"Extraction of defect density and size distributions from wafer sort test ..."

Jeffrey E. Nelson et al. (2006)

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DOI: 10.1109/DATE.2006.243807

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type: Conference or Workshop Paper

metadata version: 2023-03-24

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Jeffrey E. Nelson, Thomas Zanon, Rao Desineni, Jason G. Brown, N. Patil, Wojciech Maly, R. D. (Shawn) Blanton:
Extraction of defect density and size distributions from wafer sort test results. DATE 2006: 913-918

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