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Analog Design Methodology Jnotor r3

Analog Design Methodology in a Time to Market Environment Overview Cadence AMS project Flow and Management Cadence Projects vs Academic Research Example Designs AMS IP System Design Functional Verif IP Verification Digital IP Physical Implement Timing Electrical Verify board Design Environment Enablement Training Cadence Leading-edge EDA Products "Design Centric" Flows, Methodologies, CAD Support "Design Ready" Process design Kits Custom, on Site, on Line, Public Course Offerings.

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Manjunath Reddy
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0% found this document useful (0 votes)
407 views17 pages

Analog Design Methodology Jnotor r3

Analog Design Methodology in a Time to Market Environment Overview Cadence AMS project Flow and Management Cadence Projects vs Academic Research Example Designs AMS IP System Design Functional Verif IP Verification Digital IP Physical Implement Timing Electrical Verify board Design Environment Enablement Training Cadence Leading-edge EDA Products "Design Centric" Flows, Methodologies, CAD Support "Design Ready" Process design Kits Custom, on Site, on Line, Public Course Offerings.

Uploaded by

Manjunath Reddy
Copyright
© Attribution Non-Commercial (BY-NC)
We take content rights seriously. If you suspect this is your content, claim it here.
Available Formats
Download as PDF, TXT or read online on Scribd
You are on page 1/ 17

John Notor July 17, 2009 Rev 3

I N VE N TI V E

Analog Design Methodology in a Time to Market Environment

Overview
Cadence Services Overview Cadence AMS Project Flow and Management Cadence Projects vs Academic Research Example Designs

July 20, 2009

Cadence Holistic Solutions


Enabling customers to achieve breakthrough results

Extending Customer Capabilities

Partners: Verification IP, Silicon IP, Silicon & Board Mfg, Packaging, Test

Design Augmentation

AMS IP System Design Functional Verif IP Verification Digital IP Physical Implement

Timing Electrical Verify

DFT & DFM

Pkg

Board

Design Environment Enablement Training Cadence Leading-edge EDA Products

Design Centric Flows, Methodologies, CAD Support Design Ready Process Design Kits Custom, On Site, On Line, Public Course Offerings
ENCOUNTER VIRTUOSO ALLEGRO INCISIVE

Digital IC

Custom IC

Package and PCB

Verification

Maximizing Results from Cadence Technology Platforms

July 20, 2009

Worldwide Services Team

USA

Livingston Zelenograd Bracknell Paris Noida Bangalore Yokohama Shanghai Munich

San Jose

Columbia Cary Melbourne

Collaboration Hub Hosting Hub

July 20, 2009

Analog/RF/Mixed-signal Design and Methodology


Broad and Deep Design Expertise
83% SoC designs, 90% low power, hi-perf CMOS 111 analog specific tapeouts in the last 4 years Package/IO interactions, digital substrate coupling/isolation, multiple power, device matching, stress, well, NBTI/LOD feature implementation AFEs, Datacom, RF, Synthesizers, PLLs, A/D, D/A System-on-Chip Analog/Mixed Signal/RF Logic Design & Verification Silicon/Package/Board

Efficient and Effective Design Environment


Design and methodology project collaborations Experts in design environment enablement Design-ready PDK customization

Reliable Tape-out Success


98.1% First Pass Functionality 87.4% First Pass to Production 96.1% Full Parametric Operation with 1 metal spin 100+ products in volume production .35u to 40nm for CMOS, Bipolar, BICMOS, SiGe

July 20, 2009

Design Flow Focused on Achieving First Pass Success


System Design Architectural Simulation
Analog Design & Simulation
VSE-L Spectre (RF) Spectre Excel Matlab SystemVue Custom AMS Designer AMS Designer

Spec Review, Partitioning White board


Excel

NC SIM NC SIM

MS Design Simulation MS Design && Simulation


VSE-L Spectre/Verilog AMS UltraSim

Digital Synthesis
RTL Compiler NCSIM Conformal First Encounter - Floorplanning

ADE-XL (Corners)

ADE-XL (Corners)

DFII based design

Simulation Verification Floorplanning Physical Design Extraction Re-Simulation Chip Assembly Chip Verification

MMSim: NCSIM, Spectre, Ultrasim Verilog (D, A, AMS) VLS-GXL Encounter SOC Encounter

VLS-XL

VCAR - Custom routing

Digital Place & Route (VDIO)


Assura DRC/LVS/RCX/RF Spectre Verilog (D, A, AMS) PVS DRC UltraSim FE SE

VLS-XL Assura DRC/LVS/RCX/RF VAVO/VAEO EM/IR

VCAR power grid PVS DRC UltraSim

July 20, 2009

Emphasis on Top Down Mixed Signal Design Flow


Top-Down Design Methodology (INVITED Tutorial) E1-1 Proceedings of the IEEE 2007

Paper Spec
Functional Simulation

Spec Verification Top Level Simulation Development


Simulation strategy test bench(s), modes, startups, I/O considerations

Analog Circuits

Mixed Signal Blocks

Analog Circuits

Logic

Block Level: Design / Synthesis Corner Verification Spares Layout constrains Block Level: Abstract Creation

HDL Schematic HDL Schematic HDL Schematic HDL/Verilog RTL Verilog HDL Abstract Schematic HDL Abstract Schematic HDL Abstract Schematic HDL/Verilog Abstract RTL Verilog

Verilog/HDL

Verilog

Functional Sim (Pin for Pin)


Schematic Verilog/HDL

Top Level Device Verification


HDL Verilog
7

July 20, 2009

Program Flow Emphasizes Review at Key Milestones


Deliverables

Customer Participation KOR Design Definition Specification Development Tech Definition Foundry Selection PDR

Partitioning, Interfaces, Prelim Floor Plan, Testability Design Kit

Functional Model: AMS Designer

Customer

Model Extraction Tech. Table Devel

Analog Layout Parasitic Extraction Digital Layout CDR

Customer Participation Floor Plan

Analog Simulations Composite Simulation Digital Simulations

Analog Design, Schematic Entry

Deliverables

Digital Design, Schematic Entry OR Synthesis

Customer Participation Comp Sim Physical Verification DRC, LVS, EM/IR etc. FDR RFD Fab Proto Test TR Customer

Deliverables

Deliverables

Deliverables

July 20, 2009

Project Management Focused on Clear Communication


Program Manager Primary point of contact Program execution ownership Project Communication Plan Weekly Meetings Weekly Status Report Deliverables Action Items Open Issues/Risks Agreements Project Tracking Schedule Formal Design Reviews Design Milestone Deliveries Steering Committee Meetings
<ProjectName> Project Status - Summary
Executive Summary

Status

Key Issues

Key Risks

Rating

Plans for next week

New Actions (see Actions tab for details)


No new actions.

Resp

Actions closed this week (see Actions tab for details)

Resp

New Agreements (see Agreements tab for details)


No new agreements

At a glance weekly status clearly reports on glance all aspects of the on-going project on-

July 20, 2009

Cadence Design-Ready PDKs Increase Productivity


Additional components to standard baseline foundry PDK
Metal resistors for each level of metal with a unique recognition shape Metal fingered interconnect capacitor PCells Symmetrical center-tapped inductors MOS varactor Native devices Guard ring structures

Enhanced simulation features


Device parameters minimum set to recommended Corner models for Parasitic resistors and capacitors MOS cells that allow the user to anticipate LOD (STI) effects at schematic level and control the effect in simulation Model and control well proximity effects MOS layout-XL multiplier separate from simulation multiplier to enable interdigitation while simulating as a single multi-fingered device

Analog layout capabilities


Recommended rules followed in all PDK device layouts Minimum area diodes for use as antenna diodes Guard rings that can create multiple contact rows Integrated dummy gates on each end of MOS device Ability to merge source drains of devices and reflect in callback

10

July 20, 2009

Cadence Projects Differ from Academic Research


Project length fixed in the range ~18-26 weeks. Project team expands to complete the design effort in the allotted time. Dedicated layout personnel work with the circuit designers to create/complete layout. Server resources are sufficient to meet the needs of multiple projects, resources are scheduled appropriately for the project phase. The core team has worked together on multiple projects, cooperates well in the midst of complex and diverse competing projects. For the most part, technology objectives for the project, including performance requirements and process limitations, are well understood before the design effort begins. The technical approach taken most often involves evolution from an existing, proven approach.

11

July 20, 2009

13.2 GHz Frequency Synthesizer Macro


Synthesizer Output from ~11.5 to 13.2 GHz 66 MHz Reference Differential Quadrature I & Q outputs Very low phase noise operation Jitter < 60 fs rms, integrated from 3.5 MHz to 1 GHz Internal Self-Calibrating LC VCO Internal regulator for power supply immunity Integrated Analog Test Bus No external loop filter required Power Down Mode TSMC 90 nm G Logic Process Area ~ 1.2 sq mm In Production

12

July 20, 2009

AFE for Next Generation Wireless Multimedia

Dual 6-Bit 2.6 GHz ADC


Interpolating Flash Architecture

Dual 6-Bit 2.6 GHz DAC


Programmable current source output

Low Jitter 2.6 GHz PLL


LC VCO architecture

7 to 8 GHz Frequency Synthesizer


4th order, dual path Low jitter LC VCO

Low Phase Noise Crystal Oscillator 1:8 and 8:1 data serializer/deserializer TSMC 65 nm LP Process Multiple versions of this macro delivered In Pre-Production

13

July 20, 2009

900 MHz Zigbee Transceiver RF Macro


Low IF RX Complex BPF Complex CT Delta Sigma ADC (IQ) Direct upconversion TX Integrated -10 to +14 dBm PA Fully integrated synthesizer TSMC 180 nm CMOS
Mixer Complex Bandpass Filter PGAs adcclk

I
LNA lna_rf_p

adc _ref _p

adc _ref _m adc_i 4 adc_q

Digital Modem

IQ-ADC

2
lna_rf_m

pga_gain<3:0>

4 adcclk

Demod AGC AFC Modulation Control

gain ctrl

Q
offseti<12:0> Cal

refclk_p Synthesizer refclk_m control Tx IQ_DAC_LPF Tx I_LPF lnagain<1:0> pgagain<3:0> anttune<3:0> Antenna Tuning Mixer Tx I_DAC offsetq<12:0>

daci<5:0>

PA io_rf_p

2
io_rf_m Tx Q_LPF Tx pwr ctrl Tx Q_DAC

dacclk

dacq<5:0>

ATB MUX Bias

atbaddr<7:0>

bias_rext atb_ p atb_ m

14

July 20, 2009

12-bit Bandpass Complex Delta-Sigma ADC


Application: Zigbee Transceiver Topology: Fourth Order Hybrid Delta-Sigma Modulator with 4-bit Internal ADC/DAC Tunable loop filter Integrated ATB test bus Specifications:
1 Vpp differential inputs (I/Q) IF = 1 MHz Bandwidth = 1.2 MHz Sampling Rate = 30 MHz

SNDR = 72.4 dB 6.3 mW typical at 1.7 V Area of 0.7 sq mm TSMC 180 nm CMOS

15

July 20, 2009

10-bit 500MHz ADC in 90nm


10-bit 12 channel SAR ADC architecture All 12 channels share a master sample and hold Differential analog input ENOB: 8.8 (typ) @500 Msps; 250 MHz input rate 500 MHz maximum sample rate Integrated reference Integrated offset trim DAC Power down modes Integrated analog test bus No off-chip components required Low power: 62 mW typical Area = 0.82 sq mm TSMC 90 nm G process 1.0 V/1.8 V First silicon success

16

July 20, 2009

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