Towards Designing Reliable Universal QCA Logic in the Presence of Cell Deposition Defect
2016 29th International Conference on VLSI Design and 2016 15th International Conference on Embedded Systems (VLSID), 2016
This work targets design of a reliable universal logic gate in Quantum-dot cellular automata (r-U... more This work targets design of a reliable universal logic gate in Quantum-dot cellular automata (r-ULG with the single clock zone, r-ULG-II with multiple clock zone) with hybrid cell orientations that realizes majority and minority functions simultaneously with high fault tolerance. The characterization of the defective behaviour of r-ULGs under different cell deposition defects is investigated. The outcomes indicate that the proposed r-ULG provide 75% fault tolerance under single clock zone and 100% under two clock zone.
Uploads
Papers by Rajdeep Nath