SCOPE OF ACCREDITATION TO ISO/IEC 17025:2017

CROSS TECHNOLOGIES, INC dba CROSS (FORMERLY J.A. KING)

7103 Juniper Road
Fairview, TN 37062
Connie Foster Phone: 800 327 7727

CALIBRATION

Valid To: May 31, 2023 Certificate Number: 1741.08

In recognition of the successful completion of the A2LA evaluation process, accreditation is granted to this
laboratory to perform the following calibrations1, 10:

I. Chemical

Parameter/Equipment Range CMC2 (±) Comments

pH Meters3 4 pH 0.06 pH Standard pH solutions

7 pH 0.04 pH
10 pH 0.05 pH

Conductivity Meters3 – 10 µS/cm 0.63 µS/cm Standard conductivity

Fixed Points 100 µS/cm 2.3 µS/cm solutions
1000 µS/cm 6.1 µS/cm

II. Dimensional

Parameter/Equipment Range CMC2, 6 (±) Comments

Pin Gage3 – Class ZZ Up to 2 in 80 µin Micrometer

Calipers3 Up to 120 in (6 + 6.1L) µin + 0.6R Gage blocks

(A2LA Cert. No. 1741.08) 6/16/2021 Page 1 of 19

 Parameter/Equipment Range CMC2, 6 (±) Comments

Micrometers3 – Outside Up to 48 in (6 + 9.7L) µin + 0.6R Gage blocks

Micrometers3 – Inside Up to 8 in (2.9 + 9.4L) µin + 0.6R Gage blocks

Linear Indicators3 – Dial & Up to 4 in (3.2 + 8.8L) µin + 0.6R Gage blocks
Test

Height Gages3 Up to 20 in (2.5 + 10L) µin + 0.6R Gage blocks

(20 to 48) in (9.5 + 9.7L) µin + 0.6R

Steel Rules3 Up to 72 in (6.3 + 9.2L) µin + 0.6R Gage blocks

Tape Measures3 Up to 25 ft (6.3 + 9.2L) µin + 0.6R Gage blocks

Angle Indicators & 15°, 30°, 45°, 60°, 0.03° Angle block set
Protractors3 75°, 90°

Feeler/Thickness Gages3 Up to 1 in 80 µin Micrometer

Diameter /Radius/Fixture
Gages/Weld Gages3 –

Diameter Up to 2.0 in 430 µin Optical comparator,

measuring microscope
Radius Up to 2.0 in 430 µin

Length Up to 12.0 in 430 µin

Up to 528 in 0.049 in Fluke laser distance
meter

Circumference (12 to 36) in 0.0062 in Pi tape

Optical Comparators3 –

X-Y Linearity Up to 6 in 150 µin Glass master scales

Magnification 10x to 250x 0.014 in

Angle (0 to 90)° 0.1° Angle block set

(A2LA Cert. No. 1741.08) 6/16/2021 Page 2 of 19

 Parameter/Equipment Range CMC2, 6 (±) Comments

Microscope3 – Reticle Up to 1 mm 0.005 mm + 0.6R Stage micrometer

Linearity
(1 to 10) mm 0.005 mm + 0.6R

Surface Plates3 –
Grades AA, A, & B

Repeatability 0.002 in 26 μin Repeat-o-meter

Flatness Up to 60 DL in (31 + 0.2DL) μin Federal level systems

(>60 to 120) DL in (30 + 0.3DL) μin

Interim Verification of
Coordinate Measuring
Machines3 –

X, Y, Z Linearity Up to 36 in (55 + 3L) µin Gage blocks

Volumetric Up to 10 in 180 µin Ball bar

Performance

III. Dimensional Testing / Calibration

Parameter/Equipment Range CMC2, 6 (±) Comments

Length 3,8 –

X Axis Up to 138 in 0.0034 in Faro Arm Quantum S

Y Axis Up to 138 in 0.0034 in
Z Axis Up to 138 in 0.0034 in

Volumetric3 Up to 138 in 0.0039 in

(A2LA Cert. No. 1741.08) 6/16/2021 Page 3 of 19

IV. Electrical – DC/Low Frequency

Parameter/Equipment Range CMC2, 4, 8 (±) Comments

DC Voltage3 – Measure (0 to 100) mV 11 µV/V + 0.3 µV Agilent 3458A opt 002

100 mV to 1 V 10 µV/V + 0.3 µV
(1 to 10) V 10 µV/V + 0.5 µV
(10 to 100) V 11 µV/V + 30 µV
(100 to 1000) V 27 µV/V + 100 µV

Up to 10 kV 0.05 % + 0.03 V Vitrek 4700

(10 to 70) kV 0.07 % + 0.3 V Vitrek 4700 w/ HVL-70

DC Voltage3 – (0 to 330) mV 25 µV/V + 1 µV Fluke 5522A

Generate 330 mV to 3.3 V 14 µV/V + 2 µV
(3.3 to 33) V 15 µV/V + 15 µV
(33 to 330) V 22 µV/V + 150 µV
(100 to 1020) V 22 µV/V + 1.5 mV

Up to 5 kV 0.05 % + 0.03 V Voltage source w/ Vitrek

4700

DC Power3 – Generate

33 mV to 1020 V Fluke 5522A

(0.33 to 329.99) mA (0.01 to 330) W 0.03 %

(0.33 to 2.9999) A (0.33 to 3.3) kW 0.03 %
(3 to 20.5) A (3.3 to 20.5) kW 0.09 %

DC Current 3 – Measure (0 to 100) nA 32 µA/A + 0.04 nA Agilent 3458A opt 002

100 nA to 1 µA 23 µA/A + 0.04 nA
(1 to 10) µA 23 µA/A + 0.1 nA
(10 to 100) µA 23 µA/A + 0.8 nA
100 µA to 1 mA 23 µA/A + 5 nA
(1 to 10) mA 23 µA/A + 50 nA
(10 to 100) mA 37 µA/A + 0.5 µA
100 mA to 1 A 0.011 % + 10 µA

Up to 50 A 0.03 % Ohms Lab CS-50 w/

Agilent 3458A

(A2LA Cert. No. 1741.08) 6/16/2021 Page 4 of 19

 Parameter/Equipment Range CMC2, 4, 8 (±) Comments

DC Current 3 – Generate (0 to 330) µA 0.018 % + 0.02 µA Fluke 5522A

(0 to 3.3) mA 0.012 % + 0.05 µA
(0 to 33) mA 0.013 % + 0.25 µA
(0 to 330) mA 0.015 % + 2.5 µA
(0 to 1.1) A 0.024 % + 40 µA
(1.1 to 3) A 0.046 % + 40 µA
(3 to 11) A 0.06 % + 500 µA
(11 to 21) A 0.12 % + 750 µA

DC Clamp-On Meters3 Up to 1000 A 0.65 % + 0.5 A Fluke 5522A w/5500 coil

Resistance3 – Measure (0 to 10) Ω 18 µΩ/Ω + 50 µΩ Agilent 3458A opt 002

(10 to 100) Ω 15 µΩ/Ω + 0.5 mΩ
100 Ω to 1kΩ 14 µΩ/Ω + 0.5 mΩ
(1 to 10) kΩ 12 µΩ/Ω + 5 mΩ
(10 to 100) kΩ 12 µΩ/Ω + 50 mΩ
100 kΩ to 1 MΩ 17 µΩ/Ω + 2 Ω
(1 to 10) MΩ 51 µΩ/Ω + 100 Ω
(10 to 100) MΩ 0.051 % + 1 kΩ
100 MΩ to 1 GΩ 0.11 % + 10 kΩ

Insulation Resistance 1 MΩ, 10 MΩ, 100 1.2 % Local resistor set

MΩ, 1 GΩ, 10 GΩ

10 mΩ 1.2 % Fluke 5322A

100 mΩ to 5 Ω 0.37 % + 10 mΩ
(5 to 200) Ω 0.25 % + 10 mΩ
200 Ω to 1 MΩ 0.25 %
(1 to 10) MΩ 0.37 %
10 MΩ to 1 GΩ 0.6 %
(1 to 10) GΩ 1.2 %
100 GΩ 3.6 %

350 MΩ to 99.99 GΩ 1.8 % Fluke 5322A w/

(100 to 999.9) GΩ 3% resistance multiplier
(1 to 10) TΩ 4.2 % adapter

(A2LA Cert. No. 1741.08) 6/16/2021 Page 5 of 19

 Parameter/Equipment Range CMC2, 4, 8 (±) Comments

Resistance3 – Generate (0 to 11) Ω 49 µΩ/Ω + 0.001 Ω Fluke 5522A

(11 to 33) Ω 51 µΩ/Ω + 0.0015 Ω
(33 to 110) Ω 34 µΩ/Ω + 0.0014 Ω
110 Ω to 1.1 kΩ 34 µΩ/Ω. + 0.002 Ω
(1.1 to 11) kΩ 34 µΩ/Ω + 0.02 Ω
(11 to 110) kΩ 34 µΩ/Ω + 0.2 Ω
110 kΩ to 1.1 MΩ 39 µΩ/Ω + 2 Ω
(1.1 to 3.3) MΩ 73 µΩ/Ω + 30 Ω
(3.3 to 11) MΩ 0.016 % + 50 Ω
(11 to 33) MΩ 0.03 % + 2.5 kΩ
(33 to 110) MΩ 0.06 % + 3 kΩ
(110 to 330) MΩ 0.36 % + 100 kΩ
(330 to 1100) MΩ 1.8 % + 500 kΩ

Fixed Values 1 mΩ 0.12 % Standard resistors

10 mΩ 0.03 %
100 mΩ 0.1 %

Capacitance3 –
Generate

(220.0 to 399.9) pF (10 to 10 000) Hz 0.6 % + 10 pF Fluke 5522A

(0.4 to 1.0999) nF (10 to 10 000) Hz 0.6 % + 0.01 nF
(1.1 to 3.2999) nF (10 to 3000) Hz 0.6 % + 0.01 nF
(3.3 to 10.9999) nF (10 to 1000) Hz 0.3 % + 0.01 nF
(11 to 109.999) nF (10 to 1000) Hz 0.3 % + 0.1 nF
(110 to 329.999) nF (10 to 1000) Hz 0.3 % + 0.3 nF
(0.33 to 1.09999) µF (10 to 600) Hz 0.3 % + 1 nF
(1.1 to 3.29999) µF (10 to 300) Hz 0.3 % + 3 nF
(3.3 to 10.9999) µF (10 to 150) Hz 0.3 % + 10 nF
(11 to 32.9999) µF (10 to 120) Hz 0.49 % + 30 nF
(33 to 109.999) µF (10 to 80) Hz 0.55 % + 100 nF
(110 to 329.999) µF (0 to 50) Hz 0.54 % + 300 nF
(.33 to 1.09999) mF (0 to 20) Hz 0.55 % + 1 µF
(1.1 to 3.29999) mF (0 to 6) Hz 0.55 % + 3 µF
(3.3 to 10.9999) mF (0 to 2) Hz 0.56 % + 10 µF
(11 to 32.9999) mF (0 to 0.6) Hz 0.91 % + 30 µF
(33 to 110) mF (0 to 0.2) Hz 1.4 % + 100 µF

(A2LA Cert. No. 1741.08) 6/16/2021 Page 6 of 19

 Parameter/Range Frequency CMC2, 4 (±) Comments

AC Voltage3 –
Generate

(1 to 33) mV (10 to 45) Hz 0.1 % + 6 µV Fluke 5522A

45 Hz to 10 kHz 0.021 % + 6 µV
(10 to 20) kHz 0.027 % + 6 µV
(20 to 50) kHz 0.12 % + 6 µV
(50 to 100) kHz 0.42 % + 12 µV
(100 to 500) kHz 0.96 % + 50 µV

(33 to 330) mV (10 to 45) Hz 0.036 % + 8 µV

45 Hz to 10 kHz 0.018 % + 8 µV
(10 to 20) kHz 0.02 % + 8 µV
(20 to 50) kHz 0.042 % + 8 µV
(50 to 100) kHz 0.096 % + 32 µV
(100 to 500) kHz 0.24 % + 70 µV

330 mV to 3.3 V (10 to 45) Hz 0.036 % + 50 µV

45 Hz to 10 kHz 0.018 % + 60 µV
(10 to 20) kHz 0.023 % + 60 µV
(20 to 50) kHz 0.036 % + 50 µV
(50 to 100) kHz 0.084 % + 130 µV
(100 to 500) kHz 0.29 % + 600 µV

(3.3 to 33) V (10 to 45) Hz 0.036 % + 650 µV

45 Hz to 10 kHz 0.018 % + 600 µV
(10 to 20) kHz 0.029 % + 600 µV
(20 to 50) kHz 0.042 % + 600 µV
(50 to 100) kHz 0.11 % + 1.6 mV

(33 to 330) V 45 Hz to 1 kHz 0.023 % + 2 mV

(1 to 10) kHz 0.024 % + 6 mV
(10 to 20) kHz 0.03 % + 6 mV
(20 to 50) kHz 0.036 % + 6 mV
(50 to 100) kHz 0.24 % + 50 mV

(330 to 1020) V 45 Hz to 10 kHz 0.036 % + 100 mV

AC Voltage3 – Measure

Up to 10 mV (1 to 40) Hz 0.031 % + 0.03 % of rng Agilent 3458A opt

40 Hz to 1 kHz 0.021 % + 0.011 % of rng 002
(1 to 20) kHz 0.031 % + 0.011 % of rng
(20 to 50) kHz 0.11 % + 0.011 % of rng
(50 to 100) kHz 0.51 % + 0.011 % of rng
(100 to 300) kHz 4.1 % + 0.02 % of rng

(A2LA Cert. No. 1741.08) 6/16/2021 Page 7 of 19

 Parameter/Range Frequency CMC2, 4 (±) Comments

AC Voltage3 – Measure (cont)

10 mV to 10 V (1 to 40) Hz 0.008 % + 0.004 % of rng Agilent 3458A

40 Hz to 1 kHz 0.008 % + 0.002 % of rng
(1 to 20) kHz 0.015 % + 0.002 % of rng
(20 to 50) kHz 0.031 % + 0.002 % of rng
(50 to 100) kHz 0.081 % + 0.002 % of rng
(100 to 300) kHz 0.31 % + 0.01 % of rng

(10 to 100) V (1 to 40) Hz 0.021 % + 0.004 % of rng

40 Hz to 1 kHz 0.021 % + 0.002 % of rng
(1 to 20) kHz 0.021 % + 0.002 % of rng
(20 to 50) kHz 0.036 % + 0.002 % of rng
(50 to 100) kHz 0.13 % + 0.002 % of rng
(100 to 300) kHz 0.41 % + 0.01 % of rng

(100 to 600) V (1 to 40) Hz 0.041 % + 0.004 % of rng

40 Hz to 1 kHz 0.041 % + 0.002 % of rng
(1 to 20) kHz 0.061 % + 0.002 % of rng
(20 to 50) kHz 0.13 % + 0.002 % of rng
(50 to 100) kHz 0.31 % + 0.002 % of rng

Up to 10 kV3 60 Hz 0.15 % + 0.1 V Vitrek 4700

(10 to 50) kV3 60 Hz 0.15 % + 0.6 V Vitrek 4700 w/

HVL-70

AC Current 3 – Measure

(0 to 100) µA (10 to 20) Hz 0.4 % + 0.03 % range Agilent 3458A opt

(20 to 45) Hz 0.15 % + 0.03 % range 002
45 Hz to 1 kHz 0.06 % + 0.03 % range
100 Hz to 5 kHz 0.06 % + 0.03 % range

(0.1 to 100) mA (10 to 20) Hz 0.4 % + 0.02 % range

(20 to 45) Hz 0.15 % + 0.02 % range
(45 to 100) Hz 0.06 % + 0.02 % range
100 Hz to 5 kHz 0.03 % + 0.02 % range
(5 to 20) kHz 0.06 % + 0.02 % range
(20 to 50) kHz 0.4 % + 0.04 % range
(50 to 100) kHz 0.55 % + 0.15 % range

(A2LA Cert. No. 1741.08) 6/16/2021 Page 8 of 19

 Parameter/Range Frequency CMC2, 4, 5 (±) Comments

AC Current 3 – Measure (cont)

(0.1 to 1) A (10 to 20) Hz 0.4 % + 0.02 % range Agilent 3458A opt

(20 to 45) Hz 0.16 % + 0.02 % range 002
(45 to 100) Hz 0.08 % + 0.02 % range
100 Hz to 5 kHz 0.1 % + 0.02 % range
(5 to 20) kHz 0.3 % + 0.02 % range
(20 to 50) kHz 1 % + 0.04 % range

(1 to 50) A DC to 60 Hz 0.03 % Ohms Lab CS-50 w/

Agilent 3458A

AC Current 3 – Generate Fluke 5522A

(0 to 0.33) mA (10 to 20) Hz 0.24 % + 0.1 µA

(20 to 45) Hz 0.18 % + 0.1 µA
45 Hz to 1 kHz 0.15 % + 0.1 µA
(1 to 5) kHz 0.36 % + 0.15 µA
(5 to 10) kHz 0.96 % + 0.2 µA
(10 to 30) kHz 2 % + 0.4 µA

(0.33 to 3.3) mA (10 to 20) Hz 0.24 % + 0.15 µA

(20 to 45) Hz 0.15 % + 0.15 µA
45 Hz to 1 kHz 0.12 % + 0.15 µA
(1 to 5) kHz 0.24 % + 0.2 µA
(5 to 10) kHz 0.6 % + 0.3 µA
(10 to 30) kHz 1.2 % + 0.6 µA

(3.3 to 33) mA (10 to 20) Hz 0.22 % + 2 µA

(20 to 45) Hz 0.11 % + 2 µA
45 Hz to 1 kHz 0.05 % + 2 µA
(1 to 5) kHz 0.1 % + 2 µA
(5 to 10) kHz 0.24 % + 3 µA
(10 to 30) kHz 0.48 % + 4 µA

(33 to 330) mA (10 to 20) Hz 0.22 % + 20 µA

(20 to 45) Hz 0.11 % + 20 µA
45 Hz to 1 kHz 0.05 % + 20 µA
(1 to 5) kHz 0.12 % + 50 µA
(5 to 10) kHz 0.24 % + 100 µA
(10 to 30) kHz 0.48 % + 200 µA

(0.33 to 1.1) A (10 to 45) Hz 0.22 % + 100 µA

45 Hz to 1 kHz 0.06 % + 100 µA
(1 to 5) kHz 0.72 % + 1 mA
(5 to 10) kHz 3 % + 5 mA

(A2LA Cert. No. 1741.08) 6/16/2021 Page 9 of 19

 Parameter/Range Frequency CMC2, 4, 5 (±) Comments

AC Current 3 – Generate Fluke 5522A

(1.1 to 3) A (10 to 45) Hz 0.22 % + 100 µA

45 Hz to 1 kHz 0.08 % + 100 µA
(1 to 5) kHz 0.72 % + 1 mA
(5 to 10) kHz 3 % + 5 mA

(3 to 11) A 45 Hz to 1 kHz 0.13 % + 2 mA

(1 to 5) kHz 3.6 % + 2 mA

(11 to 20.5) A 45 Hz to 1 kHz 0.18 % + 5 mA

(1 to 5) kHz 3.6 % + 5 mA

AC Power3 – Generate Fluke 5522A

(45 to 65) Hz; PF=1

(33 to 330) mV Range

(3.3 to 8.99) mA 110 µW to 3 mW 0.17 %

(9 to 32.99) mA (3 to 11) mW 0.12 %
(33 to 89.99) mA (1.1 to 30) mW 0.17 %
(90 to 329.99) mA (3 to 110) mW 0.12 %
(0.33 to 0.8999) A (11 to 300) mW 0.16 %
(0.9 to 2.1999) A (30 to 730) mW 0.14 %
(2.2 to 4.4999) A 73 mW to 1.5 W 0.16 %
(4.5 to 20.5) A 150 mW to 6.8 W 0.14 %

330 mV to 1020 V Range

(3.3 to 8.99) mA 1.1 mW to 9 W 0.15 %

(9 to 32.99) mA 3 mW to 33 W 0.1 %
(33 to 89.99) mA 11 mW to 90 W 0.15 %
(90 to 329.99) mA 30 mW to 330 W 0.1 %
(0.33 to 0.8999) A 110 mW to 900 W 0.14 %
(0.9 to 2.1999) A 300 mW to 2200 W 0.11 %
(2.2 to 4.4999) A 730 mW to 4500 W 0.15 %
(4.5 to 20.5) A (1.5 to 20.9) kW 0.12 %

(A2LA Cert. No. 1741.08) 6/16/2021 Page 10 of 19

 Parameter/Equipment Range CMC2 (±) Comments

AC Clamp-On Meters3 – Fluke 5520A w/ 5500

coil
(Up to 150) A

Toroidal (45 to 65) Hz 0.49 % + 0.025 A

(65 to 440) Hz 1 % + 0.027 A

Non-Toroidal (45 to 65) Hz 0.76 % + 0.25 A

(65 to 440) Hz 1.3 % + 0.25 A

(150 to 1025) A

Toroidal (45 to 65) Hz 0.49 % + 0.09 A

(65 to 440) Hz 1 % + 0.1 A

Non-Toroidal (45 to 65) Hz 0.76 % + 0.9 A

(65 to 440) Hz 1.3 % + 0.9 A

Oscilloscopes3 – Fluke 5522A w/

SC1100
Square Wave Signal:

50 Ω Load @ 1 kHz 1 mV to 6.6 Vpk - pk 0.31 % + 40 µV

1 MΩ Load @ 1 kHz 1 mV to 130 Vpk - pk 0.14 % + 40 µV

DC Volt Amplitude:

50 Ω Load (0 to 6.6) V 0.3 % + 40 µV

1 MΩ Load (0 to 130) V 0.06 % + 40 µV

Level Sine Wave:

Frequency (0 to 1100) MHz 3.3 µHz/Hz

Amplitude 50 kHz Reference 2.4 % + 300 µV

50 kHz to 100 MHz 4.2 % + 300 µV
(100 to 300) MHz 4.8 % + 300 µV
(300 to 600) MHz 7.2 % + 300 µV
(600 to 1100) MHz 8.4 % + 300 µV

Flatness (Bandwidth) 0 kHz to 100 MHz 1.8 % + 100 µV

(100 to 300) MHz 2.4 % + 100 µV
(300 to 600) MHz 4.8 % + 100 µV
(600 to 1100) MHz 6 % + 100 µV

(A2LA Cert. No. 1741.08) 6/16/2021 Page 11 of 19

 Parameter/Range Frequency CMC2, 4 (±) Comments

Oscilloscopes3 – (cont) Fluke 5522A w/

SC1100
Time Markers:

Into a 50 Ω Load 5 s to 50 ms (30 + 1000t) µs/s t is time in seconds

20 ms to 1 ns 3.5 µs/s

Rise Time:

1 kHz to 2 MHz ≤ 300 ps 130 ps

(2 to 10) MHz ≤ 350 ps

Electrical Simulation of
Thermocouples3 –

Type B (600 to 800) °C 0.53 °C Fluke 5522A

(800 to 1820) °C 0.43 °C

Type E (-250 to -100) °C 0.61 °C

(-100 to 650) °C 0.21 °C
(650 to 1000) °C 0.26 °C

Type J (-210 to -100) °C 0.33 °C

(-100 to 760) °C 0.22 °C
(760 to 1200) °C 0.29 °C

Type K (-200 to -100) °C 0.4 °C

(-100 to 1000) °C 0.32 °C
(1000 to 1372) °C 0.49 °C

Type R (0 to 250) °C 0.70 °C

(250 to 1000) °C 0.42 °C
(1000 to 1767) °C 0.50 °C

Type S (0 to 250) °C 0.58 °C

(250 to 1400) °C 0.46 °C
(1400 to 1767) °C 0.57 °C

Type T (-250 to -150) °C 0.76 °C

(-150 to 0) °C 0.30 °C
(0 to 400) °C 0.21 °C

(A2LA Cert. No. 1741.08) 6/16/2021 Page 12 of 19

 Parameter/Range Frequency CMC2, 4 (±) Comments

Electrical Simulation of
Thermocouples3 –

Type J (-200 to 1200) °C 0.07 °C Fluke 5522A w/ ice

point reference
Type K (-200 to 1372) °C 0.07 °C

Type T (-250 to 400) °C 0.07 °C

Electrical Simulation of
RTDs3

Pt 385, 100 Ω (-200 to 0) °C 0.07 °C Fluke 5522A

(0 to 100) °C 0.10 °C
(100 to 300) °C 0.11 °C
(300 to 400) °C 0.13 °C
(400 to 630) °C 0.15 °C
(630 to 800) °C 0.28 °C

V. Fluid Quantities

Parameter/Equipment Range CMC2, 5 (±) Comments

Viscosity Meters3 Up To 16 300 cP 0.46 % Standard viscosity

solution w/ bath

Viscosity Dip Cups3 (0 to 100) mm²/s 2.2 cSt Certified viscosity oil
(Kinematic Viscosity, Efflux (100 to 1000) mm²/s 2.2 cSt
Time)

Volumetric Air Flow (20 to 200) lpm 1.4 % Reference flowmeter

Measure & Measuring
Equipment 3

(A2LA Cert. No. 1741.08) 6/16/2021 Page 13 of 19

VI. Mechanical

Parameter/Equipment Range CMC2, 5, 6 (±) Comments

Torque Testers /Analyzers, Up to 250 ft·lbf 0.08 % Class F weights

Transducers3 & arm

Torque Wrenches3 Up to 600 ft·lbf 0.64 % CDI Suretest

5000-ST

Rotary Torque Tools (0.02 to 2) Nꞏm 0.03 Nꞏm Crane – torque

(Pneumatic, DC, (0.5 to 5) Nꞏm 0.07 Nꞏm star w/ rotary
Pulse) (1 to 10) Nꞏm 0.15 Nꞏm transducers
(2 to 20) Nꞏm 0.29 Nꞏm
(2.5 to 25) Nꞏm 0.36 Nꞏm
(7.5 to 75) Nꞏm 1.1 Nꞏm
(18 to 180) Nꞏm 2.6 Nꞏm

Scales & Balances3 (1 to 20 000) g 0.017 % + 0.6R Class F weights

(> 20 to 5000) kg 0.017 % per 20 kg + 0.6R (applied load)

Up to 1000 lb 0.017 % + 0.6R

(1000 to 120 000) lb 0.017 % per 1000 lb + 0.6R

(1 to 5) g 0.041 mg + 0.6R Class 1 weights

(Up to 10) g 0.06 mg + 0.6R (applied load)
(Up to 30) g 0.089 mg + 0.6R
(Up to 50) g 0.14 mg + 0.6R
(Up to 100) g 0.3 mg + 0.6R
(Up to 200) g 0.6 mg + 0.6R
(Up to 300) g 0.9 mg + 0.6R
(Up to 500) g 1.4 mg + 0.6R
(Up to 1000) g 3 mg + 0.6R
(> 1000) g 3 mg per 1000 g + 0.6R

Force – Measuring Up to 5000 lbf 0.04 % + 0.6R Class F weights

Equipment 3
Up to 10 000 lbf 0.14 % of applied force Load cells w/
indicator

(A2LA Cert. No. 1741.08) 6/16/2021 Page 14 of 19

 Parameter/Equipment Range CMC2, 5 (±) Comments

Pressure3 – Measure & Up to 1 in H2O 0.63 % of full scale Dwyer 475

Measuring Equipment
Up to 10 in H2O 0.63 % of full scale Dwyer 475

Up to 200 in H2O 0.13 % of full scale Dwyer 477B

0.5 to 100 psia 0.063 psia Fluke 700GA6

(0.01 to 100) psig 0.07 % of full scale Fluke 754 w/ 700 series
(0.1 to 1000) psig 0.07 % of full scale modules
(5 to 10 000) psig 0.07 % of full scale

(30 to 300) psig 0.03 % of full scale Additel ADT-681

(300 to 3000) psig 0.03 % of full scale Additel ADT-681

Vacuum 3 (0.01 to 28.5) in∙Hg 0.07 % of full scale Fluke 754 w/ 700PD6

Indirect Verification of
Brinell Hardness Testers at
Test Condition 3 –

HBW 2.5/187.5 79.2 HBW 4.0 HBW Indirect verification

145 HBW 4.0 HBW ASTM E10

HBW 10/500 75.6 HBW 4.0 HBW

130 HBW 1.6 HBW

HBW 5/750 118 HBW 4.0 HBW

148 HBW 4.0 HBW
180 HBW 4.0 HBW
289 HBW 1.6 HBW
420 HBW 4.5 HBW

HBW 10/1000 182 HBW 4.4 HBW

299 HBW 4.4 HBW

HBW 10/3000 418 HBW 3.2 HBW

(A2LA Cert. No. 1741.08) 6/16/2021 Page 15 of 19

 Parameter/Equipment Range CMC2 (±) Comments

Indirect Verification of
Rockwell Hardness Testers3 HRA Indirect verification per
(20 to 65) 0.82 HRA ASTM E18
(70 to 78) 0.81 HRA
(80 to 84) 0.81 HRA

HRBW
(40 to 59) 0.82 HRBW
(60 to 79) 0.82 HRBW
(80 to 100) 0.81 HRBW

HRC
(20 to 30) 0.84 HRC
(35 to 55) 0.84 HRC
(60 to 65) 0.81 HRC

HR15N
(70 to 77) 0.82 HR15N
(78 to 88) 0.82 HR15N
(90 to 92) 0.81 HR15N

HR30N
(42 to 50) 0.81 HR30N
(55 to 73) 0.81 HR30N
(77 to 82) 0.81 HR30N

HR45N
(20 to 31) 0.82 HR45N
(37 to 61) 0.83 HR45N
(66 to 72) 0.81 HR45N

15T:
Low 0.80 HRBW
Medium 0.80 HRBW
High 0.82 HRBW

30T:
Low 0.80 HRBW
Medium 0.80 HRBW
High 0.82 HRBW

(A2LA Cert. No. 1741.08) 6/16/2021 Page 16 of 19

 Parameter/Equipment Range CMC2, 5 (±) Comments

Speed3 –

Optic/Non-Contact:
RPM (5 to 200 000) rpm 0.018 % Monarch PT200

Contact:
RPM (0.5 to 20 000) rpm 0.22 % Monarch PT200
Totalizer/Rate Meters (1 to 6561.7) rpm 0.22 %

Speed/RPM/Rate Simulation (6 to 200 000) rpm 0.003 % Agilent 33220A

VII. Optical Quantities

Parameter/Equipment Range CMC2 (±) Comments

Light Booths3 –

Illuminance Up to 50 000 Lux 2.7 % Illuminance

spectrophotometer
Color Temperature (CCT) (2300 to 6500) K 54 K
Incandescent

VIII. Thermodynamics

Parameter/Equipment Range CMC2, 9 (±) Comments

Infrared Thermometry3 – Up to 100 °C 1 °C Fluke 4181

Measuring Equipment 100 to 200 °C 1.2 °C
200 to 350 °C 1.7 °C
350 to 500 °C 2.3 °C

Temperature3 – Measuring (-15 to 350) °C 0.14 °C Fluke 9009 w/

Equipment reference probe

(25 to 85) °C 0.04 °C Water bath w/ reference

probe

Temperature3 – Measure (-196 to 420) °C 0.029 °C Fluke 1502A w/ PRT

(A2LA Cert. No. 1741.08) 6/16/2021 Page 17 of 19

 Parameter/Equipment Range CMC2, 9 (±) Comments

Relative Humidity3 – (20 to 80) % RH 1.5 % RH Vaisala MI70 w/ HMP-

Measuring Equipment 76 w/ controlled
environment

Relative Humidity3 – Measure (10 to 90) % RH 1.5 % RH Vaisala MI70 w/ HMP-

76

VIII. Time & Frequency

Parameter/Equipment Range CMC2, 9 (±) Comments

Frequency3 – Measuring (0 to 1100) MHz 3.3 µHz/Hz Fluke 5522A/1GHz

Equipment

Frequency3 – Measure (0 to 350) MHz 1.3 µHz/Hz Agilent 53220A

Timers & Stopwatches3 (1 to 3600) s 0.017 s Agilent 53220A

_______________________________________________________________

1 This laboratory offers commercial calibration, dimensional testing and field calibration services, where
noted.
2 Calibration and Measurement Capability Uncertainty (CMC) is the smallest uncertainty of measurement
that a laboratory can achieve within its scope of accreditation when performing more or less routine
calibrations of nearly ideal measurement standards or nearly ideal measuring equipment. CMCs represent
expanded uncertainties expressed at approximately the 95 % level of confidence, usually using a coverage
factor of k = 2. The actual measurement uncertainty of a specific calibration performed by the laboratory
may be greater than the CMC due to the behavior of the customer’s device and to influences from the
circumstances of the specific calibration.
3 Field calibration service is available for this calibration. Please note the actual measurement uncertainties
achievable on a customer's site can normally be expected to be larger than the CMC found on the A2LA
Scope. Allowance must be made for aspects such as the environment at the place of calibration and for
other possible adverse effects such as those caused by transportation of the calibration equipment. The
usual allowance for the actual uncertainty introduced by the item being calibrated, (e.g. resolution) must
also be considered and this, on its own, could result in the actual measurement uncertainty achievable on
a customer’s site being larger than the CMC.
4 The stated measured values are determined using the indicated instrument (see Comments). This
capability is suitable for the calibration of the devices intended to measure or generate the measured value
in the ranges indicated. CMCs are expressed as either a specific value that covers the full range or as a
fraction/percentage of the reading plus a fixed floor specification.

(A2LA Cert. No. 1741.08) 6/16/2021 Page 18 of 19

5 In the statement of CMC, a percent (%) refers to a percent of reading unless otherwise noted.
6 In the statement of CMC, L is the numerical value of the nominal length of the device measured in inches.
In the Calibration and Measurement Capability, R is the numerical value of the resolution of the device,
and DL is the length of the diagonal in inches.
7 In the statement of CMC, t represents the time in seconds.
8 This laboratory meets R205 – Specific Requirements: Calibration Laboratory Accreditation Program for
the types of dimensional tests listed above and is considered equivalent to that of a calibration.
9 The type of instrument or material being calibrated is defined by the parameter. This indicates the
laboratory is capable of calibrating instruments that measure or generate the values in the ranges indicated
for the listed measurement parameter.
10 This scope meets A2LA’s P112 Flexible Scope Policy.

(A2LA Cert. No. 1741.08) 6/16/2021 Page 19 of 19

 Accredited Laboratory
A2LA has accredited

CROSS TECHNOLOGIES, INC DBA CROSS (FORMERLY J.A. KING)

Fairview, TN
for technical competence in the field of

Calibration
This laboratory is accredited in accordance with the recognized International Standard ISO/IEC 17025:2017 General
requirements for the competence of testing and calibration laboratories. This laboratory also meets the requirements of R205 –
Specific Requirements: Calibration Laboratory Accreditation Program. This accreditation demonstrates technical competence for
a defined scope and the operation of a laboratory quality management system (refer to joint ISO-ILAC-IAF Communiqué dated
April 2017).

Presented this 16th day of June 2021.

_______________________
Vice President, Accreditation Services
For the Accreditation Council
Certificate Number 1741.08
Valid to May 31, 2023

For the calibrations to which this accreditation applies, please refer to the laboratory’s Calibration Scope of Accreditation.