臨界定数の英語

各量子井戸層は、結晶を構成する基板1の格子定数とは異なる格子定数を持ち且つ臨界膜厚よりも薄い膜厚で歪を有する。例文帳に追加

The respective quantum well layers have a lattice constant different from the lattice constant of a substrate 1 constituting a crystal, have a film thickness thinner than a critical thickness, and are distorted. - 特許庁

臨界安全性監視方法において、中性子計数率が所定値を越えた場合に、中性子パルスの統計的な性質から即発中性子減衰定数を求め、この即発中性子減衰定数と汎用核計算コードシステムにより求めた全遅発中性子割合と即発中性子寿命とから未臨界度を求め、未臨界度が浅くなった場合に警報を発生させる。例文帳に追加

In this nuclear criticality safety monitoring method, when the neutron counting rate exceeds a prescribed value, a prompt neutron attenuation constant is determined from a statistical property of a neutron pulse, and the degree of subcriticality is determined from the prompt neutron attenuation constant, the total delayed neutron ratio and a prompt neutron life determined by a general-purpose nuclear calculation code system, and when the degree of subcriticality becomes low, an alarm is issued. - 特許庁

炉内出力分布計算手段は、ノード平均核定数を用いて拡散モデルに基づき、炉心の臨界固有値、中性子束分布、出力分布を計算する。例文帳に追加

An in-core power distribution calculation means calculates the critical eigenvalue, neutron flux distribution and power distribution of in-core, based on a diffusion model by the use of a node average nuclear constant. - 特許庁

本発明は、従来は臨界膜厚の制限を受けて作製が困難であった基板結晶とは大きな格子定数の不整合を有する組成の半導体バルク的薄膜を作製する技術を提供するものである。例文帳に追加

To a technology for manufacturing a bulk semiconductor film of composition having mismatching of a lattice constant with a substrate crystal that it is difficult to manufacture because of a limit of a critical thickness until now. - 特許庁

２層目以降のバッファ層は下層の見かけの格子定数に対して２次元成長し得る範囲の格子不整合性を有するＩｎ_ｘ Ｇａ_１−ｘ Ａｓ層を臨界膜厚の１５倍以上１００倍以下の範囲で形成する。例文帳に追加

Buffer layers on and after a second layer are obtained by forming an In_xGa_1-xAs layer having lattice mismatch within a range where it can grow two-dimensionally for an apparent lattice constant of a lower layer within a range of ≥15 times of the critical thickness and of ≤100 times of the same. - 特許庁

ウルツ鉱型の結晶構造を有する材料から成る薄膜であって、該薄膜に対する法線とc軸が成す角である傾斜角が、縦波に関する圧電定数e_33がゼロになる臨界傾斜角よりも大きく、且つ90°未満であることを特徴とする。例文帳に追加

A thin film comprised of a material having an wurtzite crystal structure is provided, in which the tilting angle that is formed from a normal and a c-axis, with respect to the thin film, is larger than the critical tilting angle with which a piezoelectric constant e_33 for longitudinal waves become zero, and smaller than 90°. - 特許庁

この時に、各層の膜厚を電子のド・ブロイ波の波長程度、あるいは「臨界膜厚」以下とすれば、結晶欠陥を発生させることなく各層に圧縮応力を印加してその格子定数を基板のそれに近づけることができる。例文帳に追加

At this time, if the film thickness of each layer is made so thick as the wavelength of the de Broglie wave or is made equal to or less than a "critical film thickness", its lattice constant can be brought close to that of the substrate by applying compressive stress to each of the layers without causing any crystal defect. - 特許庁