{"article":{"@attributes":{"key":"journals\/access\/LeePL25a","mdate":"2025-04-01"},"author":["Seunghan Lee","Jin Hwan Park","Young-Woo Lee"],"title":"Design and Implementation of Test Infrastructure for Higher Parallel Wafer Level Testing of System-on-Chip.","pages":"37493-37500","year":"2025","volume":"13","journal":"IEEE Access","ee":"https:\/\/doi.org\/10.1109\/ACCESS.2025.3544246","url":"db\/journals\/access\/access13.html#LeePL25a","stream":"streams\/journals\/access"}}