{"inproceedings":{"@attributes":{"key":"conf\/ofc\/0001HJNTWXZ19","mdate":"2021-08-11"},"author":["John E. Bowers 0001","Duanni Huang","Daehwan Jung","Justin Norman","Minh A. Tran","Yating Wan","Weiqiang Xie","Zeyu Zhang"],"title":"Realities and Challenges of III-V\/Si Integration Technologies.","pages":"1-3","year":"2019","booktitle":"OFC","ee":"https:\/\/ieeexplore.ieee.org\/document\/8696376","crossref":"conf\/ofc\/2019","url":"db\/conf\/ofc\/ofc2019.html#0001HJNTWXZ19"}}