H. Read

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Vrije Universiteit Brussel

Nicole Herbots

Arizona State University

Dr. Nafiz Imtiaz Bin Hamid

Islamic University of Technology

David Seamon

Kansas State University

Kirsten Jacobson

University of Maine

Suseendran Jayachandran

IMEC

Derek Abbott

University of Adelaide

Elvira Fortunato

Universidade Nova de Lisboa

Kiran Dasari

University of Illinois at Urbana-Champaign

Akbar Bagri

Massachusetts Institute of Technology (MIT)

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Papers by H. Read

A new open technology CAD system

Microelectronic Engineering, 1991

An implementation of a technology CAD environment is presented, using a level concept for the sys... more

Test time reduction methods for yield test structures

International Conference on Microelectronic Test Structures, 2003., 2000

Complexity of integrated circuits has led t u liundreds of millions of transistors, wiring lines,... more Complexity of integrated circuits has led t u liundreds of millions of transistors, wiring lines, a u d layer t o layer via connections o n every chip. To allow accurate yield evaluation, it is required that process cliaracterization test chips g r o w in complexity as well which has let t o a significant bottleneck in testing them. Wafers that could be tested in less tlian two huurs in a 0.35uni technology now require 10 hours a n d m o r e in a 0.13um technology. This p a p e r will present methods how test structures c a n be redesigned t o better support testing. Based on those we will present modified test algorithms that will significantly reduce the test time by 50% and more, which will accelerate d a t a analysis a n d increases efficient use of parametric test systems.

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An integrated technology CAD environment

A new TCAD system is presented, capable of performing complex development tasks by means of a pow... more

The Viennese TCAD System

by Stefan Halama, Siegfried Selberherr, and H. Read

A new TCAD system is presented which is capable of performing complex development tasks by means ... more

An Integrated Technology CAD Environment

by Stefan Halama, Siegfried Selberherr, and H. Read

1991 International Symposium on VLSI Technology, Systems, and Applications - Proceedings of Technical Papers, 1991

A new TCAD system is presented, capable of performing complex development tasks by means of a pow... more

A new open technology CAD system

Microelectronic Engineering, 1991

An implementation of a technology CAD environment is presented, using a level concept for the sys... more

Test time reduction methods for yield test structures

International Conference on Microelectronic Test Structures, 2003., 2000

Download

An integrated technology CAD environment

A new TCAD system is presented, capable of performing complex development tasks by means of a pow... more

The Viennese TCAD System

by Stefan Halama, Siegfried Selberherr, and H. Read

A new TCAD system is presented which is capable of performing complex development tasks by means ... more

An Integrated Technology CAD Environment

by Stefan Halama, Siegfried Selberherr, and H. Read

1991 International Symposium on VLSI Technology, Systems, and Applications - Proceedings of Technical Papers, 1991

A new TCAD system is presented, capable of performing complex development tasks by means of a pow... more

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