6.720J/3.
43J - Integrated Microelectronic Devices - Spring 2007 Lecture 35-1
Lecture 35 - Bipolar Junction Transistor
(cont.)
May 3, 2007
Contents:
1. Current-voltage characteristics of ideal BJT (cont.)
Reading material:
del Alamo, Ch. 11, §11.2 (11.2.1)
Cite as: Jesús del Alamo, course materials for 6.720J Integrated Microelectronic Devices, Spring 2007.
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6.720J/3.43J - Integrated Microelectronic Devices - Spring 2007 Lecture 35-2
Key questions
• How does the BJT operate in other regimes?
• How does a complete model for the ideal BJT look like?
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6.720J/3.43J - Integrated Microelectronic Devices - Spring 2007 Lecture 35-3
1. Current-voltage characteristics of ideal BJT (cont.)
� Forward-active regime (VBE > 0, VBC < 0)
Summary of key results:
WB << LB
n-Emitter p-Base n-Collector
IE<0 IC>0
IB>0
VBE > 0 VBC < 0
qVBE
IC = IS exp
kT
IS qVBE
IB = (exp − 1)
βF kT
qVBE IS qVBE
IE = −IC − IB = −IS exp − (exp − 1)
kT βF kT
Cite as: Jesús del Alamo, course materials for 6.720J Integrated Microelectronic Devices, Spring 2007.
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6.720J/3.43J - Integrated Microelectronic Devices - Spring 2007 Lecture 35-4
• Current gain
n2i DB
IC NB WB NE DB WE
βF � � n2i DE
=
IB NB DE WB
NE WE
To maximize βF :
• NE � NB
• WE � WB (for manufacturing reasons, WE � WB )
• want npn, rather than pnp because this way DB > DE
βF hard to control ⇒ if βF is high enough (> 50), circuit techniques
effectively compensate for this.
Cite as: Jesús del Alamo, course materials for 6.720J Integrated Microelectronic Devices, Spring 2007.
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6.720J/3.43J - Integrated Microelectronic Devices - Spring 2007 Lecture 35-5
Cite as: Jesús del Alamo, course materials for 6.720J Integrated Microelectronic Devices, Spring 2007.
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6.720J/3.43J - Integrated Microelectronic Devices - Spring 2007 Lecture 35-6
• Equivalent circuit model
qVBE
B IS exp
kT
IS qVBE
(exp -1)
βF kT
qVBE
IC = IS exp
kT
IS qVBE
IB = (exp − 1)
βF kT
qVBE IS qVBE
IE = −IC − IB = −IS exp − (exp − 1)
kT βF kT
Cite as: Jesús del Alamo, course materials for 6.720J Integrated Microelectronic Devices, Spring 2007.
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6.720J/3.43J - Integrated Microelectronic Devices - Spring 2007 Lecture 35-7
• Energy band diagram
E(n) B(p) C(n)
EC
EF
thermal�
equilibrium
EV
EC
Efe
forward� qVBE
active Efh
EV
qVBC
• Summary of minority carrier profiles (not to scale)
pE nB pC
� pCo
pEo nBo
x
-WE-xBE -xBE 0 WB WB+xBC WB+xBC+WC
Cite as: Jesús del Alamo, course materials for 6.720J Integrated Microelectronic Devices, Spring 2007.
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6.720J/3.43J - Integrated Microelectronic Devices - Spring 2007 Lecture 35-8
� Reverse regime (VBE < 0, VBC > 0)
IE : electron injection from C to B, collection into E
IB : hole injection from B to C, recombination in C
n-Emitter p-Base n-Collector
IE>0 IC<0
IB>0
VBE < 0 VBC > 0
Minority carrier profiles (not to scale):
pE nB pC
� pCo
pEo nBo
x
-WE-xBE -xBE 0 WB WB+xBC WB+xBC+WC
Cite as: Jesús del Alamo, course materials for 6.720J Integrated Microelectronic Devices, Spring 2007.
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6.720J/3.43J - Integrated Microelectronic Devices - Spring 2007 Lecture 35-9
Current equations (just like FAR, but role of collector and emitter
reversed):
qVBC
IE = IS exp
kT
IS qVBC
IB = (exp − 1)
βR kT
qVBC IS qVBC
IC = −IE − IB = −IS exp − (exp − 1)
kT βR kT
Equivalent-circuit model representation:
IS qVBC
(exp -1)
βR kT
qVBC
B IS exp
kT
Cite as: Jesús del Alamo, course materials for 6.720J Integrated Microelectronic Devices, Spring 2007.
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6.720J/3.43J - Integrated Microelectronic Devices - Spring 2007 Lecture 35-10
Prefactor in IE expression is IS : emitter current scales with AE .
B E B B E B
IE AE
IB AC
C C
But, IB scales roughly as AC :
• downward component scales as AC
• upward component scales as AC − AE � AC
Hence, βR � 0.1 − 5 � βF .
Cite as: Jesús del Alamo, course materials for 6.720J Integrated Microelectronic Devices, Spring 2007.
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6.012 - Microelectronic Devices and Circuits - Fall 2005 Lecture 18-8
Forward-active Gummel plot (VCE = 3 V ):
Reverse Gummel (VEC = 3 V ):
Cite as: Jesús del Alamo, course materials for 6.720J Integrated Microelectronic Devices, Spring 2007.
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6.720J/3.43J - Integrated Microelectronic Devices - Spring 2007 Lecture 35-11
Energy band diagram:
E(n) B(p) C(n)
EC
thermal� EF
equilibrium
EV
Efe qVBC
EC qVBE
reverse
Efh
EV
Cite as: Jesús del Alamo, course materials for 6.720J Integrated Microelectronic Devices, Spring 2007.
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6.720J/3.43J - Integrated Microelectronic Devices - Spring 2007 Lecture 35-12
� Cut-off regime (VBE < 0, VBC < 0)
IE : hole generation in E, extraction into B
IC : hole generation in C, extraction into B
n-Emitter p-Base n-Collector
IE>0 IC>0
IB<0
VBE < 0 VBC < 0
Minority carrier profiles (not to scale):
pE nB pC
� pCo
pEo nBo
x
-WE-xBE -xBE 0 WB WB+xBC WB+xBC+WC
Cite as: Jesús del Alamo, course materials for 6.720J Integrated Microelectronic Devices, Spring 2007.
MIT OpenCourseWare (http://ocw.mit.edu/), Massachusetts Institute of Technology. Downloaded on [DD Month YYYY].
6.720J/3.43J - Integrated Microelectronic Devices - Spring 2007 Lecture 35-13
Current equations:
IS
IE =
βF
IS IS
IB = − −
βF βR
IS
IC =
βR
These are tiny leakage currents (∼ 10−12 A)
Equivalent-circuit model representation:
IS
βR
both reverse �
biased
B
IS
βF
Cite as: Jesús del Alamo, course materials for 6.720J Integrated Microelectronic Devices, Spring 2007.
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6.720J/3.43J - Integrated Microelectronic Devices - Spring 2007 Lecture 35-14
• Energy band diagram
E(n) B(p) C(n)
EC
EF
thermal�
equilibrium
EV
qVBE Efh
EC
cut-off Efe qVBC
EV
Cite as: Jesús del Alamo, course materials for 6.720J Integrated Microelectronic Devices, Spring 2007.
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6.720J/3.43J - Integrated Microelectronic Devices - Spring 2007 Lecture 35-15
� Saturation regime (VBE > 0, VBC > 0)
IC , IE : balance of electron injection from E/C into B
IB : hole injection into E/C, recombination in E/C, respectively
n-Emitter p-Base n-Collector
IE IC
IB<0
VBE > 0 VBC > 0
Minority carrier profiles (not to scale):
pE nB pC
� pCo
pEo nBo
x
-WE-xBE -xBE 0 WB WB+xBC WB+xBC+WC
Cite as: Jesús del Alamo, course materials for 6.720J Integrated Microelectronic Devices, Spring 2007.
MIT OpenCourseWare (http://ocw.mit.edu/), Massachusetts Institute of Technology. Downloaded on [DD Month YYYY].
6.720J/3.43J - Integrated Microelectronic Devices - Spring 2007 Lecture 35-16
Current equations: superposition of forward active + reverse:
qVBE qVBC IS qVBC
IC = IS (exp − exp ) − (exp − 1)
kT kT βR kT
IS qVBE IS qVBC
IB = (exp − 1) + (exp − 1)
βF kT βR kT
IS qVBE qVBE qVBC
IE = − (exp − 1) − IS (exp − exp )
βF kT kT kT
IC and IE can have either sign, depending on relative magnitude of
VBE and VBC and βF and βR .
Equivalent circuit model representation (Non-Linear Hybrid-π Model):
IS qVBC
(exp -1)
βR kT
qVBE qV
B IS (exp - exp BC )
kT kT
IS qVBE
(exp -1)
βF kT
Complete model has only three parameters: IS , βF , and βR.
Cite as: Jesús del Alamo, course materials for 6.720J Integrated Microelectronic Devices, Spring 2007.
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6.720J/3.43J - Integrated Microelectronic Devices - Spring 2007 Lecture 35-17
Energy band diagram:
E(n) B(p) C(n)
EC
thermal� EF
equilibrium
EV
EC
Efe qV
saturation qVBE BC
Efh
EV
In saturation, collector and base flooded with excess minority carriers
⇒ takes lots of time to get transistor out of saturation.
Cite as: Jesús del Alamo, course materials for 6.720J Integrated Microelectronic Devices, Spring 2007.
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6.720J/3.43J - Integrated Microelectronic Devices - Spring 2007 Lecture 35-18
Key conclusions
• In FAR, current gain βF maximized if NE � NB .
• βF hard to control precisely: if big enough (> 50), circuit tech
niques can compensate for variations in βF .
• BJT design optimized for operation in forward-active regime ⇒
operation in inverse regime is poor: βR � βF .
• In saturation, BJT flooded with minority carriers ⇒ takes time
to get BJT out of saturation.
• Hybrid-π model: equivalent circuit description of BJT in all
regimes:
C
IS qVBC
(exp -1)
βR kT
qVBE qV
B IS (exp - exp BC )
kT kT
IS qVBE
(exp -1)
βF kT
• Only three parameters needed to describe behavior of BJT in
four regimes: IS , βF , and βR.
Cite as: Jesús del Alamo, course materials for 6.720J Integrated Microelectronic Devices, Spring 2007.
MIT OpenCourseWare (http://ocw.mit.edu/), Massachusetts Institute of Technology. Downloaded on [DD Month YYYY].