{"inproceedings":{"@attributes":{"key":"conf\/vlsi-dat\/HuangUCSNZH19","mdate":"2019-08-13"},"author":["Yu Huang 0005","Szczepan Urban","Wu-Tung Cheng","Manish Sharma","Fengju Niu","Junna Zhong","Wen-Lung Hsu"],"title":"Reversible Scan Based Diagnostic Patterns.","pages":"1-4","year":"2019","booktitle":"VLSI-DAT","ee":"https:\/\/doi.org\/10.1109\/VLSI-DAT.2019.8742079","crossref":"conf\/vlsi-dat\/2019","url":"db\/conf\/vlsi-dat\/vlsi-dat2019.html#HuangUCSNZH19"}}