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UNIT IV
FIELD EFFECT TRANSISTOR
Junction field effect transistor (construction, principle of operation, symbol)
Pinch-off voltage
Volt-ampere characteristics
MOSFET (construction, principle of operation, symbol)
Characteristics in enhancement and depletion modes
‘Small signal model of JFET & MOSFETFIELD EFFECT TRansisTOR (Fer) ¢
|
\ the Field effect Transistor abbreviated as
|
FET is an anothen Semi Cenducton device Uke a
[err which Can be Vsed as an amplifier on switch:
Like BIT, FET is also a thnee tenminal
device, howeyen the Principle of openation of FET
is Completely - different from that ef BIT.
: the Name Field Effect %S denived from the
fact that >the’ flow of connent thnovgh the
condveting region is controlled by OH electric Feld
Types of FET. to
Bosed Mm the censtnectio, the FET can be
classified in EO two types
b. Tonetion Field Effect Thansiston (TFET)
Semicon doctor,
2. metal oxiderField ERFect Transiston (mosFert) @)
Insvlated Gate FET CTGFET) (on) Metal oxide
silico 4nansiston (Most)
er ot
ncckamet Pe thannel Bepleton Enhancement
geet ret MosFET MOSFETFeatunes of FETS
Fer is 0 vetboge cemtnolied device because ootpot
eomnent is Controlled by Vamying the; mpot 4
> Fer is a wonipolan device becavse the 2
cunnent Cmductio is only by Majonity change
canniens
> the three tenmmats of FET ane hamed 45
Drain (p) , Sevmee (Ss) and gate CQ): ovk of these
tenminals gare tenminal acks 45 Controlling
element
> Fer iS “Hsne tempenatune stable as Compared
to prt.
—> Fer has veny hgh inpot Impedance. Typically 4
the mange of Sevenat mega ohms. Fer has vkighen
input impedance than BIT, So FET 1S pnefenned
im ampli fens whene high inpot impedance is Keqprined
> Feét's Regine less Space than that of BIT
hence they ane preferred in Totegaated Ancvits ,
Jonctim Field Effect Tnansiston (sret) —
epending opm the Majonity canniens TFET has
been classified im to two types.
)N-chammet seer with electnems as the majonity
change —- canniens
2) P-channel TFET With heles as the majonity
change canniens.Construction ond Symbol of
a
“7
Drain (p)
ohmic
Contacts
N~ Channel
Teer: |
Dnain(>)
(a)
—N-channet -
N 4
Sovrce ($,
L-——* seonee ¢¢) a
gate “ J gate
Fg: Structure and symbol fon N-Channet Srer ,
TE Consists of & N-type ben tshich made of
is
Sikeem. ohmic contacts (tenminals) made at the two
ends of the ban, ane called Sounce and drain.
Soonce(S); this tenminal is Connected te the
Negative tenminal of the batteny. Electnovs which|
ore the majonity camdens in the Netype ban
enten the ban thneagh this tenminal.
Drain( dD): this tenminal is Connected to the
Pesihve tenminal of the batteny: the majority
canniens leave the
bax thnoygh this tenminal.
Gate (q): Heavily doped P-type Silicon is diffused
m™m beth sides of the N-type silicon ban by al
Pr juetions ane fonmed- these layens ane |
|
joined togetnen and called gate (q)- ichannel -the ~ thin region between the two P-4Gates
——C—C—sCC—CSCCSCN
the n-type ban, the FET is. Known a5 n-channel
TrET:
Construction (structure) and symbol of P-Channel TrET/:
ey pnain(>)
e che
Contacts .
Gatela)
Pchamet
seme ts)
Source(s)
Fig: Struct one ond symbol fer p-channel a
the device iS made of P type ban with,
Figese: the
juso metype gates os Shen m
Prevciple of — wonking of P-chommel SFET ond
n- chomel 3FET 1S simitan. the Only diggeaence is
that, im n-channel TFET the cunnent 1S comme’
by elecknens while im P pene aces tee
Connied by Neles-openation of N-channet IFET {Static characteristts of srer)
Dwhen Vas z0 and the cinevit — Symbol fon
Nechamnel SFET 18 Shou in figure below
a
\.
AD
4 4
Mes 7 - Yep
we veltage is
D when Vgg2O_ and Yps =O % hE
M +
oppied between dnoain od sousce , and gute
of the depletion
the thiekness
is uniform
and Seunce ,
regions mound the PN Jjonchons
Shown in Figure below:
Dwhen vy. =o and Ves 1s decreared from Fere
Tr this case, the PN junctions ane Hevense
biased and hence the ickness Cf the depletion
Region increasesAS Ves 18 decaeased fem zene, the nevense bias
Vottage acnoss me PN djonction is tucaecased and
hence , the thickness of the depletion megion Ww
\ % make
the channel, ontit the tuo depletion negions
\ ) the
Contact sith each othen+ tH this Condition
bo cut OFF - rhe Value of
channet is said to
Vgs which is nequined
catlea the cut-off a >
3) when Veg=0 and Vps 's increased from 670 +
to cub- orf the Channel ts
Brain is positive With Aespect to the Sounce with
Ves =O» Now the Majonity canniens ie electnons flew
shnoogh the N-channel fren Sovace to drain. Therefore
the conventional coment I, flees fre Drain to
Sounce. The maguidude of Cordent will depend “pm
the Povtewing ficken So many factons. thy the
channel acts as a esiston.
Becavse of the Nesistance of the channel and
| the applied voltage pg, thene is a gnedual ierease
[of positive potential alg te channel fiom Sovace
to drain. thus the nevense Voltage acness the PN
Junction imeneases and hence the thickness of the
depletion ede alse meseases. thenefone the chawnet |
is wedge Shaped 48 Shown In Figore below’as
Yaq
AS Vp, is imcaeased, the cnoss Sectenal
omen of the channet will be neduced. At a centain
Nalune ef Vos, the Cnoss Sectional anea at &
becomes minimum. At this ee the channel is
Said to be Pinched off and the Comes ponding Vs
is called — pinch-ore voltage (yp)
As a nesott of the Aecreasing CASS Section
of the channel with the tacnease of Vng, the
following nesvlts ane obtained YL Break down
oa in gion :
Fptvne) § NM Snegenn HOt Nae vote.
B
° ve ———> vps (v)
Fig Drain choractenristinDAS Vos is imcheased fier Zeno, Tp incneases along
op: the aoe from Vpg =0V +0 Vpg= Vp is called
the chmic megion:
RW) when Vpg= Vp, Ip becomes marimum+ when Vs is
bacneased — beyond Vp, the length of the pinch-off
region Wackeases. Hence thene is no funthen imerease
of Ip.
iii) AE a centain voltage comespandi +o the point B,
Tm Suddenly imeneases. this erfeck is due to the
avalanche moltiplication of @lectnons caused by
breaking of covalent bends of Silicen atoms in the
depledion, region between the gore and drain.
a) when Vas is negative ond Ynys 1S incaeased '-
when the gote is maintained at a Negative
Votage tess than the negative cot-off Voltage, the
mevense Veltege across the Gunetion is fonthen
Gacneased- Hence for a negative Valve of Vas, the
conve of Fp Vensus Vag HS Swertan is shown in
figose above
From the conves it is Seen that above the
Pinch - off Veltag ob a Constant Value of Vos ,
Ta trcreases with an wWerease of Vas. Hence a
JFet is Suitable For use as a voltage amplifier,
Similan to a tnansiston ampli fier!Chanoctenisti¢ panametens of the JFET
Toa TreT, the dna connent Ty depends upon
jthe dnain Voltage Nog Gnd the gete _ Vas ° Any
Jove of these Vaniables may be fied and the Melation
between the othen two ane detenmined. these nelations
ame determined by the thnee panametens which one
defined below
)) transconductance @n) Mutual conductance ( Sq) '-
gt is the Slope of the tnansfen chanactenistic
cunves, and is defined by
Tp _ AT
Qn = Vp. = Constant
Des _
ys
ze if the matio ef a Small change in the
dmain cunnent to the Conmesponding Small change in
the gate Voltage at a Constant dnain voce
gt has the omit of Comductance im mho. ~~
3) Drain Resistance LULL Necipnocal of
the Slope of the daain
~-fimed by
chonactenistics and is deé-
| ay -[2s\ Nes
| an - AT Vag = Constant
| as
| Tt is the Ratio of oa
smatl change in the
dnain Voitage
to the commesponding small change in |Jthe drain Cunnent at a constant gate Voltage oe
has he onit of Mnesistance in ohms
3) fimplification facton() 1 Zt is defined by
pfs Nps ANVo5
2 Vas a
xp *%es , Ly = constant
Tt is the notio of a smatt change in
ehe dnain cole te the cConmesponding Smal
change in the gate Mee at a enstant drain
connent. Hene the negative Sign shows that whew
Vag is incneased, Vp, must be decreased for Ty
to Remain coms tant
Relationship among FET Panametens
AS Tp depends mm Vpg and Vg,, the fonctional
equation can be expressed as
T= (os, 7)
9F- the drain Vettage is changed by a Smatt
amoont from Vv,
ns to ( Vyg + 4 vps) and the pete
Voltage is ie by A Small amoont from Ves to
(es+ oVqs), then the Connespanding small change in
Ty May be sbtained by applying Taylen's theanem
with neglecting highen
onden tenms. thus a Smatt
change or, is oven byqT
Vp a\as + 2m ) aves
Arty =(——
avg 2% Nye
Ves
|
i by 4V, os
dividing both the sides of this epation by as
we obtain
4Nps t.
AX» 2p as che
= 4 Nos
aNas 2 Ves sp \eXasfy
Ves > Ds
G Ty is eonstant then Ald _
ay
| OVys 7 4 Veg BVes
Ds
Sebsttoting the Valves of Pontial diffenental Co-eres
veients , We get
7 D> [P= NG * Bey
| nq
t
| thenefone
amplification facton (fH) is the product
of drain nesistance Cara) and tnans conductance C8m)
gake
| Pasblem + when a sovense.
Voitage OL 12V is applied to
| seer, the gate
Comment is Ina . Detenmine the
[Mesiskamce between gate
“and sounce
Sol Yog = 12v
thenefore gate toproblem: when the Nevense gate Voltage of I=¥ +s apptied
tof TrET changes fiom 4 to BaV, the drain connent
changes from 3 tO LEMA- Find the Value of
tnans Conductance
|
ea avqs = 4-849 = oOLV
OIp = 6-13 = oO3mA
go = SER Los xis
7 = 3m mhas
ANas
or
Expression fon saturation dnain connent (er)
Transfer
chahactenishes of TFET
Fon the “tnansfen charactenisti¢s Vps is maintained
constant at a Suitable value gresten than the
Pinch - off ee Vp:
The gete Voltage Vag is decreaned fron Ferd BoINN
Tp is neduced to geno
the tnonsfen chanactenistics Ty Vensus Ves is showy
im figene below.
se
r ‘ele
<— Vas W)
Transfer chanactenisties of TFET
y| the shape ef the tnansfen chanactenistic is Veny
Meanty Panabola: rt 1s found that the charac tenists
is appnoximately Aepresented by the panabola.
L
Ty, = toss | ' 7 a —o
whene Ty, > Saturation drain Cunnent
Tyssg = the valve ef Tp, when Ves =O
| Vp = Pinch - off re
ditfenentioning e¢ © with respect to Ves, we CoM
ebtan expnession for gm
en, :
SS masea{r- Yas (a
2 Ves | Vp p
|
we Know that dao 2 tos Vps = Censtant
3Ve5
-2 TT. |
_ DSS ve
Gm = - 48 —@®
Yp Np
From &
7 40 r- Nes | Tps
Np Loss
Sabstitoting Hay |
in ee ©
mm = 7-2 J Ips Toss
d re —-@®
P
Suppose when Vgs=o , bee Bin = Imo
L- 4then from ty @
thenefare from & @
dm = Imo
slope ef the Transfer chanactenistic at Tyg
raom & @ we hove
OK
tes a V Fos Foss
8G 5
Sobstie Hing Ios = Toss
tps _ ~2 ps5 spss
ONGs Vp “lp
2
this eqpation shows that the Fomgent to the conve
St Zs = Toss , Vgs= 0, will have an intencept at oe
om the ais of Veg as shown tm fiquee. thenefore
the value of Vp con be found by drawing the Komgent
at Tas = Tose , Vas =0
the Gate sovxce Cot -of f Voltoge Yascoge) om the
|
|tronsfen chanactenistic is eyrat to the pinch-off
Voltage Vp» om the drain Choractenistics ie Vp =Mastoee)|
Ves 7
therefore Ip = Tpss | '-
Vqs tort)|
|
|
|
Problem: A FET has a dnain conment of 4ma+ If Tpes-
Bma and Ves(opg) = -6¥: Find the Values of Vgs and Vp
t Ves
eee [:- eas
Yas Core)
2
4m = 8m E
te: V.
2 {t+ “43 2 Vas =-b46 v
6
Vp = I¥4s cee} OMe
Pnoblem “- An N-channel geet has T,.5 = SMA. and
Vp =-5V. Dekenmine the minimum Value of Vos for
Pinch - of negion and the dnain cunnent Tps , fer
Vas = 7-24 in the pinch - off ng
Sclution: The minimum value of Vps fer pinch-off
to occun fer Yas =-2V is
- -~ (-5)=3Y
Mostmin) = Vas 7 YR = 7? (-s)=83
L
+ t Ce
Tops = toss |'7 a
P
L
. <2
Ips = axe 1: (=)] = 2EBBMA
Companisem of geet.
"FET openation depends
Canniens. that's ihy they ane
Brr
change canniens. so BIT iS
ond 6IT
oly om the flow of Majonity
catled oni polan devices.
operations depends em beth minonity and Majoaity
called Bi polaa devicesgas the FET has ho Jonctions and te Conduction is
through an N-type oA P-type Semi conducton Moterial
Fer 1g less noisy than BIT:
Bas the inmpot cimevit of FET {5 Sevense biased, Fer
exhibits a much higher impot impedamce ond Cowen ovtpot
impedance. So FET can ack as excellent buffer ampli fien
Bot the BIT has low avtpot impedance because its
inpot Cinevit is forwand biased
Controlled device , whene as BIT
4 FeT ig a voitag
is a cunnent Cemtrotied device
6 FtrS ane much @asien to fabricate ond one
Panticolanty Borate | fen cls | bacouee: oney coach ae
Space thon BIT's+
6 FeT'S ane mene tempenatuse stable than BIT'S:
3 BT'S ame cheaper to produce Ehan FET! Ss:
Applications of seer
lo Fer is ‘sed as a butter im measuang instruments, |
Neceivens since it has high input impedance and
low ovepot impedance -
a. fets ane used im RF amplifiers In FM tenens and
pment fon the lew Moise
Ane communication 4b
level:
3B Since the input capacitavce is lan, Fer S ane
osed in Cascade amplifiens in measuring and test
| equipments -14) since the device is Voltage Cemtrolled, it is Used as a
[Veltage Vaniable esiston in opedationat omplifiens:
5. Fer's ane used in mixen cinevits in FM and Ty AEcewed
6 FETS ane used im oscillator cineuits
PFErS ane used in digitat cincvits in compotens,
Memory cincvits because sf its small size.
MOSFET (metaL oxwe semiconpuctoR FIELD EFFECT
TRAWSISTex)
METAL OXIDE SEriicomDLETOR FIELD EFFECT TRANSISTOR is
on important semi Conducten device and is widely used in
Many cinevit applications
the Inpot impedance of a MosreET is much more
than thot of a IFET because of very Smalt ge ‘ealeg
comsent-
xe srer mesretT has Gate , Souce ond dnote
MesreET ig abso called rarer ( Insulated gete Field effect
Transiston) because the. Gore of a mosrer fg imsvtated
from the channel
Moseer is clamified in to top types
1) Fehancement ty pe Mos FEC
% Deplehon type Moser
Principle : By oPriying a tnansvense electnic field
across |
an lwsvlater, depasited on the Semi Conducting mat
atenialthe thickness and hence the Mesistance of the Conducting
channel of a Semi conducting matenia) Cam be Controlled,
ina
depletion mesrer , the Contolling eclectic
\field acsoys an nSudaton , deposited m7 the semircend -
waar Mavekieck , Ws thicrKess and Wienre Heer pesiebaned
of 6 eee chore neducen the Mimber of meson ty
Canniens available for Conduction, wheae as in the
enhonecement MosFer, application of Master electyic field
Causes an increane in the wumben of Mejor ty Gren.
tn he fendunchiwg adnan of a transistor
Enhancement type MosFET ‘-
ns chamnel |
Symbol of * Enhancement
cemstnuetion ond
ype moseer
Sobtnate
igo): Symbel
Sovnce Agee)? Soe
fig ta)
Figte) shows the Cenetnuctional details af a w-charnel
| mesrer. these is ony a single P- region: his negion
ig called Svbtrate. Two aes doped ec aneane diffused in a lightly doped P- tape subtaate. ome
x fom is calle the Sovace and the other ¢
$ called
drain. A thin insulating lagen Ge cin ie) deposited
Joven the surface of the structvae and holes ase Cot
Mmto the oxtde layer, allowing Contact with Ssevace
and dna. then a thin layer of At 'S foamed over.
| the bayer of SiO,» Thin metal layer covers the entiae
channel Region ond it fons the gel G the etal
anea of the gee, Gmjonction with eat onde
teye of = SiOn and fhe Semi Conductor channel forms a
Parallel plate capacitor.
Operation of N-channel Enhancement type Mosrer :
| Sovace Vas Gate
g Drain
a+ a
< . we
Vos :
SE the subtvate is gneunded ond a
Positive vVeitage is applied at the gate, the positive |’
[shomge_om date induces an egal Negative change om |:the Subtnate side between sevsce and drain Regions:
| the negative change of electrons which ane
mimonity Canniens mM the -P-type subtvate fonms
AR the
on invension layen- AS the positive Voltage om the
: : change
Gere ineneases , the induced negek ve ‘3
In the semi Conducton incaeases - Hence the
lows from
cemductivity incaease s and Guanemt $i
Source te dnain thnough *he Induced channel:
Chanactenistics of N-kepe chomnel Enhancement
type MosFET i-
D) Drain chanackenistes -
| the Drain choractenistcs of N-Channel
Errancemont type MosFET is Shown In figure belo
ry (mn) pinch-off Matues
conve nepnesents
2
— Ves t4BN : 55
———— Nes = sav
Ves = +6¥
—Nes 245v
— Vas 249
_—___———_ us =3.
Yos Cv)
FQ: Drain chonactenisticsr
2) Tnansfen chanactenistits i
i aca
the’ tmansfen chanactenistics of N-Channel
enhancement type mosreT ts shown ih Figure
below
x, 08)
—_——»>
Vgs Cv)
Fig? Transfer ehoractenistics.
2) Depletion type mosret +
This i5 also classified in to two types
a) N- channet depletion type MmosFer
b) P- chownel depletion type MOSFET
@ N - chawnet depletion type Mosret *
| cCondtnuction '
the Constnuctiom of am N-channel depletion
MosfeT is shown in Figure below, Where an
N-chamnel is diffused between the source and
dnain. to the basic stnuctuse Of TMIOSFET.gate
Source Syenbols
Drain
P-chawne) | $
when Vago end the dnain pd at a posity
potential with Mespect to the sovnce , the electnons
Cmojonity canniens) flow thnovgh the channel fron
Sounce to drain thenefone , the Cconventioal Connent
Ty flows thnovgh the channel from drain to Source
ag gate veltage is made negative , positive
change consisting of oles 1s induced i the channel
thnovgh $10. 9F the gate - channel Capacitor:
the imtnoduction of the positive change
causes depletion ef mobile electrons wm the channel.
Lr ee channel:
dre depletion Aegion depends ™
the shape of
Vgs ond Vos + Hence the channel will be wedge
Shaped a5 shown in figureif i = ’
when Vi. is incseased, Tp incaeases and it becomes
Practically Constant at a Centain Value of Vag ,
Called the Pinch-off Velkage. the drain Comnent Ty
Almest gets saturated beyond the pinch-off voitage. |
the depletion mosFer Can also be operated in ay
Enhancement Mode. gt is only necessany +o apply
Positive gate voltage So that megative changes ane
induced in to the n-type channel. Hence the
Comductivity of the
channel creases and Tp increases
Prin chorsctenistics of p- channel depletion type
MOSFET : Ip
ewes MBM
satonation
pain | veg say
1
—— Ves: ev
——— Vey = -1v
Vas = -2v
————. We -3y
eee
Vos (v)
Tronsfen — charactenist
deplehore |
modecompanison of OSFeT
gret
DTA enhancement and depletion types of MesreT, the
tronsvense Electric field induced acaoss am insulating
layer deposited om the semi Conductor moaterdal Controls
the temduckivity of the lene or ne! | El the
transvense electvi¢ field across qhe reverne bianed
aut Chawne |.
PN jonetion contnets the conductivity of He \
; 1 the
2) the gore leokage coment ino a MosreT WS OF
pesistance of OH
onden of t6'? a. Hence the mpot
Joe to > :
MosFet is very high in the onder of 10 ° nt
i the on
the gate leakege quarent of @ FEET 5s of e onda
i onder
of isda and its inpok pesistance 1S of the on
of an
3) the vtpot choroctenistics of te TFET one Plato
tron those of the Mosrer’ ond hence , the drain
mecietore| Ge ey | TCT Co.) to ima) is mock Wigher than
Yak of a mosrer (1 +0 sok) :
H) grers ane operored only tn the depletion
mode: the depletion type mosFeT may be operated
in beth depletion and enhancement mode
5) Companing to JFET, MosFer's ane easier to fabricate,
6) mosrer is Veny Sosceptible {2 overtead veitege and[reeds special handling duning installation: xe gets damaged
Gosily if ik iS not pnepenty handled
F MOSFET S ane widely used in digital VLSI Cincuits
than FET S because of thein ea ea
Smatl Signal moder 2+ rer:
Frem the drain ond tnansfen chonactenistics
op the field effect tmansisten we com that, the
dnain ¢enment of an FET is a fevction of dnaim to
Source Vertoge Cvs) and gate +0 Source vortoge (4s):
ad vanging eonnents and Vertegen fee an ret
tp = FlVes, Vos) =O
S$ both gate ond dnain Voltages ane Vanied,
the change in drain Cunnent js gven appronimately by fast
eee cna), ie thes eaiens expansion of eg ©
(22) aug (8B) 9
avs), as Eve Ms
ns: bsh.
ay
In Small Signal Notation
and A Yos =¥yg 2 ©
Se
—®
whene than conductance n+(3) oe .) 4
Lay 3) \ me OY ds. a
vy
ond drain Resistance Ay = (ous) 2 (Nps ‘ae oe
i> ves ato Jugs = a Nesfm compli fication facton fi fet on FET may be defined as
Me (3) _ (Caves
{ Fe — = [Na >
OMs Ap \ aves Jo C), id 2
i ee
fom &4@
by setting tgao, ik cam be Verified that Ly td and Bor One
helated by B =¥4 dn]
4 small Signa) model fox FET im Common Sovace
conpiquaation can be drawn sahisfying & as shaan in Fy
3 fang & © 0
below :
. 4: ta —- .
Nye Sen Vgs Ra Vas
an 7
Fig: gma) signal mode) for FET In C5 Com fig nekion
This low freqrency model fon FET has a Nonton 5)
eonnent generator hose
ootpoe cinevit with o dependent
magnitude is proportional to the gate to Sevace Veitage
the prepontionality facton is the transconductance * 3,9/
the ovtpok mesistamce is Ad~ the impo Resistance behweey
the. eee and Source iS infinite y Since it is assomed
that the ‘Mevense biased gate draws no Cuanent. Fea
Bhe same Meason the Mesistance between gue and
|
anata 13 assumed to be infinite.