Reliability evaluation

Prior work (Fig. 1)

• OD-ECC: [104, 96] SEC-DED X 3

Motivation (Table 1) - Dominant soft error patterns

Code Layout of EPA ECC (Fig. 3)

• OD-ECC: [39, 36] SSC-DSD over GF(256)
• Using Reed-Solomon code [2]

Code flows (Fault_sim.cpp)

• 1. Setting ECC-block configuration & error scenarios.
• 2. Setting output function name: output.S file.
• 3. (Start loop) HBM2E ECC-block setup
• 4. Initialize all data in ECC-block to 0
• 5. Error injection: Errors occur based on the error scenarios. (Caution!) This evaluation has no fault!
• 6. Apply OD-ECC (On-Die ECC)

Prior work: Apply the Hsiao SEC-DED code of (104, 96) to each ECC block.

EPA-ECC: Apply the RS SSC-DSD code of [39, 36] to an ECC block.

• 7. Report CE/DUE/SDC results.
• 8. (End loop) Derive final results.

HBM2E ECC block configuration [1]

• Data: 256 bit
• System ECC redundancy: 32 bit
• On-Die ECC redundancy: 24 bit
• Num of DQ: 64 (Psuedo-channel mode)
• Num of Redundancy-DQ: 8
• Burst Length: 4

Getting Started

• $ make clean
• $ make
• $ python run.py

Answer (.S files)

• CE: detected and corrected error
• DUE: detected but uncorrected error
• SDC: Silent Data Corruption

RUN_NUM is in Fault_sim.cpp file (iteration count)

• #define RUN_NUM 100000000

References

• [1] Chun, Ki Chul, et al. "A 16-GB 640-GB/s HBM2E DRAM with a data-bus window extension technique and a synergetic on-die ECC scheme." IEEE Journal of Solid-State Circuits 56.1 (2020): 199-211.
• [2] Reed, Irving S., and Gustave Solomon. "Polynomial codes over certain finite fields." Journal of the society for industrial and applied mathematics 8.2 (1960): 300-304.