SCOPE OF ACCREDITATION TO ISO/IEC 17025:2017

& ANSI/NCSL Z540-1-1994

INNOCAL
625 E. Bunker Court
Vernon Hills, IL 60061
Mike Pietronicco Phone: 847 327 5316

CALIBRATION

Valid To: October 31, 2021 Certificate Number: 1746.01

In recognition of the successful completion of the A2LA evaluation process, accreditation is granted to
this laboratory to perform the following calibrations1, 11:

I. Acoustical

Parameter/Range Frequency CMC2, 3 (±) Comments

Sound Level Meters –

Measure

94 dB 250 Hz 0.39 dB Sound calibrator

1000 Hz 0.39 dB

114 dB 250 Hz 0.4 dB

1000 Hz 0.4 dB

II. Chemical

Parameter/Equipment Range CMC2, 3, 5 (±) Comments

pH – Buffer 4 pH 0.014 pH Standard reference

7 pH 0.016 pH buffer
10 pH 0.016 pH

(A2LA Cert. No. 1746.01) Revised 01/10/2020 Page 1 of 24

 Parameter/Equipment Range CMC2, 3, 4 (±) Comments

Conductivity – Buffer (5 to 30) μS 0.011 μS + 1 % Standard reference

(>30 to 84) μS 0.0025 μS + 1 % buffer
(>84 to 300) μS 0.33 μS + 0.64 %
(>300 to 1413) μS 1.4 μS + 0.3 %
(>1413 to 3000) μS 15 μS
(>3000 to 13 000) μS 0.27 mS

pH Simulation (0 to 14) pH 0.000 35 pH Fluke 5520A

III. Dimensional

Parameter/Equipment Range CMC2, 4 (±) Comments

Calipers and Micrometers – Up to 6 in (16 + 22L) μin Gage blocks

(6 to 12) in (3 + 14L) μin
(12 to 24) in (20L) μin
(24 to 60) in (110 + 13L) μin

Universal Measuring Up to 6 in (4.4 + 13L) μin Gage blocks

Machines (6 to 10) in 14L µin

Protractors/Angle (0 to 360)° 0.0079° Sine plate, gage blocks

Meters/Levels

Length Measurements – Up to 0.1 in 4.9 µin Gage blocks and

1D (0.1 to 1) in (3.9 + 0.28L) µin Supermic
(1 to 4) in (2.8 + 1.5L) µin
(4 to 6) in (5.1 + 0.9L) µin
(6 to 10) in (6 + 0.71L) µin

(10 to 12) in (8.5 + 1.3L) μin Gage blocks

(12 to 24) in (7.8L) μin

Rulers/Tape Measures Up to 6 in (180 + 2.9L) μin Gage blocks

(6 to 12) in (160 + 7.4L) μin
(12 to 24) in (61 + 16L) μin
(2 to 100) ft 450 μin every 2 ft

(A2LA Cert. No. 1746.01) Revised 01/10/2020 Page 2 of 24

 Parameter/Equipment Range CMC2, 4 (±) Comments

Pin/Plug/Thread Wire Up to 0.1 in 5.1 µin Gage blocks

Gages (0.1 to 1) in (4 + 0.28L) µin Gage blocks and
(1 to 3) in (2.9 + 1.4L) µin SupermicTM (H28
(3 to 4) in (2.7 + 1.5L) µin handbook)
(4 to 6) in (5.2 + 0.9L) µin
(6 to 10) in (6 + 0.7L) µin

Radius Gages Up to 12 in 0.001 in Optical comparator

Thread Gages Up to 0.1 in 24 µin SupermicTM, gage

(0.1 to 1) in (24 + 0.05L) µin blocks, and thread wires
(1 to 2) in (24 + 0.3L) µin
(2 to 10) in (24 + 0.4L) µin

Height/Depth Gages Up to 12 in (170 + 0.18L) µin Gage blocks and

(12 to 60) in (110 + 5.4L) µin surface plate

Thickness Gages Up to 1 in (0.0021 + 0.03L) in Step blocks

Squareness Up to 4 in 79 µin Granite angle block,

surface plate, gage
(4 to 17) in 120 µin amplifier and master
square

Surface Flatness –

Optical Flat Up to 4 in 3.7 µin Optical flats and Van

Keuren monochromatic
light

Surface Up to 24 in 93 µin Surface plate with

reference standard

Parallelism Up to 24 in 46 µin Surface plate with

reference standard

(A2LA Cert. No. 1746.01) Revised 01/10/2020 Page 3 of 24

 Parameter/Equipment Range CMC2, 4 (±) Comments

Gage Blocks Up to 0.1 in 4.9 µin Gage blocks

(0.1 to 1) in (3.8 + 0.35L) µin CROBLOX/Grade 00
(1 to 3) in (2.7 + 1.5L) µin and lab master
(3 to 4) in (2.9 + 1.4L) µin
(4 to 6) in (3.3 + 1.3L) µin

Sieves – ASTM E11

Opening Size (X/Y) Up to 5 in (88 + 15L) µin Optical comparator with

and Wire Diameter gage blocks
(X/Y)

Durometers – ASTM D2240

Types A, B, C, D, O,
DO and OO

Indentor Extension and

Shape –

Diameter Up to 0.25 in 0.001 in Optical comparator

Radius Up to 0.5 in 0.001 in

Angle Up to 90° 0.097°

Extension Up to 0.5 in 830 µin

Indentor Display Up to 0.1 in 330 µin Gage blocks

Spring Calibration – Up to 5 kg 0.26 g Mass and balance

Force

Angle Blocks Up to 180° 0.097° Optical comparator

V-block –

Parallelism Up to 24 in 46 µin Surface plate, reference

standard, and master
Squareness Up to 4 in 79 µin square
(4 to 17) in 120 µin

Flatness Up to 24 in 93 µin

(A2LA Cert. No. 1746.01) Revised 01/10/2020 Page 4 of 24

 Parameter/Equipment Range CMC2, 4 (±) Comments

Angle Irons –

Parallelism Up to 24 in 46 µin Surface plate, reference

standard, and master
Squareness Up to 4 in 79 µin square
(4 to 17) in 120 µin

Flatness Up to 24 in 93 µin

Ring Gages Up to 0.1 in 5.6 µin Gage blocks and

(0.1 to 1) in (4.7 + 0.24L) µin Supermic
(1 to 3) in (3.6 + 1.3L) µin
(3 to 4) in (3.2 + 1.5L) µin
(4 to 6) in (5.6 + 0.9L) µin
(6 to 10) in (6.4 + 0.7L) µin

IV. Electrical – DC/Low Frequency

Parameter/Equipment Range CMC2, 3 (±) Comments

Electrical Calibration of
Thermocouple –
Generate and Measure

Type B (250 to 350) °C 1.2 °C Ectron 1140A or Fluke

(350 to 445) °C 0.87 °C 5520A
(445 to 580) °C 0.69 °C
(580 to 600) °C 0.53 °C
(600 to 800) °C 0.35 °C
(800 to 1000) °C 0.28 °C
(1000 to 1550) °C 0.24 °C
(1550 to 1820) °C 0.26 °C

Type E (-270 to -250) °C 1.4 °C

(-250 to -245) °C 0.39 °C
(-245 to -195) °C 0.21 °C
(-195 to -155) °C 0.12 °C
(-155 to -90) °C 0.1 °C
(-90 to 15) °C 0.08 °C
(15 to 890) °C 0.07 °C
(890 to 1000) °C 0.08 °C

(A2LA Cert. No. 1746.01) Revised 01/10/2020 Page 5 of 24

 Parameter/Equipment Range CMC2, 3 (±) Comments

Electrical Calibration of
Thermocouple –
Generate and Measure
(cont.)

Type J (-210 to -180) °C 0.15 °C Ectron 1140A or Fluke

(-180 to -120) °C 0.12 °C 5520A
(-120 to -50) °C 0.1 °C
(-50 to 1200) °C 0.09 °C

Type K (-270 to -255) °C 2.6 °C

(-255 to -200) °C 0.81 °C
(-200 to -195) °C 0.26 °C
(-195 to -115) °C 0.14 °C
(-115 to -55) °C 0.11 °C
(-55 to 1000) °C 0.09 °C
(1000 to 1372) °C 0.1 °C

Type N (-270 to -260) °C 5.9 °C

(-260 to -200) °C 1.2 °C
(-200 to -140) °C 0.27 °C
(-140 to -70) °C 0.18 °C
(-70 to 25) °C 0.14 °C
(25 to 160) °C 0.12 °C
(160 to 1300) °C 0.11 °C

Type R (-50 to -30) °C 0.77 °C

(-30 to 0) °C 0.64 °C
(0 to 250) °C 0.26 °C
(250 to 400) °C 0.27 °C
(400 to 1768) °C 0.26 °C

Type S (-50 to -30) °C 0.73 °C

(-30 to 0) °C 0.66 °C
(0 to 250) °C 0.37 °C
(250 to 1000) °C 0.29 °C
(1000 to 1400) °C 0.3 °C
(1400 to 1768) °C 0.31 °C

Type T (-270 to -255) °C 2.1 °C

(-255 to -250) °C 0.59 °C
(-250 to -240) °C 0.5 °C
(-240 to -210) °C 0.35 °C
(-210 to -150) °C 0.21 °C
(-150 to -40) °C 0.14 °C
(-40 to 100) °C 0.1 °C
(100 to 400) °C 0.09 °C

(A2LA Cert. No. 1746.01) Revised 01/10/2020 Page 6 of 24

 Parameter/Equipment Range CMC2, 3 (±) Comments

Electrical Calibration of
Thermocouple – Generate and
Measure (cont.)

Type U (-200 to 0) °C 0.65 °C Ectron 1140A or

(0 to 600) °C 0.31 °C Fluke 5520A

Electrical Calibration of RTD’s

– Generate

Pt 385, 100 Ω (-200 to 0) °C 0.039 °C Fluke 5520A

(0 to 100) °C 0.054 °C
(100 to 300) °C 0.07 °C
(300 to 400) °C 0.078 °C
(400 to 630) °C 0.093 °C
(630 to 800) °C 0.18 °C

Pt 385, 200 Ω (-200 to 100) °C 0.031 °C

(100 to 260) °C 0.039 °C
(260 to 300) °C 0.093 °C
(300 to 400) °C 0.1 °C
(400 to 600) °C 0.11 °C
(600 to 630) °C 0.12 °C

Pt 3916, 100 Ω (-200 to -190) °C 0.19 °C

(-190 to -80) °C 0.031 °C
(-80 to 0) °C 0.039 °C
(0 to 100) °C 0.047 °C
(100 to 260) °C 0.055 °C
(260 to 300) °C 0.062 °C
(300 to 400) °C 0.07 °C
(400 to 600) °C 0.078 °C
(600 to 630) °C 0.18 °C

Pt 3926, 100 Ω (-200 to 0) °C 0.039 °C

(0 to 100) °C 0.054 °C
(100 to 300) °C 0.07 °C
(300 to 400) °C 0.078 °C
(400 to 630) °C 0.093 °C

(A2LA Cert. No. 1746.01) Revised 01/10/2020 Page 7 of 24

 Parameter/Equipment Range CMC2, 4, 10 (±) Comments

DC Voltage – Generate (0 to 220) mV 0.61 µV + 0.000 82 % Fluke 5700A

(0.22 to 2.2) V 1 µV + 0.000 72 %
(2.2 to 11) V 3.6 µV + 0.000 72 %
(11 to 22) V 6.5 µV + 0.000 72 %
(22 to 220) V 82 µV + 0.000 82 %
(220 to 1100) V 0.51 mV + 0.000 92 %

DC Voltage – Measure (0 to 199.999 999) mV 0.11 µV + 0.0005 % Fluke 8508A

(0.2 to 1.999 999 99) V 0.42 µV + 0.000 35 %
(2 to 19.999 999 9) V 4.3 µV + 0.000 36 %
(20 to 199.999 999) V 43 µV + 0.000 55 %
(200 to 1000.000 00) V 0.5 mV + 0.000 55 %
(1 to 2) kV 0.3 V + 0.066 % High voltage divider
(2 to 15) kV 7.6 V + 0.033 % Fluke 80F-15

DC Current – Generate (0 to 220) µA 8.2 nA + 0.0051 % Fluke 5700A

(0.22 to 2.2) mA 8.2 nA + 0.0052 %
(2.2 to 22) mA 82 nA + 0.0051 %
(22 to 220) mA 820 nA + 0.0062 %
(0.22 to 2.2) A 26 μA + 0.0082 %
(2.2 to 11) A 490 μA + 0.037 %
(11 to 20.5) A 57 μA + 0.078 % Fluke 5520A, Valhalla
(20 to 100) A 18 mA + 0.035 % 2555A with 5700A

(100 to 1000) A 0.093 A + 0.027 % Fluke 5520A with 5500

coil

DC Current – Measure (0 to 200) μA 0.52 nA + 0.0012 % Fluke 8508A

(0.2 to 2) mA 4.9 nA + 0.0012 %
(2 to 20) mA 48 nA + 0.0014 %
200 mA 0.8 µA + 0.0048 %
(0.2 to 2) A 16 µA + 0.019 %
(2 to 20) A 0.4 mA + 0.04 %
(20 to 100) A 0.0084 % Leeds and Northrop
resistors with 8508A

(A2LA Cert. No. 1746.01) Revised 01/10/2020 Page 8 of 24

 Parameter/Range Frequency CMC2, 4, 10 (±) Comments

AC Voltage – Generate

(0.22 to 2.2) mV (10 to 20) Hz 4.6 µV + 0.057 % Fluke 5700A

(20 to 40) Hz 4.6 µV + 0.022 %
(40 to 20 000) Hz 4.6 µV + 0.011 %
(20 to 50) kHz 4.6 µV + 0.038 %
(50 to 100) kHz 7.2 µV + 0.086 %
(100 to 300) kHz 13 µV + 0.12 %
(300 to 500) kHz 26 µV + 0.18 %
(500 to 1000) kHz 26 µV + 0.35 %

(2.2 to 22) mV (10 to 20) Hz 5.1 µV + 0.057 %

(20 to 40) Hz 5.1 µV + 0.022 %
(40 to 20 000) Hz 5.1 µV + 0.011 %
(20 to 50) kHz 5.1 µV + 0.038 %
(50 to 100) kHz 5.1 µV + 0.087 %
(100 to 300) kHz 12 µV + 0.12 %
(300 to 500) kHz 26 µV + 0.18 %
(500 to 1000) kHz 26 µV + 0.35 %

(22 to 220) mV (10 to 20) Hz 1.3 µV + 0.057 %

(20 to 40) Hz 8.2 µV + 0.022 %
(40 to 20 000) Hz 8.2 µV + 0.011 %
(20 to 50) kHz 8.2 µV + 0.033 %
(50 to 100) kHz 26 µV + 0.087 %
(100 to 300) kHz 26 µV + 0.12 %
(300 to 500) kHz 36 µV + 0.18 %
(500 to 1000) kHz 82 µV + 0.35 %

(0.22 to 2.2) V (10 to 20) Hz 0.31 mV + 0.041 %

(20 to 40) Hz 0.026 mV + 0.017 %
(40 to 20 000) Hz 6.1 µV + 0.0077 %
(20 to 50) kHz 16 µV + 0.013 %
(50 to 100) kHz 71 µV + 0.026 %
(100 to 300) kHz 0.13 mV + 0.044 %
(300 to 500) kHz 0.36 mV + 0.11 %
(500 to 1000) kHz 0.87 mV + 0.23 %

(2.2 to 22) V (10 to 20) Hz 0.82 mV + 0.051 % Fluke 5700 with

(20 to 40) Hz 0.26 mV + 0.017 % amplifier
(40 to 20 000) Hz 62 µV + 0.0077 %
(20 to 50) kHz 0.16 mV + 0.013 %
(50 to 100) kHz 0.36 mV + 0.026 %
(100 to 300) kHz 1.5 mV + 0.051 %
(300 to 500) kHz 4.4 mV + 0.13 %
(500 to 1000) kHz 8.7 mV + 0.28 %

(A2LA Cert. No. 1746.01) Revised 01/10/2020 Page 9 of 24

 Parameter/Range Frequency CMC2, 4, 10 (±) Comments

AC Voltage – Generate
(cont)

(22 to 220) V (10 to 20) Hz 8.2 mV + 0.051 % Fluke 5700

(20 to 40) Hz 2.6 mV + 0.017 %
(40 to 20 000) Hz 0.82 mV + 0.0082 %
(20 to 50) kHz 3.6 mV + 0.023 %
(50 to 100) kHz 8.2 mV + 0.051 %
(100 to 300) kHz 92 mV + 0.16 %
(300 to 500) kHz 92 mV + 0.48 %
(500 to 1000) kHz 0.19 V + 1.2 %

(220 to 250) V (15 to 40) Hz 16 mV + 0.041 %

(220 to 1100) V (40 to 50) Hz 4.1 mV + 0.01 %

(50 to 1000) Hz 3.6 mV + 0.009 %
(1 to 20) kHz 6.2 mV + 0.017 %
(20 to 30) kHz 11 mV + 0.062 %

(220 to 750) V (30 to 50) kHz 11 mV + 0.062 %

(50 to 100) kHz 46 mV + 0.24 %

AC Voltage – Measure

(0 to 200) mV (1 to 10) Hz 14 µV + 0.017 % Fluke 8508A

(10 to 40) Hz 4 µV + 0.014 %
(40 to 100) Hz 4 µV + 0.012 %
(100 to 2000) Hz 2 µV + 0.011 %
(2 to 10) kHz 0.004 mV + 0.012 %
(10 to 30) kHz 0.008 mV + 0.034 %
(30 to 100) kHz 20 µV + 0.077 %

(0.2 to 2.0) V (1 to 10) Hz 0.12 mV + 0.015 %

(10 to 40) Hz 20 µV + 0.012 %
(40 to 100) Hz 20 µV + 0.009 %
(100 to 2000) Hz 20 µV + 0.0075 %
(2 to 10) kHz 20 µV + 0.011 %
(10 to 30) kHz 40 µV + 0.022 %
(30 to 100) kHz 0.2 mV + 0.057 %
(100 to 300) kHz 2 mV + 0.3 %
(300 to 1000) kHz 20 mV + 1 %

(2.0 to 20) V (1 to 10) Hz 1.2 mV + 0.015 %

(10 to 40) Hz 0.2 mV + 0.0115 %
(40 to 100) Hz 0.2 mV + 0.009 %
(100 to 2000) Hz 0.2 mV + 0.0075 %
(2 to 10) kHz 0.2 mV + 0.011 %

(A2LA Cert. No. 1746.01) Revised 01/10/2020 Page 10 of 24

 Parameter/Range Frequency CMC2, 4, 10 (±) Comments

AC Voltage – Measure
(cont)

(2.0 to 20) V (10 to 30) kHz 0.4 mV + 0.022 % Fluke 8508A

(30 to 100) kHz 2 mV + 0.057 %
(100 to 300) kHz 20 mV + 0.3 %
(300 to 1000) kHz 200 mV + 1 %

(20 to 200) V (1 to 10) Hz 12 mV + 0.015 %

(10 to 40) Hz 2 mV + 0.012 %
(40 to 100) Hz 2 mV + 0.009 %
(100 to 2000) Hz 2 mV + 0.0075 %
(2 to 10) kHz 2 mV + 0.011 %
(10 to 30) kHz 4 mV + 0.022 %
(30 to 100) kHz 20 mV + 0.057 %
(100 to 300) kHz 200 mV + 0.3 %
(300 to 1000) kHz 2V+1%

(200 to 1000) V (1 to 10) Hz 70 mV + 0.015 %

(10 to 40) Hz 21 mV + 0.012 %
(40 to 10 000) Hz 20 mV + 0.012 %
(10 to 30) kHz 40 mV + 0.023 %
(30 to 100) kHz 0.2 V + 0.058 %

AC Current – Generate

(0 to 220) µA (10 to 20) Hz 26 nA + 0.072 % Fluke 5700A

(20 to 40) Hz 20 nA + 0.036 %
(40 to 1000) Hz 16 nA + 0.015 %
(1 to 5) kHz 41 nA + 0.062 %
(5 to 10) kHz 82 nA + 0.17 %

(0.22 to 2.2) mA (10 to 20) Hz 41 nA + 0.072 %

(20 to 40) Hz 36 nA + 0.036 %
(40 to 1000) Hz 36 nA + 0.015 %
(1 to 5) kHz 0.41 μA + 0.062 %
(5 to 10) kHz 0.82 µA + 0.17 %

(2.2 to 22) mA (10 to 20) Hz 0.41 μA + 0.072 %

(20 to 40) Hz 0.36 μA + 0.036 %
(40 to 1000) Hz 0.36 μA + 0.015 %
(1 to 5) kHz 4.1 μA + 0.062 %
(5 to 10) kHz 8.2 μA + 0.16 %

(22 to 220) mA (10 to 20) Hz 4.1 μA + 0.072 %

(20 to 40) Hz 3.6 μA + 0.036 %
(40 to 1000) Hz 3.6 μA + 0.015 %

(A2LA Cert. No. 1746.01) Revised 01/10/2020 Page 11 of 24

 Parameter/Range Frequency CMC2, 4, 10 (±) Comments

AC Current – Generate
(cont)

(22 to 220) mA (1 to 5) kHz 41 μA + 0.062 % Fluke 5700A

(5 to 10) kHz 82 μA + 0.17 %

(0.22 to 2.2) A (20 to 1000) Hz 36 μA + 0.067 %

(1 to 5) kHz 82 μA + 0.077 %
(5 to 10) kHz 0.16 mA + 0.87 %

(2.2 to 11) A (40 to 1000) Hz 0.18 mA + 0.047 %

(1 to 5) kHz 0.39 mA + 0.097 %
(5 to 10) kHz 0.77 mA + 0.37 %

(29 to 329.99) µA (10 to 30) kHz 0.31 µA + 1.3 % Fluke 5520A

(0.33 to 3.2999) mA (1 to 5) kHz 0.16 µA + 0.16 %

(5 to 10) kHz 0.23 µA + 0.39 %
(10 to 30) kHz 0.47 µA + 0.78 %

(3.3 to 32.999) mA (1 to 5) kHz 1.6 µA + 0.062 %

(5 to 10) kHz 2.3 µA + 0.16 %
(10 to 30) kHz 3.1 µA + 0.32 %

(33 to 329.99) mA (1 to 5) kHz 39 µA + 0.078 %

(5 to 10) kHz 78 µA + 0.16 %
(10 to 30) kHz 160 µA + 0.32 %

(11 to 20.5) A (45 to 100) Hz 3.9 mA + 0.093 %

(100 to 1000) Hz 3.8 mA + 0.12 %
(1 to 5) kHz 3.9 mA + 2.4 %

(20.5 to 1000) A (45 to 65) Hz 0.1 A + 0.33 % Fluke 5520A and

(65 to 440) Hz 0.12 A + 0.92 % 5500 coil

AC Current – Measure

(0 to 200) µA (1 to 10 000) Hz 0.02 μA + 0.031 % Fluke 8508A

(10 to 30) kHz 0.02 μA + 0.071 %
(30 to 100) kHz 0.02 μA + 0.4 %

(0.2 to 2) mA (1 to 10) Hz 0.2 μA + 0.031 %

(10 to 10 000) Hz 0.2 μA + 0.03 %
(10 to 30) kHz 0.2 μA + 0.071 %
(30 to 100) kHz 0.2 μA + 0.4 %

(A2LA Cert. No. 1746.01) Revised 01/10/2020 Page 12 of 24

 Parameter/Range Frequency CMC2, 4, 10 (±) Comments

AC Current – Measure
(cont)

(2 to 20) mA (1 to 10) Hz 2 μA + 0.031 % Fluke 8508A

(10 to 10 000) Hz 2 μA + 0.03 %
(10 to 30) kHz 2 μA + 0.071 %
(30 to 100) kHz 2 μA + 0.4 %

(20 to 200) mA (1 to 10) Hz 20 μA + 0.031 %

(10 to 10 000) Hz 20 μA + 0.029 %
(10 to 30) kHz 20 μA + 0.063 %

(0.2 to 2) A (10 to 2000) Hz 0.2 mA + 0.062 %

(2 to 10) kHz 0.2 mA + 0.073 %
(10 to 30) kHz 0.2 mA + 0.3 %

(2 to 20) A (10 to 2000) Hz 2 mA + 0.082 %

(2 to 10) kHz 2 mA + 0.25 %

(20 to 30) A 20 to 400 Hz 0.56 A + 5 % Fluke 5320A

Parameter/Equipment Range CMC2, 4, 5, 10 (±) Comments

Resistance – Generate (0 to 10.9999) Ω 0.78 mΩ + 0.003 % Fluke 5520A

(11 to 32.9999) Ω 1.2 mΩ + 0.002 %
(33 to 109.9999) Ω 1.1 mΩ + 0.0022 %
(0.11 to 1.099 999) kΩ 1.6 mΩ + 0.0022 %
(1.1 to 10.999 99) kΩ 1.6 mΩ + 0.0022 %
(11 to 109.999 99) kΩ 0.16 Ω + 0.0022 %
(0.11 to 1.099 999) MΩ 1.6 Ω + 0.0025 %
(1.1 to 3.299 999) MΩ 23 Ω + 0.0047 %
(3.3 to 10.999 99) MΩ 40 Ω + 0.01 %
(11 to 32.999 99) MΩ 2 kΩ + 0.019 %
(33 to 109.9999) MΩ 2.3 kΩ + 0.039 %
(110 to 329.9999) MΩ 75 kΩ + 0.24 %
(330 to 1100) MΩ 390 kΩ + 1.2 %

(1.1 to 10) GΩ 0.96 MΩ + 0.59 % Resistance decade

(10 to 20) GΩ 0.79 MΩ + 1.2 % box
(20 to 100) GΩ. 6.2 MΩ + 1.2 %
(100 to 1000) GΩ 2.1 %

(1 to 10) TΩ 9 MΩ + 3.2 % Fluke 5320A

(A2LA Cert. No. 1746.01) Revised 01/10/2020 Page 13 of 24

 Parameter/Equipment Range CMC2, 4, 5, 10 (±) Comments

Resistance – Measure (0 to 2) Ω 5.3 μΩ + 0.0016 % Fluke 8508A

(2 to 20) Ω 1.4 μΩ + 0.000 97 %
(20 to 200) Ω 50 μΩ + 0.000 82 %
(200 to 2000) Ω 0.56 mΩ + 0.0008 %
(2 to 20) kΩ 5 mΩ + 0.000 82 %
(20 to 200) kΩ 50 mΩ + 0.0008 %
(200 to 2000) kΩ 1Ω + 0.000 93 %
(2 to 20) MΩ 100 Ω + 0.0021 %
(20 to 200) MΩ 10 kΩ + 0.012 %
(200 to 2000) MΩ 1 MΩ + 0.15 %
(2 to 20) GΩ 15 MΩ + 0.14 %

Resistance – Generate, 0Ω 52 μΩ Fluke 5700A

Fixed Points 1Ω 97 μΩ
1.9 Ω 180 μΩ
10 Ω 290 μΩ
19 Ω 530 μΩ
100 Ω 1.7 mΩ
190 Ω 3.3 mΩ
1 kΩ 13 mΩ
1.9 kΩ 25 mΩ
10 kΩ 120 mΩ
19 kΩ 230 mΩ
100 kΩ 1.4 Ω
190 kΩ 2.7 Ω
1 MΩ 20 Ω
1.9 MΩ 41 Ω
10 MΩ 410 Ω
19 MΩ 910 Ω
100 MΩ 11 kΩ

Capacitance – Generate (0.19 to 3.2999) nF 8 pF + 0.39 % Fluke 5520A

(3.3 to 10.9999) nF 7.9 pF + 0.2 %
(11 to 109.999) nF 78 pF + 0.2 %
(110 to 329.999) nF 0.23 nF + 0.2 %
(0.33 to 1.099 99) μF 0.81 nF + 0.2 %
(1.1 to 3.299 99) μF 2.3 nF + 0.2 %
(3.3 to 10.9999) μF 1.8 nF + 0.38 %
(11 to 32.999 9) μF 23 nF + 0.31 %
(33 to 109.999) μF 76 nF + 0.36 %
(110 to 329.999) μF 0.24 µF + 0.35 %
(0.33 to 1.099 99) mF 0.76 µF + 0.36 %
(1.1 to 3.2999) mF 2.4 µF + 0.35 %
(3.3 to 10.9999) mF 7.2 µF + 0.37 %
(11 to 32.9999) mF 24 μF + 0.58 %
(33 to 110) mF 78 μF + 0.85 %

(A2LA Cert. No. 1746.01) Revised 01/10/2020 Page 14 of 24

 Parameter/Equipment Range CMC2, 5, 10 (±) Comments

Capacitance – Generate
(cont)

Fixed Points 0.0001 μF 120 fF Precision capacitors

0.0002 μF 240 fF
0.0003 μF 350 fF
0.0004 μF 470 fF
0.0005 μF 600 fF
0.0006 μF 710 fF
0.0007 μF 820 fF
0.0008 μF 960 fF
0.0009 μF 1.1 pF
0.001 μF 1.2 pF
0.002 μF 2.5 pF
0.003 μF 3.7 pF
0.004 μF 4.9 pF
0.005 μF 5.9 pF
0.006 μF 7.1 pF
0.007 μF 8.2 pF
0.008 μF 9.4 pF
0.009 μF 11 pF
0.01 μF 12 pF
0.02 μF 24 pF
0.03 μF 36 pF
0.04 μF 47 pF
0.05 μF 58 pF
0.06 μF 71 pF
0.07 μF 82 pF
0.08 μF 94 pF
0.09 μF 110 pF
0.1 μF 120 pF
0.2 μF 250 pF
0.3 μF 360 pF
0.4 μF 490 pF
0.5 μF 610 pF

Parameter/Equipment Frequency CMC2, 3 (±) Comments

Inductance – Generate

Fixed Points

100 μH (0.1 to 10) kHz 0.47 μH GenRad 1482x

200 μH (0.1 to 10) kHz 0.71 μH
500 μH (0.1 to 10) kHz 0.76 μH

(A2LA Cert. No. 1746.01) Revised 01/10/2020 Page 15 of 24

 Parameter/Equipment Frequency CMC2, 3 (±) Comments

Inductance – Generate
(cont)

Fixed Points

1 mH (0.1 to 10) kHz 4.1 μH GenRad 1482x

100 mH (0.1 to 10) kHz 0.17 mH

Distortion – Measure

(0 to 99.99) dB 20 Hz to 20 kHz 1.2 dB HP 8903B

(20 to 100) kHz 2.4 dB

V. Electrical/RF Microwave

Parameter/Range Frequency CMC2, 3, 4 (±) Comments

RF Power – Measure

(+13 to -67) dB 0.1 MHz to 3.2 GHz 1 dB Rohde & Schwarz

(-67 to -57) dB 0.1 MHz to 3.2 GHz 0.19 dB NRV
(-57 to -47) dB 0.1 MHz to 2 GHz 0.075 dB
(-47 to -37) dB (2 to 3.2) GHz 0.093 dB

0.1 MHz to 2 GHz 0.076 dB

(-37 to -27) dB (2 to 3.2) GHz 0.092 dB

0.1 MHz to 2 GHz 0.078 dB

(-27 to -17) dB (2 to 3.2) GHz 0.093 dB

0.1 MHz to 2 GHz 0.078 dB

(-17 to -7) dB (2 to 3.2) GHz 0.093 dB

(0.1 to 30) MHz 0.077 dB

(-7 to 3) dB (0.03 to 2) GHz 0.092 dB
(2 to 3.2) GHz 0.19 dB

(0.1 to 30) MHz 0.08 dB

(3 to 13) dB (0.03 to 2) GHz 0.11 dB
(2 to 3.2) GHz 0.31 dB

(A2LA Cert. No. 1746.01) Revised 01/10/2020 Page 16 of 24

 Parameter/Range Frequency CMC2, 3, 4 (±) Comments

Frequency Response –
Measure

AC Level Flatness

(Up to 3) V (0.010 to 1000) kHz 0.4 % Precision

(1 to 30) MHz 0.46 % Measurements
(30 to 50) MHz 0.61 % EL-2257 with
(50 to 70) MHz 1.1 % 3458A and Fluke
(70 to 80) MHz 1.4 % 5700A
(80 to 100) MHz 1.7 %

Parameter/Equipment Range CMC2, 3, 4 (±) Comments

Oscilloscopes –

Square Wave Signal -

Generate (1 kHz input)

50 Ω (1 to 109.99) mV 32 μV + 0.21 % Fluke 5520A/SC1100

(0.11 to 6.599) V 32 μV + 0.19 %

1 MΩ (1 to 109.99) mV 32 μV + 0.1 %
(0.110 to 10.999) V 32 μV + 0.11 %
(11 to 130) V 960 μV + 0.1 %

Leveled Sine Wave

Amplitude

5 mV to 5.5 V 50 kHz Reference 0.24 mV + 1.6 %

(0.050 to 100) MHz 0.23 mV + 2.8 %

5 mV to 3.5 V (100 to 300) MHz 0.23 mV + 3.1 %

(300 to 600) MHz 0.23 mV + 4.7 %
(600 to 1100) MHz 0.23 mV + 5.4 %

Leveled Sine Wave

Flatness

5 mV to 5.5 V (0.050 to 100) MHz 7.7 μV + 1.2 %

(100 to 300) MHz 7.8 μV + 1.6 %
(300 to 600) MHz 7.8 μV + 3.1 %

5 mV to 3.5 V (600 to 1100) MHz 0.23 mV + 5.4 %

(A2LA Cert. No. 1746.01) Revised 01/10/2020 Page 17 of 24

 Parameter/Equipment Range CMC2, 4 (±) Comments

Oscilloscopes – (cont)

Time Marker

50 Ω Load (1 to 5) ns 0.0002 % Fluke 5520A/SC1100

10 ns 0.0002 %
(20 to 50) ns 0.0002 %
100 ns to 20 ms 0.0002 %
50 ms to 5 s 0.51 %

Edge – Rise Time

1 kHz to 2 MHz ≤ 300 ps 79 ps
>2 MHz to 10 MHz ≤ 350 ps 79 ps

Edge – Amplitude 5 mV to 2.5 V 0.16 mV + 1.6 %

VI. Fluid Quantities

Parameter/Equipment Range CMC2, 3, 4 (±) Comments

Airflow – Mass Flow and (0.002 to 20) LPM 0.23 % Laminar flow
Correlated, Direct Read (20 to 80) LPM 0.22 % elements

(80 to 500) LPM 0.34 % Volumetric

comparison

Air Velocity – Measuring (4 to 13) m/s 0.038 m/s + 0.056 % Wind tunnel and
Equipment (13 to 40) m/s 0.61 % pressure transducers

Refractive Index – (5 to 91.75)° Brix 0.02° Brix + 0.012 % Standard reference

Refractometers materials

Liquid Volume – (0.1 to 1) μL 2.4 nL + 1 % Photometric

Pipettes/Burettes9 (1 to 10) μL 1 nL + 1.2 % calibrator
(10 to 100) μL 130 nL + 1.1 nL/μL
(100 to 1000) μL 100 nL + 1.4 nL/μL Gravimetric method
(1 to 10) mL 1.6 μL/mL and Class 1 mass
(10 to 500) mL 2.1 μL + 1.3 μL/mL
(500 to 2000) mL 1.4 μL/mL
(2000 to 4000) mL 4.2 μL/mL

(A2LA Cert. No. 1746.01) Revised 01/10/2020 Page 18 of 24

 Parameter/Equipment Range CMC2, 3, 4 (±) Comments

Specific Gravity – (0.65 to 0.95) sg 0.000 38 sg Hydrostatic

Hydrometers (0.95 to 1.05) sg 0.000 11 sg weighing
(1.05 to 1.55) sg 0.000 23 sg
(1.55 to 2.00) sg 0.000 48 sg

Viscosity 4.5 cP 0.012 cP Reference

9 cP 0.027 cP standard silicone
48 cP 0.15 cP oils
96 cP 0.35 cP
480 cP 1.8 cP
969 cP 3.5 cP
4859 cP 22 cP
11 860 cP 61 cP
30 160 cP 150 cP
59 940 cP 290 cP

VII. Mechanical

Parameter/Equipment Range CMC2, 4 (±) Comments

Barometers (700 to 1100) mBar 0.11 mBar RPM4/BA100Ks

and chamber

Vacuum (0 to 24) inHg 0.0071 in Hg + 0.0021 % Quartz reference

(24 to 29.2) inHg 0.0098 in Hg transducer

(24 to 100) mTorr 0.17 mTorr + 0.44 % Capacitance

(0.1 to 1) Torr 0.033 Torr + 0.0092 % Manometers
(1 to 10) Torr 0.033 Torr + 0.082 %

Pressure (0 to 2) inH2O 0.00034 inH2O MicroTector

(2 to 30) inH2O 0.0011 inH2O + 0.0005 % deadweight tester
(30 to 100) inH2O 0.00012 inH2O + 0.000 21 %
(0 to 5) psi 0.000 09 psi + 0.012 % Quartz reference
(5 to 15) psi 0.000 011 psi + 0.013 % transducers
(15 to 30) psi 0.027 %
(30 to 100) psi 0.0029 psi + 0.01 %
(100 to 300) psi 0.013 %
(300 to 1000) psi 0.000 21 psi + 0.013 %
(1000 to 3000) psi 0.29 psi + 0.0009 %
(3000 to 10 000) psi 0.012 %
(10 000 to 20 000) psi 0.43 psi + 0.02 %

(A2LA Cert. No. 1746.01) Revised 01/10/2020 Page 19 of 24

 Parameter/Equipment Range CMC2, 3, 4 (±) Comments

Torque – Measuring (0.5 to 160) in⋅oz 0.0016 in⋅oz + 0.027 % Dead weights and
Equipment (10 to 20) in⋅lb 0.0034 in⋅lb + 0.15 % torque arm or
(20 to 600) in⋅lb 0.12 % wheels
(50 to 1000) ft-lb 0.07 %

Torque – Generating (0.5 to 5) in⋅oz 0.006 in⋅oz + 0.006 % Watch calibrator,

Equipment (5 to 40) in⋅oz 1.5 % torque transducers
(40 to 400) in⋅oz 0.32 in⋅oz + 0.51 %
(25 to 50) in⋅lb 0.32 in⋅lb + 0.11 %
(50 to 150) in⋅lb 0.13 in⋅lb + 0.26 %
(150 to 400) in⋅lb 0.061 in⋅lb + 0.31 %
(30 to 250) ft⋅lb 0.16 ft⋅lb + 0.26 %
(250 to 500) ft⋅lb 0.026 ft⋅lb + 0.31 %

Balance and Scales6 1 mg 6.5 μg OIML Ultra Class

(1 mg to 160 kg) 2 mg 6.5 μg mass pieces
5 mg 6.1 μg
10 mg 6.1 μg
20 mg 6.1 μg
50 mg 5.2 μg
100 mg 7.6 μg
200 mg 6.2 μg
500 mg 6.3 μg
1g 20 μg
2g 21 μg
5g 28 μg
10 g 40 μg
20 g 52 µg
50 g 93 µg
100 g 0.19 mg
200 g 0.38 mg
500 g 0.97 mg
1 kg 2.3 mg
2 kg 4.6 mg
5 kg 10 mg
10 kg 33 mg ASTM Class 1
20 kg 64 mg mass pieces

Mass6 1 mg 6.2 μg OIML Ultra Class

2 mg 6.1 μg
5 mg 6.1 µg
10 mg 6 µg
20 mg 6 µg
50 mg 6 µg

(A2LA Cert. No. 1746.01) Revised 01/10/2020 Page 20 of 24

 Parameter/Equipment Range CMC2, 3, 4 (±) Comments

Mass6 100 mg 6 µg OIML Ultra Class

200 mg 6 µg
500 mg 6 µg
1g 20 µg
2g 20 µg
5g 21 µg
10 g 32 µg
20 g 50 µg
50 g 92 µg
100 g 0.19 mg
200 g 0.37 mg
300 g 0.63 mg
400 g 0.7 mg
500 g 0.91 mg
1 kg 1.7 mg
1.5 kg 2.5 mg
2 kg 4.4 mg
5 kg 10 mg
10 kg 31 mg ASTM Class 1 mass
20 kg 63 mg pieces

Force – Measuring (0 to 250) lbf 0.000 65 lbf + 0.0034 % Dead weights

Equipment
(250 to 1000) lbf 0.45 lbf + 0.03 % Load Cells

VIII. Thermodynamics

Parameter/Equipment Range CMC2, 3, 4 (±) Comments

Temperature – (-15 to 0) °C 0.54 °C + 0.13 % Blackbody IR

IR Systems (0 to 100) °C 0.53 °C + 0.14 % calibrator
(100 to 200) °C 0.41 °C + 0.26 %
(200 to 500) °C 0.13 °C + 0.4 %

Temperature – -196.0 °C 0.0046 °C Liquid nitrogen BP

Measuring Equipment apparatus, SPRT
and Measure8
(-95 to -80) °C 0.061°C Metrology well and
SPRT

(-80 to 0) °C 0.0098 °C Liquid bath and SPRT

(A2LA Cert. No. 1746.01) Revised 01/10/2020 Page 21 of 24

 Parameter/Equipment Range CMC2, 3, 4 (±) Comments

Temperature – 0 °C 0.0045 °C Ice bath and SPRT

Measuring Equipment
and Measure8 (cont) (0 to 90) °C 0.006 °C + 0.000 77 % Liquid bath and
(90 to 235) °C 0.007 °C + 0.0034 % SPRT

(235 to 550) °C 0.0042 % Salt bath, SPRT

(550 to 660) °C 0.022 °C + 0.000 66 %
(660 to 700) °C 0.12 °C Sand bath, SPRT
(700 to 800) °C 0.27 °C
(800 to 900) °C 0.48 °C Dry well, SPRT, T/C
(900 to 1000) °C 0.75 °C
(1000 to 1100) °C 1.1 °C
(1100 to 1200) °C 1.5 °C Dry well, T/C

Dewpoint (-70 to -60) °C 0.47°C Chilled mirror and

(-60 to -40) °C 0.29°C moisture generator
(-40 to -20) °C 0.27°C
(-20 to 10) °C 0.26°C Two-pressure
(10 to 20) °C 0.16°C humidity generator

Relative Humidity8 (10 to 60) % RH 0.51 % RH Two-pressure

(60 to 95) % RH 0.52 % RH humidity generator

IX. Time & Frequency

Parameter/Equipment Range CMC2, 4, 6 (±) Comments

Stopwatches –
Mechanical 60 s to 720 hr 0.58 s/day Vibrograf
Electronic 60 s to 720 hr 0.054 s/day

Stroboscopes (0 to 20 000) fpm 0.0031 fpm + 0.000 82 % Comparison to

(20 000 to 120 000) fpm 0.24 fpm + 0.000 67 % counter and detector

(A2LA Cert. No. 1746.01) Revised 01/10/2020 Page 22 of 24

 Parameter/Equipment Range CMC2, 3, 4, 6 (±) Comments

Optical Tachometers (0 to 100 000) rpm 0.000 51 rpm + 0.000 17 % Comparison to

(100 000 to 125 000) rpm 0.96 rpm function generator
(125 000 to 150 000) rpm 1.8 rpm and lamp
(150 000 to 175 000) rpm 2.6 rpm
(175 000 to 200 000) rpm 3.4 rpm

Contact Tachometers (60 to 12 000) rpm 0.016 rpm + 0.003 % Comparison to

(12 000 to 24 000) rpm 0.31 rpm + 0.0003 % counter and
tachometer tester

Frequency – Measure 0.1 Hz to 3.1 GHz 2.1 µHz + 0.000 021 % Universal counter

Frequency – 0.1 Hz to 20 MHz 12 nHz/Hz + 80 µHz 3325A Function

Measuring generator with 5 x
Equipment 10-11 oscillator

(20 to 3200) MHz (0.12 Hz + 0.000 24 %) 8648C generator

10 MHz 7.7 parts in 10-11 Hz/Hz 10 MHz reference

using Rubidium
oscillator

_____________________________________
1
This laboratory offers commercial calibration service.
2
Calibration and Measurement Capability Uncertainty (CMC) is the smallest uncertainty of measurement
that a laboratory can achieve within its scope of accreditation when performing more or less routine
calibrations of nearly ideal measurement standards or nearly ideal measuring equipment. CMCs
represent expanded uncertainties expressed at approximately the 95 % level of confidence, usually
using a coverage factor of k = 2. The actual measurement uncertainty of a specific calibration
performed by the laboratory may be greater than the CMC due to the behavior of the customer’s device
and to influences from the circumstances of the specific calibration.
3
The type of instrument or material being calibrated is defined by the parameter. This indicates the
laboratory is capable of calibrating instruments that measure or generate the values in the ranges
indicated for the listed measurement parameter.
4
In the statement of CMC, % is to be read as % of the absolute value of reading unless otherwise noted. R
indicates unit under test resolution. L is the numerical value of the nominal length of the device
measured in inches.
5
Resistance functions can be used to simulate conductivity, dissolved oxygen, RTD, and thermistor
functions. Uncertainties are translated into simulated measurement units through known conversion
factors.

(A2LA Cert. No. 1746.01) Revised 01/10/2020 Page 23 of 24

6
CMC values listed are for cardinal points. Other values within the range can be obtained using
substitution method with uncertainty increased for each value added.
7
Typical temperature measuring devices are liquid-in-glass (LIG) thermometers, thermocouples, RTDs,
thermistors, bimetal thermometers, dry-well baths, liquid baths, ovens, PRTs, temperature transmitters,
temperature controllers, temperature dataloggers, temperature recorders, and digital thermometers.
3
Typical relative humidity devices are thermohygrometers, hygrometers, psychrometers,
hygrothermographs, humidity dataloggers, transmitters and recorders.
9
Typical liquid volume devices are pipettes, burettes, dispensers and rain gauges.
10
The stated measured values are determined using the indicated instrument (see Comments). This
capability is suitable for the calibration of the devices intended to measure or generate the measured
value in the ranges indicated. CMC’s are expressed as either a specific value that covers the full range
or as a percent or fraction of the reading plus a fixed floor specification.
11
This scope meets A2LA’s P112 Flexible Scope Policy.

(A2LA Cert. No. 1746.01) Revised 01/10/2020 Page 24 of 24

 Accredited Laboratory
A2LA has accredited

INNOCAL
Vernon Hills, IL
for technical competence in the field of

Calibration
This laboratory is accredited in accordance with the recognized International Standard ISO/IEC 17025:2017 General
requirements for the competence of testing and calibration laboratories. This laboratory also meets the requirements of ANSI/NCSL
Z540-1-1994 and R205 – Specific Requirements: Calibration Laboratory Accreditation Program. This accreditation demonstrates
technical competence for a defined scope and the operation of a laboratory quality management system
(refer to joint ISO-ILAC-IAF Communiqué dated April 2017).

Presented this 30th day of October 2019.

_______________________
Vice President, Accreditation Services
For the Accreditation Council
Certificate Number 1746.01
Valid to October 31, 2021
Revised January 10, 2020

For the calibrations to which this accreditation applies, please refer to the laboratory’s Calibration Scope of Accreditation.