{"inproceedings":{"@attributes":{"key":"conf\/irps\/Diaz-FortunyBGB25","mdate":"2025-07-04"},"author":["Javier Diaz-Fortuny","Mahdi Benkhelifa","Alexander Grill","Erik Bury","Robin Degraeve","Ben Kaczer","Hussam Amrouch"],"title":"Investigation of Cryogenic Aging in 28 nm CMOS: Suppression of BTI and HCD in Circuits and SRAM.","pages":"1-7","year":"2025","booktitle":"IRPS","ee":"https:\/\/doi.org\/10.1109\/IRPS48204.2025.10982796","crossref":"conf\/irps\/2025","url":"db\/conf\/irps\/irps2025.html#Diaz-FortunyBGB25"}}