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ORCIDJin Wang 0030
Person information
- affiliation: Auburn University, Auburn, AL, USA
Other persons with the same name
- Jin Wang — disambiguation page
- Jin Wang 0001
![[0000-0001-5473-8738]](https://dblp.uni-trier.de/img/orcid-mark.12x12.png "0000-0001-5473-8738")
— Changsha University of Science and Technology, School of Computer and Communication Engineering, China (and 3 more) - Jin Wang 0002 — The University of Western Australia, Perth, WA, Australia (and 1 more)
- Jin Wang 0003 — Beijing Jiaotong University, State Key Lab of Rail Traffic Control and Safety, China
- Jin Wang 0004 — Wuhan University, School of Electronic Information, China
- Jin Wang 0005 — Nantong University, School of Computer Science and Technology, China
- Jin Wang 0006 — Chongqing University of Posts and Telecommunications, Chongqing Key Laboratory of Computational Intelligence, China (and 1 more)
- Jin Wang 0007 — Arizona State University, AZ, USA (and 3 more)
- Jin Wang 0008 — Yunnan University, School of Information Science and Engineering, China (and 1 more)
- Jin Wang 0009 — Soochow University, Department of Computer Science and Technology, Suzhou, China (and 2 more)
- Jin Wang 0010 — Georgia Institute of Technology, School of Electrical and Computer Engineering, Atlanta, GA, USA
- Jin Wang 0012 — Institute of Applied Physics and Computational Mathematics, Beijing, China (and 1 more)
- Jin Wang 0013 — Aeroflex Cambridge Ltd., UK (and 2 more)
- Jin Wang 0015 — Zhejiang University, State Key Laboratory of Fluid Power and Mechatronic Systems, Hangzhou, China
- Jin Wang 0016 — Kyushu University, Research and Development Center for Taste and Odor Sensing, Fukuoka, Japan (and 1 more)
- Jin Wang 0017 — City University of Hong Kong, Department of Systems Engineering and Engineering Management, Hong Kong
- Jin Wang 0018 — Nanyang Technological University, School of Computer Engineering, Singapore
- Jin Wang 0019 — Huazhong University of Science and Technology, Key Laboratory of Ministry of Education for Image Processing and Intelligent Control, Wuhan, China (and 1 more)
- Jin Wang 0020 — Nanjing University of Science and Technology, School of Electronic and Optical Engineering, China
- Jin Wang 0021 — Southeast University, School of Computer Science and Engineering, Nanjing, China (and 1 more)
- Jin Wang 0022 — Beijing University of Technology, Beijing, China
- Jin Wang 0023 — Beijing University of Technology, Faculty of Information Technology, China
- Jin Wang 0024 — Huawei Technologies Co Ltd., Shenzhen, China
- Jin Wang 0025 — Aerospace Information Research Institute, Chinese Academy of Sciences, Beijing, China
- Jin Wang 0026 — Guangdong University of Finance and Economics, Guangzhou, Guangdong, China
- Jin Wang 0027 — Vanderbilt University, Nashville, TN, USA
- Jin Wang 0028 — Beihang University, Beijing, China
- Jin Wang 0029 — China University of Mining and Technology, Xuzhou, China
- Jin Wang 0031 — Qingdao University, Qingdao, China
- Jin Wang 0032 — Railway Police College, Zhengzhou, China
- Jin Wang 0033 — Innovation Academy for Precision Measurement Science and Technology, Chinese Academy of Sciences, Wuhan, China
- Jin Wang 0034 — Shandong University, Jinan, China
- Jin Wang 0035 — Tianjin University, Tianjin, China
- Jin Wang 0036 — Chang'an University, Xi'an, China
- Jin Wang 0037 — Zhejiang Normal University, Jinhua, China
- Jin Wang 0038 — Central South University, Changsha, China
- Jin Wang 0039 — University of Hong Kong, Hong Kong, SAR, China
- Jin Wang 0040 — Nanjing University of Information Science and Technology, Nanjing, China
- Jin Wang 0041 — Xi'an University of Posts and Telecommunications, Xi'an, China
- Jin Wang 0042 — Liverpool John Moores University, Liverpool, UK
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2020 – today
- 2025
[c16]Bahareh Hassani, Yajun Wang, Ankur Kumar, Jesus Flores-Cerrillo, Jin Wang, Q. Peter He:
Statistical Process Monitoring of Cryogenic Air Separation Unit Startups. ACC 2025: 4818-4823- 2022
- [c15]Kiumars Badr, Q. Peter He, Jin Wang:
Understanding the evolution of interspecies metabolic interactions using dynamic genome-scale metabolic modeling*. ACC 2022: 450-455 - 2020
- [j6]Si-Zhao Joe Qin, Yining Dong, Qinqin Zhu, Jin Wang, Qiang Liu:
Bridging systems theory and data science: A unifying review of dynamic latent variable analytics and process monitoring. Annu. Rev. Control. 50: 29-48 (2020) - [j5]Devarshi Shah, Jin Wang, Q. Peter He:
Feature engineering in big data analytics for IoT-enabled smart manufacturing - Comparison between deep learning and statistical learning. Comput. Chem. Eng. 141: 106970 (2020) - [c14]Jangwon Lee, Jesus Flores-Cerrillo, Jin Wang, Q. Peter He:
A Variable Selection Method for Improving Variable Selection Consistency and Soft Sensor Performance. ACC 2020: 725-730 - [c13]Kerul Suthar, Jin Wang, Zhihua Jiang, Q. Peter He:
Using Channel State Information for Estimating Moisture Content in Woodchips via 5 GHz Wi-Fi. ACC 2020: 2784-2789
2010 – 2019
- 2019
- [j4]Q. Peter He, Jin Wang, Devarshi Shah:
Feature space monitoring for smart manufacturing via statistics pattern analysis. Comput. Chem. Eng. 126: 321-331 (2019) - [j3]Kerul Suthar, Devarshi Shah, Jin Wang, Q. Peter He:
Next-generation virtual metrology for semiconductor manufacturing: A feature-based framework. Comput. Chem. Eng. 127: 140-149 (2019) - 2017
- [c12]Kyle A. Stone, Devarshi Shah, Q. Peter He, Jin Wang:
A new application of data-driven soft sensor: Estimating individual biomass in mixed cultures. ACC 2017: 561-566 - [c11]Q. Peter He, Jin Wang:
Statistical process monitoring in the era of smart manufacturing. ACC 2017: 4797-4802 - 2013
- [c10]Meng Liang, Q. Peter He, Thomas W. Jeffries, Jin Wang:
Elucidating xylose metabolism of scheffersomyces stipitis by integrating principal component analysis with flux balance analysis. ACC 2013: 3777-3782 - [c9]Q. Peter He, Jin Wang:
Quantification of valve stiction based on a semi-physical model. ACC 2013: 4362-4367 - [c8]Jin Wang, Q. Peter He, Thomas F. Edgar:
Improved state estimation for high-mix semiconductor manufacturing. ACC 2013: 6649-6654 - 2012
- [c7]Q. Peter He, Jin Wang, Hector E. Gilicia, John D. Stuber, Bhalinder S. Gill:
Statistics pattern analysis based virtual metrology for plasma etch processes. ACC 2012: 4897-4902 - 2010
- [c6]Q. Peter He, Jin Wang:
Comparison of a new spectrum alignment algorithm with other methods. ACC 2010: 1260-1265 - [c5]Jin Wang, Q. Peter He, Thomas F. Edgar:
Control performance assessment and diagnosis for semiconductor processes. ACC 2010: 7004-7009
2000 – 2009
- 2008
- [c4]Q. Peter He, Jin Wang:
Principal component based k-nearest-neighbor rule for semiconductor process fault detection. ACC 2008: 1606-1611 - [c3]Jin Wang, Q. Peter He:
EWMA run-to-run controllers with gain updating: Stability and sensitivity analysis. ACC 2008: 2872-2877 - 2007
- [j2]Christopher A. Bode, Jin Wang, Q. Peter He, Thomas F. Edgar:
Run-to-run control and state estimation in high-mix semiconductor manufacturing. Annu. Rev. Control. 31(2): 241-253 (2007) - [c2]Jin Wang, Q. Peter He, Thomas F. Edgar:
A General Framework for State Estimation in High-Mix Semiconductor Manufacturing. ACC 2007: 3636-3641 - 2006
- [j1]Jin Wang, Si-Zhao Joe Qin:
Closed-loop subspace identification using the parity space. Autom. 42(2): 315-320 (2006) - 2001
- [c1]Jin Wang, S. Joe Qin:
Principal component analysis for errors-in-variables subspace identification. CDC 2001: 3936-3941
Coauthor Index
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