"Deep Learning-Assisted Trap Extraction Method from Noise Power Spectral ..."

Jinghan Xu et al. (2024)

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DOI: 10.1109/IRPS48228.2024.10529340

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type: Conference or Workshop Paper

metadata version: 2024-05-29

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Jinghan Xu, Zheng Zhou, Mengqi Fan, Zixuan Sun, Shuhan Wang, Zili Tang, Fei Liu, Xiaoyan Liu:
Deep Learning-Assisted Trap Extraction Method from Noise Power Spectral Density for MOSFETs. IRPS 2024: 1-7

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