Properties of step-edge Pb-Si-Pb Josephson junctions
Journal of Low Temperature Physics, Apr 1, 1986
A description is given of the properties and fabrication of a superconductor-semiconductor-superc... more A description is given of the properties and fabrication of a superconductor-semiconductor-superconductor Josephson device based on a novel step-edge technique. This technique allows for careful control of device lengths down to 100 nm. The fabricated devices exhibit high normal-state resistances and surprisingly strong Josephson coupling. The temperature dependence of the measured critical currents suggests that the coherence length in silicon
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Papers by Alicia Serfaty