contacting the Inversion layer,
the body effect, Regions of inversion, VCB control. (8 hours)
UNIT-4 Four terminal MOS Structure: Introduction, Transistor region of operation, Complete all
region model, Simplified all region models, Model based on Quasi-Fermi Potential, Regions of
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inversion in term of terminal voltages, strong inversion, weak inversion, moderate inversion,
source referenced vs body referenced modelling, effective mobility, temperature effects.
(8 hours)
UNIT-5 Small Dimension Effects: Introduction, carrier velocity saturation, channel length
modulation, charge sharing, drain induced barrier lowering, punch through, hot carrier effects,
poly silicon depletion, quantum mechanical effects, DC gate current, junction leakage: band to
band tunnelling and GIDL, leakage currents. Ballistic FET: Introduction, channel transmission,
Introduction to the Virtual source model. (8 hours)
Text Books:
1. Semiconductor Device Fundamentals by Robert F. Pierret ,Pearson; 1st edition (1 January
2006)
2. Semiconductor Devices: Modeling and Technology by A Dasgupta, N. Dasgupta, Prentice hall
India Private Limited, 2004.
3. Semiconductor Devices, Physics and Technology, 3ed by S. M. Sze, Wiley; Eighth edition (1
January 2015)..
4. Operation and modeling of the MOS transistor by YannisTsividis, Oxford University Press,
2011
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Course Outcomes:
Syllabus Contents:
Meaning of research; objectives of research; basic steps of research; criteria of good research; Research
methods vs. Methodology. Types of research –criteria of good research; Meaning of research problem;
selection of research problem; Approaches of investigation of solutions for research problem, Errors in
selecting a research problem, Scope and objectives of research problem, Review of related literature-
Meaning, necessity and sources. (8 hours)
Research design: Types of research design- exploratory, descriptive, diagnostic and experimental;
Variables- Meaning and types; Hypothesis- Meaning, function and types of hypothesis; Null/Alternative
hypothesis; Sampling- Meaning and types of sampling; Probability and Non-Probability; Tools and
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techniques of data collection- questionnaire, schedule, interview, observation, case study, survey etc.
(8 hours)
Unit 3:REPORT WRITING AND ITS INTERPRETATION
Ethics-ethical issues, ethical committees (human & animal); scholarly publishing- IMRAD concept and
design of research paper, citation and acknowledgement, plagiarism and its concept and importance for
scholar. (8 hours)
IPR- intellectual property rights and patent law, commercialization, New developments in IPR; copy
right, royalty, trade related aspects of intellectual property rights (TRIPS); Process of Patenting and
Development; Procedure for grants of patents, Patenting under PCT;Patent Rights: Scope of Patent
Rights. Licensing and transfer of technology. Patent information and databases. (8 hours)
Reference Books:
1. Stuart Melville and Wayne Goddard, “Research methodology: an introduction for science
&engineeringstudents’”
2. WayneGoddardandStuartMelville,“ResearchMethodology:AnIntroduction”
3. RanjitKumar,2ndEdition,“ResearchMethodology:AStepbyStepGuideforbeginners”
4. Halbert,“ResistingIntellectualProperty”,Taylor&FrancisLtd,2007.
5. Mayall,“IndustrialDesign”,McGrawHill,1992.
6. Niebel,“ProductDesign”,McGrawHill,1974.
7. Asimov,“IntroductiontoDesign”,PrenticeHall,1962.
8. Robert P. Merges, Peter S. Menell, Mark A. Lemley, “ Intellectual Property in New
Technological Age”,2016.
9. [Link],“IntellectualPropertyRightsUnderWTO”,[Link],2008
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Low Power VLSI Design (VDT 304)
L:T:P[Link] Credits-3
COURSE OBJECTIVES:
1. Improvise on the latest techniques used for designing power-efficient logic gates, latches, and
flip-flops
2. Learn the latest MOS and bipolar models; breakthroughs in copper metallization, isolation and
deep submicron processes; and new approaches to designing logic gates, latches, and flip-flops.
Course Contents:
UNIT-I Introduction to Needs for Low Power VLSI Chips, Charging and Discharging
Capacitance, Short-circuit Current in CMOS Circuit, CMOS Leakage Current, Static Current,
Basic Principles of Low Power Design, Low Power Figure of Merits, Gate-level Logic
Simulation (8 hours)
UNIT-II Probabilistic Power Analysis of Random Logic Signals, Probability and Frequency,
Probabilistic Power Analysis Techniques, Signal Entropy, Transistor and Gate Sizing, Transistor
and Gate Sizing, Network Restructuring and Reorganization, Special Latches and Flip-flops,
Low Power Digital Cell Library, Adjustable Device Threshold Voltage(8 hours)
UNIT-III Logical Gate Reorganization, Signal Gating, Logic Encoding, State Machine
Encoding, Precomputation Logic, Power Reduction in Clock Networks, CMOS Floating Node,
Low Power Bus, Delay Balancing, Low Power Techniques for SRAM (8 hours)
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UNIT-V Challenges involved in low power Analog integrated circuits, issues about low supply
voltage, roadmap, Techniques to design and implement low voltage/low power analog circuits
like self cascode structure, flipped voltage follower, Bulk driven, FGMOS, QFGMOS etc.
(8 hours)
Reference Books:
1. Gary K. Yeap, , “Practical Low power Digital VLSI Design,” Springer
2. Rabaey, Pedram, “Low power design methodologies,” Kluwer Academic.
3. Kaushik Roy, SharatPrasad,“Low-Power CMOS VLSI Circuit Design,” Wiley.
4. Christian Piguet, “Low-power CMOS circuits: technology, logic design and CAD tools,”
CRC Press, Taylor & Francis Group.
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System on Chip Design(VDT 305)
L:T:P[Link] Credits-3
COURSE OBJECTIVES:
1. Understand the concepts of System on Chip Design methodology for Logic and Analog Cores
2. Understand the concepts of System on Chip Design Validation.
3. Understand the concepts of SOC Testing.
COURSE CONTENTs:
Unit-I System-level and SoC design methodologies and tools; (8 hours)
Text Books/References:
1. Black, J. Donovan, System C: From the Ground Up, Springer, 2004.
2. P. Marwedel, Embedded System Design, Springer, 2006.
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VLSI Signal Processing(VDT-306)
L:T:P[Link] Credits-3
COURSE OBJECTIVES:
Course Outcomes:
1. Ability to determine the parameters influencing the efficiency of DSP architectures and
apply pipelining and parallel processing techniques to alter FIR structures for efficiency
2. Ability to analyze and modify the design equations leading to efficient DSP architectures
for transforms apply low power techniques for low power dissipation
3. Ability to speed up convolution process and develop fast and area efficient IIR structures
4. Ability to develop fast and area efficient multiplier architectures
5. Ability to reduce multiplications and build fast hardware for synchronous digital systems
.
UNIT I INTRODUCTION TO DSP SYSTEMS, PIPELINING AND PARALLEL
PROCESSING OF FIR FILTERS: Introduction to DSP systems – typical DSP algorithms,
data flow and dependence graphs – criticalpath, loop bound, iteration bound, longest path matrix
algorithm, pipelining and parallel processingof FIR filters, pipelining and parallel processing for
low power. (8 hours)
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multipliers, design of lyon‟s bit-serial multipliers using Horner‟s rule, bit-serialFIR filter, CSD
representation, CSD multiplication using Horner‟s rule for precisionimprovement, Distributed
Arithmetic fundamentals and FIR filters (8 hours)
REFERENCES
1. Keshab K. Parhi, “ VLSI Digital Signal Processing Systems, Design and Implementation “,
Wiley, Interscience, 2007
2. U. Meyer – Baese, “ Digital Signal Processing with Field Programmable Gate Arrays”,
Springer, 2nd Edition, 2004.
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COURSEOUTCOMES(COs):
1. Todesignandperformanalysisoffundamentalbuildingblocksandbasicanalogcirc
uits.
2. tointroducecircuitdesignconceptsforbasicbuildingblocksusedinmixed-
signalintegratedcircuitdesigns.
3. To provide a foundation for more complicated and advanced circuit designs
4. To handle both practical design and layout issues involved.
COURSECONTENT:
Unit-I Analog and discrete-time signal processing, analog integrated continuous-
time and discrete-time filters, Analog continuous-time filters, passive and active
filters, basics of analog discrete-time filtersandZ-transform (8 hours)
Unit-II
Switched-capacitor filters, Non-idealities in switched-capacitor filters, switched
capacitor filter architectures, switched capacitor filter applications, (8 hours)
Unit-III
Basics of data converters, Successive approximation ADCs, Dual slope ADCs
,Flash ADC, Pipeline ADC (8 hours)
Unit-IV
Hybrid ADC structures, higher solution ADC, DAC, Mixed signal layout, Inter
connects and data transmission,Voltage-modesignalinganddatatransmission,Current-
modesignalinganddatatransmission. (8 hours)
Unit-V
Introduction to frequency synthesizers and synchronization, basics of PLL, Analog
PLL, Digital PLL, Delay Locked Loop(DLL). (8 hours)
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Text Books/References:
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Memory Technologies(VDT-308)
L:T:P[Link] Credits-3
COURSE OBJECTIVES:
COURSEOUTCOMES(COs):
1. Analysis the different types of RAM, ROM designs.
2. Analysis the different RAM and ROM architecture and interconnects.
3. Analysis about design and characterization technique.
4. Analysis of different memory testing and design for testability.
5. Identification of new developments in semiconductor memory design.
Course Content:
UNIT 1
Random Access Memory Technologies: Static Random Access Memories (SRAMs), SRAM
Cell Structures, MOS SRAM Architecture, MOS SRAM Cell and Peripheral Circuit, Bipolar
SRAM, SOl, Advanced SRAM Architectures, Application Specific SRAMs; DRAMs, MOS
DRAM Cell, BiC MOS DRAM, Error Failures in DRAM, Advanced DRAM Design and
Architecture, Application Specific DRAM. (8 hours)
UNIT 2
Non-Volatile Memories: High Density ROMs, PROMs, Bipolar & CMOS PROM, EEPROMs,
Floating Gate EPROM Cell, OTP EPROM, EEPROMs, Nonvolatile SRAM, Flash Memories.
(8 hours)
UNIT 3
Memory Fault Modeling Testing and Memory Design for Testability and Fault Tolerance: RAM
Fault Modeling, Electrical Testing, Pseudo Random Testing, Megabit DRAM Testing,
Nonvolatile Memory Modeling and Testing, IDDQ Fault Modeling and Testing, Application
Specific Memory Testing. (8 hours)
UNIT 4
Semiconductor Memory Reliability and Radiation Effects: General Reliability Issues, RAM
Failure Modes and Mechanism, Nonvolatile Memory, Reliability Modeling and Failure Rate
Prediction, Reliability Screening and Qualification. Radiation Effects, SEP, Radiation Hardening
Techniques. Process and Design Issues, Radiation Hardened Memory Characteristics, Radiation
Hardness Assurance and Testing. (8 hours)
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UNIT 5
Advanced Memory Technologies and High-density Memory Packing Technologies: Ferroelectric
Random Access Memories (FRAMs), Gallium Arsenide (GaAs) FRAMs, Analog Memories,
Magneto Resistive Random Access Memories (MRAMs), Experimental Memory Devices.
Memory Hybrids (2D & 3D), Memory Stacks, Memory Testing and Reliability Issues, Memory
Cards, High Density Memory Packaging, Future Directions, Introduction to digital tablet PC,
LCD, DVD player etc. (8 hours)
Reference Books:
1. Ashok K. Sharma, “Semiconductor Memories: Technology, Testing and Reliability",
1. Prentice- Hall of India Private Limited.
2. Ashok K Sharma, “Advanced Semiconductor Memories: Architectures, Designs and
3. Applications”, Wiley Interscience Publication.
4. Wen C. Lin, “Handbook of Digital System Design”, CRC Press.
5. KiyooItoh, “VLSI memory chip design”, Springer International Edition.
6. Chenming C Hu, “Modern Semiconductor Devices for Integrated Circuits”, Prentice
Hall.
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COURSE OBJECTIVES:
1. Analyzing the control-flow and data-flow of a software program and a cycle-based hardware
description
2. Partitioning simple software programs into hardware and software components, and creating
appropriate hardware-software interfaces to reflect this partitioning
3. Identifying performance bottlenecks in a given hardware-software architecture and optimize them
by transformations on hardware and software component
Course Outcomes:
1. Describe The Broad Range of System Architectures and Design Methodologies that currently
exist and define their fundamental attributes.
2. Discuss the Dataflow Models as a State-of-the-Art Methodology to Solve Co-Design Problems
and to Optimize the balance between Software and Hardware.
3. Understand in Translating between Software and Hardware Descriptions through Co-Design
Methodologies.
4. Understand the State-of-The-Art practices in developing Co-Design Solutions to problems using
modern Hardware/Software Tools for building prototypes.
5. Understand the Concurrent Specification from an Algorithm, Analyze its behavior and partition
the Specification into Software (C Code) and Hardware (HDL) Components
Couse Content:
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HW/SW Partitioning Problem, Optimization, HW/SW Partitioning Based On Heuristic Scheduling,
HW/SW Partitioning Based On Genetic Algorithms. (8 hours)
REFERENCE BOOKS:
1. Patrick Schaumont, “A Practical Introduction to Hardware/Software Co-design”, Springer,2010.
2. Ralf Niemann, “Hardware/Software Co-Design for Data Flow Dominated Embedded Systems”,
Kluwer Academic Publisher, 1998.
3. Jorgen Staunstrup, Wayne Wolf, “Hardware/Software Co-Design: Principles and Practice”,
Kluwer Academic Publisher,1997.
4. Giovanni De Micheli, Rolf Ernst Morgon, “Reading in Hardware/Software Co-Design”,
Kaufmann Publisher,2001.
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Course Outcomes:
1. Describe the architecture of FPGAs and logic design process and implement different logic
circuits on the internal architecture of FPGA
2. Write HDL codes of combinational and sequential Circuits and perform their functional
verification
3. Design the control unit of a Digital Circuit and implement it using Finite State Machines (FSMs).
4. Design of efficient and high speed adders and multipliers for optimizing the datapath of digital
circuits.
5. Analyze Digital design in terms of area, power and speed.
Course Contents:
UNIT-I Introduction: Different kinds of programmable logic devices: Field Programmable Gate
Array (FPGA), Programmable Logic Device (PLD), FPGA manufacturers (Xilinx, Altera, Actel,
Lattice Semiconductor, Atmel). FPGA applications. Adjoining devices. Instruments and
software. (8 hours)
UNIT-II The Structure of FPGA: FPGA general description. Different kinds of FPGA packages.
FPGA architecture. Internal hard modules of FPGA (CLB, Block RAM, DCM), their meanings
and usage. Different kinds of I/O modules, their usage and configuration. FPGAs Field
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Programmable Gate Arrays–Logic blocks, routing architecture, Design flow,Technology
Mapping for FPGAs. (8 hours)
UNIT-III FPGA Design Flow: Architecture design. Project design using Verilog Hardware
Description Language (HDL). Defining testing methodology and test bench design. RTL
simulation, synthesizing, implementation, gate level simulation of design. Reusing of internal
hard modules during design and implementation. (8 hours)
UNIT-IV Testing Methodology: Functional and gate level testing. SDF file description and
usage. (8 hours)
Reference Books:
1. Scott Hauckand Andre Dehon. Reconfigurable Computing: The Theory and Practice of
FPGABased Computation.
2. [Link]& S. Mourad, Digital Design using Field ProgrammableGate Array, Prentice Hall.
2. [Link], Edr., Field Programmable Gate Array Technology,Kluwer Academic Pub.
3. J. Old Field, [Link], Field Programmable Gate Arrays, John Wiley& Sons, Newyork.
4. V. Sklyarov, L. Skliarova, A. Barkalov, L. Titarenko. Synthesis and Optimization of
FPGA‐ Based Systems. Springer; 2014
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VLSI CIRCUIT DESIGN(VDT-311)
L:T:P[Link] Credits-4
COURSE OBJECTIVES:
COURSE OUTCOMES:
UNIT 5: Testing, Debugging, and Verification: Test vectors, Fault Models, Observability,
Controllability, Repeatability, Survivability, Fault Coverage, Automatic Test Pattern Generation
(ATPG),Delay Fault Testing, Ad Hoc Testing, Scan Design, Built-In Self-Test (BIST), IDDQ
Testing, Design for Manufacturability, Boundary Scan etc. (8 hours)
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BOOKS :
1. Rabaey, Chandrakasan and Nikolic, “Digital Integrated Circuit: A Design Perspective”, PHI;
Latest Edition.
2. Sung-Mo Kang, Yusuf Liblebici, “CMOS Digital Integrated Circuits,” Tata Mc Graw Hill.
3. Weste and Eshraghian, “Principles of CMOS VLSI Design” Addison Wesley, Latest Edition
4. Weste and Harris, “CMOS VLSI Design”
5. Ajit Pal, ―Low-Power VLSI Circuits and Systems‖, Springer, 2015.
6. K. Roy and S. C. Prasad, ―Low-Power CMOS VLSI Circuit Design‖, Wiley, 2000.
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Embedded System Design(VDT-312)
L:T:P[Link] Credits-4
COURSE OBJECTIVES:
1. Acquire knowledge about the basic functions, structure, concepts and applications of embedded
systems
2. Learn the method of designing and program an Embedded Systems for real time applications
3. Acquire knowledge about the development of embedded software using RTOS and implement
small programs to solve well-defined problems on an embedded platform.
COURSE CONTENTs:
Unit I
Formal definition of an Embedded System. Embedded system examples. Compare and contrast
embedded system and conventional/generic computer system. Overview of elements of an Embedded
system. Processor level implementation using (a) generic devices (b) full custom ASIP and (c) Soft
core implementation on FPGA. Key parameters of Embedded System Design (Time to market and
cost). (8 hours)
Unit II
Microcontroller Classification based on memory access, ISA, data bus width. Example
microcontroller families (8-bit, 16-bit and 32-bit examples). Memory technologies, Memory interface
busses. Desirable microcontroller features. Development, debugging and testing tools. Elements of
Microcontroller ecosystem: Reset, Clock, Power supply and program download options. (8 hours)
Unit III
AVR Microcontroller architecture details. Elements of physical interfacing: Input devices, Output,
environmental sensors, actuators. Elements of analog signal processing. Inter and Intra-device
communication Interfaces. Real Time Clock. Storage devices. Power supply topologies for
embedded systems. (8 hours)
Unit IV
Elements of Embedded C programming; pointers and memory optimization, bit-wise operations,
using and creating device library, Compiler optimization. Interrupt driven programming and
Foreground-background programming model. (8 hours)
Unit V
Introduction to RTOS. Threads, Processes and Message Passing. Basics of scheduling. Complete
system design example. Security in embedded systems. System testing and debugging. (8 hours)
Text Books:
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1. Embedded System Design: Embedded Systems Foundation of Cyber-Physical Systems and
the Internet of Things. 3rd Edition. Peter Marwedel. ISBN 978-3-319-56043-4. Springer.
2. Embedded Hardware: Know It All. Jack Ganssle et al. ISBN: 0750685840. Newnes.
3. Designing Embedded Hardware. 2nd Edition. John Catsoulis. ISBN: 0596007558. O'Reilly
4. Embedded Systems: World Class Designs. Jack Ganssle. ISBN: 0750686251. Newnes.
COURSE OBJECTIVES:
Deal with the study of VLSI design flow, Functional verification, verification flow, need of electronic
testing, fault modeling, test generation for combinational circuits
Course Contents:
Test generation basics - test generation algorithms - path sensitization - Boolean difference –
Dalgorithm– PODEM - Testable combinational logic circuit design.
Testing of sequential circuits as iterative combinational circuits - state table verification - test
generation based on circuit structure - Design of testable sequential circuits - Ad Hoc design
rules - scan path technique (scan design) - partial scan - Boundary scan
UNIT IV - MEMORY, DELAY FAULT AND IDDQ TESTING (8 hours)
Testable memory design - RAM fault models - test algorithms for RAMs – Delay faults –Delay
test- IDDQ testing - testing methods - limitations of IDDQ Testing
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Test pattern generation of Built-in Self-Test (BIST) - Output response analysis – BIST
architectures.
Reference Books:
1. P. K. Lala, “Digital Circuit Testing and Testability”, Academic Press.
2. M.L. Bushnell and V.D. Agrawal, “Essentials of Electronic Testing for Digital, Memory and
Mixed-Signal VLSI Circuits”, Kluwar Academic Publishers.
3. N.K. Jha and S.G. Gupta, “Testing of Digital Systems”, Cambridge University Press.
4. ZainalabeNavabi, “Digital System Test and Testable Design: Using HDL Models and
Architectures”, Springer.
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ASIC DESIGN USING VERILOG(VDT-314)
L:T:P:: [Link] Credits-4
COURSE OBJECTIVES:
1. Understand how modern digital systems are designed based around the use of hardware
description languages, logic synthesis and mapping onto standard cell and field programmable
logic.
2. Understand non-logic-design issues in ASIC design, including timing, power, and verification.
3. Know how to approach block level optimization in ASIC design.
COURSE OUTCOMES:
At the end of the course, the student will be able to:
1. Explain VLSI design flow using HDL.
2. Design the combinational and sequential digital systems.
3. Employ EDA tools to model a digital system.
4. Write test benches to verify the design.
Course Contents:
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UNIT 4: TASKS AND FUNCTIONS DESIGN: Introduction, function, structure and scope of
function, task enabling, user defined primitive: combinational and sequential user defined
primitive, path delay, system task and functions, file based task and function. (8 hours)
UNIT 5: QUEUES AND FINITE STATE MACHINE: Introduction, task for queue
initialization, task for adding and removing from the queue, design of finite state machine:
Moore machine and Mealy machine. (8 hours)
BOOKS:
3. Samir Palnitkar, “Verilog HDL, A Guide to Digital Design and Synthesis”, Second Edition,
Pearson Education, 2004
4. T.R. Padmanabhan, B. Bala Tripura Sundari “Design through Verilog HDL” Wiley India
Pvt. Ltd, 2008
3. J. Bhaskar, “Verilog HDL Synthesis”, BS publications, 2001.
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Algorithms for VLSI Design Automation(VDT-315)
COURSE OBJECTIVES:
1. Understand techniques for electronic design automation (EDA), a.k.a. computer-aided design
(CAD)
2. Study IC technology evolution and their impacts on the development of EDA tools
COURSE OUTCOMES:
Course Contents:
UNIT 1: VLSI physical design automation and Fabrication VLSI Design cycle, New trends
in VLSI design, Physical design cycle, Design style, Introduction to fabrication process, design
rules, layout of basic devices (8 hours)
UNIT 3: Floor planning & pin assignment: Problem formulation, classification of floor
planning algorithms, constraint based floor planning, floor planning algorithms for mixed
block& cell design, chip planning, pin assignment, problem formulation, classification of pin
assignment algorithms, General & channel pin assignment Placement Problem formulation,
classification of placement algorithms, simulation base placement algorithms, recent trends in
placement (8 hours)
UNIT 4: Global Routing and Detailed routing: Problem formulation, classification of global
routing algorithms, Maze routing algorithm, line probe algorithm, Steiner Tree based
algorithms, performance driven routing Detailed routing problem formulation, classification
of routing algorithms, introduction to single layer routing algorithms, two layer channel routing
algorithms, greedy channel routing, switchbox routing algorithms. (8 hours)
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UNIT 5: Over the cell routing & via minimization: Two layers over the cell routers,
constrained & unconstrained via minimization Compaction: Problem formulation, classification
of compaction algorithms, One dimensional compaction, two dimension based compaction,
hierarchical compaction. (8 hours)
Reference Books :
1. NaveedShervani, “Algorithms for VLSI physical design Automation”, KluwerAcademic
Publisher, Second edition.
2. ChristophnMeinel& Thorsten Theobold, “Algorithm and Data Structures for VLSIDesign”,
Kluwer Academic Publisher.
3. R. Drechsler, “Evolutionary Algorithm for VLSI CAD”, Kluwer Academic Publication.
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Sensors and Actuators(VDT-316)
L:T:P:: [Link] Credits-3
COURSE OBJECTIVES:
Course Contents:
Unit-I Sensors/Transducers: Principles – Classification – Parameters Characteristics –
Environmental Parameters (EP) – Characterization Mechanical and Electromechanical Sensors:
Introduction – Resistive Potentiometer – Strain Gauge – Resistance Strain Gauge –
Semiconductor Strain Gauges -Inductive Sensors: Sensitivity and Linearity of the Sensor Types-
Capacitive Sensors:– Electrostatic Transducer– Force/Stress Sensors Using Quartz Resonators –
Ultrasonic Sensors (8 hours)
Unit-II Thermal Sensors: Introduction – Gas thermometric Sensors – Thermal Expansion Type
Thermometric Sensors – Acoustic Temperature Sensor – Dielectric Constant and Refractive
Index thermosensors – Helium Low Temperature Thermometer – Nuclear Thermometer –
Magnetic Thermometer – Resistance Change Type Thermometric Sensors –Thermoemf
Sensors– Junction Semiconductor Types– Thermal Radiation Sensors –Quartz Crystal
Thermoelectric Sensors – NQR Thermometry – Spectroscopic Thermometry – Noise
Thermometry – Heat Flux Sensors (8 hours)
UNIT-III Magnetic sensors: Introduction – Sensors and the Principles Behind – Magneto-
resistive Sensors –Anisotropic Magneto resistive Sensing – Semiconductor Magnetoresistors–
Hall Effect and Sensors –Inductance and Eddy Current Sensors– Angular/Rotary Movement
Transducers – Synchros –Synchro-resolvers - Eddy Current Sensors – Electromagnetic
Flowmeter – Switching Magnetic Sensors SQUID Sensors Radiation Sensors: Introduction –
Basic Characteristics – Types of Photo sensistors/Photo detectors– X-ray and Nuclear Radiation
Sensors– Fiber Optic Sensors. (8 hours)
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UNIT-IV Electro analytical Sensors: Introduction – The Electrochemical Cell – The Cell
Potential – Standard Hydrogen Electrode (SHE) – Liquid Junction and Other Potentials –
Polarization – Concentration Polarization-– References Electrodes - Sensor Electrodes – Electro
ceramics in Gas Media . Smart Sensors: Introduction – Primary Sensors – Excitation –
Amplification – Filters – Converters – Compensation– Information Coding/Processing - Data
Communication – Standards for Smart Sensor Interface – The Automation Sensors –
Applications: Introduction – On-board Automobile Sensors (Automotive Sensors)– Home
Appliance Sensors – Aerospace Sensors –– Sensors for Manufacturing –Sensors for
environmental Monitoring (8 hours)
Reference Books:
1. D. Patranabis – “Sensors and Transducers” –PHI Learning Private Limited.
2. W. Bolton – “Mechatronics” –Pearson Education Limited.
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Design for Testability(VDT-317)
L:T:P[Link] Credits-3
COURSE OBJECTIVES:
1. Apply the concepts in testing which can help them design a better yield in IC design
2. Tackle the problems associated with testing of semiconductor circuits at earlier design levels
3. Identify the design for testability methods for combinational & sequential CMOS circuits
COURSE CONTENTs:
Unit-I
Introduction to Testing: Testing Philosophy, Role of Testing, Digital and Analog VLSI Testing,
VLSI Technology Trends affecting Testing, Types of Testing, Fault Modeling: Defects, Errors
and Faults, Functional Versus Structural Testing, Levels of Fault Models, Single Stuck-at Fault.
(8 hours)
Unit-II
Logic and Fault Simulation: Simulation for Design Verification and Test Evaluation, Modeling
Circuits for Simulation, Algorithms for True-value Simulation, Algorithms for Fault Simulation,
ATPG. (8 hours)
Unit-III
Testability Measures: SCOAP Controllability and Observability, High Level Testability
Measures, Digital DFT and Scan Design: Ad-Hoc DFT Methods, Scan Design, Partial-Scan
Design, Variations of Scan. (8 hours)
Unit-IV
Built-In Self-Test: The Economic Case for BIST, Random Logic BIST: Definitions, BIST
Process, Pattern Generation, Response Compaction, Built-In Logic Block Observers, Test-Per-
Clock, Test-Per-Scan BIST Systems, Circular Self Test Path System, Memory BIST, Delay Fault
BIST.
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(8 hours)
Unit-V
Boundary Scan Standard: Motivation, System Configuration with Boundary Scan: TAP
Controller and Port, Boundary Scan Test Instructions, Pin Constraints of the Standard, Boundary
Scan Description Language: BDSL Description Components, Pin Descriptions. (8 hours)
Text Books/References:
1. Essentials of Electronic Testing for Digital, Memory and Mixed Signal VLSI Circuits-
M.L. Bushnell, V. D. Agrawal, Kluwer Academic Pulishers.
2. Digital Systems and Testable Design - M. Abramovici, [Link] and A.D Friedman,
Jaico Publishing House.
3. Digital Circuits Testing and Testability - P.K. Lala, Academic Press.
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L:T:P[Link] Non-credits
Course Objectives:
To develop effective writing and presentation skills in students.
To develop textual, linguistic and presentation competencies in students appropriate for their
professional careers.
Course Outcomes:
After the successful completion of course, the students will be able to:
CO1: Write clearly and fluently to produce effective technical documents.
CO2: Demonstrate an appropriate communication style to different types of audiences both orally and
written as per demand of their professional careers.
CO3: Communicate in an ethically responsible manner.
Course Contents:
WRITING SKILLS
Unit-I (4 hours)
Technical Writing-Basic Principles: Words-Phrases-Sentences, Construction of Cohesive Paragraphs,
Elements of Style.
Unit-II (4 hours)
Principles of Summarizing: Abstract, Summary, Synopsis
Unit-III (6 hours)
Technical Reports: Salient Features, Types of Reports, Structure of Reports, Data Collection, Use of
Graphic Aids, Drafting and Writing
PRESENTATION SKILLS
Unit-IV (6 hours)
Speaking Skills: Accuracy vs. Fluency, The Audience, Pronunciation Guidelines, Voice Control.
Unit-V (8 hours)
Professional Presentations: Planning, Preparing, Presentation Strategies, Overcoming, Communication
Barriers, Using Technology, Effective Presentations.
References:
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6. Barker, Larry L., “Communication”, Prentice-Hall.
7. Lesikar & Flatley, “Basic Business Communication-Skills for Empowering the Internet
Generation”, Tata McGraw-Hill.
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