"High-Performance CMOS-Based VLSI Testers: Timing Control and Compensation."

Jim Chapman (1992)

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DOI: 10.1109/TEST.1992.527804

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type: Conference or Workshop Paper

metadata version: 2023-03-23

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Jim Chapman:
High-Performance CMOS-Based VLSI Testers: Timing Control and Compensation. ITC 1992: 59-67

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