{"id":1153,"date":"2019-01-14T16:03:59","date_gmt":"2019-01-14T16:03:59","guid":{"rendered":"https:\/\/www.corelis.com\/?page_id=7"},"modified":"2026-07-15T17:10:15","modified_gmt":"2026-07-16T00:10:15","slug":"home","status":"publish","type":"page","link":"https:\/\/www.corelis.com\/","title":{"rendered":"Corelis Home"},"content":{"rendered":"

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“Reach for excellence, and transform your embedded hardware testing experience with Corelis’ extensive suite of test tools”<\/span><\/h4>\n<\/div><\/div><\/div>
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Enhance BGA Package Testing and Reliability with JTAG Boundary-Scan Solutions<\/span><\/h4><\/div>

Learn how JTAG Boundary-Scan technology and IEEE 1149.X standards can address the unique challenges associated with BGA packaged embedded hardware, ensuring thorough testing and improved reliability.<\/span><\/p>\n

Don’t let BGA package complexities hold you back! Discover how JTAG Boundary-Scan can revolutionize your testing process, boost product quality, and streamline debugging. Unlock the full potential of this powerful testing methodology using ScanExpress Embedded Hardware Solutions.<\/span><\/p>\n<\/div>

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Embedded Hardware Challenges: What to Avoid for Maximizing Success<\/h4><\/div>

With a well-developed Design-for-Testability (DFT) plan, you can avoid costly pitfalls in embedded hardware design and manufacturing. Discover how you can avoid issues such as faulty components, signal issues, and manufacturing errors. Don’t miss out on these crucial insights.<\/p>\n<\/div>

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<\/i>Talk to the Experts<\/span><\/a><\/div><\/div><\/div>
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