Kelly Ockunzzi

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Universite de Rouen, CORIA

Johannes Heinze

Shin-juh Chen

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Papers by Kelly Ockunzzi

<title>Planar imaging of hydroxyl in a high-temperature high-pressure combustion facility</title>

Optical Techniques in Fluid, Thermal, and Combustion Flow, 1995

An optically accessible flame tube combustor is described which has high temperature, pressure, a... more An optically accessible flame tube combustor is described which has high temperature, pressure, and air flow capabilities. The windows in the combustor measure 3.8 cm axially by 5.1 cm radially, providing 67% optical access to the square cross section flow chamber. The instrumentation allows one to examine combusting flows and combustor subcomponents, such as fuel injectors and air swiders. These internal combustor subcomponents have previously been studied only with physical probes, such as temperature and species rakes. Planar laser-induced fluorescence (PLIF) images of OH have been obtained from this lean burning combustor burning JP-5 fuel. These images were obtained using various laser excitation lines of the OH A<--X (I,0) band for two fuel injector configurations with pressures ranging from I013 kPa (I0 atm) to 1419 kPa (14 atm), and equivalence ratios from 0.41 to 0.59. Non-uniformities in the combusting flow, attributed to differences in fuel injector configuration, are revealed by these images.

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Test strategies for BIST at the algorithmic and register-transfer levels

Proceedings of the 38th conference on Design automation - DAC '01, 2001

The proposed BIST-based DFT method targets testability problems caused by three constructs. The f... more The proposed BIST-based DFT method targets testability problems caused by three constructs. The first construct is reconvergent fanout in a circuit behavior, which causes correlation. The second construct, control statements, also cause correlation, and relational operations degrade observability. The third construct is random-pattern-resistant RTL modules, which cannot be tested effectively with random patterns. Test strategies are presented that overcome the testability problems by modifying the circuit behavior. An analysis and insertion scheme that systematically identifies the problems and applies the strategies is described. Experimental results from seven examples show that this scheme improves fault coverage while minimizing the impact on area and critical delay.

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Breaking correlation to improve testability

Proceedings 19th IEEE VLSI Test Symposium. VTS 2001, 2001

A BIST-based design-for-test method targeting correlation in circuit behaviors is proposed. Corre... more A BIST-based design-for-test method targeting correlation in circuit behaviors is proposed. Correlation introduced by reconvergent fanout and conditional statements is considered. Testability problems caused by correlation are described and behavioral modification techniques to implicitly break the correlation are presented. An analysis and insertion scheme is proposed that systematically identifies testability problems in a circuit and modifies the circuit to resolve

Testability Enhancement for Control-Flow Intensive Behaviors

Journal of Electronic Testing, 1998

A BIST-based test synthesis methodology for control-flow intensive behaviors is proposed. This me... more A BIST-based test synthesis methodology for control-flow intensive behaviors is proposed. This methodology targets the control statements in a behavioral description, such as if-then-else and loop statements, because such statements can introduce testability problems in the resulting circuit. How well the operations in each branch of a control statement can be tested depends on the probability of taking each branch and the quality of the test patterns used in each branch. Behavioral modifications are presented that can resolve these testability issues. The proposed methodology systematically identifies poor testability areas within a behavior and applies the behavioral modifications to improve the testability. Experimental results from six practical examples show that this technique is effective.

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OH imaging in a lean burning high-pressure combustor

Aiaa Journal, 1996

Optimizing delay tests at the memory boundary

2015 IEEE International Test Conference (ITC), 2015

Associated grouping of embedded cores for manufacturing test

Mechanism to Provide Test Access to Third-Party Macro Circuits Embedded in an Asic (Application-Specific Integrated Circuit)

by Richard Grupp and Kelly Ockunzzi

<title>Planar imaging of hydroxyl in a high-temperature high-pressure combustion facility</title>

Optical Techniques in Fluid, Thermal, and Combustion Flow, 1995

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Test strategies for BIST at the algorithmic and register-transfer levels