Ug1099 Bga Device Design Rules
Ug1099 Bga Device Design Rules
User Guide
Chapter 3: Recommended Layout Dimensions within BGA Area for 1.0 mm Pitch
Devices
BGA Ball Pad and Via Dimensions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13
Trace Widths Dimensions inside the BGA Area . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17
Trace Routing Between Vias . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20
Sample Breakouts using Standard and Advanced Processes . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 21
Chapter 4: Recommended Layout Dimensions within BGA Area for 0.8 mm Pitch
Devices
BGA Ball Pad and Via Dimensions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30
Trace Widths Dimensions inside BGA Area . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 32
Trace Routing Between Vias . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 34
Sample Breakouts using Standard and Advanced PCB Processes . . . . . . . . . . . . . . . . . . . . . . . . . . 35
Chapter 5: Recommended Layout Dimensions within BGA Area for 0.5 mm Pitch
Devices
BGA Ball Pad and Via Dimensions. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 42
Trace Widths Dimensions inside BGA Area . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 44
Trace Routing Between Vias . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45
Sample Breakout Using Advanced Process . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 45
Introduction
Xilinx® UltraScale™ architecture, 7 series, and 6 series devices come in a variety of
packages that are designed for maximum performance and maximum flexibility. Three pitch
sizes are available for these packages: 1.0 mm, 0.8 mm, and 0.5 mm. In general, as the pitch
size decreases, the challenges for PCB routing increase as there is less room to route traces
and vias between package balls. This guide illustrates various methods for successful design
regardless of pitch size.
Note: Throughout this guide, various specifications and estimates are given regarding PCB pricing,
costs, and technology. As PCB manufacturing technology is constantly advancing, it is highly advised
to consult with your PCB manufacturer to fully understand their capabilities regarding the
information presented here.
Pitch Size
Pitch size is defined as the distance between consecutive balls on a BGA package, measured
from center to center, as shown in Figure 1-1.
X-Ref Target - Figure 1-1
PP
PP
PP
PP
PP
PP
;
160'3DG 60'3DG
;
Signals
Layers = ------------------------------------------------------------------------------------- Equation 2-1
Routing Channels × Routes Per Channel
For Xilinx FPGAs, the amount of signals is approximately 60% of the number of BGA balls.
The other 40% are power and ground signals that are most often routed directly down to
planes by vias. This is assuming full I/O utilization. If fewer I/Os are used, then the number
of signals to route goes down accordingly.
Routing channels are the number of available routing paths out of the BGA area (the
number of BGA pins on one side minus one, times four sides). Figure 2-1 shows a 5x5 grid
with sixteen total routing channels (four routing channels per side times four sides).
;
Figure 2-1: Definition of Routing Channel (16 Total Routing Channels Shown)
Routes per channel is either one or two, depending on whether one or two signals are
routed between BGA pads. The approximate number of layers required to fully route out a
Xilinx FPGA are shown in Table 2-1.
• Fabrication technologies
BGA Size
The amount of pins in a BGA indicates the amount of signals to route. Because of physical
space constraints, the amount of signals required to route is proportional to the amount of
signal layers required.
To facilitate routing in the ball grid area, necking down the trace width in the critical space
between the BGA pads/vias (the breakout area) is allowable. This then allows for two signal
rows to be routed on a single metal layer (or three if routing the outermost row).
The traces can then be widened after they escape the breakout area. Changes in width over
very short distances can cause small impedance changes. Validate these issues with the
board vendor and signal integrity engineers responsible for the design.
Fixed Pinouts
Xilinx FPGA pinouts are designed with maximum flexibility in mind. However, certain FPGA
signals, such as JTAG, transceiver inputs and outputs, and Interlaken signals (among others)
have fixed locations, which means routing of these signals is limited compared to other
signals that can be swapped as needed. Fixed locations lead to layout trade-offs that can
have an impact on the number of required signal layers.
Fabrication Technologies
Several advanced fabrication technologies can be used to reduce the amount of layers
required to route a design, although each of these technologies increase fabrications costs
of the board:
Blind Vias (+20% to +40% fabrication cost) – As opposed to a through-hole via, a blind
via does not travel from the top layer to the bottom layer. A blind via travels either from the
top or bottom layer to an inner signal layer, freeing up room above or below for other
routing.
Buried Vias (+25% to +60% fabrication cost) – A buried via is located entirely inside the
printed circuit board and does not touch the top or bottom layers.
Micro Vias (+30% fabrication cost) – A micro via is either a blind or buried via, only much
smaller. Micro Vias are most often used in small, high density applications such as cell
phones.
Back-drilled Vias (+10% fabrication cost) – A back-drilled via is a through-hole via that
has a portion of its length drilled out such that it is no longer conductive. This improves
signal integrity as it removes an unneeded stub from the route.
Via-In-Pad (+30% fabrication cost) – A via-in-pad is a via drilled directly beneath a pad.
This removes the need for a separate metal trace to be drawn to drop down a via. This can
result in improved signal integrity because of lower inductance, but the trade-off is a much
higher board fabrication cost.
Extra Layers (+20% fabrication cost (per every two layers) – It might be such that the
cost to add two (or more) extra signal layers is lower than the cost to add an advanced
technology, so adding layers is not always to be considered a negative alternative.
If a higher board thickness than the drill diameter and aspect ratio can support is required,
the use of buried or blind vias can be used, but at a higher manufacturing cost.
%*$%DOO
3LWFK
%*$%DOO3DG
'LDPHWHU
6ROGHU0DVN
2SHQLQJ
'LDPHWHU
'LVWDQFH
EHWZHHQ 9LD)LQLVKHG
9LDDQG +ROH'LDPHWHU
%*$3DG
9LD3ODWLQJ
'LDPHWHU
;
Figure 3-1: Ball and Via Dimensions for 1.0mm Pitch FB and FT Devices (mils)
%*$%DOO
3LWFK
%*$%DOO3DG
'LDPHWHU
6ROGHU0DVN
2SHQLQJ
'LDPHWHU
'LVWDQFH
9LD)LQLVKHG
EHWZHHQ
+ROH
9LDDQG
'LDPHWHU
%*$3DG
9LD3ODWLQJ
'LDPHWHU
;
Figure 3-2: Ball and Via Dimensions for 1.0mm Pitch FB and FT Devices (mm)
%*$%DOO
3LWFK
%*$%DOO3DG
'LDPHWHU
6ROGHU0DVN
2SHQLQJ
'LDPHWHU
'LVWDQFH
EHWZHHQ 9LD)LQLVKHG
9LDDQG +ROH'LDPHWHU
%*$3DG
9LD3ODWLQJ
'LDPHWHU
;
Figure 3-3: Ball and Via Dimensions for 1.0mm Pitch FF, FG, FH, FL, RB, and RF Devices (mils)
%*$%DOO
3LWFK
%*$%DOO3DG
'LDPHWHU
6ROGHU0DVN
2SHQLQJ
'LDPHWHU
'LVWDQFH
EHWZHHQ 9LD)LQLVKHG
9LDDQG +ROH'LDPHWHU
%*$3DG
9LD3ODWLQJ
'LDPHWHU
;
Figure 3-4: Ball and Via Dimensions for 1.0mm Pitch FF, FG, FH, FL, RB, and RF Devices (mm)
%DOO3LWFK %DOO3LWFK
$YDLODEOH5RXWLQJ $YDLODEOH5RXWLQJ
'LVWDQFH 'LVWDQFH
2QH7UDFH 7ZR7UDFHV
%HWZHHQ%DOOV %HWZHHQ%DOOV
;
Figure 3-5: Trace Routing Between BGA Balls for 1.0mm Pitch FB and FT Devices (mils)
%DOO3LWFK %DOO3LWFK
$YDLODEOH5RXWLQJ $YDLODEOH5RXWLQJ
'LVWDQFH 'LVWDQFH
2QH7UDFH 7ZR7UDFHV
%HWZHHQ%DOOV %HWZHHQ%DOOV
;
Figure 3-6: Trace Routing Between BGA Balls for 1.0mm Pitch FB and FT Devices (mm)
X-Ref Target - Figure 3-7
%DOO3LWFK %DOO3LWFK
$YDLODEOH5RXWLQJ $YDLODEOH5RXWLQJ
'LVWDQFH 'LVWDQFH
2QH7UDFH 7ZR7UDFHV
%HWZHHQ%DOOV %HWZHHQ%DOOV
;
Figure 3-7: Trace Routing Between BGA Balls for 1.0mm Pitch FF, FG, FH, FL, RB, and RF Devices
(mils)
%DOO3LWFK %DOO3LWFK
$YDLODEOH5RXWLQJ $YDLODEOH5RXWLQJ
'LVWDQFH 'LVWDQFH
2QH7UDFH 7ZR7UDFHV
%HWZHHQ%DOOV %HWZHHQ%DOOV
;
Figure 3-8: Trace Routing Between BGA Balls for 1.0mm Pitch FF, FG, FH, FL, RB, and RF Devices
(mils)
9LD3LWFK 9LD3LWFK
$YDLODEOH5RXWLQJ $YDLODEOH5RXWLQJ
'LVWDQFH 'LVWDQFH
'ULOOWR 'ULOOWR
&RSSHU &RSSHU
PLQLPXP PLQLPXP
2QH7UDFH 7ZR7UDFHV
%HWZHHQ9LDV %HWZHHQ9LDV
;
Figure 3-9: Trace Routing Between Vias for 1.0mm Pitch Devices (mils)
9LD3LWFK 9LD3LWFK
$YDLODEOH5RXWLQJ $YDLODEOH5RXWLQJ
'LVWDQFH 'LVWDQFH
'ULOOWR 'ULOOWR
&RSSHU &RSSHU
PLQLPXP PLQLPXP
2QH7UDFH 7ZR7UDFHV
%HWZHHQ9LDV %HWZHHQ9LDV
;
Figure 3-10: Trace Routing Between Vias for 1.0mm Pitch Devices (mils)
Figure 3-16 through Figure 3-18 show a representative 1.0 mm FFG900 breakout using the
top PCB signal layer and two inner signal layers by means of a more advanced process
which includes two signal routes between BGA balls and vias.
Most power balls are located in the center region of the ball grid array, so signal routing
takes place primarily on the outer edges.
Figure 3-11: 1.0 mm Pitch FFG900 Breakout, Top Signal Layer 1, Standard PCB Process
Figure 3-12: 1.0 mm Pitch FFG900 Breakout, Inner Signal Layer 2, Standard PCB Process
Figure 3-13: 1.0 mm Pitch FFG900 Breakout, Inner Signal Layer 3, Standard PCB Process
Figure 3-14: 1.0mm Pitch FFG900 Breakout, Inner Signal Layer 4, Standard PCB Process
Figure 3-15: 1.0mm Pitch FFG900 Breakout, Inner Signal Layer 5, Standard PCB Process
Figure 3-16: 1.0mm Pitch FFG900 Breakout, Top Signal Layer 1, Advanced PCB Process
Figure 3-17: 1.0mm Pitch FFG900 Breakout, Inner Signal Layer 2, Advanced PCB Process
Figure 3-18: 1.0mm Pitch FFG900 Breakout, Inner Signal Layer 3, Advanced PCB Process
BGA Ball
Pitch
(31.50)
BGA Ball Pad
Diameter
(15.75)
Solder Mask
Opening
Diameter
(17) 5
Distance
Via Finished
between
Hole
Via and
Diameter
BGA Pad
(10)
(22.27)
Via Plating
Diameter
(19)
;
Figure 4-1: Ball and Via Dimensions for 0.8 mm Pitch CS, RS, SB, and SF Devices (mils)
BGA Ball
Pitch
(0.8)
BGA Ball Pad
Diameter
(0.40)
Solder Mask
Opening
Diameter
(0.43) 0.13
Distance
between Via Finished Hole
Via and Diameter
BGA Pad (0.25)
(0.56)
Via Plating
Diameter
(0.48)
;
Figure 4-2: Ball and Via Dimensions for 0.8 mm Pitch CS, RS, SB, and SF Devices (mm)
%DOO3LWFK %DOO3LWFK
$YDLODEOH5RXWLQJ $YDLODEOH5RXWLQJ
'LVWDQFH 'LVWDQFH
2QH7UDFH 7ZR7UDFHV
%HWZHHQ%DOOV %HWZHHQ%DOOV
;
Figure 4-3: Trace Routing Between BGA Balls for 0.8 mm Pitch CS, RB, SB, and SF Devices (mils)
%DOO3LWFK %DOO3LWFK
$YDLODEOH5RXWLQJ $YDLODEOH5RXWLQJ
'LVWDQFH 'LVWDQFH
2QH7UDFH 7ZR7UDFHV
%HWZHHQ%DOOV %HWZHHQ%DOOV
;
Figure 4-4: Trace Routing Between BGA Balls for 0.8 mm Pitch CS, RB, SB, and SF Devices (mm)
9LD3LWFK
$YDLODEOH5RXWLQJ
'LVWDQFH
9LD'ULOO'LDPHWHU 9LD'ULOO'LDPHWHU
'ULOOWR
&RSSHU
PLQLPXP
2QH7UDFH
%HWZHHQ9LDV
;
Figure 4-5: Trace Routing Between Vias for 0.8 mm Pitch Devices (mils)
X-Ref Target - Figure 4-6
9LD3LWFK
$YDLODEOH5RXWLQJ
'LVWDQFH
'ULOOWR
&RSSHU
PLQLPXP
2QH7UDFH
%HWZHHQ9LDV
;
Figure 4-6: Trace Routing Between Vias for 0.8 mm Pitch Devices (mm)
Figure 4-11 through Figure 4-13 show a representative 0.8 mm CSG484 breakout using the
top PCB signal layer and two inner signal layers by means of a more advanced process
which includes two signal routes between BGA balls and one signal route between vias.
Design rules do not allow for two routes between vias for 0.8 mm devices.
Many power balls are located in the center region of the ball grid array, so signal routing
takes place primarily on the outer edges.
Figure 4-7: 0.8 mm Pitch CSG484 Breakout, Top Signal Layer 1, Standard PCB Process
Figure 4-8: 0.8 mm Pitch CSG484 Breakout, Inner Signal Layer 2, Standard PCB Process
Figure 4-9: 0.8 mm Pitch CSG484 Breakout, Inner Signal Layer 3, Standard PCB Process
Figure 4-10: 0.8 mm Pitch CSG484 Breakout, Inner Signal Layer 4, Standard PCB Process
Figure 4-11: 0.8 mm Pitch CSG484 Breakout, Top Signal Layer 1, Advanced PCB Process
Figure 4-12: 0.8 mm Pitch CSG484 Breakout, Inner Signal Layer 2, Advanced PCB Process
Figure 4-13: 0.8mm Pitch CSG484 Breakout, Inner Signal Layer 3, Advanced PCB Process
%*$%DOO
3LWFK
%*$%DOO3DG
'LDPHWHU
6ROGHU0DVN
2SHQLQJ
'LDPHWHU
'LVWDQFH
EHWZHHQ 9LD)LQLVKHG+ROH
9LDDQG 'LDPHWHU
%*$3DG
9LD3ODWLQJ
'LDPHWHU
;
Figure 5-1: Ball and Via Dimensions for 0.5 mm Pitch CP Devices (mils)
%*$%DOO
3LWFK
%*$%DOO3DG
'LDPHWHU
6ROGHU0DVN
2SHQLQJ
'LDPHWHU
'LVWDQFH
EHWZHHQ 9LD)LQLVKHG+ROH
9LDDQG 'LDPHWHU
%*$3DG
9LD3ODWLQJ
'LDPHWHU
;
Figure 5-2: Ball and Via Dimensions for 0.5 mm Pitch CP Devices (mm)
%DOO3LWFK
$YDLODEOH5RXWLQJ
'LVWDQFH
3DG'LDPHWHU 3DG'LDPHWHU
2QH7UDFH
%HWZHHQ%DOOV
;
Figure 5-3: Trace Routing Between BGA Balls for 0.5 mm Pitch CP Devices (mil)
%DOO3LWFK
$YDLODEOH5RXWLQJ
'LVWDQFH
3DG'LDPHWHU 3DG'LDPHWHU
2QH7UDFH
%HWZHHQ%DOOV
;
Figure 5-4: Trace Routing Between BGA Balls for 0.5 mm Pitch CP Devices (mm)
Figure 5-5: 0.5 mm Pitch CPG236 Breakout, Top Signal Layer 1, Advanced PCB Process
Figure 5-6: 0.5 mm Pitch CPG236 Breakout, Inner Signal Layer 2, Advanced PCB Process
Figure 6-1 shows how to calculate the amount of current that can pass through each via
channel. Ensure that the power planes are wide enough and encompassing enough to
supply the needed amperage to the BGA power balls. Equation 6-1 can be used to calculate
the current per channel. Table 6-1 and Table 6-2 show current per channel values for
0.8 mm and 1.0 mm pitch devices. Because of the very fine pitch of 0.5 mm devices, it is not
possible to route in-between standard vias. Micro-vias under the BGA pads are
recommended for 0.5 mm devices in order to reach the power planes.
X-Ref Target - Figure 6-1
9LD'ULOO
'LDPHWHU
9'
'ULOOWR
&RSSHU
6SHFLILFDWLRQ
'&
$YDLODEOH
3RZHU7UDFH
9LD3LWFKH
VDPHDV
$PSV3HU0LO ODQGLQJSLWFK
RI7UDFH $PLO
:LGWK$30
&XUUHQW
&KDQQHO
;
Table 6-1: Current Per Channel Calculation for 0.8 and 1.0 mm Devices (mils)
0.8 mm Pitch 1.0 mm Pitch
Via Pitch (e) 31.50 39.37
Via Drill Diameter (VD) 13 13
Drill to Copper Specification (DC) 7 7
Amps per Unit Trace Width (ATW), 0.5 oz Cu 0.05 0.05
Amps per Unit Trace Width (ATW), 1.0 oz Cu 0.075 0.075
Current per Channel, 0.5 oz Cu 0.23A 0.61A
Current per Channel, 1.0 oz Cu 0.34A 0.93A
Table 6-2: Current Per Channel Calculation for 0.8 and 1.0mm Devices (mm)
0.8 mm Pitch 1.0 mm Pitch
Via Pitch (e) 0.8 1.0
Via Drill Diameter (VD) 0.33 0.33
Drill to Copper Specification (DC) 0.18 0.18
Amps per Unit Trace Width (ATW), 0.5 oz Cu 1.97 1.97
Amps per Unit Trace Width (ATW), 1.0 oz Cu 2.95 2.95
Current per Channel, 0.5 oz Cu 0.23A 0.61A
Current per Channel, 1.0 oz Cu 0.34A 0.93A
;
All of the V CCINT power must be delivered through an approximate grid of approximately
9x8 vias, as shown in Figure 6-2 (V CCINT vias are shown in red).
X-Ref Target - Figure 6-3
;
Figure 6-3: V CCINT Via Array for XCKU040-FBVA900 Device (V CCINT vias are shown in red)
There are thirty via channels that surround the 9x8 array in Figure 6-3, and all of the power
for VCCINT must be delivered through these openings. According Equation 6-1, the FB
package can deliver 0.6A between each via channel for 0.5oz copper. Thirty via channels
@0.6A per channel equates to a capability of 18A. If more current is needed than this, then
either another power layer can be added for V CCINT, or thicker copper can be used,
supplying up to 27A for 1.0 oz copper in this example.
Xilinx Resources
For support resources such as Answers, Documentation, Downloads, and Forums, see Xilinx
Support.
Solution Centers
See the Xilinx Solution Centers for support on devices, software tools, and intellectual
property at all stages of the design cycle. Topics include design assistance, advisories, and
troubleshooting tips.
References
1. UltraScale Architecture PCB Design User Guide (UG583)
2. Zynq-7000 All Programmable SoC PCB Design User Guide (UG933)
3. 7 Series FPGAs PCB Design User Guide (UG483)
fail-safe or for use in any application requiring fail-safe performance; you assume sole risk and liability for use of Xilinx products
in such critical applications, please refer to Xilinx’s Terms of Sale which can be viewed at http://www.xilinx.com/legal.htm#tos.
© Copyright 2016 Xilinx, Inc. Xilinx, the Xilinx logo, Artix, ISE, Kintex, Spartan, Virtex, Vivado, Zynq, and other designated brands
included herein are trademarks of Xilinx in the United States and other countries. All other trademarks are the property of their
respective owners.