PragaTI (TI India Technical University) announces a course,
RFIC Design and Testing for Wireless Communications
July 18, 21, 22, 2008|9:00AM – 5:30PM|Bangalore
by
Vishwani D. Agrawal and Foster Dai
Course Objective
The boom of wireless and mobile networks has led to an ever-increasing
demand for high performance, low power, and low cost RFIC design.
Advances in silicon and silicon-germanium based technologies can now
provide highly integrated system-on-chip (SOC). With WLAN and cellular
standards operating in very different frequency bands, market leading
wireless solutions have to offer multi-mode interoperability with transparent
worldwide usage. The increasing demand for wireless multimedia
applications such as video streaming keeps pushing future wireless systems
to support higher data rates at higher link reliability and over greater
distances. A multiple-input multiple-output (MIMO) wireless system in
combination with space-time signal processing allows increased data rate,
improved transmission range and link reliability without additional costs in
bandwidth or power.
In spite of a significant motivation, the engineering education today lacks
coverage of RFIC design and test techniques. Wireless networks provide
plenty of design challenges with both academic and commercial values. This
course provides information about fundamentals of wireless communication
systems and building block designs of wireless transceivers. The course
starts with a discussion on multi-com radios for multi-standard coexistence
issues on RFIC designs. It then focuses on wireless transceiver IC designs
such as low-noise-amplifier (LNA), mixer, and voltage-controlled oscillator
(VCO) designs. The course presents essential topics in RFIC testing.
Target Audience
This course is suitable for engineers who did not have any experience with
but plan work with RFICs, those who work on IC design and wish to sharpen
their understanding of modern methods, and engineering managers. It is an
abbreviated version of a one-semester course being developed at Auburn
University.
Course Details
Friday, July 18, 2008
9:00 – 10:30 Introduction Agrawal
RF VLSI devices, functions, technologies
Basic characteristics
11:00 – 12:30 Distortion – theory, measurements, test Agrawal
2:00 – 3:30 Noise – theory, measurements, test Agrawal
4:00 – 5:30 RFIC SOCs and their testing Agrawal
Monday, July 21, 2008
9:00 – 10:30 Introduction – Semiconductor history, RF characteristics Dai
11:00 – 12:30 Basic Concepts – Linearity, noise figure, gain Dai
2:00 – 3:30 RF front-end design – LNA, mixer Dai
4:00 – 5:30 Frequency synthesizer design I (PLL) Dai
Tuesday, July 22, 2008
9:00 – 10:30 Frequency synthesizer design II (VCO) Dai
11:00 – 12:30 RFIC design for wireless communications Dai
2:00 – 3:30 Analog and mixed signal testing Dai
4:00 – 5:30 Power considerations, economics, testing costs Agrawal
References:
[1] J. Kelly and M. Engelhardt, Advanced Production Testing of RF, SoC, and SiP Devices,
Boston: Artech House, 2007.
[2] B. Razavi, RF Microelectronics, Upper Saddle River, New Jersey: Prentice Hall PTR, 1998.
[3] J. Rogers, C. Plett and F. Dai, Integrated Circuit Design for High-Speed Frequency Synthesis,
Boston: Artech House, 2006.
[4] K. B. Schaub and J. Kelly, Production Testing of RF and System-on-a-chip Devices for Wireless
Communications, Boston: Artech House, 2004.