Crystallography Errors and CIF Documentation
Crystallography Errors and CIF Documentation
CCCW 2011
Examples of artefacts:
• Shortened bond distances to light
atoms due to libration
1.04 Å (neutron)
0.96 Å (X ray)
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Artefacts versus errors
Examples of artefacts:
• Shortened bond distances due to libration.
• Shortened bond distances for triple bonds C≡C ou C≡N (electron
density in the bond)
• Wrong hydrogen positions
• Residual electron density around special positions or close to
heavy atoms because of Fourier truncation errors, also called
Fourier truncation ripples.
ρ ( x , y , z ) = 1V ∑ Fhkl ⋅ e iα ⋅ e − 2πi ( hx + ky + lz )
hkl
hkl
http://www.theses.ulaval.ca/2005/23016/apd.html
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The errors
An artefact is an error which is unavoidable.
Thus, what are the avoidable errors? (P. Müller, Crystal Structure
Refinement, 2006)
• Wrong unit cell
• Twin refined as a disorder
• Wrong atom assignment
• Wrong space group
• Interpretation of Fourier truncation ripples as hydrogen atoms and
vice versa
And there are the “really avoidable errors” (Roland Boese, 1999):
• Typographic errors in the unit cell
• Errors in the refinement
• Wrong data collection strategy
• Data collection at room temperature
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Documentation of an X-ray diffraction study
As every scientific experience, an X-ray diffraction study has to be documented
according to good scientific principles.
1. Lab book: Use a dedicated lab book for the determination of structures. The lab
book should contain information not included in the electronic data (such as
crystal size, color etc.) as well as your choices made during refinement.
2. Report: The results have to include:
• Crystallisation details (solvent, temperature, how did you obtain the crystal)
• Details of the data collection (instrument, number of reflections, crystal size)
• Details of the solution/refinement (confidence factors, hydrogen treatment)
• Details of the structure (atom positions, thermal parameters, bond distances
and angles)
• A figure showing the atom numeration
• A figure showing the thermal ellipsoid (ORTEP) (could be combined)
3. Archiving: You are responsible to archive reliably (min. 5 years)
• experimental results (images etc)
• solution/refinement results (files .res, .hkl, .cif, .lst)
(A reliable archiving includes that one can find the relevant data after
several years, even in your absence!)
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The CIF file
CIF (Crystallographic Information File):
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Generation of the CIF file
1. A first version of name.cif is generated with the command
ACTA in SHELXTL (XL)
_refine_ls_hydrogen_treatment
exemple.cif:
… Definition: Treatment of hydrogen atoms in the
_refine_ls_hydrogen_treatment ? least-squares refinement.
The data value must be one of the following:
refall refined all H-atom parameters
refxyz refined H-atom coordinates only
refU refined H-atom U's only
exemple.cif:
… noref no refinement of H-atom parameters
_refine_ls_hydrogen_treatment constr
constr H-atom parameters constrained
mixed some constrained, some independent
undef H-atom parameters not defined
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Documentation and validation
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The refinement – step by step
1. Reading of the .hkl file containing the reflection intensities
exemple.lst:
h k l Fo^2 Sigma Why rejected
-10 =< h =< 10, -13 =< k =< 13, -18 =< l =< 18, Max. 2-theta = 137.96
23 Systematic absence violations
Solution 1 Solution 2
I
0
-3σ
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Why use reflections with negative intensities?
Solution 1 Solution 2
I
0
-3σ
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3 σ: What connects the standard deviation with the
confidence interval ?
A random distribution of errors should follow a Gaussian distribution
1⎛ ( x − μ ) ⎞
2
1 − ⎜ ⎟
2⎝ σ ⎠
f ( x) = e μ: correct value
σ 2π σ: standard deviation
μ +σ
∫ f ( x ) = 0.68 = 68%
μ −σ
μ + 2σ
f(x)
∫ f ( x ) = 0.96 = 96%
μ − 2σ
μ + 3σ
(x-μ)/σ
∫ f ( x ) = 0.99 = 99%
μ − 3σ
-10 =< h =< 10, -13 =< k =< 13, -18 =< l =< 18, Max. 2-theta = 137.96
23 Systematic absence violations
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The refinement – Error of merging
1. Reading of the .hkl file containing the reflection intensities
exemple.lst:
20975 Reflections read, of which 685 rejected
Rint …
Rint =
∑ F o
2
− Fo2 ( mean )
∑F o
2
Rsigma =
∑ o)
σ ( F 2
∑ o
F 2
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Confidence factors
Optimised value: M = ∑ w Fo − Fc( 2
)
2 2
(The lower M, the better is the agreement of our model with the experimental data.)
But: M increases with the number of reflections and with their intensity. It is thus
structure dependent, with well diffracting structures with high redundancy giving the
highest M values. We thus need a structure independent value.
∑ w (F − F )
2 2 2
R2 wR2 = Rw ( F ) =2 o c
∑ w( F ) o
2 2
R1 =
∑F −F o c
R1
∑F o
Goodness of Fit
The GoF or GooF is another value which describes the
quality of our model:
GooF = S =
∑ w( F − Fc2 ) 2 o
2
N Ref. − N Par .
NRef.: number of independent reflections, NPar.: number of parameters
S should be around 1.
S > 1: bad model or bad data/parameter ratio
S < 1: model is better than the data: problems with the absorption
correction, space group problems
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Criteria for a good structure
SHELXL calculates 4 confidence values:
• wR2 (all data) Refinement against F2 requires a
• wR2 (observed data, I>2σ(I)) correct weighing scheme
• R1 (all data) The weighing schemes optimised
• R1 (observed data, I>2σ(I)) for refinement against F2 cannot
be used for the calculation of R1.
The important values are wR2 (all data) (since we do the refinement with all
data) and R1 (observed data), for comparison with the old method.
Sources of errors:
• Bad absorption correction
• Disorder
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Correlation matrix elements
test.lst:
Largest correlation matrix elements
0.853 U11 Fe1 / OSF 0.728 U11 S2 / U11 Fe1 0.524 U11 S1 / U11 Fe1
0.771 U11 S2 / OSF 0.588 U11 S1 / OSF 0.543 U12 S1 / U23 S1
Values > 0.5 for the correlation matrix elements indicate that some
parameters in the refinement are dependent from each other.
Some dependances are acceptable, such as f. e. between the
thermal parameters of the heavy atom and the overall scale factor
or between the Uxy of the same atom.
Attention: A high number of dependances > 0.5 between multiple
atoms might indicate a missed symmetry! (wrong space group)
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Manual inspection : Thermal parameters
Disorder
Displacement parallel to a bond greater than
perpendicular displacement
⇒ disorder, two atoms with different
bond lengths sharing the same position,
here F et Cl.
CHECKCIF: Violation of the “Hirshfeld test”
*.lst:
Principal mean square atomic displacements U
[…]
0.3098 0.0893 0.0464 C4 may be split into 0.6218 0.2673 0.2408 and 0.6118 0.2471 0.2666
0.3100 0.0924 0.0392 C5 may be split into 0.5976 0.3191 0.3424 and 0.5834 0.3017 0.3597
Wrong atom
assignments
CHECKCIF: Violation of
the “Hirshfeld test”
N
N N
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Bond Distances
M CH3
synthesized crystallized
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Aids to verify your structure
Verifications:
• Missed symmetry (wrong space group)
• Holes/voids in the structure
• Thermal parameters (Hirshfeld test)
• Bond distances and angles
• Atom assignment
• Other details of the refinement and the data collection
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Example of a checkcif report
Alert level B
PLAT230_ALERT_2_B Hirshfeld Test Diff for C24 - C25 .. 7.36 su
Alert level C
CRYSC01_ALERT_1_C The word below has not been recognised as a standard
identifier. : plates
CRYSC01_ALERT_1_C No recognised colour has been given for crystal colour.
PLAT222_ALERT_3_C Large Non-Solvent H Ueq(max)/Ueq(min) ... 3.08 Ratio
PLAT230_ALERT_2_C Hirshfeld Test Diff for C25 - C26 .. 5.93 su
Correct manually
.cif: in the CIF file
_exptl_crystal_description red
_exptl_crystal_colour plates
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Example of a checkcif report
Alert level A
Alert level B
PLAT230_ALERT_2_B Hirshfeld Test Diff for C24 - C25 .. 7.36 su
Alert level C
PLAT222_ALERT_3_C Large Non-Solvent H Ueq(max)/Ueq(min) ... 3.08 Ratio
PLAT230_ALERT_2_C Hirshfeld Test Diff for C25 - C26 .. 5.93 su
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Hirshfeld test violations
Wrong atom assignment:
Bad description of thermal ellipsoids
(data quality problem, disorder etc.)
Substitutional disorder:
M M
but:
Vibration of a
but: M whole group
M=C=O
Linear distribution of electrons in bonds
Braga, D. & Koetzle, T. F. (1988). Acta Cryst. B44, 151–156.
Alert level C
PLAT222_ALERT_3_C Large Non-Solvent H Ueq(max)/Ueq(min) ... 3.08 Ratio
=> presence of strongly vibrating terminal phenyl groups and strongly bound Cp-
groups
C24
C25
C26
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The Checkcif report
Why should you comment on CHECKCIF errors:
• You have to do it anyway, if you want to publish a structure.
• It shows the reader that, despite the errors, the structure is of good
quality.
• When you write up your thesis or a publication, sometimes years
later, you might not recall what caused the alert and what you have
already tried to resolve it. Even worse, if you are gone and your
supervisor tries to publish your results.
• Finish all structures to the point, where they are immediately
publishable.
Hirshfield test violations for atoms C24, C25 and C26 are caused by a
strong vibration of a complete phenyl substituent.
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The Checkcif report
How to comment on remaining CHECKCIF errors:
3. Add your comments using the “Virtual reply form” :
Checkcif report:
Alert level B
PLAT230_ALERT_2_B Hirshfeld Test Diff for C24 - C25 .. 7.36 su
Alert level C
PLAT222_ALERT_3_C Large Non-Solvent H Ueq(max)/Ueq(min) ... 3.08 Ratio
CIF file:
data_example1
_vrf_PLAT230_example1
;
RESPONSE:
Caused by vibration of a complete phenyl substituent
;
_vrf_PLAT222_example1
;
RESPONSE:
Presence of strongly vibrating terminal phenyl groups and
strongly bound Cp-groups.
;
Datablock: shap30
The following ALERTS were generated. Each ALERT has the format test-name_ALERT_alert-type_alert-
level. Click on the hyperlinks for more details of the test.
Alert level B PLAT230_ALERT_2_B Hirshfeld Test Diff for C24 - C25 .. 7.36 su
Author Response: Caused by vibration of a complete phenyl substituent
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PLAT154_ALERT_1_G The su's on the Cell Angles are Equal .......... 0.00200 Deg.
Author’s response: Provided data is correct. Unrounded su’s show slight differences.
CIF:
_cell_angle_alpha 92.702(2)
_cell_angle_beta 93.216(2)
_cell_angle_gamma 98.523(2)
A B C Alpha Beta Gamma Vol
9.40774 9.44160 21.46292 92.7024 93.2165 98.5227 1879.43
0.00006 0.00006 0.00015 0.0002 0.0003 0.0002 0.03
Corrected for goodness of fit:
0.00057 0.00058 0.00135 0.0023 0.0025 0.0021 0.23
PLAT250_ALERT_2_C Large U3/U1 Ratio for Average U(i,j) Tensor .... 3.5
Author Response: Manual inspection of the thermal ellipsoids does not indicate any
preferred orientation. The increased U3/U1 ratio is most probably caused by the
toluene solvent disordered around the inversion center, which has increased thermal
ellipsoids parallel to the line connecting the centers of gravity of the disordered
molecules.
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PLAT232_ALERT_2_C Hirshfeld Test Diff (M-X) Cr1 -- N1 .. 6.0 su
Author Response: Manual inspection of the thermal ellipsoids does
not indicate any problems. The alert might be caused by the low sd of
the heavy atom position.
Since the Hirshfeld test is performed relative to the esd of the thermal parameters,
heavy atoms with very low esds show sometimes “invisible” Hirshfeld test
violations.
C69
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Checklist
wR2 < 12%
R1 < 5%
Rint < 3 x Rsigma
0.9 < GoF < 1.2
Residual electron density < 0.5 e-/Å3
No correlation matrix elements > 0.5
Thermal ellipsoids are acceptable
Checkcif, checkcif report and explications
Figure showing thermal ellipsoids (50% probability level) and
the numeration of atoms
Printed version of the structural details, bond distances and
angles
Archiving: 1 x with the X-ray service, 1 x for you, 1 x for the
synthetic chemist, 1 x for your supervisor
The end
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