回折強度の英語

セルロースＩ型結晶化度（％）＝〔（Ｉ_22.6−Ｉ_18.5）／Ｉ_22.6〕×１００ （１）〔Ｉ_22.6は、Ｘ線回折における格子面（００２面）（回折角２θ＝２２．６°）の回折強度、及びＩ_18.5は、アモルファス部（回折角２θ＝１８．５°）の回折強度を示す〕例文帳に追加

Cellulose I type crystallinity degree (%)=[(I_22.6-I_18.5)/I_22.6]×100 (1) [wherein I_22.6 represents the diffraction intensity of lattice plane (plane 002) (diffraction angle 2θ=22.6°) and I_18.5 represents the diffraction intensity of amorphous part (diffraction angle 2θ=18.5°) in X-ray diffraction]. - 特許庁

セルロースＩ型結晶化度（％）＝〔（Ｉ_22.6−Ｉ_18.5）／Ｉ_22.6〕×１００〔Ｉ_22.6は、Ｘ線回折における格子面（回折角２θ＝２２．６°）の回折強度、及びＩ_18.5は、アモルファス部（回折角２θ＝１８．５°）の回折強度を示す〕例文帳に追加

The cellulose I type crystallinity (%)=[(I_22.6-I_18.5)/I_22.6]×100 wherein, I_22.6 is a diffracted intensity of a lattice plane (angle of diffraction 2θ= 22.6°) in X-ray diffraction; and I_18.5 is a diffracted intensity of an amorphous portion (angle of diffraction 2θ= 18.5°). - 特許庁

そして、「対象試料の回折Ｘ線強度比」を、「参照試料の回折Ｘ線強度比」で除算した値を、「規格化された回折Ｘ線強度比」としこの値から結晶状態を解析する。例文帳に追加

A value obtained by dividing "the intensity ratio of the object specimen" by "the intensity ratio of the reference specimen" is taken as "a standardized diffracted X-ray intensity ratio" to analyze a crystalline state from this value. - 特許庁

セルロースＩ型結晶化度（％）＝〔（Ｉ_22.6−Ｉ_18.5）／Ｉ_22.6〕×１００ （１）〔式中、Ｉ_22.6は、Ｘ線回折における格子面（００２面）（回折角２θ＝２２．６°）の回折強度、及びＩ_18.5は、アモルファス部（回折角２θ＝１８．５°）の回折強度を示す。例文帳に追加

In the process for producing the low crystalline cellulose, a residual component obtained by removing water from the cellulose-containing raw material has the cellulose content of ≥20 mass%, and the cellulose-containing raw material is treated with a grinding aid to reduce the cellulose I crystallinity to ≤33%. - 特許庁

セルロースＩ結晶化度（％）＝〔（Ｉ_22.6−Ｉ_18.5）／Ｉ_22.6〕×１００ （１）〔式中、Ｉ_22.6は格子面（００２面）の回折強度を示し、Ｉ_18.5はアモルファス部の回折強度を示す。例文帳に追加

Cellulose I crystallinity (%)= [(I_22.6-I_18.5)/I_22.6]×100 (1). - 特許庁

強度算出枠２６の内側の領域で，Ｘ線記録領域上の回折Ｘ線の積分強度を求めて，これを回折斑点３４の強度とする。例文帳に追加

The integrated intensity of the diffracted X-ray on the X-ray recording region is determined in a region inside the intensity calculation frame 26, and the result is used as the intensity of the diffraction spot 34. - 特許庁

試料３で回折した回折Ｘ線５は、Ｘ線検出器６でその強度が測定される。例文帳に追加

A diffraction X-ray 5 diffraction at the sample 3 is measured in its intensity by an X-ray detector 6. - 特許庁

Ｘ線構造解析における回折斑点の強度算出方法例文帳に追加

INTENSITY CALCULATION METHOD OF DIFFRACTION SPOT IN X-RAY STRUCTURE ANALYSIS - 特許庁