SCOPE OF ACCREDITATION TO ISO/IEC 17025:2017

& ANSI/NCSL Z540-1-1994

MSI-VIKING GAGE, LLC

3130 Stanton Ct.
N. Charleston, SC 29418
Steve Sandlin Phone: 864 485 0569

CALIBRATION

Valid To: September 30, 2023 Certificate Number: 1387.03

In recognition of the successful completion of the A2LA evaluation process, accreditation is granted to this
laboratory to perform the following calibrations and dimensional inspections1, 9:

I. Acoustic

Parameter/Equipment Range CMC2 (±) Comments

Sound Level Meters 94 dB @ 1000 Hz 0.65 dB Sound level

114 dB @ 1000 Hz 0.70 dB calibrator

II. Chemical

Parameter/Equipment Range CMC2 (±) Comments

pH – Measuring 4 pH 0.040 pH pH buffer solutions

Equipment3 7 pH 0.034 pH
10 pH 0.04 pH

Conductivity3 – Measure 8.31 % IACS 0.31 % IACS Reference

29.34 % IACS 0.70 % IACS conductivity
58.78 % IACS 0.80 % IACS blocks
100.5 % IACS 0.97 % IACS

(A2LA Cert. No. 1387.03) Revised 3/31/2022 Page 1 of 30

III. Dimensional

Parameter/Equipment Range CMC2, 4 (±) Comments

Bore Micrometers Up to 12 in (34 + 1.1D) μin Master rings

Up to 304.8 mm (0.86 + 0.0011D) μm

Dial Bore Gages Up to 4 in:

(Bore Gage w/ Indicator) 0.000 01 in 7.1 μin Gage blocks/indicator
0.000 05 in 30 μin calibrator
0.0001 in 58 μin
0.0005 in 290 in
0.001in 580 in

0.000 25 mm 0.18 μm
0.001 mm 0.75 μm
0.0025 mm 1.5 μm
0.01 mm 7.2 μm
0.025 mm 14 μm

Calipers3 Up to 24 in (7.1 + 7.6L) μin Caliper checker,

(24 to 80) in (190 + 13L) μin gage blocks

Up to 610 mm (0.18 + 0.0076L) μm

(610 to 2032) mm (4.8 + 0.13L) μm

Caliper Checkers Up to 12 in (11 + 1.8L) μin

Electronic indicator
(25 to 305) mm (0.28 + 0.0018L) µm
amplifier, gage blocks
Up to 1800 mm (2 + L/350) µm
CMM

Caliper Gage3 –

Internal, External Up to 20 in (16 + 14D) μin Gage blocks,

Up to 508 mm (0.41 + 0.14D) µm ring gages

Depth Step Gages (0.5 to 11.5) in (12 + 3.0L) μin Electronic indicator
(12.7 to 290) mm (0.30 + 0.003L) μm amplifier, gage blocks

(A2LA Cert. No. 1387.03) Revised 3/31/2022 Page 2 of 30

 Parameter/Equipment Range CMC2, 4 (±) Comments

Cylindrical Ring Gages3 Up to 0.43 in 4.3μin Universal length

(0.43 to 17) in (11 + 0.63D) μin machine, master
rings, gage blocks
Up to 10.80 mm 0.11 µm
(15.24 to 430) mm (0.28 + 0.000 63D) µm

Up to 1800 mm (2.0 + L/350) µm CMM

Up to 6 in (67 + 6.4L) µin Vision system

Up to 152.4 mm (1.7 + 0.0064L) µm

Disc, Plug and Pin Gages3 Up to 39 in (7.9 + 0.92D) μin Universal length
Up to 1000 mm (0.20 + 0.000 92D) μm machine (ULM), gage
blocks

Up to 1800 mm (2.0 + L/350) µm CMM

Electronic Indicator Up to 0.02 in 9.3 μin Gage blocks, optical

Amplifier3 Up to 0.508 mm 0.24 μm flat

Optical Flats Up to 6 in 3.9 μin Master optical flat

Up to 152.4 mm 0.10 μm

Up to 12 in (1.3 + 1.8D) µin Roundness machine

Up to 304.8 mm (0.033 + 0.0018D) µm

Sine Bars –

Length Up to 20 in (67 + 6.4L) µin Vision system

(1.7 + 0.0064L) µm

Flatness Up to 20 in 28 µin Electronic indicator

Up to 508 mm 0.71 µm amplifier

Parallelism Up to 20 in 14 µin
Up to 508 mm 0.36 µm

(A2LA Cert. No. 1387.03) Revised 3/31/2022 Page 3 of 30

 Parameter/Equipment Range CMC2, 4 (±) Comments

Cylindrical Square –

Straightness Up to 12 in 22 µin Roundness machine

Roundness Up to 10 in (1.4 + 1.8D) µin

Squareness Up to 12 in 22 µin

Glass Scales Up to 12 in (67 + 6.4L) µin Vision system

Up to 304.6 mm (1.7 + 0.0064L) µm

Height Gages3 Up to 48 in 260 + 0.35L uin Gage blocks

Up to 1219.2 mm 6.6 + 0.000 35L μm

Indicators/LVDTs3 Up to 4 in:
0.000 001 7.1 µin Gage blocks,
0.000 05 in 30 µin indicator calibrator
0.0001 in 58 µin
0.0005 in 290 µin
0.001 in 580 µin

0.00025 mm 0.18 µm
0.001 mm 0.77 µm
0.0025 mm 1.5 µm
0.01 mm 7.4 µm
0.025 mm 15 µm

Length Standards3 Up to 38 in (8.0 + 1.3L) μin Universal length

Up to 1000 mm (0.20 + 0.0013L) μm machine (ULM)

Up to 40 in (16 + 0.89L) μin Gage blocks,

(508 to 1016) mm (0.41 + 0.000 89L) µm electronic indicator
amp

Up to 1800 mm (2 + L/350) µm CMM

Levels3 Up to 12 in 22 µin + 0.6R Surface plate, sine

Up to 304.8 mm 0.56 µm + 0.6R bar, gage blocks

(A2LA Cert. No. 1387.03) Revised 3/31/2022 Page 4 of 30

 Parameter/Equipment Range CMC2, 4 (±) Comments

Micrometers3 – Up to 60 in (6 + 13L) µin Gage blocks

Up to 1524 mm (0.15 + 0.013L) µm

(24 to 48) in (5.4 + 15L) µin

Up to 1219 mm (0.14 + 0.39L) µm

Groove Up to 4 in (0.96 + 16L) µin Gage blocks

Up to 101.6 mm (0.025 + 0.016L) µm

Depth Up to 12 in (580 + 3.3L) µin Gage blocks

Up to 304.8 mm (15+ 0.0033L) µm

Inside Up to 38 in (12 + 1.0D) µin Universal length

Up to 965.2 mm (0.30 + 0.001D) µm machine

(32 to 77) in (120 + 6.1L) µin + 0.6R Gage blocks

(812.8 to 1955.8) mm (3.1 + 0.006L) µm + 0.6R

Specialty Micrometers Up to 4 in (0.96 + 16L) µin Master pins

Up to 101.6 mm (0.025 + 0.016L) µm

Indicator Calibrators3 Up to 2 in (23 + 9.5L) µin LVDTs

(Mic Head Type) Up to 50.8 mm (0.6 + 0.0095L) µm

Parallels Up to 20 in 14 μin Electronic gage

Up to 508 mm 0.36 μm amplifier

Plain Pins Class ZZ3 Up to 2 in 29 μin Laser micrometer

Up to 50.8 mm 0.74 µm

Protractor –

Bevel Up to 180º 2.3 arcsec Vision system

Digital3 Up to 90º 27 arcsec Sine plate, gage

blocks

(A2LA Cert. No. 1387.03) Revised 3/31/2022 Page 5 of 30

 Parameter/Equipment Range CMC2, 4 (±) Comments

Spheres/Roundness (1 to 10) in (1.4 + 1.8D) µin Roundness machine

(25.4 to 254) mm (0.036 + 0.0018D) µm

Steel Rules3 Up to 12 in (67 + 6.4L) µin Vision system

Up to 304.8 mm (1.7 + 0.0064L) µm

(12 to 72) in 110 µin Direct comparison

(304.8 to 1828.8) mm 2.8 µm

Steel Tapes3 Up to 26 ft 0.04 in Direct comparison

Up to 100 ft 0.06 in

Pi-Tapes3 (8 to 17) in 950 µin Master disc gage

(203 to 432) mm 24 μm

(17 to 36) in 940 µin Vision machine

(432 to 914) mm 24 μm

(2 to 60) in 1200 µin Optical comparison

(36 to 144) in 2200 μin
(914 to 3600) mm 56 μm

Thickness and Feeler Up to 2 in (8.0 + 1.3L) μin Universal length

Gages3 Up to 50.8 mm (0.20 + 0.0013L) μm machine (ULM)

Up to 1 in 18 μin High resolution

Up to 25.4 mm 0.71 μm micrometer

Thread Measuring (4 to 120) TPI µin 9.2 μin Universal length

Wires3 (0.25 to 4.0) TPI µm 0.23 μm machine (ULM), gage
blocks

Laser Micrometers3 Up to 4 in (21 + 1.5D) µin Master pin gages

Up to 101.6 mm (0.53 + 0.0015L) µm

(A2LA Cert. No. 1387.03) Revised 3/31/2022 Page 6 of 30

 Parameter/Equipment Range CMC2, 4 (±) Comments

Screw Thread Micrometer Up to 12 in (67 + 6.4L) μin Vision system

Standards Up to 304.8 µm (1.7 + 0.0064L) μm

Snap Gage3 –

Flatness of Anvils Up to 3 in 4.1 μin Optical flat

Up to 76.2 mm 0.11 µm

Size Up to 1 in 6.3 μin Gage blocks

Up to 25.4 mm 0.16 µm

(1 to 20) in (3.9 + 2.4L) μin

(25.4 to 508) mm (0.10 + 0.0024L) µm

Universal Measuring Up to 39 in (8.0 + 1.3L) μin Gage blocks

Machines/Bench Up to 1000 mm (0.20 + 0.0013L) μm
Micrometers3

CMM/Articulating Arm
CMM’s3 –

Hysteresis Up to 0.500 in 94 μin Gage blocks

Up to 40 in 270 μin

X-Scale Displacement Up to 20 in (11 + 3.3L) μin

Up to 500 mm (0.28 + 0.0033L) μm

Y-Scale Displacement Up to 20 in (12 + 4.1L) μin

Up to 500 mm (0.30 + 0.0041L) μm

Z-Scale Displacement Up to 20 in (13 + 4.1L) μin

Up to 500 mm (0.33 + 0.0041L) μm

Volumetric Up to 40 in (12 + 4.3L) μin

Repeatability Up to 1000 mm (0.30 + 0.0043L) μm

Radius Gages Up to 12 in (67 + 6.4L) μin Vision system

Up to 304.8 µm (1.7 + 0.0064L) µm

(A2LA Cert. No. 1387.03) Revised 3/31/2022 Page 7 of 30

 Parameter/Equipment Range CMC2, 4 (±) Comments

Adjustable Thread Up to 4 in 120 µin Set using master plug

Rings8 gages. ASME/ANSI
B1.2-1983 and
ASME/ANSI B1.3-
2007

NPT Tapered Thread

Rings –

Standoff Up to 2.5 in 77 µin Electronic indicator,

Up to 63.5 mm 2.0 µm master NPT plug

Ring Thickness Up to 2.5 in (8.2 + 1.2L) µin Universal length

Up to 63.5 mm (0.21 + 0.0012L) µm machine (ULM)

Geometry Measuring
Machine3 –

Gage Head Amplifier 0.004 in fine 7.0 µin Master sphere,

0.016 in course 7.0 µin gage blocks,
cylindrical square,
0.10 mm fine 0.18 µm optical flat
0.40 mm course 0.18 µm

Radial Accuracy 3 in 5.3 µin

75 mm 0.14 µm

Coning Accuracy 8 in 5.3 µin

200 mm 0.14 µm

Axial Bearing 3 in 8.6 µin

Accuracy 75 mm 0.22 µm

Parallelism of Column Up to 12 in 8.3 µin

to Table Axis Up to 300 mm 0.21 µm
Accuracy

Straightness of Column Up to 12 in 5.3 µin

Up to 300 mm 0.14 µm

R-Axis Up to 4 in 6.1 µin

Perpendicularity Up to 101.6 mm 0.16 µm

Straightness Up to 4 in 6.6 µin

Up to 101.6 mm 0.17 µm

(A2LA Cert. No. 1387.03) Revised 3/31/2022 Page 8 of 30

 Parameter/Equipment Range CMC2, 4 (±) Comments

Video Measurement
System3 –
X, Y Axis Up to 12 in (11 + 0.9L) μin Calibration grid
Up to 304.8 µm (0.3 + 0.001L) μm
Z Axis Up to 6 in (14 + 0.5L) μin Gage blocks
Up to 152.4 mm (0.36 + 0.0005L) µm

Surface Finish (2 to 500) µin 5.0 µin Master surface finish

Testers3 (0.05 to 12.5) µm 0.13 µm patch

Angle Blocks Up to 90° 2.3 arcsec Vision system

Chamfer Check Gages Set Ring Effective 49 µin Chamfer check

Diameter master,
set ring
Gage Probe Angle 2.4 arcsec Vision system

Optical Comparators3 –
Horizontal Linearity Up to 12 in (52 + 1.4L) μin Glass master
Up to 304.8 mm (1.3 + 0.0014L) μm
Vertical Linearity Up to 9 in (97 + 0.39L) μin Glass master
Up to 228.6 mm (2.5 + 0.000 39L) μm
Squareness Up to 12 in 160 μin Glass master
Up to 304.8 mm 4.0 μm
Table Parallelism Up to 12 in 130 μin Indicator
Up to 304.8 mm 3.4 μm

Distortion Up to 10 in magnified 55 μin Glass master,

image 14'' glass scale
Up to 254 mm 1.4 μm
magnified image

Magnification – Up to 20 in image 55 μin Glass master,

10x to 100x Up to 508 mm image 1.4 μm 14'' glass scale
Chart Angularity 90° 220 arcsec Glass master
Chart Rotation 180° 330 arcsec Glass master

(A2LA Cert. No. 1387.03) Revised 3/31/2022 Page 9 of 30

 Parameter/Equipment Range CMC2, 4 (±) Comments

Surface Finish Standards3 (2 to 500) µin 4.2 µin Direct comparison to

(0.05 to 12.5) µm 0.10 µm master surface patch

Bolt Protrusion Gages Up to 12 in (67 + 6.4L) μin Vision system

Up to 304.8 mm (1.7 + 0.000 64L) µm

Thread Plugs3 –

Major Diameter Up to 8 in (8.2 + 1.2D) μin Universal length

Up to 203.2 mm (0.21 + 0.0012D) µm machine

Pitch Diameter Up to 120 TPI (65 + 0.32D) μin Universal length

Up to 4.0 mm pitch (1.7 + 0.000 32D) µm machine, thread
measuring wires

Tapered Thread Plug Up to 4 in (65 + 0.32D) μin Universal length

Gage – Pitch Diameter Up to 101.6 mm (1.7 + 0.000 32D) µm machine, gage blocks

Step Up to 1 in 59 μin Gage blocks

Up to 25.4 mm 1.5 µm

Crimping Tools3 Go/No-Go 0.0010 in Pin gages

Crimp Height 0.000 15 in Point micrometer

Pullout Test 0.5 lb Force gage, master

weights

ID/OD Comparator3 Up to 10 in (9.0 + 0.67D) μin Gage blocks

Up to 250 mm (0.23 + 0.000 67D) µm

(A2LA Cert. No. 1387.03) Revised 3/31/2022 Page 10 of 30

 Parameter/Equipment Range CMC2, 4 (±) Comments

Surface Plates3 –

Flatness Up to 245” in Diagonal (17 + 0.59DL) μin Electronic levels

Line

Repeatability Localized Up to 245” in 24 μin Repeat reading

Diagonal Line indicator

Tool Makers Microscopes,3 Up to 12 in 190 µin Glass master

Linearity Up to 304.8 mm 4.8 µm

Contour/Contour
Systems3 –

Tracing Arm Length and Up to 14 in 7.8 µin Gage blocks, pin

Stylus Tip Height Up to 350 mm 0.20 µm gages, optical flats

Pick-Up Sensitivity 2 in 46 µin

50 mm 1.2 µm

Probe Deflection 0 Base 0.15 µin

Repeatability 0.004 µm

Stylus Tip Form and 3 mm 9.1 µin

Radius 0.23 µm

Go/No-go3 Up to 12 in (67 + 6.4L) μin Vision system

Up to 304.8 mm (1.7 + 0.0064L) µm

Up to 39 in (7.9 + 0.92D) μin Universal length

Up to 990 mm (0.20 + 0.000 92D) μm machine
Ext. Measurement

Up to 17 in (11 + 0.63D) µin Electronic indicator

Int. Measurement (0.28 + 0.000 63D) µm amplifier, gage blocks

Up to 6 in 0.000 30 in Rings, plugs, pins,

threads and hand tools

Up to 1800 mm (2 + L/350) µm CMM

(A2LA Cert. No. 1387.03) Revised 3/31/2022 Page 11 of 30

 Parameter/Equipment Range CMC2, 4 (±) Comments

Coating Thickness (1 to 669) mils (7.9 + 0.92L) μin Master foils

Standards 17.0 mm (0.20 + 0.000 92L) µm Foils/shims

Spheres & Balls Up to 6 in (7.9 + 0.92L) μin ULM

Up to 150 mm (0.20 + 0.000 92L) μm

Ultrasonic Thickness Up to 4 inches (7.9 + 0.92L) μin ULM/gage blocks

Gages3
Up to 101.6 mm (0.20 + 0.000 92L) μm

IV. Dimensional Testing/Calibration5

Parameter/Equipment Range CMC2, 4, 8 (±) Comments

Surface Finish5 – Measure (2 to 500) µin 5.3 µin Master surface finish
(0.05 to 12.5) µm 0.14 µm patch

Geometric Measurements5 – X (Up to 1800 mm) (2 + L/350) µm CMM

Waviness, Cylindricity,
profile, line profile, Form, Y (Up to 1800 mm) (2 + L/350) µm
Curve Form, Curve Jump,
Position, Concentricity, Z (Up to 1800 mm) (2 + L/350) µm
Coaxially,
Perpendicularity,
Parallelism, Runout,
Distance

Roundness5 – Measure Up to 10 in (9.2 + 1.6D) μin Roundness machine

Up to 254 mm (0.23 + 0.0016D) μm

(A2LA Cert. No. 1387.03) Revised 3/31/2022 Page 12 of 30

 Parameter/Equipment Range CMC2, 4, 8 (±) Comments

2D Optical Inspection5 –
Measure

Horizontal Linearity Up to 12 in (52 + 1.4L) μin Vision System

Up to 304.8 mm (1.3 + 0.0014L) μm

Vertical Linearity Up to 9 in (97 + 0.39L) μin

Up to 228.6 mm (2.5 + 0.000 39L) μm

Angle Up to 180° 220 arcsec

Flatness5 – Measure Up to 20 in 28 μin Electronic indicator

Up to 508 mm 0.71 μm

Up to 6 in 3.9 μin Optical flat

Up to 152.4 mm 0.10 μm

Up to 1800 mm (2 + L/350) µm CMM

Parallelism5– Measure Up to 20 in 14 μin Electronic gage

Up to 508 mm 0.36 μm amplifier

Radius5 – Measure Up to 12 in (67 + 6.4L) μin Vision system

Up to 304.8 mm (0.30 + 0.000 45L) μm

Straightness5 – Measure Up to 12 in 22 μin Electronic indicator

Up to 304.8 mm 0.56 µm amplifier

Up to 1800 mm (2 + L/350) µm CMM

Video System – Measure5

X, Y Axis Up to 12 in (12 + 0.45L) μin Zeiss O-Inspect

Up to 304.8 mm (0.30 + 0.000 45L) μm

Z Axis Up to 6 in (14 + 0.49L) μin

Up to 152.4 mm (0.36 + 0.000 49L) μm

(A2LA Cert. No. 1387.03) Revised 3/31/2022 Page 13 of 30

 Parameter/Equipment Range CMC2, 4, 8 (±) Comments

Angular Devices – Up to 360 º 2.3 arcsec Vision system

Measure5

Inspection Fixtures (V-

Blocks, 1-2-3 Blocks,
Bar Parallels, Angle
Squares) –

Angle Up to 90° 2.3 arcsec CMM

Flatness Up to 36 in (2 + L/350) µm

Perpendicularity Up to 36 in (2 + L/350) µm

Parallelism Up to 36 in (2 + L/350) µm

III. Electrical – DC/Low Frequency

Parameter/Equipment Range CMC2, 6 (±) Comments

DC Voltage – Measure3 (0 to 100) mV 6.2 µV/V + 0.30 µV Agilent 3458A opt

100 mV to 1 V 4.2 µV/V + 0.30 µV 002
(1 to 10) V 4.2 µV/V + 0.50 µV
(10 to 100) V 11 µV/V + 0.30 mV
(100 to 1000) V 8 µV/V + 1 mV

DC High Voltage – (1 to 10) kV 0.50 % + 0.40 V Vitrek 4700

Measure3
(10 to 90) kV 1.0 % + 4.0 V Vitrek 4700 w/
HL100 probe

DC Voltage – Generate3 (0 to 329.9999) mV 22 µV/V + 1.0 µV Fluke 5520A

330 mV to 3.299 V 13 µV/V + 2.0 µV
(3.3 to 32.9999) V 14 µV/V + 20 µV
(30 to 329.9999) V 20 µV/V + 150 µV
(100 to 1000) V 21 µV/V + 1.6 mV

(A2LA Cert. No. 1387.03) Revised 3/31/2022 Page 14 of 30

 Parameter/Equipment Range CMC2, 6 (±) Comments

DC Current – Measure3 (0 to 100) µA 25 µA/A + 0.80 nA Agilent 3458A opt

(0.1 to 1) mA 23 µA/A + 5.0 nA 002
(1 to 10) mA 23 µA/A + 50 nA
(10 to 100) mA 37 µA/A + 500 nA
(0.1 to 1) A 0.013 % + 10 µA

High Current –
Measure3

DC Up to 60 Hz3 (1 to 15) A 1.9 mA/A + 4.5 µA Current shunt

(15 to 100) A 0.029 % + 0.3 mA w/ 6.5 digit
(100 to 300) A 0.015 % + 0.9 mA voltmeter
(300 to 5000) A 0.012 % + 15 mA

DC Current – Generate3 (1 to 329.999) µA 0.016 % + 20 nA Fluke 5520A

(0.33 to 3.299 99) mA 0.011 % + 50 nA
(3.3 to 32.9999) mA 0.010 % + 250 nA
(33 to 329.999) mA 0.011 % + 3.0 µA
(0.33 to 1.09999) A 0.021 % + 40 µA
(1.1 to 2.99999) A 0.039 % + 40 µA
(3 to 10.9999) A 0.051 % + 500 µA
(11 to 20.5) A 0.12 % + 750 µA

(10 to 16.499) A 1.0 % + 50 mA Fluke 5520A w/

(16.5 to 149.999) A 1.0 % + 75 mA Fluke 5500A coil
(150 to 950) A 1.0 % + 75 mA

Resistance – Measure3 (0 to 10) Ω 18 µΩ/Ω + 50 µΩ Agilent 3458A opt

(10 to 100) Ω 13 µΩ/Ω + 500 µΩ 002
100 Ω to 1 kΩ 11 µΩ/Ω + 500 µΩ
(1 to 100) kΩ 11 µΩ/Ω + 50 mΩ
100 kΩ to 1 MΩ 16 µΩ/Ω + 2.0 Ω
(1 to 10) MΩ 53 µΩ/Ω + 100 Ω
(10 to 100) MΩ 0.070 % + 1.0 kΩ

(A2LA Cert. No. 1387.03) Revised 3/31/2022 Page 15 of 30

 Parameter/Equipment Range CMC2, 6 (±) Comments

Resistance – Generate3 (1 to 10.9999) Ω 42 µΩ/Ω + 10 mΩ Fluke 5520A

(11 to 32.9999) Ω 34 µΩ/Ω + 15 mΩ
(33 to 109.9999) Ω 31 µΩ/Ω + 15 mΩ
(110 to 329.9999) Ω 31 µΩ/Ω + 20 mΩ
(0.33 to 1.099 999) kΩ 32 µΩ/Ω + 20 mΩ
(1.1 to 3.299 999) kΩ 34 µΩ/Ω + 200 mΩ
(3.3 to 10.999 99) kΩ 30 µΩ/Ω + 100 mΩ
(11 to 32.999 99) kΩ 31 µΩ/Ω + 1.0 Ω
(33 to 109.9999) kΩ 30 µΩ/Ω +1.0 Ω
(110 to 329.9999) kΩ 36 µΩ/Ω + 10 Ω
(0.33 to 1.099 999) MΩ 37 µΩ/Ω + 10 Ω
(1.1 to 3.299 99) MΩ 62 Ω/Ω + 150 Ω
(3.3 to 10.999 99) MΩ 0.014 % + 250 Ω
(11 to 32.999 99) MΩ 0.026 % + 2.5 kΩ
(33 to 109.9999) MΩ 0.052 % + 3.0 kΩ
(110 to 329.9999) MΩ 0.34 % + 100 kΩ
(330 to 1100) MΩ 1.7 % + 500 kΩ

Parameter/Range Frequency CMC2, 6 (±) Comments

AC Voltage – Generate3

(1 to 32.999) mV (10 to 45) Hz 0.085 % + 6.0 µV Fluke 5520A

45 Hz to 10 kHz 0.019 % + 6.0 µV
(10 to 20) kHz 0.024 % + 6.0 µV
(20 to 50) kHz 0.12 % + 6.0 µV
(50 to 100) kHz 0.38 % + 12 µV
(100 to 500) kHz 0.84 % + 50 µV

(33 to 329.999) mV (10 to 45) Hz 0.033 % + 8.0 µV

45 Hz to 10 kHz 0.016 % + 8.0 µV
(10 to 20) kHz 0.018 % + 8.0 µV
(20 to 50) kHz 0.036 % + 8.0 µV
(50 to 100) kHz 0.082 % + 32 µV
(100 to 500) kHz 0.21 % + 70 µV

(0.33 to 3.299 99) V (10 to 45) Hz 0.031 % + 50 µV

45 Hz to 10 kHz 0.017 % + 60 µV
(10 to 20) kHz 0.019 % + 60 µV
(20 to 50) kHz 0.031 % + 50 µV
(50 to 100) kHz 0.072 % + 130 µV
(100 to 500) kHz 0.26 % + 600 µV

(A2LA Cert. No. 1387.03) Revised 3/31/2022 Page 16 of 30

 Parameter/Range Frequency CMC2, 6 (±) Comments

AC Voltage – Generate3
(cont)

3.3 V to 32.9999 V (10 to 45) Hz 0.031 % + 650 µV Fluke 5520A

45 Hz to 10 kHz 0.017 % + 600 µV
(10 to 20) kHz 0.026 % + 600 µV
(20 to 50) kHz 0.036 % + 600 µV
(50 to 100) kHz 0.092 % + 1.6 mV

(33 to 329.999) V (10 to 45) Hz 0.021 % + 2.0 mV

45 Hz to 10 kHz 0.021 % + 6.0 mV
(10 to 20) kHz 0.026 % + 6.0 mV
(20 to 50) kHz 0.031 % + 6.0 mV
(50 to 100) kHz 0.21 % + 50 mV

(330 to 1000) V 45 Hz to 1 kHz 0.031 % + 10 mV

(1 to 5) kHz 0.026 % + 10 mV
(5 to 10) kHz 0.031 % + 10 mV

AC High Voltage –
Measure3

(1 to 10) kV 60 Hz 0.90 % + 0.40 V Vitrek 4700

(10 to 90) kV 60 Hz 1.6 % + 6.0 V W/ HL100 probe

(A2LA Cert. No. 1387.03) Revised 3/31/2022 Page 17 of 30

 Parameter/Range Frequency CMC2, 6 (±) Comments

AC Voltage –
Measure3

(1 to 10) mV (1 to 40) Hz 0.030 % + 3.0 µV Agilent 3458A opt 002

40 Hz to 1 kHz 0.020 % + 2.0 µV
(1 to 20) kHz 0.040 % + 2.0 µV
(20 to 50) kHz 0.11 % + 2.0 µV
(50 to 100) kHz 0.50 % + 2.0 µV
(100 to 300) kHz 4.1 % + 2.0 µV

(10 to 100) mV (1 to 40) Hz 0.0080 % + 4.0 µV

40 Hz to 1 kHz 0.0080 % + 2.0 µV
(1 to 20) kHz 0.016 % + 2.0 µV
(20 to 50) kHz 0.031 % + 2.0 µV
(50 to 100) kHz 0.081 % + 2.0 µV
(100 to 300) kHz 0.34 % + 10 µV
300 kHz to 1 MHz 1.1 % + 10 µV
(1 to 2) MHz 1.6 % + 10 µV

100 mV to 1 V (1 to 40) Hz 0.0090 % + 40 µV

40 Hz to 1 kHz 0.0070 % + 20 µV
(1 to 20) kHz 0.017 % + 20 µV
(20 to 50) kHz 0.036 % + 20 µV
(50 to 100) kHz 0.082 % + 20 µV
(100 to 300) kHz 0.31 % + 100 µV
300 kHz to 1 MHz 1.1 % + 100 µV
(1 to 2) MHz 1.6 % + 100 µV

(1 to 10) V (1 to 40) Hz 0.0080 % + 400 µV

40 Hz to 1 kHz 0.0080 % + 200 µV
(1 to 20) kHz 0.015 % + 200 µV
(20 to 50) kHz 0.031 % + 200 µV
(50 to 100) kHz 0.080 % + 200 µV
(100 to 300) kHz 0.30 % + 1.0 mV
300 kHz to 1 MHz 1.0 % + 1.0 mV

(10 to 100) V (1 to 40) Hz 0.030 % + 4.0 mV

40 Hz to 1 kHz 0.030 % + 2.0 mV
(1 to 20) kHz 0.030 % + 2.0 mV
(20 to 50) kHz 0.040 % + 2.0 mV
(50 to 100) kHz 0.13 % + 2.0 mV

(100 to 750) V (1 to 40) Hz 0.040 % + 4.0 mV

40 Hz to 1 kHz 0.040 % + 2.0 mV
(1 to 20) kHz 0.060 % + 2.0 mV
(20 to 50) kHz 0.14 % + 2.0 mV
(50 to 100) kHz 0.40 % + 2.0 mV

(A2LA Cert. No. 1387.03) Revised 3/31/2022 Page 18 of 30

 Parameter/Range Frequency CMC2, 6 (±) Comments

AC Current – Generate3

(29 to 329.99) µA (10 to 20) Hz 0.30 % + 0.10 µA Fluke 5520A

(20 to 45) Hz 0.20 % + 0.10 µA
45 Hz to 1 kHz 0.20 % + 0.10 µA
(1 to 5) kHz 0.40 % + 0.20 µA
(5 to 10) kHz 1.0 % + 0.20 µA
(10 to 30) kHz 1.7 % + 0.40 µA

(.33 to 3.2999) mA (10 to 20) Hz 0.30 % + 0.20 µA

(20 to 45) Hz 0.20 % + 0.20 µA
45 Hz to 1 kHz 0.20 % + 0.20 µA
(1 to 5) kHz 0.30 % + 0.20 µA
(5 to 10) kHz 0.60 % + 0.30 µA
(10 to 30) kHz 1.1 % + 0.60 µA

(3.3 to 32.9999) mA (10 to 20) Hz 0.20 % + 2.0 µA

(20 to 45) Hz 0.10 % + 2.0 µA
45 Hz to 1 kHz 0.050 % + 2.0 µA
(1 to 5) kHz 0.10 % + 2.0 µA
(5 to 10) kHz 0.30 % + 3.0 µA
(10 to 30) kHz 0.50 % + 4.0 µA

(33 to 329.99) mA (10 to 20) Hz 0.20 % + 20 µA

(20 to 45) Hz 0.10 % + 20 µA
45 Hz to 1 kHz 0.060 % + 20 µA
(1 to 5) kHz 0.20 % + 50 µA
(5 to 10) kHz 0.30 % + 100 µA
(10 to 30) kHz 0.50 % + 200 µA

(0.33 to 1.09999) A (10 to 45) Hz 0.20 % + 100 µA

45 Hz to 1 kHz 0.10 % + 100 µA
(1 to 5) kHz 0.70 % + 1.0 mA
(5 to 10) kHz 2.7 % + 5.0 mA

(1.1 A to 2.999 99) A (10 to 45) Hz 0.20 % + 100 µA

45 Hz to 1 kHz 0.070 % + 100 µA
(1 to 5) kHz 0.70 % + 1.0 mA
(5 to 10) kHz 2.6 % + 5.0 mA

(3 to 10.9999) A (45 to 100) Hz 0.10 % + 2.0 mA

100 Hz to 1 kHz 0.20 % + 2.0 mA
(1 to 5) kHz 3.3 % + 2.0 mA

(11 to 20.5) A (45 to 100) Hz 0.18 % + 5.0 mA

100 Hz to 1 kHz 0.17 % + 5.0 mA
(1 to 5) kHz 3.2 % + 5.0 mA

(A2LA Cert. No. 1387.03) Revised 3/31/2022 Page 19 of 30

 Parameter/Range Frequency CMC2, 6 (±) Comments

AC Current – Generate3
(cont)

(20 to 150) A 50 Hz 1.3 % + 1.9 mA Fluke 5520 w/ 50

(151 to 1000) A 50 Hz 0.66 % + 1.1 A turn coil

AC Current – Measure3

(5 to 100) μA (10 to 20) Hz 0.45 % + 0.030 μA Agilent 3458A opt

(20 to 45) Hz 0.17 % + 0.030 μA 002
(45 to 100) Hz 0.070 % + 0.030 μA
100 Hz to 5 kHz 0.10 % + 0.030 μA

(1 to 100) mA (10 to 20) Hz 0.47 % + 20 μA

(20 to 45) Hz 0.18 % + 20 μA
(45 to 100) Hz 0.080 % + 20 μA
100 Hz to 5 kHz 0.050 % + 20 μA
(5 to 20) kHz 0.080 % + 20 μA
(20 to 50) kHz 0.50 % + 40 μA
(50 to 100) kHz 0.70 % + 150 μA

1A (10 to 20) Hz 0.47 % + 200 μA

(20 to 45) Hz 0.19 % + 200 μA
(45 to 100) Hz 0.10 % + 200 μA
100 Hz to 5 kHz 0.12 % + 200 μA
(5 to 20) kHz 0.37 % + 20 μA
(20 to 50) kHz 1.2 % + 40 μA

Parameter/Equipment Range CMC2, 6 (±) Comments

Capacitance – Generate3 (0.19 to 0.3999) nF 0.60 % + 10 pF Fluke 5520

(0.4 to 1.0999) nF 0.60 % + 10 pF
(1.1 to 3.2999) nF 0.60 % + 10 pF
(3.3 to 10.9999) nF 0.30 % + 10 pF
(11 to 32.9999) nF 0.30 % + 100 pF
(33 to 109.999) nF 0.30 % + 100 pF
(110 to 329.999) nF 0.30 % + 300 pF
(0.33 to 1.099 99) μF 0.30 % + 1.0 nF
(1.1 to 3.299 99) μF 0.30 % + 3.0 nF
(3.3 to 10.9999) μF 0.30 % + 10 nF
(11 to 32.9999) μF 0.50 % + 30 nF
(33 to 109.9999) μF 0.50 % + 100 nF
(110 to 329.999) μF 0.50 % + 300 nF
(0.33 to 1.099 99) mF 0.50 % + 1.0 µF
(1.1 to 3.299 99) mF 0.50 % + 3.0 µF

(A2LA Cert. No. 1387.03) Revised 3/31/2022 Page 20 of 30

 Parameter/Equipment Range CMC2 (±) Comments

Electrical Calibration of
Thermocouples and
Thermocouple Indicating
Systems3 –

Type B (600 to 800) °C 0.50 °C Fluke 5520A

(800 to 1000) °C 0.35 °C
(1000 to 1550) °C 0.35 °C
(1550 to 1820) °C 0.34 °C

Type C (0 to 150) °C 0.30 °C

(150 to 650) °C 0.28 °C
(650 to 1000) °C 0.31 °C
(1000 to 1800) °C 0.55 °C
(1800 to 2316) °C 0.90 °C

Type E (-250 to -100) °C 0.50 °C

(-100 to -25) °C 0.23 °C
(-25 to 350) °C 0.22 °C
(350 to 650) °C 0.23 °C
(650 to 1000) °C 0.27 °C

Type J (-210 to -100) °C 0.32 °C

(-100 to -30) °C 0.23 °C
(-30 to 150) °C 0.17 °C
(150 to 760) °C 0.20 °C
(760 to 1200) °C 0.25 °C

Type K (-200 to -100) °C 0.37 °C

(-100 to -25) °C 0.25 °C
(-25 to 120) °C 0.23 °C
(120 to 1000) °C 0.31 °C
(1000 to 1372) °C 0.42°C

Type L (-200 to -100) °C 0.40 °C

(-100 to 800) °C 0.31 °C
(800 to 900) °C 0.24 °C

Type N (-200 to -100) °C 0.42 °C

(-100 to -25) °C 0.28 °C
(-25 to 120) °C 0.26 °C
(120 to 410) °C 0.25 °C
(410 to 1300) °C 0.32 °C

(A2LA Cert. No. 1387.03) Revised 3/31/2022 Page 21 of 30

 Parameter/Equipment Range CMC2 (±) Comments

Electrical Calibration of
Thermocouples and
Thermocouple Indicating
Systems3 – (cont)

Type R (0 to 250) °C 0.60 °C Fluke 5520A

(250 to 400) °C 0.40 °C
(400 to 1000) °C 0.37 °C
(1000 to 1767) °C 0.42 °C

Type S (0 to 250) °C 0.48 °C

(250 to 1000) °C 0.39 °C
(1000 to 1400) °C 0.40 °C
(1400 to 1767) °C 0.50 °C

Type T (-250 to -150) °C 0.65 °C

(-150 to 0) °C 0.25 °C
(0 to 120) °C 0.20 °C
(120 to 400) °C 0.15 °C

Type U (-200 to 0) °C 0.56 °C

(0 to 600) °C 0.32 °C

Electrical Calibration of
RTD Indicating System3 –

Pt 385, 100 Ω (-200 to -80) °C 0.040 °C Fluke 5520

(-80 to 0) °C 0.040 °C
(0 to 100) °C 0.060 °C
(100 to 300) °C 0.080 °C
(300 to 400) °C 0.080 °C
(400 to 630) °C 0.10 °C
(630 to 800) °C 0.18 °C

Pt 3926, 100 Ω (-200 to -80) °C 0.040 °C

(-80 to 0) °C 0.040 °C
(0 to 100) °C 0.060 °C
(100 to 300) °C 0.080 °C
(300 to 400) °C 0.080 °C
(400 to 630) °C 0.10 °C

PtNi 385, 120 Ω (-80 to 0) °C 0.090 °C

(0 to 100) °C 0.090 °C
(100 to 260) °C 0.15 °C

Cu 427, 10 Ω (-100 to 260) °C 0.30 °C

(A2LA Cert. No. 1387.03) Revised 3/31/2022 Page 22 of 30

 Parameter/Equipment Range CMC2, 6, 7 (±) Comments

Oscilloscopes3 –

Square Wave Signal:

50 Ω @ 1kHz (0 to ± 6.6) V 0.31 % + 40 μV Fluke
5520A/SC1100
1 MΩ (0 to ± 130) V 0.06 % + 40 μV

Leveled Sine Wave 50 kHz (reference) 2 % + 300 μV

Characteristics into 50 Ω

Square Wave Signal 50 kHz to 100 MHz 2.2 % of Output + 100 μV

(100 to 300) MHz 2.3 % of Output + 100 μV
(300 to 600) MHz 3.5 % of Output + 100 μV
600 MHz to 1.1 GHz 3.4 % of Output + 100 μV

Time Mark (50 Ω) (1 to 5) ns 2.0 µs/s

10 ns 2.0 µs/s
(20 to 50) ns 2.0 µs/s t = time in seconds
100 ns to 20 ms 2.0 µs/s
50 ms to 5 s 25 µs/s + t*1000 µs/s
Rise Time ≤ 300 ps (+0.02 ns / -100 ps)

AC High Voltage –
Measure3

60 Hz (1 to 10) kV 0.90 % + 0.40 V Vitrek 4700

(10 to 90) kV 1.6 % + 6.0 V Vitrek 4700 w/

HL100 probe

Radar Guns – Fixed

Points3

K and KA Band 25.3 MPH 2.4 MPH Tuning forks

K and KA Band 40.3 MPH 2.4 MPH

KA Band 55.3 MPH 2.4 MPH

Welding Devices3 (0 to 350) ADC 1% Loadbank and

(0 to 100) VDC 0.05 VDC DMM/shunt

(A2LA Cert. No. 1387.03) Revised 3/31/2022 Page 23 of 30

IV. Magnetic Quantities

Parameter/Equipment Range CMC2, 6, 8 (±) Comments

Magnetic Flux Density – (0 to 100) gauss 0.56 % Helmholtz coil w/

Generate3 (Gauss Meters) power supply

V. Mechanical

Parameter/Equipment Range CMC2 (±) Comments

Indirect Verification of HRA:

Rockwell Hardness (60 to 69) HRA 0.78 HRA ASTM E18 Indirect
Testers3 (70 to 79) HRA 0.36 HRA Method
(80 to 93) HRA 0.29 HRA

HRB:
(1 to 50) HRB 0.73 HRB
(51 to 79) HRB 0.93 HRB
(80 to 130) HRB 0.95 HRB

HRC:
(20 to 39) HRC 0.60 HRC
(40 to 59) HRC 0.61 HRC
(60 to 70) HRC 0.75 HRC

HR30N:
(40 to 59) HR30N 0.56 HR30N
(60 to 76) HR30N 0.65 HR30N
(77 to 85) HR30N 0.67 HR30N

HR30T:
(20 to 49) HR30T 0.50 HR30T
(50 to 56) HR30T 0.48 HR30T
(57 to 85) HR30T 0.48 HR30T

HR15N:
(40 to 79) HR15N 0.59 HR15N
(80 to 89) HR15N 0.46 HR15N
(90 to 95) HR15N 0.44 HR15N

(A2LA Cert. No. 1387.03) Revised 3/31/2022 Page 24 of 30

 Parameter/Equipment Range CMC2 (±) Comments

Indirect Verification of HR15T:

Rockwell Hardness (20 to 79) HR15T 0.57 HR15T ASTM E18
Testers3 (cont) (80 to 87) HR15T 0.45 HR15T indirect method
(88 to 100) HR15T 0.36 HR15T

HR45N:
(10 to 49) HR45N 0.94 HR45N
(50 to 66) HR45N 0.42 HR45N
(67 to 75) HR45N 0.75 HR45N

HR45T:
(1 to 39) HR45T 0.64 HR45T
(40 to 49) HR45T 0.71 HR45T
(50 to 75) HR45T 0.98 HR45T

Indirect Verification of
Brinell Hardness
Testers at Test
Conditions3 –

HBW 5/750 (200 to 400) HBW 2.1 HBW ASTM E10

indirect method
HBW 10/3000 (400 to 750) HBW 6.1 HBW

Indirect Verification of (200 to 400) HV 15 HV ASTM E92

Vickers Hardness (400 to 750) HV 20 HV indirect method
Testers3 (@ 500 gf)

Indirect Verification of (100 to 250) HK 14 HK ASTM E92

Knoop Hardness Above 250 HK 20 HK indirect method
Testers3 (@ 500 gf)

Force Gages, Load Up to 500 lbf 0.23 % IV Tinius

Cells, Dynamometers – (501 to 1000) lbf 0.38 % IV Olsen/weights
Tension and (1001 to 5000) lbf 0.36 % IV
Compression3 (5001 to 10 000) lbf 0.36 % IV
(10 001 to 25 000) lbf 0.36 % IV
(25 001 to 50 000) lbf 0.35 % IV
(50 000 to 75 000) lbf 0.37 % IV
(75 000 to 120 000) lbf 0.3 % IV

(A2LA Cert. No. 1387.03) Revised 3/31/2022 Page 25 of 30

 Parameter/Equipment Range CMC2, 8 (±) Comments

Pressure3 – Measure Up to 4000 psi 0.03 + (0.000 015 × a) psi Deadweight tester
(2000 to 20 000) psi 0.04 + (0.000 029 × a) psi
(4000 to 40 000) psi 0.06 + (0.000 043 × a) psi

Up to 5 psi 0.0013 + (0.000 013 × a) psi Primary pressure

(5 to 50) psi 0.0011 + (0.000 014 × a) psi standard;
(50 to 500) psi 0.0045 + (0.000 017 × a) psi a = applied pressure
at the calibration
value

(-75 to 75) inH2O 0.011 inH2O Primary pressure

(-5 to 5) inH2O 0.000 64 inH2O. standard
(-1 to 1) inH20 0.000 48 inH2O.

Pressure – Measuring (0 to 30) psi 0.011 psi Multifunction

Equipment3 (30 to 100) psi 0.11 psi calibrator
(100 to 200) psi 0.15 psi
(200 to 300) psi 0.21 psi

Torque Transducers3 (20 to 200) in·ozf 0.23 % of full scale Torque arms,
(0 to 50) in·lbf 0.81 % of full scale weights
(50 to 250) in·lbf 0.18 % of full scale
(250 to 1000) in·lbf 0.051 % of full scale
(0 to 250) ft·lbf 0.20 % of full scale
(250 to 2000) ft·lbf 0.075 % of full scale

Torque Wrenches3 Up to 2000 ft·lbf 0.76 % of indicated value Torque transducers

(2000 to 4000) ft lbf 0.91 % of indicated value

Vacuum – Measuring (-30 to 0) in·Hg 0.013 % Primary vacuum

Equipment3 standard

Mass – Measure Up to 5 g 4.6 µg Comparators w/std

weights
(5 to 210) g (0.10 + 0.0038M) mg

(210 to 30 000) g (30 + 0.005M) mg

(A2LA Cert. No. 1387.03) Revised 3/31/2022 Page 26 of 30

 Parameter/Equipment Range CMC2, 4, 8 (±) Comments

Scales and Balances3 Up to 50 lb 0.48 lbs Weights

(>50 to 500) lb 0.67 lbs
(>500 to 1000) lb 0.80 lbs
(>1000 to 2000) lb 0.85 lbs

Up to 500 mg 0.0047 mg Weights

500 mg 0.0050 mg
1g 0.0058 mg
2g 0.0063 mg
5g 0.0098 mg
10 g 0.049 mg
20 g 0.055 mg
50 g 0.086 mg
100 g 0.15 mg
200 g 0.29 mg
(500 to 1000) g 30 mg
(1 to 2) kg 49 mg
(2 to 5) kg 120 mg
(5 to 10) kg 230 mg
(10 to 20) kg 450 mg

Air Velocity – (500 to 8000) fpm (5.1 + 0.035V) fpm Comparison of

Measuring Equipment standard probe w/
UUT using wind
tunnel

Durometer Calibration: ASTM D2240

(A, B, C, D, DO, E, M,
O, OO, OOO) –
Optical inspection
Indentor Extension Up to 0.2 in 65 µin under magnification
and Shape –

Extension Diameter of the base 45 µin

Diameter of the frustrum: 0.5 in

Diameter of the top of 45 µin

the frustrum: 0.5 in

Diameter of the base 45 µin

of the cone: 0.5 in

Angle –
35° Right Circular Cone angle 0.015°
Conical Frustrum

30° Cone Cone angle 0.015°

(A2LA Cert. No. 1387.03) Revised 3/31/2022 Page 27 of 30

 Parameter/Equipment Range CMC2 (±) Comments

Durometer Calibration: ASTM D2240

(A, B, C, D, DO, E, M,
O, OO, OOO) – (cont)

Radius Tip radius: 0.25 in 16 µin

Indentor Display Indenter thickness 45 µin

Indenter radius 16 µin

Spring Calibration – (0 to 100) duro units 0.4 duro Balance or

electronic force cell
Force (0 to 5000) gf 0.3 gf

VI. Optical

Parameter/Equipment Range CMC2, 8 (±) Comments

Light – Measure White Up to 40 Lux 6.6 % Direct comparison

(40 to 400) Lux 9.9 %
(400 to 4000) Lux 6.4 %

Gloss – Measure 20⁰ 0.99 GU Gloss standards

60⁰ 0.94 GU
85⁰ 0.98 GU

VII. Thermodynamics

Parameter/Equipment Range CMC2, 8 (±) Comments

Relative Humidity 11 % RH 1.4 % RH Rotronic HygroPalm/

Measuring Equipment – 33 % RH saturated salts
Fixed Points3 53 % RH
75.5 % RH
90 % RH

(A2LA Cert. No. 1387.03) Revised 3/31/2022 Page 28 of 30

 Parameter/Equipment Range CMC2, 5, 7, 8 (±) Comments

Relative Humidity – Up to 50 % RH 1.4 % RH Rotronic HygroPalm

Measure3 (50 to 80) % RH 1.5 % RH

Temperature – (-78 to 0) °C 0.016 °C PRT w/ indicator

Measuring Equipment, (0 to 500) °C 0.014 °C
Glass Thermometers3

Temperature / Humidity (-78 to 0) °C 0.016 °C PRT w/ indicator

Recorders3 – (0 to 500) °C 0.014 °C Environmental
Environmental (11 to 90) % RH 1.4 % RH chamber, humidity
Monitors/Recorders standards

Temperature – Measure

Ovens, Furnaces, and (-78 to 0) °C 0.016 °C PRT w/ indicator

Freezers3 (0 to 500) °C 0.014 °C

Temperature – IR
Measuring Equipment3 (50 to 500) °C (0.77 + 0.007T) °C Fluke 9132

VII. Time & Frequency

Parameter/Equipment Range CMC2, 6, 7 (±) Comments

Tachometers Up to 10 000 RPM 0.030 % Frequency counter

Tachometers – Up to 199 999 RPM 0.030 % Function generator

Non-Contact3

Stop Watches/Time Up to 24 hours 0.35 s Comparison

Measurements3
0.04 s Totalize w/GPS

Frequency – Measure (1 to 40) Hz 0.43 % Agilent 3458

40 Hz to 10 MHz 0.18 %

(A2LA Cert. No. 1387.03) Revised 3/31/2022 Page 29 of 30

 Parameter/Equipment Range CMC2, 6, 7 (±) Comments

Frequency – Measuring 0.01 Hz to 2 MHz 3.4 µHz/Hz + 5.0 µHz Fluke 5520A
Equipment3
2 MHz to 1.1 GHz 5.0 µHz/Hz Fluke 5520A
w/ SC1100

___________________________________________

1
This laboratory offers commercial dimensional testing/calibration service and field calibration service.
2
Calibration and Measurement Capability Uncertainty (CMC) uncertainty is the smallest uncertainty of
measurement that a laboratory can achieve within its scope of accreditation when performing more or
less routine calibrations of nearly ideal measurement standards or nearly ideal measuring equipment.
CMC’s represent expanded uncertainties expressed at approximately the 95 % level of confidence,
usually using a coverage factor of k = 2. The actual measurement uncertainty of a specific calibration
performed by the laboratory may be greater than the CMC uncertainty due to the behavior of the
customer’s device and to influences from the circumstances of the specific calibration.
3
Field calibration service is available for this calibration. Please note the actual measurement uncertainties
achievable on a customer's site can normally be expected to be larger than the CMC found on the A2LA
Scope. Allowance must be made for aspects such as the environment at the place of calibration and for
other possible adverse effects such as those caused by transportation of the calibration equipment. The
usual allowance for the actual uncertainty introduced by the item being calibrated, (e.g. resolution) must
also be considered and this, on its own, could result in the actual measurement uncertainty achievable on
a customer’s site being larger than the CMC.
4
In the statement of CMC, L is the numerical value of the nominal length of the device measured in inches
or millimeters. DL is the diagonal length measured in inches or millimeters. R is the resolution of the unit
under test. D is the numerical value of the nominal diameter of the device measured in inches or
millimeters. V is the velocity of the reading. H is the Humidity of the reading. M is the mass of the reading
in grams or pounds. T is the temperature of the measure in Celsius.
5
This laboratory meets R205 – Specific Requirements: Calibration Laboratory Accreditation Program for
the types of dimensional tests listed above and is considered equivalent to that of a calibration.
6
The measurands stated are generated using the indicated instrument (see Comments). This capability is
suitable for the calibration of the devices intended to measure the measurand in the ranges indicated.
CMC uncertainties are expressed as either a specific value that covers the full range or as a
percent/fraction of the reading plus a fixed floor specification.
7
In the statement of CMC, percentage (%) refers to percent of reading, unless otherwise noted.
8
The type of instrument or material being calibrated is defined by the parameter. This indicates the
laboratory is capable of calibrating instruments that measure or generate the values in the ranges indicated
for the listed measurement parameter.
9
This scope meets A2LA’s P112 Flexible Scope Policy.

(A2LA Cert. No. 1387.03) Revised 3/31/2022 Page 30 of 30

 Accredited Laboratory
A2LA has accredited

MSI-VIKING GAGE, LLC

N. Charleston, SC
for technical competence in the field of

Calibration
This laboratory is accredited in accordance with the recognized International Standard ISO/IEC 17025:2017 General
requirements for the competence of testing and calibration laboratories. This laboratory also meets the requirements of ANSI/NCSL
Z540-1-1994 and R205 – Specific Requirements: Calibration Laboratory Accreditation Program. This accreditation demonstrates
technical competence for a defined scope and the operation of a laboratory quality management system
(refer to joint ISO-ILAC-IAF Communiqué dated April 2017).

Presented this 14th day of October 2021

_______________________
Vice President, Accreditation Services
For the Accreditation Council
Certificate Number 1387.03
Valid to September 30, 2023

For the calibrations to which this accreditation applies, please refer to the laboratory’s Calibration Scope of Accreditation.