2020 IEEE Power & Energy Society General Meeting (PESGM), 2020
With the rapid advancement of power electronic technologies and the reduction of photovoltaic cel... more With the rapid advancement of power electronic technologies and the reduction of photovoltaic cell price, the share of solar energy in the total power production has been booming recently. On the one hand, the increase in the amount of power delivered by solar energy can be beneficial in many economic and environmental aspects. On the other hand, this can cause various technical challenges to network operators. One of these issues is related to classifying faults located in distribution networks with high penetration of photovoltaic systems. Although many studies have paid significant attention to developing new algorithms applicable for a more active today distribution networks, there is still space for other improvements. Hence, after reviewing stateof-the-art researches, this paper was intended to develop a fault classification that is based on artificial neural networks. In particular, a technique so-called Multiplayer Perceptron Classifier was selected for the proposed algorithm. First, the authors generated a data set for the study by modeling and simulating a real distribution network with practical parameters provided by a local utility in the environment software PowerFactory/DigSILENT. Multiple fault scenarios were simulated. Second, a part of the generated data collection was used for network learning. Finally, the performance of the proposed methodology was demonstrated via testing on the remaining number of generated data.
Thèse dirigée par Eric ZAMAI et codirigée par Khoi Quoc TRAN DINH préparée au sein du Laboratoire... more Thèse dirigée par Eric ZAMAI et codirigée par Khoi Quoc TRAN DINH préparée au sein du Laboratoire G-SCOP dans l'École Doctorale EEATS Approche probabiliste pour l'estimation dynamique de la confiance accordée à un équipement de production : vers une contribution au diagnostic de services des SED Thèse soutenue publiquement le 19 décembre 2012, devant le jury composé de :
IECON 2014 - 40th Annual Conference of the IEEE Industrial Electronics Society, 2014
This paper proposes an approach to accurately localize the origin of product quality drifts, in a... more This paper proposes an approach to accurately localize the origin of product quality drifts, in a flexible manufacturing system (FMS). The logical diagnosis model is used to reduce the search space of suspected equipment in the production flow; however, it does not help in accurately localizing the faulty equipment. In the proposed approach, we model this reduced search space as a Bayesian network that uses historical data to compute conditional probabilities for each suspected equipment. This approach helps in making accurate decisions on localizing the cause for product quality drifts as either one of the equipment in production flow or product itself.
In this paper, we present a method for combining an asymmetrical phase mask and its conjugation p... more In this paper, we present a method for combining an asymmetrical phase mask and its conjugation phase mask to produce the point spread function of a wavefront coding imaging system, which has the defocus invariant characteristic of the asymmetrical phase mask and symmetric characteristic through an orthogonal axis pair of the symmetrical phase mask. Simulation results for comparing the wavefront coding imaging system with combining the sinusoidal phase mask and its conjugation phase mask and a traditional imaging system for a clear aperture without any phase mask are presented. Comparative results indicate that the wavefront coding imaging system combined with the sinusoidal phase mask and its conjugation phase mask has an imaging performance invariant over a wide range of defocus.
This paper proposes an approach to accurately localize the origin of product quality drifts, in a... more This paper proposes an approach to accurately localize the origin of product quality drifts, in a flexible manufacturing system (FMS). The failure propagation mechanism in a production process is proposed based on the relationships between failure sources to explain the failure propagation following production flow. The logical diagnosis model is used to reduce the search space of suspected equipment in the production flow; however, it does not help in accurately localizing the faulty equipment. In the proposed approach, we model this reduced search space as a Bayesian network that uses historical data to compute conditional probabilities for each suspected equipment. This approach helps in making accurate decisions on localizing the cause for product quality drifts as either one of the equipment in production flow or product itself.
This paper proposes a model to compute confidence of reported information level (CRIL) in the dom... more This paper proposes a model to compute confidence of reported information level (CRIL) in the domain of logic diagnosis. This level of confidence is provided by a diagnosis module allowing to quickly identify the origin of equipment failure. We studied the factors affecting CRIL, such as measurement system reliability, production context, position of sensors in the acquisition chains, type of product, reference metrology, preventive maintenance and corrective maintenance based on historical data and reported information generated by production equipment. We have introduced a new 'CRIL' concept based on the Bayesian Network approach, Naïve Bayes model and Tree Augmented Naïve Bayes model. Our contribution includes an on-line confidence computation module for production equipment data, and an algorithm to compute CRIL. We suggest it be applied to the semiconductor manufacturing industry.
Nowadays, Semiconductor Manufacturing is operating in an intense competitive environment. These c... more Nowadays, Semiconductor Manufacturing is operating in an intense competitive environment. These companies are developing manufacturing solutions to improve the quality of the process which improves the production equipment effectiveness. We can cite many different directions such as virtual metrology, dynamic control plan, and maintenance, etc. In this paper, we propose to contribute to an online diagnosis method helping human operator to identify equipments at the origin of a propagated failure. Our contribution consists in providing an online confidence calculating module of the data issued from the manufacturing equipments. Bayesian networks theory and naïve algorithm are at the base of the proposed approach. We suggest its application to a semiconductor manufacturing industry.
Proceedings of the 2014 IEEE Emerging Technology and Factory Automation (ETFA), 2014
This paper proposes a method for real time diagnosis against product quality drifts in an automat... more This paper proposes a method for real time diagnosis against product quality drifts in an automated manufacturing system. We use Logical Diagnosis model to reduce the search space of suspected equipment in the production flow, which is then formulated as a Bayesian network to compute risk priority for each equipment, using joint and conditional probabilities. The objective is to quickly and accurately localize the possible fault origins and support effective decisions on corrective maintenance. The key advantages offered by this method are (i) reduced unscheduled equipment breakdowns, and (ii) increased and stable production capacities, required for success in highly competitive and automated manufacturing systems. Moreover, this is a generic method and can be deployed on fully or semi automated manufacturing systems.
Low noise transconductance amplifier design for continuous-time ΣΔ wideband frontend
2011 20th European Conference on Circuit Theory and Design (ECCTD), 2011
A low-noise transconductance amplifier (LNTA) aimed at continuous-timewideband frontend is presen... more A low-noise transconductance amplifier (LNTA) aimed at continuous-timewideband frontend is presented. In this application, the LNTA operates with a capacitive load to provide high linearity and sufficient Gm gain over a wide frequency band. By combination of various circuit techniques the LNTA, which is designed in 65nm CMOS, achieves in simulation the noise figure less than 1.35 dB and linearity of maximum IIP3 = 13.6 dBm over 0.8 - 5 GHz band. The maximum trans- conductance Gm = 11.6 mS, the return loss S11 < -14 dB while the total power consumption is 3.9 mW for 1.2 V supply.
Wideband RF frontend design for flexible radio receiver
2011 International Symposium on Integrated Circuits, 2011
ABSTRACT A wideband RF frontend for flexible radio applications is presented. A target is the per... more ABSTRACT A wideband RF frontend for flexible radio applications is presented. A target is the performance adequate for multistandard 3G/ 4G systems operating in frequency range 0.8–6 GHz. Because of relaxed requirements on band select filters, more demands are placed on linearity while the necessary noise performance is assured. We discuss architecture with Low Noise Transconductance Amplifier (LNTA) and a passive mixer terminated by a low impedance load. One variant of it is a Miller integrator where its input impedance is upconverted by the mixer and provides partial attenuation for blockers at RF. We also investigate a variant with a capacitive load followed by a high impedance transconductance amplifier (TCA). In either variant there is a tradeoff between the frontend NF and IP3, and also between NF and the blocker attenuation. Optimization of the 65 nm CMOS frontend is attained by careful sizing of the mixer switches. The frontend simulation results show NF +4 dBm and blocker attenuation &gt; 20 dB. Finally, we also discuss the demands placed on the A/D converter resolution in terms of the frontend and the receiver overall NF.
On the Mixed Multiplicities of Multi-graded Fiber Cones
Tokyo Journal of Mathematics, 2008
Let $(A,\frak{m})$ denote a Noetherian local ring with maximal ideal $\frak{m}$, $J$ an $\frak m$... more Let $(A,\frak{m})$ denote a Noetherian local ring with maximal ideal $\frak{m}$, $J$ an $\frak m$-primary ideal, $I_1,\ldots, I_s$ ideals of $A$; $M$ a finitely generated $A$-module. This paper will answer when mixed multiplicities of the multi-graded fiber cone $$ F_M(J,I_1,\ldots, I_s)=\bigoplus_{n_1,\ldots,n_s\geqslant 0}\dfrac{I_1^{n_1}\cdots I_s^{n_s}M}{JI_1^{n_1}\cdots I_s^{n_s}M} $$ are positive and characterize them in terms of the length of modules.
The reliability of RF MEMS switches is closely linked to their operational and environmental cond... more The reliability of RF MEMS switches is closely linked to their operational and environmental conditions. This paper examines the reliability of five different capacitive switch designs by a combined use of modeling and experimental tools. Three-dimensional multiphysics finite element analysis was performed to estimate the actuation voltage and deflection vs. temperature variations of the micro-switches. The effect of temperature and temperature cycles on switch dilatation and pull-in voltage are studied, as well as the influence of different operational signals on switch reliability.
Confidence estimation of feedback information for logicdiagnosis
Engineering Applications of Artificial Intelligence, 2013
This paper proposes an estimation method for the confidence level of feedback information (CLFI),... more This paper proposes an estimation method for the confidence level of feedback information (CLFI), namely the confidence level of reported information in computer integrated manufacturing (CIM) architecture for logic diagnosis. This confidence estimation provides a diagnosis module with precise reported information to quickly identify the origin of equipment failure. We studied the factors affecting CLFI, such as measurement system reliability, production context, position of sensors in the acquisition chains, type of products, reference metrology, preventive maintenance and corrective maintenance based on historical data and feedback information generated by production equipments. We introduced the new 'CLFI' concept based on the Dynamic Bayesian Network approach and Tree Augmented Naive Bayes model. Our contribution includes an on-line confidence computation module for production equipment data, and an algorithm to compute CLFI. We suggest it to be applied to the semiconductor manufacturing industry.
A new approximated exponential equation is proposed, which offers a wide decibel linear range for... more A new approximated exponential equation is proposed, which offers a wide decibel linear range for use in many applications such as exponential converters, log-domain filters, variable gain amplifiers (VGAs), automatic gain control amplifiers, etc. The proposed equation is implemented into a circuit as a two-stage VGA, which is fabricated in 0.18 mm CMOS technology and offers a gain range of 90 dB (À54-36 dB) and about 82 dB with linearity error of less than AE 1 dB. The 3 dB bandwidth is 50 MHz at a maximum gain of 36 dB and P1 dB is from À40 to À17 dBm. The power dissipation is 3.7 mA from a 1.8 V supply. The chip, excluding bond pads, occupies 0.34 mm 2 .
A simple single-stage variable gain amplifier that offers 86 dB of gain variation, consumes 1.4 m... more A simple single-stage variable gain amplifier that offers 86 dB of gain variation, consumes 1.4 mW, and occupies 0.07 mm 2 is introduced and shown to have the largest gain range, lowest power, and smallest chip size ever reported based on 0.18 mm CMOS technology. A new approximated exponential equation is proposed, which offers the largest dB-linear range compared to all previously-reported approximated equations.
A digitally-controlled topology that reduces power dissipation to half that of the conventional o... more A digitally-controlled topology that reduces power dissipation to half that of the conventional one while occupying smaller die area and obtaining higher linearity is presented. In the 0.13 mm CMOS process, the VGA occupies an active area of 0.46 mm 2 and dissipates an average current of 5.2 mA at 1.5 V. The gain-variation range is 232 to 52 dB with a gain error of less than +1 dB. The IIP3, P1dB, NF at 52 dB of gain, and 3 dB bandwidth are 237 to þ13 dBm, 242 to 22 dBm, 6.2 dB and 200 MHz, respectively.
2020 IEEE Power & Energy Society General Meeting (PESGM), 2020
With the rapid advancement of power electronic technologies and the reduction of photovoltaic cel... more With the rapid advancement of power electronic technologies and the reduction of photovoltaic cell price, the share of solar energy in the total power production has been booming recently. On the one hand, the increase in the amount of power delivered by solar energy can be beneficial in many economic and environmental aspects. On the other hand, this can cause various technical challenges to network operators. One of these issues is related to classifying faults located in distribution networks with high penetration of photovoltaic systems. Although many studies have paid significant attention to developing new algorithms applicable for a more active today distribution networks, there is still space for other improvements. Hence, after reviewing stateof-the-art researches, this paper was intended to develop a fault classification that is based on artificial neural networks. In particular, a technique so-called Multiplayer Perceptron Classifier was selected for the proposed algorithm. First, the authors generated a data set for the study by modeling and simulating a real distribution network with practical parameters provided by a local utility in the environment software PowerFactory/DigSILENT. Multiple fault scenarios were simulated. Second, a part of the generated data collection was used for network learning. Finally, the performance of the proposed methodology was demonstrated via testing on the remaining number of generated data.
Thèse dirigée par Eric ZAMAI et codirigée par Khoi Quoc TRAN DINH préparée au sein du Laboratoire... more Thèse dirigée par Eric ZAMAI et codirigée par Khoi Quoc TRAN DINH préparée au sein du Laboratoire G-SCOP dans l'École Doctorale EEATS Approche probabiliste pour l'estimation dynamique de la confiance accordée à un équipement de production : vers une contribution au diagnostic de services des SED Thèse soutenue publiquement le 19 décembre 2012, devant le jury composé de :
IECON 2014 - 40th Annual Conference of the IEEE Industrial Electronics Society, 2014
This paper proposes an approach to accurately localize the origin of product quality drifts, in a... more This paper proposes an approach to accurately localize the origin of product quality drifts, in a flexible manufacturing system (FMS). The logical diagnosis model is used to reduce the search space of suspected equipment in the production flow; however, it does not help in accurately localizing the faulty equipment. In the proposed approach, we model this reduced search space as a Bayesian network that uses historical data to compute conditional probabilities for each suspected equipment. This approach helps in making accurate decisions on localizing the cause for product quality drifts as either one of the equipment in production flow or product itself.
In this paper, we present a method for combining an asymmetrical phase mask and its conjugation p... more In this paper, we present a method for combining an asymmetrical phase mask and its conjugation phase mask to produce the point spread function of a wavefront coding imaging system, which has the defocus invariant characteristic of the asymmetrical phase mask and symmetric characteristic through an orthogonal axis pair of the symmetrical phase mask. Simulation results for comparing the wavefront coding imaging system with combining the sinusoidal phase mask and its conjugation phase mask and a traditional imaging system for a clear aperture without any phase mask are presented. Comparative results indicate that the wavefront coding imaging system combined with the sinusoidal phase mask and its conjugation phase mask has an imaging performance invariant over a wide range of defocus.
This paper proposes an approach to accurately localize the origin of product quality drifts, in a... more This paper proposes an approach to accurately localize the origin of product quality drifts, in a flexible manufacturing system (FMS). The failure propagation mechanism in a production process is proposed based on the relationships between failure sources to explain the failure propagation following production flow. The logical diagnosis model is used to reduce the search space of suspected equipment in the production flow; however, it does not help in accurately localizing the faulty equipment. In the proposed approach, we model this reduced search space as a Bayesian network that uses historical data to compute conditional probabilities for each suspected equipment. This approach helps in making accurate decisions on localizing the cause for product quality drifts as either one of the equipment in production flow or product itself.
This paper proposes a model to compute confidence of reported information level (CRIL) in the dom... more This paper proposes a model to compute confidence of reported information level (CRIL) in the domain of logic diagnosis. This level of confidence is provided by a diagnosis module allowing to quickly identify the origin of equipment failure. We studied the factors affecting CRIL, such as measurement system reliability, production context, position of sensors in the acquisition chains, type of product, reference metrology, preventive maintenance and corrective maintenance based on historical data and reported information generated by production equipment. We have introduced a new 'CRIL' concept based on the Bayesian Network approach, Naïve Bayes model and Tree Augmented Naïve Bayes model. Our contribution includes an on-line confidence computation module for production equipment data, and an algorithm to compute CRIL. We suggest it be applied to the semiconductor manufacturing industry.
Nowadays, Semiconductor Manufacturing is operating in an intense competitive environment. These c... more Nowadays, Semiconductor Manufacturing is operating in an intense competitive environment. These companies are developing manufacturing solutions to improve the quality of the process which improves the production equipment effectiveness. We can cite many different directions such as virtual metrology, dynamic control plan, and maintenance, etc. In this paper, we propose to contribute to an online diagnosis method helping human operator to identify equipments at the origin of a propagated failure. Our contribution consists in providing an online confidence calculating module of the data issued from the manufacturing equipments. Bayesian networks theory and naïve algorithm are at the base of the proposed approach. We suggest its application to a semiconductor manufacturing industry.
Proceedings of the 2014 IEEE Emerging Technology and Factory Automation (ETFA), 2014
This paper proposes a method for real time diagnosis against product quality drifts in an automat... more This paper proposes a method for real time diagnosis against product quality drifts in an automated manufacturing system. We use Logical Diagnosis model to reduce the search space of suspected equipment in the production flow, which is then formulated as a Bayesian network to compute risk priority for each equipment, using joint and conditional probabilities. The objective is to quickly and accurately localize the possible fault origins and support effective decisions on corrective maintenance. The key advantages offered by this method are (i) reduced unscheduled equipment breakdowns, and (ii) increased and stable production capacities, required for success in highly competitive and automated manufacturing systems. Moreover, this is a generic method and can be deployed on fully or semi automated manufacturing systems.
Low noise transconductance amplifier design for continuous-time ΣΔ wideband frontend
2011 20th European Conference on Circuit Theory and Design (ECCTD), 2011
A low-noise transconductance amplifier (LNTA) aimed at continuous-timewideband frontend is presen... more A low-noise transconductance amplifier (LNTA) aimed at continuous-timewideband frontend is presented. In this application, the LNTA operates with a capacitive load to provide high linearity and sufficient Gm gain over a wide frequency band. By combination of various circuit techniques the LNTA, which is designed in 65nm CMOS, achieves in simulation the noise figure less than 1.35 dB and linearity of maximum IIP3 = 13.6 dBm over 0.8 - 5 GHz band. The maximum trans- conductance Gm = 11.6 mS, the return loss S11 < -14 dB while the total power consumption is 3.9 mW for 1.2 V supply.
Wideband RF frontend design for flexible radio receiver
2011 International Symposium on Integrated Circuits, 2011
ABSTRACT A wideband RF frontend for flexible radio applications is presented. A target is the per... more ABSTRACT A wideband RF frontend for flexible radio applications is presented. A target is the performance adequate for multistandard 3G/ 4G systems operating in frequency range 0.8–6 GHz. Because of relaxed requirements on band select filters, more demands are placed on linearity while the necessary noise performance is assured. We discuss architecture with Low Noise Transconductance Amplifier (LNTA) and a passive mixer terminated by a low impedance load. One variant of it is a Miller integrator where its input impedance is upconverted by the mixer and provides partial attenuation for blockers at RF. We also investigate a variant with a capacitive load followed by a high impedance transconductance amplifier (TCA). In either variant there is a tradeoff between the frontend NF and IP3, and also between NF and the blocker attenuation. Optimization of the 65 nm CMOS frontend is attained by careful sizing of the mixer switches. The frontend simulation results show NF +4 dBm and blocker attenuation &gt; 20 dB. Finally, we also discuss the demands placed on the A/D converter resolution in terms of the frontend and the receiver overall NF.
On the Mixed Multiplicities of Multi-graded Fiber Cones
Tokyo Journal of Mathematics, 2008
Let $(A,\frak{m})$ denote a Noetherian local ring with maximal ideal $\frak{m}$, $J$ an $\frak m$... more Let $(A,\frak{m})$ denote a Noetherian local ring with maximal ideal $\frak{m}$, $J$ an $\frak m$-primary ideal, $I_1,\ldots, I_s$ ideals of $A$; $M$ a finitely generated $A$-module. This paper will answer when mixed multiplicities of the multi-graded fiber cone $$ F_M(J,I_1,\ldots, I_s)=\bigoplus_{n_1,\ldots,n_s\geqslant 0}\dfrac{I_1^{n_1}\cdots I_s^{n_s}M}{JI_1^{n_1}\cdots I_s^{n_s}M} $$ are positive and characterize them in terms of the length of modules.
The reliability of RF MEMS switches is closely linked to their operational and environmental cond... more The reliability of RF MEMS switches is closely linked to their operational and environmental conditions. This paper examines the reliability of five different capacitive switch designs by a combined use of modeling and experimental tools. Three-dimensional multiphysics finite element analysis was performed to estimate the actuation voltage and deflection vs. temperature variations of the micro-switches. The effect of temperature and temperature cycles on switch dilatation and pull-in voltage are studied, as well as the influence of different operational signals on switch reliability.
Confidence estimation of feedback information for logicdiagnosis
Engineering Applications of Artificial Intelligence, 2013
This paper proposes an estimation method for the confidence level of feedback information (CLFI),... more This paper proposes an estimation method for the confidence level of feedback information (CLFI), namely the confidence level of reported information in computer integrated manufacturing (CIM) architecture for logic diagnosis. This confidence estimation provides a diagnosis module with precise reported information to quickly identify the origin of equipment failure. We studied the factors affecting CLFI, such as measurement system reliability, production context, position of sensors in the acquisition chains, type of products, reference metrology, preventive maintenance and corrective maintenance based on historical data and feedback information generated by production equipments. We introduced the new 'CLFI' concept based on the Dynamic Bayesian Network approach and Tree Augmented Naive Bayes model. Our contribution includes an on-line confidence computation module for production equipment data, and an algorithm to compute CLFI. We suggest it to be applied to the semiconductor manufacturing industry.
A new approximated exponential equation is proposed, which offers a wide decibel linear range for... more A new approximated exponential equation is proposed, which offers a wide decibel linear range for use in many applications such as exponential converters, log-domain filters, variable gain amplifiers (VGAs), automatic gain control amplifiers, etc. The proposed equation is implemented into a circuit as a two-stage VGA, which is fabricated in 0.18 mm CMOS technology and offers a gain range of 90 dB (À54-36 dB) and about 82 dB with linearity error of less than AE 1 dB. The 3 dB bandwidth is 50 MHz at a maximum gain of 36 dB and P1 dB is from À40 to À17 dBm. The power dissipation is 3.7 mA from a 1.8 V supply. The chip, excluding bond pads, occupies 0.34 mm 2 .
A simple single-stage variable gain amplifier that offers 86 dB of gain variation, consumes 1.4 m... more A simple single-stage variable gain amplifier that offers 86 dB of gain variation, consumes 1.4 mW, and occupies 0.07 mm 2 is introduced and shown to have the largest gain range, lowest power, and smallest chip size ever reported based on 0.18 mm CMOS technology. A new approximated exponential equation is proposed, which offers the largest dB-linear range compared to all previously-reported approximated equations.
A digitally-controlled topology that reduces power dissipation to half that of the conventional o... more A digitally-controlled topology that reduces power dissipation to half that of the conventional one while occupying smaller die area and obtaining higher linearity is presented. In the 0.13 mm CMOS process, the VGA occupies an active area of 0.46 mm 2 and dissipates an average current of 5.2 mA at 1.5 V. The gain-variation range is 232 to 52 dB with a gain error of less than +1 dB. The IIP3, P1dB, NF at 52 dB of gain, and 3 dB bandwidth are 237 to þ13 dBm, 242 to 22 dBm, 6.2 dB and 200 MHz, respectively.
Uploads
Papers by QUOC BUI DUONG