{"id":"https:\/\/openalex.org\/W4404370780","doi":"https:\/\/doi.org\/10.1109\/tii.2024.3488789","title":"Subpixel Vision Measurement Method for Rectangular-Pin SMDs Based on Asymmetric Gaussian Gradient Edge Profile","display_name":"Subpixel Vision Measurement Method for Rectangular-Pin SMDs Based on Asymmetric Gaussian Gradient Edge Profile","publication_year":2024,"publication_date":"2024-11-14","ids":{"openalex":"https:\/\/openalex.org\/W4404370780","doi":"https:\/\/doi.org\/10.1109\/tii.2024.3488789"},"language":"en","primary_location":{"id":"doi:10.1109\/tii.2024.3488789","is_oa":false,"landing_page_url":"https:\/\/doi.org\/10.1109\/tii.2024.3488789","pdf_url":null,"source":{"id":"https:\/\/openalex.org\/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https:\/\/openalex.org\/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https:\/\/openalex.org\/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"},"type":"article","indexed_in":["crossref"],"open_access":{"is_oa":false,"oa_status":"closed","oa_url":null,"any_repository_has_fulltext":false},"authorships":[{"author_position":"first","author":{"id":"https:\/\/openalex.org\/A5100627443","display_name":"Weihua Liu","orcid":"https:\/\/orcid.org\/0009-0001-2880-6116"},"institutions":[],"countries":[],"is_corresponding":true,"raw_author_name":"Weihua Liu","raw_affiliation_strings":["Yongjiang Laboratory, Ningbo, China"],"affiliations":[{"raw_affiliation_string":"Yongjiang Laboratory, Ningbo, China","institution_ids":[]}]},{"author_position":"middle","author":{"id":"https:\/\/openalex.org\/A5088418397","display_name":"Yimin Wang","orcid":null},"institutions":[{"id":"https:\/\/openalex.org\/I204983213","display_name":"Harbin Institute of Technology","ror":"https:\/\/ror.org\/01yqg2h08","country_code":"CN","type":"education","lineage":["https:\/\/openalex.org\/I204983213"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Yimin Wang","raw_affiliation_strings":["Harbin Institute of Technology, Harbin, China"],"affiliations":[{"raw_affiliation_string":"Harbin Institute of Technology, Harbin, China","institution_ids":["https:\/\/openalex.org\/I204983213"]}]},{"author_position":"middle","author":{"id":"https:\/\/openalex.org\/A5057597956","display_name":"Juan J. Rodr\u00edguez-Andina","orcid":"https:\/\/orcid.org\/0000-0002-0919-1793"},"institutions":[{"id":"https:\/\/openalex.org\/I159389169","display_name":"Ningbo University of Technology","ror":"https:\/\/ror.org\/037dym702","country_code":"CN","type":"education","lineage":["https:\/\/openalex.org\/I159389169"]}],"countries":["CN"],"is_corresponding":false,"raw_author_name":"Juan J. Rodriguez-Andina","raw_affiliation_strings":["Ningbo University of Technology, Ningbo, China"],"affiliations":[{"raw_affiliation_string":"Ningbo University of Technology, Ningbo, China","institution_ids":["https:\/\/openalex.org\/I159389169"]}]},{"author_position":"last","author":{"id":"https:\/\/openalex.org\/A5044251375","display_name":"Xinghu Yu","orcid":"https:\/\/orcid.org\/0000-0001-8181-6199"},"institutions":[],"countries":[],"is_corresponding":false,"raw_author_name":"Xinghu Yu","raw_affiliation_strings":["Ningbo Institute of Intelligent Equipment Technology Company, Ltd., Ningbo, China"],"affiliations":[{"raw_affiliation_string":"Ningbo Institute of Intelligent Equipment Technology Company, Ltd., Ningbo, China","institution_ids":[]}]}],"institutions":[],"countries_distinct_count":1,"institutions_distinct_count":4,"corresponding_author_ids":["https:\/\/openalex.org\/A5100627443"],"corresponding_institution_ids":[],"apc_list":null,"apc_paid":null,"fwci":1.1801,"has_fulltext":false,"cited_by_count":3,"citation_normalized_percentile":{"value":0.76354591,"is_in_top_1_percent":false,"is_in_top_10_percent":false},"cited_by_percentile_year":{"min":95,"max":99},"biblio":{"volume":"21","issue":"2","first_page":"1823","last_page":"1832"},"is_retracted":false,"is_paratext":false,"is_xpac":false,"primary_topic":{"id":"https:\/\/openalex.org\/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9804999828338623,"subfield":{"id":"https:\/\/openalex.org\/subfields\/2206","display_name":"Computational Mechanics"},"field":{"id":"https:\/\/openalex.org\/fields\/22","display_name":"Engineering"},"domain":{"id":"https:\/\/openalex.org\/domains\/3","display_name":"Physical Sciences"}},"topics":[{"id":"https:\/\/openalex.org\/T13049","display_name":"Surface Roughness and Optical Measurements","score":0.9804999828338623,"subfield":{"id":"https:\/\/openalex.org\/subfields\/2206","display_name":"Computational Mechanics"},"field":{"id":"https:\/\/openalex.org\/fields\/22","display_name":"Engineering"},"domain":{"id":"https:\/\/openalex.org\/domains\/3","display_name":"Physical Sciences"}},{"id":"https:\/\/openalex.org\/T14158","display_name":"Optical Systems and Laser Technology","score":0.9765999913215637,"subfield":{"id":"https:\/\/openalex.org\/subfields\/2208","display_name":"Electrical and Electronic Engineering"},"field":{"id":"https:\/\/openalex.org\/fields\/22","display_name":"Engineering"},"domain":{"id":"https:\/\/openalex.org\/domains\/3","display_name":"Physical Sciences"}},{"id":"https:\/\/openalex.org\/T11583","display_name":"Advanced Measurement and Metrology Techniques","score":0.9294000267982483,"subfield":{"id":"https:\/\/openalex.org\/subfields\/2210","display_name":"Mechanical Engineering"},"field":{"id":"https:\/\/openalex.org\/fields\/22","display_name":"Engineering"},"domain":{"id":"https:\/\/openalex.org\/domains\/3","display_name":"Physical Sciences"}}],"keywords":[{"id":"https:\/\/openalex.org\/keywords\/subpixel-rendering","display_name":"Subpixel rendering","score":0.958051323890686},{"id":"https:\/\/openalex.org\/keywords\/gaussian","display_name":"Gaussian","score":0.5350307822227478},{"id":"https:\/\/openalex.org\/keywords\/enhanced-data-rates-for-gsm-evolution","display_name":"Enhanced Data Rates for GSM Evolution","score":0.4716845154762268},{"id":"https:\/\/openalex.org\/keywords\/computer-vision","display_name":"Computer vision","score":0.4554176330566406},{"id":"https:\/\/openalex.org\/keywords\/edge-detection","display_name":"Edge detection","score":0.4165674149990082},{"id":"https:\/\/openalex.org\/keywords\/optics","display_name":"Optics","score":0.410597026348114},{"id":"https:\/\/openalex.org\/keywords\/computer-science","display_name":"Computer science","score":0.3782329857349396},{"id":"https:\/\/openalex.org\/keywords\/artificial-intelligence","display_name":"Artificial intelligence","score":0.3727595806121826},{"id":"https:\/\/openalex.org\/keywords\/materials-science","display_name":"Materials science","score":0.344437837600708},{"id":"https:\/\/openalex.org\/keywords\/image-processing","display_name":"Image processing","score":0.30461978912353516},{"id":"https:\/\/openalex.org\/keywords\/physics","display_name":"Physics","score":0.3020777404308319},{"id":"https:\/\/openalex.org\/keywords\/pixel","display_name":"Pixel","score":0.1907852590084076},{"id":"https:\/\/openalex.org\/keywords\/image","display_name":"Image (mathematics)","score":0.13971039652824402}],"concepts":[{"id":"https:\/\/openalex.org\/C68516990","wikidata":"https:\/\/www.wikidata.org\/wiki\/Q452912","display_name":"Subpixel rendering","level":3,"score":0.958051323890686},{"id":"https:\/\/openalex.org\/C163716315","wikidata":"https:\/\/www.wikidata.org\/wiki\/Q901177","display_name":"Gaussian","level":2,"score":0.5350307822227478},{"id":"https:\/\/openalex.org\/C162307627","wikidata":"https:\/\/www.wikidata.org\/wiki\/Q204833","display_name":"Enhanced Data Rates for GSM Evolution","level":2,"score":0.4716845154762268},{"id":"https:\/\/openalex.org\/C31972630","wikidata":"https:\/\/www.wikidata.org\/wiki\/Q844240","display_name":"Computer vision","level":1,"score":0.4554176330566406},{"id":"https:\/\/openalex.org\/C193536780","wikidata":"https:\/\/www.wikidata.org\/wiki\/Q1513153","display_name":"Edge detection","level":4,"score":0.4165674149990082},{"id":"https:\/\/openalex.org\/C120665830","wikidata":"https:\/\/www.wikidata.org\/wiki\/Q14620","display_name":"Optics","level":1,"score":0.410597026348114},{"id":"https:\/\/openalex.org\/C41008148","wikidata":"https:\/\/www.wikidata.org\/wiki\/Q21198","display_name":"Computer science","level":0,"score":0.3782329857349396},{"id":"https:\/\/openalex.org\/C154945302","wikidata":"https:\/\/www.wikidata.org\/wiki\/Q11660","display_name":"Artificial intelligence","level":1,"score":0.3727595806121826},{"id":"https:\/\/openalex.org\/C192562407","wikidata":"https:\/\/www.wikidata.org\/wiki\/Q228736","display_name":"Materials science","level":0,"score":0.344437837600708},{"id":"https:\/\/openalex.org\/C9417928","wikidata":"https:\/\/www.wikidata.org\/wiki\/Q1070689","display_name":"Image processing","level":3,"score":0.30461978912353516},{"id":"https:\/\/openalex.org\/C121332964","wikidata":"https:\/\/www.wikidata.org\/wiki\/Q413","display_name":"Physics","level":0,"score":0.3020777404308319},{"id":"https:\/\/openalex.org\/C160633673","wikidata":"https:\/\/www.wikidata.org\/wiki\/Q355198","display_name":"Pixel","level":2,"score":0.1907852590084076},{"id":"https:\/\/openalex.org\/C115961682","wikidata":"https:\/\/www.wikidata.org\/wiki\/Q860623","display_name":"Image (mathematics)","level":2,"score":0.13971039652824402},{"id":"https:\/\/openalex.org\/C62520636","wikidata":"https:\/\/www.wikidata.org\/wiki\/Q944","display_name":"Quantum mechanics","level":1,"score":0}],"mesh":[],"locations_count":1,"locations":[{"id":"doi:10.1109\/tii.2024.3488789","is_oa":false,"landing_page_url":"https:\/\/doi.org\/10.1109\/tii.2024.3488789","pdf_url":null,"source":{"id":"https:\/\/openalex.org\/S184777250","display_name":"IEEE Transactions on Industrial Informatics","issn_l":"1551-3203","issn":["1551-3203","1941-0050"],"is_oa":false,"is_in_doaj":false,"is_core":true,"host_organization":"https:\/\/openalex.org\/P4310319808","host_organization_name":"Institute of Electrical and Electronics Engineers","host_organization_lineage":["https:\/\/openalex.org\/P4310319808"],"host_organization_lineage_names":["Institute of Electrical and Electronics Engineers"],"type":"journal"},"license":null,"license_id":null,"version":"publishedVersion","is_accepted":true,"is_published":true,"raw_source_name":"IEEE Transactions on Industrial Informatics","raw_type":"journal-article"}],"best_oa_location":null,"sustainable_development_goals":[{"id":"https:\/\/metadata.un.org\/sdg\/7","display_name":"Affordable and clean energy","score":0.5199999809265137}],"awards":[{"id":"https:\/\/openalex.org\/G1338259402","display_name":null,"funder_award_id":"2023J268","funder_id":"https:\/\/openalex.org\/F4320332587","funder_display_name":"Natural Science Foundation of Ningbo"},{"id":"https:\/\/openalex.org\/G3321955391","display_name":null,"funder_award_id":"2024M752791","funder_id":"https:\/\/openalex.org\/F4320321543","funder_display_name":"China Postdoctoral Science Foundation"},{"id":"https:\/\/openalex.org\/G6108543026","display_name":null,"funder_award_id":"62303401","funder_id":"https:\/\/openalex.org\/F4320321001","funder_display_name":"National Natural Science Foundation of China"}],"funders":[{"id":"https:\/\/openalex.org\/F4320321001","display_name":"National Natural Science Foundation of China","ror":"https:\/\/ror.org\/01h0zpd94"},{"id":"https:\/\/openalex.org\/F4320321543","display_name":"China Postdoctoral Science Foundation","ror":"https:\/\/ror.org\/0426zh255"},{"id":"https:\/\/openalex.org\/F4320332587","display_name":"Natural Science Foundation of Ningbo","ror":"https:\/\/ror.org\/01h0zpd94"}],"has_content":{"pdf":false,"grobid_xml":false},"content_urls":null,"referenced_works_count":28,"referenced_works":["https:\/\/openalex.org\/W2005503614","https:\/\/openalex.org\/W2022018587","https:\/\/openalex.org\/W2035459724","https:\/\/openalex.org\/W2049928636","https:\/\/openalex.org\/W2066712602","https:\/\/openalex.org\/W2096889917","https:\/\/openalex.org\/W2165149777","https:\/\/openalex.org\/W2318731427","https:\/\/openalex.org\/W2769087851","https:\/\/openalex.org\/W2792643808","https:\/\/openalex.org\/W2803361407","https:\/\/openalex.org\/W2899496112","https:\/\/openalex.org\/W2911938806","https:\/\/openalex.org\/W2914107945","https:\/\/openalex.org\/W2995268951","https:\/\/openalex.org\/W3009951607","https:\/\/openalex.org\/W3009994855","https:\/\/openalex.org\/W3020942003","https:\/\/openalex.org\/W3025592463","https:\/\/openalex.org\/W3137589698","https:\/\/openalex.org\/W3149210910","https:\/\/openalex.org\/W4285156135","https:\/\/openalex.org\/W4288056892","https:\/\/openalex.org\/W4313559872","https:\/\/openalex.org\/W4321433787","https:\/\/openalex.org\/W4323656912","https:\/\/openalex.org\/W4387789729","https:\/\/openalex.org\/W6735897172"],"related_works":["https:\/\/openalex.org\/W2375702896","https:\/\/openalex.org\/W2361076620","https:\/\/openalex.org\/W2118683497","https:\/\/openalex.org\/W2111946936","https:\/\/openalex.org\/W2044632550","https:\/\/openalex.org\/W2315652488","https:\/\/openalex.org\/W2028037572","https:\/\/openalex.org\/W2039365229","https:\/\/openalex.org\/W65623452","https:\/\/openalex.org\/W2145843506"],"abstract_inverted_index":{"In":[0],"mounting":[1,59],"machines,":[2],"vision":[3,24],"measurement":[4,25],"of":[5,45,54,76,86,98,106,170],"surface":[6,150],"mount":[7,151],"devices":[8],"(SMDs)":[9],"is":[10,37,93,115],"a":[11,111],"crucial":[12],"task,":[13],"widely":[14],"used":[15],"for":[16,41,50,69,154],"size":[17],"calculation":[18],"and":[19,66,110,160,167],"defect":[20],"detection.":[21],"However,":[22],"current":[23],"methods":[26],"focus":[27],"on":[28,148],"specific":[29],"SMDs,":[30,78],"such":[31],"as":[32],"quad":[33],"flat":[34],"packages.":[35],"There":[36],"no":[38],"unified":[39],"method":[40,68],"measuring":[42,70],"all":[43],"kinds":[44],"rectangular-pin":[46,77],"components,":[47],"which":[48,79],"account":[49],"more":[51],"than":[52],"half":[53],"the":[55,74,96,119,133,149,164,171],"SMDs":[56,107],"processed":[57],"in":[58,95],"machines.":[60],"This":[61],"article":[62],"presents":[63],"an":[64,89],"automatic":[65],"universal":[67],"with":[71],"subpixel":[72,144],"accuracy":[73,166],"parameters":[75],"can":[80],"be":[81],"applied":[82],"to":[83,143],"different":[84,155,158],"types":[85],"SMDs.":[87],"First,":[88],"edge":[90],"gradient":[91],"model":[92],"proposed":[94,172],"form":[97],"asymmetric":[99],"Gaussian":[100],"function.":[101],"After":[102],"that,":[103],"line":[104,112,134,139],"segments":[105,124],"are":[108,125,141],"extracted":[109],"adjacency":[113,135],"matrix":[114],"obtained":[116],"that":[117],"describes":[118],"relationship":[120],"between":[121],"lines.":[122],"Then,":[123],"combined":[126],"into":[127],"long":[128],"lines":[129],"by":[130],"searching":[131],"through":[132],"matrix.":[136],"Finally,":[137],"pixel":[138],"pairs":[140],"refined":[142],"level.":[145],"Experimental":[146],"results":[147],"hardware":[152],"platform":[153],"components":[156],"under":[157],"angles":[159],"light":[161],"conditions":[162],"demonstrate":[163],"high":[165],"strong":[168],"robustness":[169],"method.":[173]},"counts_by_year":[{"year":2026,"cited_by_count":1},{"year":2025,"cited_by_count":2}],"updated_date":"2026-02-27T16:54:17.756197","created_date":"2025-10-10T00:00:00"}