Analog / Mixed-Signal Power, Noise, and Reliability Solution
Analog / Mixed-Signal Power, Noise, and Reliability Solution
Key Capabilities
• Delivers
full-chip capacity with • Provides
built-in extraction and • Layout-driven
analysis integrated with
SPICE-level accuracy for transient simulation engine with fast incremental existing analog design environment
power/ground noise analysis and “what-if” analysis • Ability
to generate models for hierarchical
• Concurrently
analyzes noise propagation • Enablesgrid weakness check, “hot spot” full-chip and system-level simulation
through power delivery network, substrate root cause identification, and design fix • Performspower and signal electro-migration
network, and package/PCB parasitics exploration, delivering significant time
signoff supporting industry standard and
savings and productivity enhancements
advanced process technology EM limit
www.apache-da.com
Totem-MMX™ Analog / Mixed-signal Power, Noise, and Reliability Solution
Layout-based Unified Analysis top-level connectivity and noise coupling Signal EM checks on flattened transistor-level
and Debugging Environment scenario for block/IP-level analysis. Once designs as well as on block-level inter-cells
validated, the designer can generate a for embedded digital blocks. Its layout-based
Totem-MMX provides advanced viewing, detailed model capturing layout and circuit GUI with cross probing capabilities provides
debugging and fixing capabilities to effectively behavior of the IP. easy to use and robust debugging including
analyze and optimize full-custom designs.
detailed violation reports with current values
Its layout-driven interface is integrated with IP model generated by Totem-MMX, Custom
and their direction.
existing analog design environment and Macro Model (CMM™), captures different
supports cross-probing of power noise operating states such as “read” and
violations with the industry standard layout “write” with its associated current and other
schematic tools, as well as interactively parameters. It also enables designers to
analyze the fixes made in the design. embed constraints such as maximum voltage
drop allowance on transistors or a metal layer
for top-level verification.