default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDIEEE Design & Test, Volume 42
Volume 42, Number 1, February 2025
- Partha Pratim Pande
:
Top Picks in Hardware and Embedded Security 2022. 4 - Thomas Bourgeat, Jules Drean, Yuheng Yang, Lillian Tsai, Joel S. Emer, Mengjia Yan:
CaSA: End-to-End Quantitative Security Analysis of Randomly Mapped Caches. 5-12 - Mark Zhao, G. Edward Suh:
Remote Power Side- Channel Attacks on FPGAs. 13-19 - Jaehun Kim, Stjepan Picek, Annelie Heuser, Shivam Bhasin, Alan Hanjalic:
Still Making Noise: Improving Deep- Learning-Based Side- Channel Analysis. 20-27 - Mehdi Baradaran Tahoori, Seyedeh Maryam Ghasemi, Yervant Zorian:
Silicon Lifecycle Management (SLM): Requirements, Trends, and Opportunities. 28-38 - Anandpreet Kaur, Pravin Srivastav, Bibhas Ghoshal:
Exploring Resilience of LPDRAM Against RowHammer. 39-46 - Salma Afifi, Ishan G. Thakkar, Sudeep Pasricha:
STAR: A Mixed Analog Stochastic In-DRAM Convolutional Neural Network Accelerator. 47-55 - Muslum Emir Avci, Sule Ozev:
Background Receiver IQ Imbalance Correction for In-Field Testing. 56-64 - Alain Girault, Tei-Wei Kuo, Frank Mueller:
Report on the 2024 Embedded Systems Week (ESWEEK). 65-67 - Pascal Meinerzhagen, Kapil Dev, Jerald Yoo:
Recap of the 29th ACM/IEEE International Symposium on Low Power Electronics and Design (ISLPED'24). 68-69 - Sudeep Pasricha, Marilyn Wolf:
Erratum to "Ethical Design of Computers: From Semiconductors to IoT and Artificial Intelligence". 70 - Scott Davidson:
This Stuff Is Great - Am I Right? 71
Volume 42, Number 2, April 2025
- Partha Pratim Pande:
Special Issue on Wearable IoT Devices for Reliable Mobile Health Applications. 4 - Ganapati Bhat, Pietro Mercati:
Special Issue on Wearable IoT Devices for Reliable Mobile Health Applications. 5-6 - ErXun Yan, Ping Lu, Haibin Ni:
An EMG Denoising Method Based on Flexible Wearable Sensors. 7-16 - Flavio Ponzina, Mialyssa Gomez, Congge Xu, Tajana Simunic Rosing:
GlucoseHD: Predicting Glucose Levels Using Hyperdimensional Computing. 17-24 - Hamidreza Alikhani, Anil Kanduri, Emad Kasaeyan Naeini, Sina Shahhosseini, Pasi Liljeberg, Amir M. Rahmani, Nikil D. Dutt:
ISCA: Intelligent Sense-Compute Adaptive Co-Optimization of Multimodal Machine Learning Kernels for Resilient mHealth Services on Wearables. 25-34 - Pietro Mercati, Ganapati Bhat:
Self-Sustainable Wearable and Internet of Things (IoT) Devices for Health Monitoring: Opportunities and Challenges. 35-60 - Harshit Saurabh, Suparna Kundu, Samarth Shivakumar Titti, Anupam Golder, K. K. Soundra Pandian, Chaoyun Li, Angshuman Karmakar, Debayan Das:
Full Key Extraction of SNOW-V Using ML-Assisted Power SCA. 61-70 - Kamil Khan, Sudeep Pasricha:
CAFEEN: A Cooperative Approach for Energy-Efficient NoCs With Multiagent Reinforcement Learning. 71-78 - Guihui Xie, Zijian Wang, Yunxin Zhang, Ruyan Li, Xin Liu:
Compact and High-Performing Five-Stage Pipeline RISC-V Microprocessor Designed for IoT Applications. 79-88 - Scott Davidson:
Getting to Know All About Us. 89
Volume 42, Number 3, June 2025
- Partha Pratim Pande:
Special Issue on Top Picks in Test and Reliability. 4 - Jyotika Athavale, Haralampos-G. Stratigopoulos:
Special Issue on the First IEEE Top Picks in VLSI Test and Reliability Workshop. 5-6 - Guanpeng Li, Siva Kumar Sastry Hari, Michael B. Sullivan, Timothy Tsai, Karthik Pattabiraman, Joel S. Emer, Stephen W. Keckler:
Understanding Error Propagation in Deep-Learning Neural Networks' Accelerators and Applications. 7-13 - Annachiara Ruospo, Salvatore Pappalardo, Vittorio Turco, Alberto Bosio, Ernesto Sánchez:
Reliability of Deep Neural Networks: Impact and Open Issues. 14-25 - Elbruz Ozen, Ozgur Ozerdem, Alex Orailoglu:
Linear Algorithmic Checksums for Deep-Neural-Network Error Detection: Fundamentals and Recent Advancements. 26-40 - Yanjing Li, Vijay Janapa Reddi:
Robust Methods for Deep-Learning Training. 41-56 - Fernando Fernandes dos Santos, Paolo Rech:
Challenges in Assessing and Improving Deep Neural Networks' Reliability. 57-65 - Wen Li, Ying Wang, Huawei Li, Xiaowei Li, Kaiwei Zou:
Functional Testing and Repair for ReRAM-Based Deep-Learning Accelerators. 66-73 - Eric Cheng, Hyungmin Cho, Shahrzad Mirkhani, Lukasz G. Szafaryn, Jacob A. Abraham, Pradip Bose, Chen-Yong Cher, Klas Lilja, Kevin Skadron, Mircea Stan, Subhasish Mitra:
CLEAR Cross-Layer Resilience: A Retrospective. 74-85 - Hassan Nassar, Lars Bauer, Jörg Henkel:
Turbo-FHE: Accelerating Fully Homomorphic Encryption With FPGA and HBM Integration. 86-93 - Samarth Shivakumar Titti, Harshit Saurabh, Debayan Das:
TYLOR: TDC-Based Low-Overhead Synthesizable Power SCA Countermeasure on FPGAs. 94-102 - Pravin Srivastav, Anandpreet Kaur, Bibhas Ghoshal:
SuBhI: Securing Embedded System's Runtime Integrity via Behavioral Information. 103-112 - Nicola Nicolici:
Interview With Yao-Wen Chang. 113-118 - Scott Davidson:
Reliability for the Masses. 119
Volume 42, Number 4, August 2025
- Partha Pratim Pande:
Special Issue on the 2023 Symposium on Integrated Circuits and Systems Design. 4 - Ney Calazans, Bruno Zatt:
Guest Editors' Introduction: SBCCI 2023. 5-6 - Pietro M. Ferreira, Zalfa Jouni, Siqi Wang, Geoffroy Klisnick, Aziz Benlarbi-Delaï:
Noise-Optimized Neuromorphic Spiking Radio in Context-Aware IoT. 7-16 - Murilo R. Perleberg, Marcello M. Muñoz, Denis Maass, Vladimir Afonso, Luciano Agostini, Marcelo Schiavon Porto:
An Efficient Hardware Design for the VVC Prediction Refinement With Optical Flow. 17-24 - Állan G. Ferreira, Lucas B. Zilch, Marcelo Soares Lubaszewski, Tiago R. Balen:
Indirect Test Pattern Generation for Mixed-Signal Circuits Using Machine Learning. 25-33 - Marcello M. Muñoz, Denis Maass, Murilo R. Perleberg, Luciano Agostini, Guilherme Corrêa, Marcelo Schiavon Porto:
A Coding Efficiency-Aware Hardware Design for VVC Affine Motion Estimation Reconstructor. 34-40 - Hans Jakob Damsgaard, Aleksandr Ometov, Jari Nurmi:
Adaptive Approximate Computing With CGRAgen. 41-47 - M. Shafkat M. Khan, Liton Kumar Biswas, Himanandhan Reddy Kottur, Rouhan Noor, Nitin Varshney, Nelson Hastings, Navid Asadizanjani:
Toward Standardized Vulnerability Assessment of Advanced Packaging Against Probing Attacks. 48-58 - Olivia P. Dizon-Paradis, David Selasi Koblah, Ronald Wilson, Domenic Forte, Damon L. Woodard:
IC SEM Reverse Engineering Tutorial Using Artificial Intelligence. 59-68 - Scott Davidson:
Stored Programs Restored. 69
Volume 42, Number 5, October 2025
- Partha Pratim Pande:
Special Issue on TinyML. 4 - Theocharis Theocharides, Marian Verhelst, Vijay Janapa Reddy, Evgeni Gousev:
TinyML - From Efficient Edge Inference to On-Device Intelligence. 5-7 - Angelo Garofalo, Luca Benini:
Leveraging RISC-V for HW/SW Codesign of Flexible and Efficient TinyML SoCs. 8-26 - Gian Marco Iodice, Wolfgang Furtner:
Edge AI - An Industry View. 27-34 - Md Ragib Shaharear, Arnab Neelim Mazumder, Tinoosh Mohsenin:
ViT-Reg: Regression-Focused Hardware-Aware Fine-Tuning for ViT on TinyML Platforms. 35-44 - Dimitrios Samakovlis, Stefano Albini, Rubén Rodríguez Álvarez, Denisa-Andreea Constantinescu, Pasquale Davide Schiavone, Miguel Peón-Quirós, David Atienza:
BiomedBench: A Benchmark Suite of TinyML Biomedical Applications for Low-Power Wearables. 45-54 - Baichuan Huang, Amir Aminifar:
Binary Forward-Only Algorithms. 55-62 - Philip Wiese, Gamze Islamoglu, Moritz Scherer, Luka Macan, Victor Jean-Baptiste Jung, Alessio Burrello, Francesco Conti, Luca Benini:
Toward Attention-Based TinyML: A Heterogeneous Accelerated Architecture and Automated Deployment Flow. 63-72 - Hasan Al Shaikh, Shuvagata Saha, Sujan Kumar Saha, Kimia Zamiri Azar, Farimah Farahmandi, Mark Tehranipoor:
Rethinking SoC Verification for Secure Cross-Layer Interactions. 73-82 - Anirban Sengupta, Nabendu Bhui:
Time-Bomb HLS Trojan for Performance Degradation Payload. 83-92 - Aida Todri-Sanial, Theocharis Theocharides, Valeria Bertacco, Alberto Bosio:
A Growing and Thriving Electronic Design, Automation, and Test Community: A DATE 2025 Perspective. 93-99 - Scott Davidson:
Small Smarts. 100
Volume 42, Number 6, December 2025
- Partha Pratim Pande:
Special Issue on 20 Years of IEEE CEDA. 4 - Jörg Henkel, L. Miguel Silveira:
Celebrating 20 Years of EDA: Milestones, Challenges, and Future Directions. 5-7 - Giovanni De Micheli:
The Council on Electronic Design Automation: Creation, Growth, and Future. 8-14 - Yao-Wen Chang, David Z. Pan:
Physical Design for Heterogeneous Integration: Challenges and Opportunities. 15-29 - David Z. Pan, Yao-Wen Chang, Chen-Hao Hsu, Yang Hsu:
From Classical Algorithms to AI: Evolving Trends in VLSI Physical Design Automation. 30-39 - Subhasish Mitra, Subho S. Banerjee, Martin Dixon, Mike Fuller, Rama Govindaraju, Peter Hochschild, Eric X. Liu, Bharath Parthasarathy, Parthasarathy Ranganathan:
Silent Data Corruption by 10× Test Escapes Threatens Reliable Computing. 40-53 - Yiran Chen, Cong Guo, Yintao He, Mingyuan Ma, Tergel Molom-Ochir, Nicky Ramos, Haoxuan Shan, Chiyue Wei, Hai Li:
Circuits to Systems: Codesigning Efficient AI Hardware. 54-62 - Georges G. E. Gielen:
A Brief 20-Year History and Future Perspectives on Sizing and Layout Synthesis of Analog/RF ICs. 63-74 - Xiaobo Sharon Hu, Mingyen Lee, Mengyuan Li, João Paulo Cardoso de Lima, Liu Liu, Zhenhua Zhu, Jerónimo Castrillón, Michael T. Niemier, Yu Wang:
Cross-Layer Design and Design Automation for In-Memory Computing Based on Nonvolatile Memory Technologies. 75-86 - Tulika Mitra:
Embedded System Design: Milestones, Momentum, and the Frontier. 87-98 - David Atienza, Kai Zhu, Darong Huang, Luis Costero:
A 20-Year Retrospective on Power and Thermal Modeling and Management. 99-110 - Jiahao Lin, Hasan Umut Suluhan, Hyunwon Chung, Arindam Dutta, Anish Vipperla, Gerard Gubash, Jacob Holtom, Bernd-Peter Paris, Chaitali Chakrabarti, Daniel W. Bliss, David T. Blaauw, Hun-Seok Kim, Ali Akoglu, Ümit Y. Ogras:
An Overview of Challenges and Requirements for Real-Time Spectrum Sensing in Modern RF Autonomy Systems. 111-126 - Aritra Dasgupta, Sudipta Paria, Christopher Sozio, Swarup Bhunia:
LATTE: Library Attack for Evaluating Hardware IP Protections Against Reverse Engineering. 127-137 - Hai Li, Ranu Mehra:
Recap of the 62nd ACM/IEEE Design Automation Conference (DAC62): The "Chips to Systems Conference". 138-139 - Scott Davidson:
20 Years of IEEE CEDA and More of EDA. 140
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
last updated on 2026-01-29 02:11 CET by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
