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M. Z. Dai

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2000 – 2009

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2008
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M. Z. Dai, S. I. Kim, Andrew Yap, Shaohua Liu, Arthur Cheng, Leeward Yi:
A unification of interface-state generation and hole-injection for hot-carrier-injection stress in low and high-voltage NMOSFET. Microelectron. Reliab. 48(4): 504-507 (2008)

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