{"@attributes":{"name":"Annabelle Gentil","pid":"69\/8565","n":"1"},"person":{"@attributes":{"key":"homepages\/69\/8565","mdate":"2010-09-29"},"author":"Annabelle Gentil"},"r":{"article":{"@attributes":{"key":"journals\/mr\/AugusteHJAP09","mdate":"2020-02-22"},"author":["Manoubi Auguste Bahi","H\u00e9l\u00e8ne Fr\u00e9mont","Jean-Pierre Landesman","Annabelle Gentil","Pascal Lecuyer"],"title":"A new methodology for the identification of ball bond degradation during high-temperature aging tests on devices in standard plastic packages.","pages":"1273-1277","year":"2009","volume":"49","journal":"Microelectron. Reliab.","number":"9-11","ee":"https:\/\/doi.org\/10.1016\/j.microrel.2009.07.009","url":"db\/journals\/mr\/mr49.html#AugusteHJAP09"}},"coauthors":{"@attributes":{"n":"4","nc":"1"},"co":[{"@attributes":{"c":"0"},"na":"Manoubi Auguste Bahi"},{"@attributes":{"c":"0"},"na":"H\u00e9l\u00e8ne Fr\u00e9mont"},{"@attributes":{"c":"0"},"na":"Jean-Pierre Landesman"},{"@attributes":{"c":"0"},"na":"Pascal Lecuyer"}]}}