BECE201L
Electronic Materials & Devices
Dr Arivarasi
TEMPERATURE DEPENDENCE OF RESISTIVITY: IDEAL PURE METALS
• When the conduction electrons are only scattered by thermal vibrations of the metal
ions, then τ in the mobility expression μd = eτ / me refers to the mean time between
scattering events by this process.
• The resulting conductivity and resistivity are denoted by σT and ρT, where the
subscript T represents “thermal vibration scattering.”
• To find the temperature dependence of σ, we first consider the temperature
dependence of the mean free time τ, since this determines the drift mobility
• An electron moving with a mean speed u is scattered when its path crosses the cross-
sectional area S of a scattering center
• The scattering center may be a vibrating atom, impurity, vacancy, or some other
crystal defect
• Since τ is the mean time taken for one scattering process, the mean free path ℓ of
the electron between scattering processes is uτ. If Ns is the concentration of
scattering centers, then in the volume S ℓ, there is one scattering center, that is,
(Suτ)Ns = 1. Thus, the mean free time is given by
• Because the atomic vibrations are random, the atom covers a cross-sectional area π a2,
where a is the amplitude of the vibrations
• If the electron’s path crosses π a2, it gets scattered. Therefore, the mean time between
scattering events τ is inversely proportional to the area πa2 that scatters the electron, that
is, τ ∝ 1 /πa2.
• The thermal vibrations of the atom can be considered to be simple harmonic
motion, much the same way as that of a mass M attached to a spring
• The average kinetic energy of the oscillations is ¼ M a2ω2, where ω is the oscillation
frequency
• From the kinetic theory of matter, this average kinetic energy must be on the order
of ½ KT. Therefore,
where A is a temperature-independent constant. This shows that the resistivity of a pure metal wire
increases linearly with the temperature. We term this conductivity lattice-scattering-limited
conductivity
Problem
Problem 2
What is the applied electric field that will impose a drift
velocity equal to 0.1 percent of the mean speed ‘u’ (∼106 m
s−1)of conduction electrons in copper? What is the
corresponding current density and current through a Cu wire
of diameter 1 mm? [μd is the drift mobility, which for copper is
43.4 cm2 V−1 s−1 and σ = 5.9 × 107 Ω−1 m−1 ]
Books & Weblinks
TEXT BOOK
1. S. O. Kasap, Principles of Electronic Materials and Devices , 2018, 4th Edition, McGraw Hill
Education.
BOOK REFERENCES
1. Simon Sze, Ming-Kwei Lee, “Semiconductor Devices, Physics and Technology”,2012, 3rd Edition,
Wiley International Student Version.
2. Ben G Streetman and Sanjay Kumar Banerjee, “Solid State Electronic Devices”, 2015, 7th Edition,
Pearson.
3. Adel S. Sedra, Kenneth C. Smith & Arun N. Chandorkar, “Microelectronic Circuits: Theory and
Applications”, 2014, 7th Edition, Oxford University Press, New York.
4. Donald A. Neamen, “Semiconductor Physics and Devices”, 2017, 4th Edition, McGraw Hill.
WEBSITE LINKS
https://nptel.ac.in/courses/108/108/108108112/
https://nptel.ac.in/courses/113/106/113106065/