Academia.edu no longer supports Internet Explorer.
To browse Academia.edu and the wider internet faster and more securely, please take a few seconds to upgrade your browser.
2020, 2020 17th International Bhurban Conference on Applied Sciences and Technology (IBCAST)
In this paper, we report two low noise broadband amplifiers based on ABMN's AlGaN/GaN on SiC HEMT technology for X-band applications. Two design topologies, a single-stage (LNA-1) and a two-stage (LNA-2), have been investigated. LNA-1 and the first stage of LNA-2 is based on common source (CS) with inductive source degeneration topology. LNA-1 has a flat gain response of ±1.4 dB gain variation with a gain greater than 8 dB for 9 V drain voltage and 100 mA/mm drain current. Input return loss better than 9.8 dB and output return loss better than 12.8 dB have been achieved. The simulated value of noise figure for this design is less than 1.4 dB. In LNA-2 design, a two-stage topology is implemented to enhance amplifier's gain. The simulated values for LNA-2 show a gain greater than 16.8 dB with ±2.9 dB gain variation. Input and output return loss values are better than 8.8 dB and 10 dB, respectively. The value of noise figure for this design is less than 1.7 dB in the desired frequency range. Both designs, having state-of-the art small dimensions, are suitable for their potential applications for space communications, Radar, satellite communications etc.
physica status solidi (c), 2005
A fully monolithic AlGaN/GaN HEMT-based low noise amplifier is reported. The circuit demonstrated a noise figure of 3.5 dB, gain of 7.5 dB, input return loss of-7.5 dB, and output return loss of-15 dB at 8.5 GHz. The dc characteristics of individual 0.25-µm × 150-µm transistors were: maximum current density of 1.0 A/mm, maximum transconductance of 170 mS/mm and a threshold voltage of-6.8 V. The devices have a typical short circuit current gain cutoff frequency of 24.5 GHz and a maximum oscillating frequency of 48 GHz. The devices demonstrated a minimum noise figure of 1.6 dB with an associated gain of 10.6 dB at 10 GHz.
2005
This study regards the low noise properties of X-bandGaN-based LNAs as well as its associated robustness. Devices are processed on epilayers grown onSiC or Si substrates. The HEMTs present very low noise properties with NFmin and Gass close to 1 dB and 13 dB at 12GHz. The robustness testsshow that the component withstands power level up to 34 dBm. A two-stages X-bandLNA is fabricated showing a noise figure of 1.7 dB with a gain of 20 dB at 10 GHz.
Microwave and Optical Technology Letters, 2013
far-field radiation pattern [11] and scattering parameters [12]. In this article the envelope correlation is calculated using the scattering parameters, based on a formula proposed in [13]: q e 5 jS Ã 11 S 12 1S Ã 21 S 22 j 2 12 jS 11 j 2 1jS 22 j 2 12 jS 22 j 2 1jS 12 j 2 :
This work presents MMIC low-noise amplifiers based on AlGaN/GaN HEMT technology on SiC substrate for robust receiver applications at X-band between 8 GHz and 11 GHz. Three versions of one-stage and two versions of two-stage amplifiers are presented with a noise figure of 1.81 dB at 10 GHz and 18 dB of small-signal gain for the two-stage device fully integrated in coplanar passive technology. The paper describes modeling and circuit design, bias dependence of the small-signal and noise circuit parameters of the MMICs realized, and highpower and intermodulation behavior.
IEEE Microwave and Wireless Components Letters, 2004
This letter reports high-performance passivated AlGaN/GaN high electron-mobility transistors (HEMTs) with 0.25-m gate-length for low noise applications. The devices exhibited a minimum noise figure ( min ) of 0.98 dB and an associated gain ( ) of 8.97 dB at 18 GHz. The noise resistance ( ), the measure of noise sensitivity to source mismatch, is 31 at 18 GHz, which is relatively low and suitable for broad-band low noise amplifiers. The noise modeling analysis shows that the minimum noise figure of the GaN HEMT can be reduced further by reducing noise contributions from parasitics. These results demonstrate the viability of AlGaN/GaN HEMTs for low-noise as well as high power amplifiers. Index Terms-AlGaN, GaN, HEMTs, microwave noise, minimum noise figure.
In this study, AlGaN/GaN high electron mobility transistor (HEMT) with 0.25 um gate-length have been designed on an SIC-4H substrate. DC and Noise characteristics of AlGaN/GaN HEMT with 0.25 um gate-length at microwave frequencies have been explored. The simulation has been performed by using the Silvaco software. The extrinsic transconductance of the device was 215 ms/mm. Also, device exhibited current drive capability as high as 1400 ma/mm. The device has demonstrated high unity current gain cutoff frequency (ft) of 100 GHz. The microwave noise characteristics of the device were determined from 0 to 20 GHz at different drain biases and drain currents. At a gate bias of-4 V and drain bias of 10 V, device exhibited a minimum noise figure (NFmin) of 0.41 dB and maximum associated gain (Gma) of 19.95 dB at 10 GHz. The noise resistance of device is 27.2 ohm at 10 GHz, which is very suitable for low noise applications in X-band frequency range. These results indicates the capability of AlGaN/GaN HEMT for low noise and high power amplifiers.
IOSR Journal of Electrical and Electronics Engineering, 2016
In this paper, AlGaN/GaN/AlGaN/GaN high electron mobility transistor (HEMT) with 0.25 um gatelength have been designed on an SIC-4H substrate. DC and Noise characteristics of AlGaN/GaN/AlGaN/GaN HEMT with 0.25 um gate-length at microwave frequencies have been explored. The simulation has been performed by using the Silvaco software. The extrinsic transconductance of the device was 350 ms/mm. Also, device exhibited current drive capability as high as 1750 ma/mm. The device has demonstrated high unity current gain cutoff frequency (ft) of 200 GHz. The microwave noise characteristics of the device were determined from 0 to 20 GHz at different drain biases and drain currents. At a gate bias of-3 V and drain bias of 10 V, device exhibited a minimum noise figure (NFmin) of 0.35 dB and maximum associated gain (Gma) of 24.35 dB at 10 GHz. The noise resistance of device is 7.2 ohm at 10 GHz, which is very suitable for low noise applications in X-band frequency range. These results indicates the capability of AlGaN/GaN HEMT for low noise and high power amplifiers.
2008 IEEE Compound Semiconductor Integrated Circuits Symposium, 2008
Gallium-Nitride technology is known for its high power density and power amplifier designs, but is also very well suited to realize robust receiver components. This paper presents the design and measurement of a robust AlGaN/GaN Low Noise Amplifier and Transmit/Receive Switch MMIC. Two versions of both MMICs have been designed in the Alcatel-Thales III-V lab AlGaN/GaN microstrip technology. One chipset version operates at X-band and the second also shows wideband performance. Input power handling of >46 dBm for the switch and >41 dBm for the LNA have been measured.
Proceedings. IEEE Lester Eastman Conference on High Performance Devices
2014 Eleventh International Conference on Wireless and Optical Communications Networks (WOCN), 2014
GaN based devices are in great demand due to its rugged characteristics at extreme conditions. In this paper, design of GaN monolithic microwave integrated circuit (MMIC) low noise amplifier (LNA) with coplanar waveguide matching is presented to understand the key aspects of high gain, low noise figure and high linearity. The LNA can be used in base station technologies as frequency of interest is from 0.6-3 GHz. It delivers gain of 23 dB and noise figure 0.3 dB and OIP3 upto 51 dBm. The linear performance presented here enables reconfigurable designs of LNA over multiple octaves of bandwidth.
IEEE Transactions on Microwave Theory and Techniques, 2022
This article reports on a gallium-nitride (GaN) low-noise amplifier (LNA) monolithic microwave integrated circuit (MMIC) with a 3-dB gain bandwidth (BW) from 63 to 101 GHz. The MMIC is fabricated in the Fraunhofer IAF 70-nm GaN-on-silicon-carbide (SiC) high-electron-mobility transistor (HEMT) technology. The four-stage common-source LNA exhibits an average noise figure (NF) of 3 dB for a measured frequency range from 75 to 101 GHz. The MMIC reaches a minimum NF of 2.8 dB at an operating frequency of 83 GHz. A mapping of two 100-mm wafers shows an excellent homogeneity with an 86% yield and an average NF of 3-3.3 dB. At 100 GHz, the LNA obtains output-referred 1-dB compression and third-order intercept points of 12.1 and 14.4 dBm, respectively. Furthermore, comprehensive investigations of the bias dependence of all measured performance parameters provide an insight into the presented device and LNA. To the best of the authors' knowledge, this MMIC demonstrates the lowest NF among GaN LNAs at E/W-band frequencies.
IEEE Microwave and Wireless Components Letters, 2005
This work presents a two-stage high-power amplifier monolithic microwave integrated circuit (MMIC) operating between 9 GHz and 11 GHz based on a fully integrated AlGaN/GaN high electron mobility transistor (HEMT) technology on s.i. SiC substrate and is suitable for radar applications. The MMIC device with a chip size of 4.5 3 mm 2 yields a linear gain of 20 dB and a maximum pulsed saturated output power of 13.4 W at 10 GHz equivalent to 3.3 W/mm at V DS =35 V, 10% duty cycle, and a gain compression level of 5 dB. Further, dc reliability data are given for the MMIC HEMT technology. Index Terms-Coplanar waveguide (CPW), microstrip (MSL), microwave power field effect transistors (FET) amplifiers, modulation-doped field effect transistors (MODFETs), phased array radar, reliability.
An X-Band Monolithic Microwave Integrated Circuit (MMIC) High Power Amplifier (HPA) with coplanar waveguide (CPW) based on AlGaN/GaN on SiC technology is presented in this paper. Coplanar waveguide technology (CPW) is chosen for the simplicity and reduced cost of fabrication since CPW process has no via. High Electron Mobility Transistors (HEMTs) are matched for the 8 GHz-8.4GHz frequency band for maximum output power. The Amplifier has a small signal gain over 10 dB, output power of 36.5dBm at 1 dB gain compression point (P 1dB), 40% power added efficiency (PAE) at (P 1dB) in the desired frequency band (8 GHz-8.4 GHz) with V ds = 30V.
A two-stage high-power amplifier MMIC was realized with a chip size of 4.5 mm /spl times/ 3 mm operating between 8 GHz and 10 GHz based on a fully integrated microstrip AlGaN/GaN HEMT technology on s.i. SiC substrate. The MMIC device delivers a maximum pulsed output power of 8.9 W (39.5 dBm) at 8.5 GHz at V/sub DS/ = 31 V, 10 % duty cycle, and more than 6 dB gain compression level, and features a linear gain in excess of 20 dB.
IEEE Transactions on Microwave Theory and Techniques, 2001
Broad-band high-power cascode AlGaN/GaN high electron-mobility transistor monolithic-microwave integrated-circuit (MMIC) amplifiers with high gain and power-added efficiency (PAE) have been fabricated on high-thermal conductivity SiC substrates. A cascode gain cell exhibiting 5 W of power at 8 GHz with a small-signal gain of 19 dB was realized. A nonuniform distributed amplifier (NDA) based on this process was designed, fabricated, and tested, yielding a saturated output power of 3-6 W over a dc-8-GHz bandwidth with an associated PAE of 13%-31%. A broad-band amplifier MMIC using cascode cells in conjunction with a lossy-match input matching network showed a useful operating range of dc-8 GHz with an output power of 5-7.5 W and a PAE of 20%-33% over this range. The third-order intermodulation products of the amplifiers under two-tone excitation were studied and third-order-intercept values of 42 and 43 dBm (computed using two-tone carrier power) for the lossy match and NDA amplifiers were obtained.
2006 IEEE MTT-S International Microwave Symposium Digest, 2006
Although GaN technologies were initially developed for solid state source amplifiers, it was recently demonstrated that AlGaN/GaN HEMT transistors were also suitable for low noise applications such as LNA [1]. The frequency synthesis is not yet widely explored for these technologies. In this paper the design of a low phase noise X-Band oscillator is proposed. The low frequency noise performance and the residual phase noise, as well as dynamic Sparameters were carried out on AlGaN/GaN HEMT grown on SiC. A large-signal modeling technique is also presented. The reduced complexity and the good accuracy of our large signal model permits an efficient circuit design, without intensive knowledge of the technological device parameters. These characterization and modeling tools are used for the design of an 1-stage oscillator working at 10 GHz delivering 20dBm.
2013 IEEE MTT-S International Microwave Symposium Digest (MTT), 2013
This paper describes a C-band monolithic high power amplifier implemented with a 0.25 ȝm AlGaN/GaN HEMT process. The circuit has been designed for use in synthetic aperture radar antenna modules in space applications. The amplifier is made up of two stages: the final stage consists of eight devices for 9.6 mm of total periphery that are merged together to form a single power-bar. A quasi-inverse class-F regime for the HEMTs is implemented by harmonic tuning in order to achieve the best tradeoff between maximum output power and efficiency. When operating in pulsed mode with 50 ȝs pulse width and 10% duty cycle, the amplifier delivers about 40 watt with 21 dB of associated gain and 40% PAE over a 15% bandwidth centered at 5.4 GHz. The proposed MMIC HPA is a very valuable replacement for lower output power MMIC GaAs HPAs or hybrid HPAs, which are currently exploited at C-band for these applications. Index Terms-High Power Amplifier, MMIC, AlGaN/GaN, high efficiency power amplifiers.
IEEE Microwave and Wireless Components Letters, 2000
Broadband microstrip and coplanar MMIC amplifiers featuring beyond 10 W for X-band radar applications are realized in a AlGaN/GaN HEMT technology on 2" s.i. SiC substrate. Single-stage and dual-stage demonstrators with flat gain from 1 GHz to 2.7 GHz and up to 40 W peak power in hybrid microstrip technology for basestation applications are presented. The performance illustrates the potential of this technology with very high bandwidth and superior power density in comparison to GaAs.
IEEE Transactions on Electron Devices, 2000
In this paper, an overview of recently reported low-noise amplifiers (LNAs), designed, and fabricated in GaN technology is provided, highlighting their noise performance together with high-linearity and high-robustness capabilities. Several SELEX-ES GaN monolithic technologies are detailed, providing the results of the noise characterization and modeling on sample devices. An in-depth review of three LNAs based on the 0.25-µm GaN HEMT process, marginally described in previous publications, is then presented. In particular, two robust and broadband 2-18-GHz monolithic microwave integrated circuit (MMIC) LNAs are designed, fabricated, and tested, exhibiting robustness to over 40-dBm input power levels; an X-band MMIC LNA, suitable for synthetic aperture radar systems, is also designed and realized, for which measurement results show a noise figure ∼2.2 dB with an associated gain >25 dB and robustness up to 41-dBm input power level.
Loading Preview
Sorry, preview is currently unavailable. You can download the paper by clicking the button above.