Mechanics of Solis

Nano-crystalline iridium oxide thin films were obtained by a spray pyrolysis technique onto preheated
glass substrates. X-ray diffraction reveals that IrO2 thin films were polycrystalline in the rutile structure
with primitive tetragonal lattice and its preferential orientation were along the 〈110〉 and 〈101〉 directions.
X-ray diffraction line profile analysis (XRDLPA) was used to assign microstructure and crystal imperfections
of IrO2 thin films. Some important parameters such as crystallite size, microstrain, average
residual stress, number of crystallite/cm2 and dislocation density were studied. The effects of deposition
temperatures and solution concentrations on the microstructural and crystal defects were discussed. All
estimated values were found to be dependent upon the growth parameters. Mott parameters, trapping
state energy and potential barrier were investigated and studied for a defined thin film sample. This
sample was selected because it has the suitable conditions for electrochromic applications.