Papers by Cleonilson Souza
Ingenius
Debido al creciente desarrollo tecnológico de los sistemas embebidos y el internet de las cosas (... more Debido al creciente desarrollo tecnológico de los sistemas embebidos y el internet de las cosas (IoT), los dispositivos basados en microcontroladores se aplican cada vez más en diversas áreas del conocimiento. En este contexto, las plataformas y productos educativos online se consideran laboratorios virtuales remotos, ya que los estudiantes pueden acceder a los dispositivos físicos en cualquier lugar siempre que dispongan de un sistema informático conectado a internet. En este sentido, este trabajo describe el diseño y desarrollo de una plataforma con cuatro productos educativos online para la enseñanza de microcontroladores y IoT. Estos productos educativos están basados en software de código abierto, lo que permite su distribución gratuita en línea y se puede acceder a ellos desde un servidor en la nube. El enfoque de código abierto y multiplataforma (Linux, Windows® y Mac OSX) permite una mayor interacción y accesibilidad del usuario. Los productos educativos en línea hacen posib...
2005 Joint 30th International Conference on Infrared and Millimeter Waves and 13th International Conference on Terahertz Electronics, 2005
... In Column 6 and 7, it is reported the minimal number of detectors in order to attain zero-err... more ... In Column 6 and 7, it is reported the minimal number of detectors in order to attain zero-error detection, ie, zero alias-ing, using r-contiguous and r-hamming, respectively. ... [4] Ali, L.; Sidek, R.; Aris, I.; Suparjo, B. S. and Ali, AM Challenges and directions for testingIC. ...
Anais do XXII Simpósio Brasileiro de Telecomunicações
This paper presents a new scheme of Linear-Feedback Shift-Register (LFSR) reseeding technique bas... more This paper presents a new scheme of Linear-Feedback Shift-Register (LFSR) reseeding technique based on Berlekamp-Massey Algorithm (BMA). It is proposed an LFSR-based TPG which its feedback polynomial is programmable by a BMA-synthesized LFSR that, in its turn, generates specific patterns to change the LFSR-based TPG's feedback polynomial. Using the proposed method, high fault coverage is achieved with a small number
This paper presents a new scheme of Linear-Feedback Shift-Register (LFSR) reseeding technique bas... more This paper presents a new scheme of Linear-Feedback Shift-Register (LFSR) reseeding technique based on Berlekamp-Massey Algorithm (BMA). It is proposed an LFSR-based TPG which its feedback polynomial is programmable by a BMA-synthesized LFSR that, in its turn, generates specific patterns to change the LFSR-based TPG's feedback polynomial. Using the proposed method, high fault coverage is achieved with a small number
IEEE Latin America Transactions
Anais de XXXVI Simpósio Brasileiro de Telecomunicações e Processamento de Sinais
AEU - International Journal of Electronics and Communications
The International Journal of the Constructed Environment
IEEE Transactions on Instrumentation and Measurement
Revista Principia - Divulgação Científica e Tecnológica do IFPB, 2016
RESUMO O aumento da densidade de transistores em circuitos integrados (CIs), em virtude dos avanç... more RESUMO O aumento da densidade de transistores em circuitos integrados (CIs), em virtude dos avanços da tecnologia de fabricação, tornaram os procedimentos de testes de CIs mais complexos. Ao passo que quanto maior a densidade, menor é o espaçamento entre os componentes e suas conexões, aumentando a probabilidade de haver falhas entre os componentes na presença de defeitos físicos. Em virtude da redução no espaçamento, os modelos de falhas clássicos, que representam defeitos físicos em circuitos integrados, já não satisfazem os requisitos atuais para testes. Por isso, atualmente tem-se estudado modelos de falhas que sejam baseados no próprio leiaute do CI e não somente em seu diagrama em nível lógico ou em nível de transistores. Tais modelos visam analisar o leiaute como um todo e verificar os pontos mais prováveis de acontecer uma falha em consequência de um possível defeito físico. Neste trabalho é feito um estudo dos modelos de falhas clássicos e os modelos baseados na perspectiva do leiaute, e são explanados os conceitos de tipos de falhas, defeitos e elementos parasitas. E, finalmente, foram obtidos resultados experimentais com um inversor e foram comparadas as respostas obtidas pela simulação analógica com esquemático, com as respostas obtidas pela simulação baseada no leiaute do inversor com os elementos parasitas. Palavras-chave: Testes de circuitos integrados. Modelos de falhas clássicos. Modelos de falhas na perspectiva do leiaute.
IEEE Latin America Transactions, 2016
Most built-in self-testing (BIST) schemes compress the test response into a compact signature usi... more Most built-in self-testing (BIST) schemes compress the test response into a compact signature using space and/or time compaction. A fundamental problem associated with response compaction is error masking or aliasing. In this paper an alternative zero-aliasing BIST scheme is presented. The main conceptual ingredient utilized in order to build the proposed scheme framework is the application of the Berlekamp-Massey Algorithm (BMA). BMA provides a general solution of synthesizing the shortest LFSR capable of generating a given finite sequence. In design stage, considering the ¢-bit fault-free test response sequence, BMA is applied in order to synthesize the shortest LFSR capable of generating this sequence. The testing stage consists in comparing the test response sequence of the circuit under test (CUT) with the fault-free test response sequence generated by LFSR previously designed. In this way, a testing of the CUT can be made. It should be observed that there is no aliasing when such scheme is applied. The key to make this scheme attractive is to keep the LFSR length as small as possible. It is noticed however that the LFSR length depends on linear complexity of the sequence to be synthesized. In this way, two alternative schemes, called Simple-LFSR and Multi-LFSR, are shown to try to solve this problem. Experimental results are shown for some ISCAS85 benchmarks.
The Linear Variable Differential Transformer (LVDT) is an inductive sensor which is used to measu... more The Linear Variable Differential Transformer (LVDT) is an inductive sensor which is used to measure linear displacement and finds uses in modern machine-tool, robotics, avionics, and computerized manufacturing. Its basic structure consists of a primary coil and two secondary coils like an electrical transformer. However, LVDT has a movable magnetic core that when the primary coil is excited with an
2016 IEEE International Instrumentation and Measurement Technology Conference Proceedings, 2016
International Journal of Industrial Electronics and Drives, Mar 20, 2015
International Journal of Distributed Sensor Networks, 2016
Anais do 10. Congresso Brasileiro de Inteligência Computacional, 2016
This work shows a digital environment that possibilities the teach of applications in control of ... more This work shows a digital environment that possibilities the teach of applications in control of industrial devices with different control method. A digital system called SADAC that realize the interface of the several external devices with the Personal Computer was developed. A platform of identification and digital control of machines DC, induction machines, step motors, heating system, level tank, etc, using techniques of discrete control, is proposed. It has as main purpose the posterior use for applications of teaching of discrete control.
Abstract⎯ The Linear Variable Differential Transformer (LVDT) is an inductive sensor which is use... more Abstract⎯ The Linear Variable Differential Transformer (LVDT) is an inductive sensor which is used to measure linear displacement and finds uses in modern machine-tool, robotics, avionics, and computerized manufacturing. Its basic structure consists of a primary coil and two secondary coils like an electrical transformer. However, LVDT has a movable magnetic core that when the primary coil is excited with an AC voltage source, induced secondary voltages vary with the displacement of the core. In general, this accurate and reliable displacement-to-electrical sensor can be modeled in two forms: geometrical-parameterbased model and electrical-parameter-based model. Both are very used. However, research results based in geometrical-based model may become useless when only parameters from electrical one are known. In this paper, it is shown a way of conversion from geometrical-to electrical-based model in order to allow the interaction from one to other.
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Papers by Cleonilson Souza