Many signal processing and decision making algorithms reported in contemporary literature charact... more Many signal processing and decision making algorithms reported in contemporary literature characterize the performance of the proposed methods utilizing decision error rates. However there is significant need for strategies that provide quantitative assessment of the fidelity of decisions made by the algorithms. This article develops novel techniques utilizing which fidelity measures can be assigned quantitatively on some prevalent signal detection algorithms. The developed fidelity measurement methods with the detection algorithms are employed for topography imaging utilizing dynamic mode atomic force microscope (AFM). The AFM is a versatile metrology tool for interrogating material at the nano-scale. In spite of its remarkable achievements, a key issue that remains largely unaddressed is the assessment of fidelity of the measurement data. The developed paradigm facilitates user specific priority for either detection of sample features with high decision confidence or on not missing detection of true features. The fidelity measures presented here are suitable for real-time implementation. A detailed comparative study is presented to characterize the proposed signal detection algorithms and fidelity measurement techniques under practical AFM applications. Comprehensive simulation and experimental data corroborate the effectiveness of proposed methods.
Design of FPGA based system identification module with application to atomic force microscopy, 2018
The science of system identification is widely utilized in modeling input-output relationships of... more The science of system identification is widely utilized in modeling input-output relationships of diverse systems. In this article, we report field programmable gate array (FPGA) based implementation of a real-time system identification algorithm which employs forgetting factors and bias compensation techniques. The FPGA module is employed to estimate the mechanical properties of surfaces of materials at the nano-scale with an atomic force microscope (AFM). The FPGA module is user friendly which can be interfaced with commercially available AFMs. Extensive simulation and experimental results validate the design.
International Journal of Electrical, Computer, Energetic, Electronic and Communication Engineering, 2010
For higher order multiplications, a huge number of adders or compressors are to be used to perfor... more For higher order multiplications, a huge number of adders or compressors are to be used to perform the partial product addition. We have reduced the number of adders by introducing special kind of adders (compressors) that are capable to add five/six/seven bits per decade.
In this article, we explore methods that enable estimation of material properties with the dynami... more In this article, we explore methods that enable estimation of material properties with the dynamic mode atomic force microscopy (AFM) suitable for soft matter investigation. Finally, the article identifies key pitfalls that need to be avoided toward quantitative estimation of material properties.
This article analytically develops a new scheme called the innovations squared mismatch (ISM) for... more This article analytically develops a new scheme called the innovations squared mismatch (ISM) for fast binary plant detection. This project demonstrates that the proposed detection algorithms can be applied to probe based data storage systems.
Atomic force microscopes (AFMs) are measurement devices for which there exists significant dearth... more Atomic force microscopes (AFMs) are measurement devices for which there exists significant dearth of research on determining confidence/fidelity measures of the measurement data. I conceived novel signal processing methods which determine fidelity measures for the first time on AFM methodologies.
I derived new signal processing algorithms for fast real-time detection of a system which switche... more I derived new signal processing algorithms for fast real-time detection of a system which switches its dynamical behavior. Kalman filter based architectures are utilized for detection of system switching.
The algorithm is applied for fast topography detection at nano meter resolution with atomic force microscopy.
The need for covert communication in tactical battlefields has developed the ideas of low probabi... more The need for covert communication in tactical battlefields has developed the ideas of low probability of intercept (LPI) networks. Spread spectrum communication is used for LPI communication. Multicarrier CDMA is a new type of spread spectrum technique that has been developed in recent years. Most of the works in MC-CDMA are focused on finding out BER performance of it when
Many signal processing and decision making algorithms reported in contemporary literature charact... more Many signal processing and decision making algorithms reported in contemporary literature characterize the performance of the proposed methods utilizing decision error rates. However there is significant need for strategies that provide quantitative assessment of the fidelity of decisions made by the algorithms. This article develops novel techniques utilizing which fidelity measures can be assigned quantitatively on some prevalent signal detection algorithms. The developed fidelity measurement methods with the detection algorithms are employed for topography imaging utilizing dynamic mode atomic force microscope (AFM). The AFM is a versatile metrology tool for interrogating material at the nano-scale. In spite of its remarkable achievements, a key issue that remains largely unaddressed is the assessment of fidelity of the measurement data. The developed paradigm facilitates user specific priority for either detection of sample features with high decision confidence or on not missing detection of true features. The fidelity measures presented here are suitable for real-time implementation. A detailed comparative study is presented to characterize the proposed signal detection algorithms and fidelity measurement techniques under practical AFM applications. Comprehensive simulation and experimental data corroborate the effectiveness of proposed methods.
Design of FPGA based system identification module with application to atomic force microscopy, 2018
The science of system identification is widely utilized in modeling input-output relationships of... more The science of system identification is widely utilized in modeling input-output relationships of diverse systems. In this article, we report field programmable gate array (FPGA) based implementation of a real-time system identification algorithm which employs forgetting factors and bias compensation techniques. The FPGA module is employed to estimate the mechanical properties of surfaces of materials at the nano-scale with an atomic force microscope (AFM). The FPGA module is user friendly which can be interfaced with commercially available AFMs. Extensive simulation and experimental results validate the design.
International Journal of Electrical, Computer, Energetic, Electronic and Communication Engineering, 2010
For higher order multiplications, a huge number of adders or compressors are to be used to perfor... more For higher order multiplications, a huge number of adders or compressors are to be used to perform the partial product addition. We have reduced the number of adders by introducing special kind of adders (compressors) that are capable to add five/six/seven bits per decade.
In this article, we explore methods that enable estimation of material properties with the dynami... more In this article, we explore methods that enable estimation of material properties with the dynamic mode atomic force microscopy (AFM) suitable for soft matter investigation. Finally, the article identifies key pitfalls that need to be avoided toward quantitative estimation of material properties.
This article analytically develops a new scheme called the innovations squared mismatch (ISM) for... more This article analytically develops a new scheme called the innovations squared mismatch (ISM) for fast binary plant detection. This project demonstrates that the proposed detection algorithms can be applied to probe based data storage systems.
Atomic force microscopes (AFMs) are measurement devices for which there exists significant dearth... more Atomic force microscopes (AFMs) are measurement devices for which there exists significant dearth of research on determining confidence/fidelity measures of the measurement data. I conceived novel signal processing methods which determine fidelity measures for the first time on AFM methodologies.
I derived new signal processing algorithms for fast real-time detection of a system which switche... more I derived new signal processing algorithms for fast real-time detection of a system which switches its dynamical behavior. Kalman filter based architectures are utilized for detection of system switching.
The algorithm is applied for fast topography detection at nano meter resolution with atomic force microscopy.
The need for covert communication in tactical battlefields has developed the ideas of low probabi... more The need for covert communication in tactical battlefields has developed the ideas of low probability of intercept (LPI) networks. Spread spectrum communication is used for LPI communication. Multicarrier CDMA is a new type of spread spectrum technique that has been developed in recent years. Most of the works in MC-CDMA are focused on finding out BER performance of it when
Uploads
Papers by Sayan Ghosal
The algorithm is applied for fast topography detection at nano meter resolution with atomic force microscopy.
The algorithm is applied for fast topography detection at nano meter resolution with atomic force microscopy.